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Topic: Phase Detector
Results
2012 / IEEE / 978-0-7695-4688-9
By: Garside, J.D.; Plana, L.A.; Clark, D.M.; Temple, S.; Furber, S.B.;
By: Garside, J.D.; Plana, L.A.; Clark, D.M.; Temple, S.; Furber, S.B.;
2014 / IEEE
By: Kay, Holger; Gessler, Patrick; Hidvegi, Attila; Bohm, Christian; Petrosyan, Vahan; Stechmann, Christoph; Aghababyan, Arthur; Petrosyan, Lyudvig; Petrosyan, Gevorg; Rehlich, Kay;
By: Kay, Holger; Gessler, Patrick; Hidvegi, Attila; Bohm, Christian; Petrosyan, Vahan; Stechmann, Christoph; Aghababyan, Arthur; Petrosyan, Lyudvig; Petrosyan, Gevorg; Rehlich, Kay;
2014 / IEEE
By: Chiang, Patrick Yin; Hong, Zhiliang; Yue, C. Patrick; Sun, Li; Wang, Zhongkai; Jing, Xing; Wang, Juncheng; Bai, Rui; Nan, Qi;
By: Chiang, Patrick Yin; Hong, Zhiliang; Yue, C. Patrick; Sun, Li; Wang, Zhongkai; Jing, Xing; Wang, Juncheng; Bai, Rui; Nan, Qi;
2014 / IEEE
By: Khatri, Vishal; Gaggatur, Javed S; Banerjee, Gaurab; Lenka, Manas K; Raja, Immanuel;
By: Khatri, Vishal; Gaggatur, Javed S; Banerjee, Gaurab; Lenka, Manas K; Raja, Immanuel;
2013 / IEEE
By: Gessler, Patrick; Hidvegi, Attila; Bohm, Christian; Rehlich, Kay; Kay, Holger; Aghababyan, Arthur; Petrosyan, Lyudvig; Petrosyan, Gevorg; Petrosyan, Vahan; Stechmann, Christoph;
By: Gessler, Patrick; Hidvegi, Attila; Bohm, Christian; Rehlich, Kay; Kay, Holger; Aghababyan, Arthur; Petrosyan, Lyudvig; Petrosyan, Gevorg; Petrosyan, Vahan; Stechmann, Christoph;
1989 / IEEE
By: Asbeck, P.M.; Chang, M.F.; Fang, S.; Basit, H.F.; Kwark, Y.H.; Anderson, C.J.; Watanabe, G.T.; Young, R.; Harr, J.D.; George, J.D.; McDermott, T.; Honaker, C.; Wang, K.C.; McDonald, M.; Sullivan, G.J.; Nubling, R.;
By: Asbeck, P.M.; Chang, M.F.; Fang, S.; Basit, H.F.; Kwark, Y.H.; Anderson, C.J.; Watanabe, G.T.; Young, R.; Harr, J.D.; George, J.D.; McDermott, T.; Honaker, C.; Wang, K.C.; McDonald, M.; Sullivan, G.J.; Nubling, R.;
1996 / IEEE / 0-7803-3117-6
By: Sitch, J.; Rabjohn, G.; Salama, C.A.T.; Greshishchev, Yu.; Sowlati, T.;
By: Sitch, J.; Rabjohn, G.; Salama, C.A.T.; Greshishchev, Yu.; Sowlati, T.;
1996 / IEEE / 0-7803-3504-X
By: Bronner, W.; Rieger-Motzer, M.; Lang, M.; Baumberger, W.; Leber, P.; Raynor, B.; Hulsmann, A.;
By: Bronner, W.; Rieger-Motzer, M.; Lang, M.; Baumberger, W.; Leber, P.; Raynor, B.; Hulsmann, A.;
1997 / IEEE
By: Sumi, T.; Okada, K.; Hirano, S.; Fujiwara, T.; Yamanaka, K.; Koyama, M.; Murakami, S.; Takeuchi, S.; Ido, J.;
By: Sumi, T.; Okada, K.; Hirano, S.; Fujiwara, T.; Yamanaka, K.; Koyama, M.; Murakami, S.; Takeuchi, S.; Ido, J.;
1997 / IEEE / 0-7803-3669-0
By: Hulsmann, A.; Bronner, W.; Lao, Z.; Rieger-Motzer, M.; Kaufel, G.; Wang, Z.G.; Leber, P.; Lang, M.; Raynor, B.;
By: Hulsmann, A.; Bronner, W.; Lao, Z.; Rieger-Motzer, M.; Kaufel, G.; Wang, Z.G.; Leber, P.; Lang, M.; Raynor, B.;
1999 / IEEE / 0-7803-5573-3
By: Kuo, C.H.; Kuo, C.C.; Hsu, K.T.; Hu, K.H.; Lin, K.K.; Chen, J.; Chen, C.S.; Ueng, T.S.;
By: Kuo, C.H.; Kuo, C.C.; Hsu, K.T.; Hu, K.H.; Lin, K.K.; Chen, J.; Chen, C.S.; Ueng, T.S.;
2000 / IEEE / 0-7803-5853-8
By: Mitsui, K.; Hamamoto, T.; Kikuda, S.; Furutani, K.; Kato, T.; Kuge, S.; Ozaki, H.; Konishi, Y.; Akiyama, M.; Nakaoka, Y.; Kawaguchi, Z.; Haraguchi, M.; Kubo, T.; Amano, T.; Kono, T.; Kawasaki, S.; Komiya, Y.; Hamade, K.; Setogawa, J.;
By: Mitsui, K.; Hamamoto, T.; Kikuda, S.; Furutani, K.; Kato, T.; Kuge, S.; Ozaki, H.; Konishi, Y.; Akiyama, M.; Nakaoka, Y.; Kawaguchi, Z.; Haraguchi, M.; Kubo, T.; Amano, T.; Kono, T.; Kawasaki, S.; Komiya, Y.; Hamade, K.; Setogawa, J.;