Your Search Results
Use materials about this topic in your textbook!
AcademicPub holds over eight million pieces of educational content - such as case studies and journal articles - for you to mix-and-match your way.
Experience the freedom of customizing your course pack with AcademicPub!

Topic: Phase Measurement
Results
2011 / IEEE
By: Kim Keng Teo; Zhiliang Qin; Lin-Yu, M.; Jingliang Zhang; Wai Ee Wong; Kui Cai; Songhua Zhang; Eng Teo Ong;
By: Kim Keng Teo; Zhiliang Qin; Lin-Yu, M.; Jingliang Zhang; Wai Ee Wong; Kui Cai; Songhua Zhang; Eng Teo Ong;
2012 / IEEE
By: Ghasr, M.T.; Kothari, A.; Baumgartner, M.A.; Fallahpour, M.; Zoughi, R.; Pommerenke, D.;
By: Ghasr, M.T.; Kothari, A.; Baumgartner, M.A.; Fallahpour, M.; Zoughi, R.; Pommerenke, D.;
2012 / IEEE
By: Azkarate, I.; Leturiondo, L.A.; Gutierrez, J.J.; Lazkano, A.; Ruiz, J.; Redondo, K.; Saiz, P.;
By: Azkarate, I.; Leturiondo, L.A.; Gutierrez, J.J.; Lazkano, A.; Ruiz, J.; Redondo, K.; Saiz, P.;
Design of Phase Identification System to Support Three-Phase Loading Balance of Distribution Feeders
2012 / IEEEBy: Te-Tien Ku; Chao-Shun Chen; Chia-Hung Lin;
2012 / IEEE
By: Kondo, R.; Yazawa, K.; Yamaguchi, T.; Hashimoto, N.; Kon, S.; Yamada, T.; Kurosawa, K.;
By: Kondo, R.; Yazawa, K.; Yamaguchi, T.; Hashimoto, N.; Kon, S.; Yamada, T.; Kurosawa, K.;
2012 / IEEE
By: Aoki, T.; Ohtsuka, M.; Nakamoto, N.; Takahashi, T.; Yajima, M.; Chiba, I.; Konishi, Y.;
By: Aoki, T.; Ohtsuka, M.; Nakamoto, N.; Takahashi, T.; Yajima, M.; Chiba, I.; Konishi, Y.;
2012 / IEEE
By: Smart, K.W.; Timms, G.P.; Archer, J.W.; Smith, S.L.; Granet, C.; Hay, S.G.; Barker, S.J.;
By: Smart, K.W.; Timms, G.P.; Archer, J.W.; Smith, S.L.; Granet, C.; Hay, S.G.; Barker, S.J.;
2002 / IEEE / 978-0-7354-0107-5
By: Fuks, Mikhail I.; Schamiloglu, Edl; Palitsin, Alexey V.; Kovalev, Nikolay F.; Goikhman, Mikhail B.;
By: Fuks, Mikhail I.; Schamiloglu, Edl; Palitsin, Alexey V.; Kovalev, Nikolay F.; Goikhman, Mikhail B.;
2006 / IEEE / 978-3-9805741-8-1
By: Cibiel, G.; Sauvage, G.; Schaefer, W.; Cermak, J.; Barillet, R.; Lefebvre, F.; Salzenstein, P.; Gribaldo, S.; Hejc, G.; Sojdr, L.; Kuna, A.; Vacheret, X.; Franquet, N.; Meyer, F.; Llopis, O.; Franquet, O.;
By: Cibiel, G.; Sauvage, G.; Schaefer, W.; Cermak, J.; Barillet, R.; Lefebvre, F.; Salzenstein, P.; Gribaldo, S.; Hejc, G.; Sojdr, L.; Kuna, A.; Vacheret, X.; Franquet, N.; Meyer, F.; Llopis, O.; Franquet, O.;
2011 / IEEE / 978-1-4577-1226-5
By: Kakue, T.; Matoba, O.; Nishio, K.; Kubota, T.; Ura, S.; Awatsuji, Y.; Tahara, T.;
By: Kakue, T.; Matoba, O.; Nishio, K.; Kubota, T.; Ura, S.; Awatsuji, Y.; Tahara, T.;
2011 / IEEE / 978-1-4577-1226-5
By: Montilla, I.; Femenia, B.; Rodriguez-Ramos, L.F.; Militello, C.; Quintero, H.; Guadalupe, V.; Rosa, F.; Lopez, R.; Sanluis, J.C.; Dominguez-Conde, C.; Fernandez-Valdivia, J.J.; Lopez, M.; Puga, M.; Trujillo-Sevilla, J.; Luke, J.P.; Marichal-Hernandez, J.G.; Rodriguez-Ramos, J.M.;
By: Montilla, I.; Femenia, B.; Rodriguez-Ramos, L.F.; Militello, C.; Quintero, H.; Guadalupe, V.; Rosa, F.; Lopez, R.; Sanluis, J.C.; Dominguez-Conde, C.; Fernandez-Valdivia, J.J.; Lopez, M.; Puga, M.; Trujillo-Sevilla, J.; Luke, J.P.; Marichal-Hernandez, J.G.; Rodriguez-Ramos, J.M.;
2011 / IEEE / 978-1-4577-1226-5
By: Jourdain, P.; Boss, D.; Kuhn, J.; Marquet, P.; Depeursinge, C.; Magistretti, P.;
By: Jourdain, P.; Boss, D.; Kuhn, J.; Marquet, P.; Depeursinge, C.; Magistretti, P.;
2011 / IEEE / 978-1-61284-795-5
By: Korotkov, D.A.; Rogozhnikov, E.V.; Voroshilin, E.P.; Vershinin, A.S.; Maikov, D.Y.;
By: Korotkov, D.A.; Rogozhnikov, E.V.; Voroshilin, E.P.; Vershinin, A.S.; Maikov, D.Y.;