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Topic: Phase Detectors
Results
2012 / IEEE
By: Loke, A.L.S.; Doyle, B.A.; Maheshwari, S.K.; Fang, E.S.; Wang, C.L.; Tin Tin Wee; Fischette, D.M.;
By: Loke, A.L.S.; Doyle, B.A.; Maheshwari, S.K.; Fang, E.S.; Wang, C.L.; Tin Tin Wee; Fischette, D.M.;
2011 / IEEE / 978-1-61284-943-0
By: Yuldashev, M.V.; Leonov, G.A.; Kuznetsov, N.V.; Yuldashev, R.V.;
By: Yuldashev, M.V.; Leonov, G.A.; Kuznetsov, N.V.; Yuldashev, R.V.;
2011 / IEEE / 978-1-61284-857-0
By: Shuo-Hung Hsu; Jen-Ming Wu; Ching-Te Chiu; Jen-Chieh Chih; Yar-Sun Hsu;
By: Shuo-Hung Hsu; Jen-Ming Wu; Ching-Te Chiu; Jen-Chieh Chih; Yar-Sun Hsu;
2012 / IEEE / 978-0-7695-4688-9
By: Garside, J.D.; Plana, L.A.; Clark, D.M.; Temple, S.; Furber, S.B.;
By: Garside, J.D.; Plana, L.A.; Clark, D.M.; Temple, S.; Furber, S.B.;
2010 / American Institute of Physics
By: A. Mlynek; G. Schramm; H. Eixenberger; G. Sips; K. McCormick; J. Eheberg; M. Zilker; K. Behler;
By: A. Mlynek; G. Schramm; H. Eixenberger; G. Sips; K. McCormick; J. Eheberg; M. Zilker; K. Behler;
1990 / IEEE
By: Sullivan, G.J.; Nubling, R.B.; Wang, K.C.; Asbeck, P.M.; Higgins, J.A.; Sheng, N.H.; Chang, M.F.; Wang, N.L.; Ho, W.J.;
By: Sullivan, G.J.; Nubling, R.B.; Wang, K.C.; Asbeck, P.M.; Higgins, J.A.; Sheng, N.H.; Chang, M.F.; Wang, N.L.; Ho, W.J.;
1996 / IEEE / 0-7803-3504-X
By: Wang, K.C.; Price, A.; Penney, J.; Pedrotti, K.; Wu, D.Y.; Beccue, S.; Meeker, D.; Yen, A.C.;
By: Wang, K.C.; Price, A.; Penney, J.; Pedrotti, K.; Wu, D.Y.; Beccue, S.; Meeker, D.; Yen, A.C.;
1994 / IEEE / 0-7803-1975-3
By: Shikata, M.; Ushikubo, T.; Nishi, S.; Fujishiro, H.I.; Shigemasa, R.; Nishino, A.;
By: Shikata, M.; Ushikubo, T.; Nishi, S.; Fujishiro, H.I.; Shigemasa, R.; Nishino, A.;
1998 / IEEE / 0-7803-4766-8
By: Abiko, H.; Fukaishi, M.; Nakamura, K.; Yotsuyanagi, M.; Matsumoto, A.;
By: Abiko, H.; Fukaishi, M.; Nakamura, K.; Yotsuyanagi, M.; Matsumoto, A.;
1998 / IEEE
By: Horowitz, M.A.; Eddleman, D.J.; Yue, C.P.; Min Xu; del Mar Hershenson, M.; Lee, T.H.; Samavati, H.; Mohan, S.S.; Shaeffer, D.K.; Shahani, A.R.; Rategh, H.R.;
By: Horowitz, M.A.; Eddleman, D.J.; Yue, C.P.; Min Xu; del Mar Hershenson, M.; Lee, T.H.; Samavati, H.; Mohan, S.S.; Shaeffer, D.K.; Shahani, A.R.; Rategh, H.R.;
1999 / IEEE / 0-7803-5443-5
By: Jongsang Choi; Yongsam Moon; Min-Kyu Kim; Deog-Kyoon Jeong; Kyeongho Lee;
By: Jongsang Choi; Yongsam Moon; Min-Kyu Kim; Deog-Kyoon Jeong; Kyeongho Lee;
1999 / IEEE / 0-7803-5471-0
By: Matsuda, Y.; Ishii, H.; Furuhashi, R.; Kitai, N.; Obote, S.; Sumi, Y.; Fukui, Y.;
By: Matsuda, Y.; Ishii, H.; Furuhashi, R.; Kitai, N.; Obote, S.; Sumi, Y.; Fukui, Y.;
1998 / IEEE / 0-7803-5008-1
By: Mendez-Rivera, M.; Sanchez-Sinencio, E.; Silva-Martinez, J.; Valero-Lopez, A.;
By: Mendez-Rivera, M.; Sanchez-Sinencio, E.; Silva-Martinez, J.; Valero-Lopez, A.;
2000 / IEEE / 0-7803-5853-8
By: Yamashida, H.; Sato, T.; Sumi, Y.; Matsushima, Y.; Yamashina, M.; Yamaguchi, H.; Mizuno, M.; Minami, K.; Nakano, T.;
By: Yamashida, H.; Sato, T.; Sumi, Y.; Matsushima, Y.; Yamashina, M.; Yamaguchi, H.; Mizuno, M.; Minami, K.; Nakano, T.;
2000 / IEEE / 0-7803-5853-8
By: Mitsui, K.; Hamamoto, T.; Kikuda, S.; Furutani, K.; Kato, T.; Kuge, S.; Ozaki, H.; Konishi, Y.; Akiyama, M.; Nakaoka, Y.; Kawaguchi, Z.; Haraguchi, M.; Kubo, T.; Amano, T.; Kono, T.; Kawasaki, S.; Komiya, Y.; Hamade, K.; Setogawa, J.;
By: Mitsui, K.; Hamamoto, T.; Kikuda, S.; Furutani, K.; Kato, T.; Kuge, S.; Ozaki, H.; Konishi, Y.; Akiyama, M.; Nakaoka, Y.; Kawaguchi, Z.; Haraguchi, M.; Kubo, T.; Amano, T.; Kono, T.; Kawasaki, S.; Komiya, Y.; Hamade, K.; Setogawa, J.;