Your Search Results
Use materials about this topic in your textbook!
AcademicPub holds over eight million pieces of educational content - such as case studies and journal articles - for you to mix-and-match your way.
Experience the freedom of customizing your course pack with AcademicPub!

Topic: Photoluminescence
Results
2011 / IEEE
By: Eun-Soo Nam; Cheol-Hoi Kim; Jong-In Shim; Han-Youl Ryu; Jin Hyoung Choi; Jong-Moo Lee; Min-Soo Noh; Hyun Min Jung;
By: Eun-Soo Nam; Cheol-Hoi Kim; Jong-In Shim; Han-Youl Ryu; Jin Hyoung Choi; Jong-Moo Lee; Min-Soo Noh; Hyun Min Jung;
2011 / IEEE
By: Jenkins, M.; Keeley, J.; Shuo Liu; Holmes, M.R.; Hawkins, A.R.; Schmidt, H.; Leake, K.;
By: Jenkins, M.; Keeley, J.; Shuo Liu; Holmes, M.R.; Hawkins, A.R.; Schmidt, H.; Leake, K.;
2012 / IEEE
By: Butendheich, R.; Humphreys, C.; Dandan Zhu; Trivellin, N.; Vaccari, S.; Leirer, C.; Zanoni, E.; Meneghini, M.; Meneghesso, G.; Hahn, B.;
By: Butendheich, R.; Humphreys, C.; Dandan Zhu; Trivellin, N.; Vaccari, S.; Leirer, C.; Zanoni, E.; Meneghini, M.; Meneghesso, G.; Hahn, B.;
2012 / IEEE
By: Xuejun Xu; Narusawa, S.; Chiba, T.; Shiraki, Y.; Jinsong Xia; Usami, N.; Maruizumi, T.; Tsuboi, T.;
By: Xuejun Xu; Narusawa, S.; Chiba, T.; Shiraki, Y.; Jinsong Xia; Usami, N.; Maruizumi, T.; Tsuboi, T.;
2012 / IEEE
By: Su-Ik Park; Jong-In Shim; Han-Youl Ryu; Dong-Soo Shin; Hyun-Sung Kim; Dong-Hyun Jang; Jong-Ik Lee;
By: Su-Ik Park; Jong-In Shim; Han-Youl Ryu; Dong-Soo Shin; Hyun-Sung Kim; Dong-Hyun Jang; Jong-Ik Lee;
2012 / IEEE
By: Grinyov, B.; Sidletskiy, O.; Gorbenko, V.; Voznyak, T.; Savchyn, V.; Nikl, M.; Zorenko, Y.; Douissard, P.; Martin, T.; Mares, J.;
By: Grinyov, B.; Sidletskiy, O.; Gorbenko, V.; Voznyak, T.; Savchyn, V.; Nikl, M.; Zorenko, Y.; Douissard, P.; Martin, T.; Mares, J.;
2012 / IEEE
By: Shimizu, T.; Nakazato, T.; Cadatal-Raduban, M.; Takeda, K.; Sakai, K.; Sarukura, N.; Wakamiya, A.; Kano, M.; Yamanoi, K.; Fukuda, T.;
By: Shimizu, T.; Nakazato, T.; Cadatal-Raduban, M.; Takeda, K.; Sakai, K.; Sarukura, N.; Wakamiya, A.; Kano, M.; Yamanoi, K.; Fukuda, T.;
2012 / IEEE
By: Moses, W.W.; Choong, W.; Grim, J.Q.; Li, Q.; Singh, J.; Vasil'ev, A.N.; Payne, S.A.; Williams, R.T.; Bizarri, G.A.;
By: Moses, W.W.; Choong, W.; Grim, J.Q.; Li, Q.; Singh, J.; Vasil'ev, A.N.; Payne, S.A.; Williams, R.T.; Bizarri, G.A.;
2012 / IEEE
By: Sekiwa, H.; Miyamoto, M.; Kikuchi, M.; Futami, Y.; Wakahara, S.; Sugiyama, M.; Nikl, M.; Yokota, Y.; Kurosawa, S.; Fujimoto, Y.; Yanagida, T.; Yoshikawa, A.; Yamaji, A.;
By: Sekiwa, H.; Miyamoto, M.; Kikuchi, M.; Futami, Y.; Wakahara, S.; Sugiyama, M.; Nikl, M.; Yokota, Y.; Kurosawa, S.; Fujimoto, Y.; Yanagida, T.; Yoshikawa, A.; Yamaji, A.;
2012 / IEEE
By: Wei-Ting Chang; Min-Chi Cheng; Yu-Chuan Su; Chih-Chien Chu; Hsiao, V.K.S.; Prasad, P.N.; Wing-Cheung Law; Ken-Tye Yong;
By: Wei-Ting Chang; Min-Chi Cheng; Yu-Chuan Su; Chih-Chien Chu; Hsiao, V.K.S.; Prasad, P.N.; Wing-Cheung Law; Ken-Tye Yong;
2012 / IEEE
By: Huang, J.Y.T.; Jeng-Ya Yeh; Menoni, C.S.; Pikal, J.M.; Mawst, L.J.; Patel, D.; Lifang Xu; Tansu, N.;
By: Huang, J.Y.T.; Jeng-Ya Yeh; Menoni, C.S.; Pikal, J.M.; Mawst, L.J.; Patel, D.; Lifang Xu; Tansu, N.;
Light Emission Enhancement From Er-Doped Silicon Photonic Crystal Double-Heterostructure Microcavity
2012 / IEEEBy: Yue Wang; Xiongwei Hu; Hongjie Wang; Jianguang Li; Junming An; Yuanda Wu; Jiashun Zhang;
2012 / IEEE
By: Ohshita, Y.; Kamiya, I.; Wen Hu; Kozu, M.; Takahasi, M.; Yamaguchi, M.; Ikeda, K.; Inagaki, M.; Suzuki, H.; Sasaki, T.; Shimomura, K.;
By: Ohshita, Y.; Kamiya, I.; Wen Hu; Kozu, M.; Takahasi, M.; Yamaguchi, M.; Ikeda, K.; Inagaki, M.; Suzuki, H.; Sasaki, T.; Shimomura, K.;
2000 / IEEE
By: Kato, K.; Sengiku, M.; Kaneko, F.; Shinbo, K.; Oda, Y.; Ogura, Y.; Yatsui, K.; Jiang, W.;
By: Kato, K.; Sengiku, M.; Kaneko, F.; Shinbo, K.; Oda, Y.; Ogura, Y.; Yatsui, K.; Jiang, W.;
2009 / IEEE / 978-1-4577-0493-2
By: Agnello, S.; Alessi, A.; Brichard, B.; Oproiu, C.; Sporea, D.G.; Gelardi, F.M.;
By: Agnello, S.; Alessi, A.; Brichard, B.; Oproiu, C.; Sporea, D.G.; Gelardi, F.M.;
2010 / IEEE / 978-1-4244-5261-3
By: Smolyakov, G.A.; Rivera, A.C.; Medina, G.; Akins, B.A.; Withers, N.J.; Plumley, J.B.; Osinski, M.;
By: Smolyakov, G.A.; Rivera, A.C.; Medina, G.; Akins, B.A.; Withers, N.J.; Plumley, J.B.; Osinski, M.;
2011 / IEEE / 978-1-61284-795-5
By: Aleksandrov, I.A.; Malin, T.V.; Zhuravlev, K.S.; Osinnykh, I.V.;
By: Aleksandrov, I.A.; Malin, T.V.; Zhuravlev, K.S.; Osinnykh, I.V.;
2011 / IEEE / 978-1-4577-0624-0
By: Caron, T.; Frenois, C.; Hairault, L.; Pasquinet, E.; Barthet, C.; Montmeat, P.; Eloy, N.; Veignal, F.; Bouhadid, M.;
By: Caron, T.; Frenois, C.; Hairault, L.; Pasquinet, E.; Barthet, C.; Montmeat, P.; Eloy, N.; Veignal, F.; Bouhadid, M.;
2011 / IEEE / 978-1-61284-774-0
By: Yu Qiu; Wang, L.; Heqiu Zhang; Lizhong Hu; Ye Lang; Jin xue Ma; Jiuyu Ji; Guangwei Qu; Guoqiang Liu;
By: Yu Qiu; Wang, L.; Heqiu Zhang; Lizhong Hu; Ye Lang; Jin xue Ma; Jiuyu Ji; Guangwei Qu; Guoqiang Liu;
2011 / IEEE / 978-3-8007-3356-9
By: Tawil, S.N.M.; Asahi, H.; Hasegawa, S.; Emura, S.; Krishnamurthy, D.; Zhou, Y.K.;
By: Tawil, S.N.M.; Asahi, H.; Hasegawa, S.; Emura, S.; Krishnamurthy, D.; Zhou, Y.K.;
2011 / IEEE / 978-3-8007-3356-9
By: Huh, J.-H.; Hermannstadter, C.; Suemune, I.; Sasakura, H.; Jahan, N.A.;
By: Huh, J.-H.; Hermannstadter, C.; Suemune, I.; Sasakura, H.; Jahan, N.A.;
2011 / IEEE / 978-3-8007-3356-9
By: Borgstrom, M.T.; Lindgren, D.; Heurlin, M.; Kawaguchi, K.; Samuelson, L.;
By: Borgstrom, M.T.; Lindgren, D.; Heurlin, M.; Kawaguchi, K.; Samuelson, L.;
2011 / IEEE / 978-3-8007-3356-9
By: Ilahi, B.; Patriarche, G.; Naji, K.; Chauvin, N.; Maaref, H.; Khmissi, H.; Gendry, M.; Hadj Alouane, M.H.; Bru-Chevallie, C.;
By: Ilahi, B.; Patriarche, G.; Naji, K.; Chauvin, N.; Maaref, H.; Khmissi, H.; Gendry, M.; Hadj Alouane, M.H.; Bru-Chevallie, C.;
2011 / IEEE / 978-1-4577-0378-2
By: Young, S.L.; Shih, Y.T.; Horng, L.; Kung, C.Y.; Chen, H.Z.; Ou, C.R.; Lin, C.C.; Lin, C.H.; Kao, M.C.;
By: Young, S.L.; Shih, Y.T.; Horng, L.; Kung, C.Y.; Chen, H.Z.; Ou, C.R.; Lin, C.C.; Lin, C.H.; Kao, M.C.;
2011 / IEEE / 978-1-4577-0378-2
By: Wei-Chun Chen; Fang-I Lai; Shou-Yi Kuo; Kang-Yuan Lee; Hung-Wen Huang; Woei-Tyng Lin;
By: Wei-Chun Chen; Fang-I Lai; Shou-Yi Kuo; Kang-Yuan Lee; Hung-Wen Huang; Woei-Tyng Lin;
2011 / IEEE / 978-3-8007-3356-9
By: Jancu, J.-M.; Durand, O.; Burin, J.-P.; Richard, S.; Letoublon, A.; Perrin, M.; Elias, G.; Bondi, A.; Guo, W.; Thanh, T.N.; Robert, C.; Cornet, C.; Le Corre, A.; Ponchet, A.; Bertru, N.; Folliot, H.; Loualiche, S.; Even, J.;
By: Jancu, J.-M.; Durand, O.; Burin, J.-P.; Richard, S.; Letoublon, A.; Perrin, M.; Elias, G.; Bondi, A.; Guo, W.; Thanh, T.N.; Robert, C.; Cornet, C.; Le Corre, A.; Ponchet, A.; Bertru, N.; Folliot, H.; Loualiche, S.; Even, J.;
2011 / IEEE / 978-3-8007-3356-9
By: Kim, W.B.; Kim, K.M.; Asahi, H.; Hasegawa, S.; Kobayashi, H.; Ishimaru, M.; Krishnamurthy, D.;
By: Kim, W.B.; Kim, K.M.; Asahi, H.; Hasegawa, S.; Kobayashi, H.; Ishimaru, M.; Krishnamurthy, D.;
2011 / IEEE / 978-1-61284-088-8
By: Yangan Yan; Jing Wang; Huawa Yu; Yali Du; Hanchen Liu; Bin Gao; Xin Wang;
By: Yangan Yan; Jing Wang; Huawa Yu; Yali Du; Hanchen Liu; Bin Gao; Xin Wang;
2011 / IEEE / 978-1-61284-777-1
By: Yuan-Ron Ma; Patil, R.R.; Jin-Han Lin; Ching-Ling Lin; Devan, R.S.;
By: Yuan-Ron Ma; Patil, R.R.; Jin-Han Lin; Ching-Ling Lin; Devan, R.S.;
2011 / IEEE / 978-1-61284-878-5
By: Arnold, P.L.; Ayodele, O.; Sujecki, S.; Weinstein, J.A.; Sazanovich, I.V.; Phillips, A.; Ali, M.I.;
By: Arnold, P.L.; Ayodele, O.; Sujecki, S.; Weinstein, J.A.; Sazanovich, I.V.; Phillips, A.; Ali, M.I.;
2011 / IEEE / 978-1-4244-8340-2
By: Portalupi, S.L.; Lo Savio, R.; Priolo, F.; Galli, M.; O'Faolain, L.; Shakoor, A.; Welna, K.; Franzo, G.; Irrera, A.; Krauss, T.F.; Andreani, L.C.; Guizzetti, G.; Gerace, D.;
By: Portalupi, S.L.; Lo Savio, R.; Priolo, F.; Galli, M.; O'Faolain, L.; Shakoor, A.; Welna, K.; Franzo, G.; Irrera, A.; Krauss, T.F.; Andreani, L.C.; Guizzetti, G.; Gerace, D.;
2011 / IEEE / 978-966-335-357-9
By: Kochev, A.S.; Nikolaenko, I.A.; Stepanova, L.S.; Gaponenko, N.V.; Orekhovskaya, T.I.;
By: Kochev, A.S.; Nikolaenko, I.A.; Stepanova, L.S.; Gaponenko, N.V.; Orekhovskaya, T.I.;
2011 / IEEE / 978-966-335-357-9
By: Bulanyi, M.F.; Omelrchenko, S.A.; Skuratovskaya, E.V.; Kovalenko, A.V.;
By: Bulanyi, M.F.; Omelrchenko, S.A.; Skuratovskaya, E.V.; Kovalenko, A.V.;
2011 / IEEE / 978-1-4244-6051-9
By: Cassan, E.; Marris-Morini, D.; Beck, A.; Le Roux, X.; Gaufres, E.; Izard, N.; Vivien, L.;
By: Cassan, E.; Marris-Morini, D.; Beck, A.; Le Roux, X.; Gaufres, E.; Izard, N.; Vivien, L.;
2011 / IEEE / 978-1-61284-172-4
By: Tiginyanu, I.; Lupan, O.; Ghimpu, L.; Ursaki, V.V.; Shishiyanu, S.; Shishiyanu, T.;
By: Tiginyanu, I.; Lupan, O.; Ghimpu, L.; Ursaki, V.V.; Shishiyanu, S.; Shishiyanu, T.;
2011 / IEEE / 978-1-4577-1549-5
By: Yusoff, M.Z.M.; Yunus, M.B.M.; Yusof, Y.; Ahmad, A.; Chin Che Woei; Mahyuddin, A.; Hassan, Z.;
By: Yusoff, M.Z.M.; Yunus, M.B.M.; Yusof, Y.; Ahmad, A.; Chin Che Woei; Mahyuddin, A.; Hassan, Z.;