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Topic: Permittivity
Results
2011 / IEEE
By: Chun-zao Li; Xue-yong Zhang; Bo-rui Bian; Hai-feng Zhang; Xiang-kun Kong; Shao-bin Liu;
By: Chun-zao Li; Xue-yong Zhang; Bo-rui Bian; Hai-feng Zhang; Xiang-kun Kong; Shao-bin Liu;
2011 / IEEE
By: Bai Yang; Ting Li; Ruihe Tang; Ronghai Yu; Zhiyu Zou; Xiaofang Liu; Zhangben Wu; Zhengjun Zhang; Wei Liu; Zhigang Yang; He Jiang; Wupeng Cai;
By: Bai Yang; Ting Li; Ruihe Tang; Ronghai Yu; Zhiyu Zou; Xiaofang Liu; Zhangben Wu; Zhengjun Zhang; Wei Liu; Zhigang Yang; He Jiang; Wupeng Cai;
2011 / IEEE
By: Huitema, L.; Mattei, J.-L.; Thakur, A.; Souriou, D.; Staraj, R.; Ferrero, F.; Jamnier, B.; Sharahia, A.; Minard, P.; Pintos, J.-F.; Queffelec, P.;
By: Huitema, L.; Mattei, J.-L.; Thakur, A.; Souriou, D.; Staraj, R.; Ferrero, F.; Jamnier, B.; Sharahia, A.; Minard, P.; Pintos, J.-F.; Queffelec, P.;
2011 / IEEE
By: Osada, H.; Kubota, K.; Sekino, N.; Namizaki, Y.; Dawson, F.P.; Uchidate, S.; Oka, H.; Lavers, J.D.;
By: Osada, H.; Kubota, K.; Sekino, N.; Namizaki, Y.; Dawson, F.P.; Uchidate, S.; Oka, H.; Lavers, J.D.;
2011 / IEEE
By: Wasa, K.; Kalinin, S.V.; Jesse, S.; Jackson, T.N.; Bharadwaja, S.S.N.; Trolier-McKinstry, S.; Dalong Zhao; Jousse, P.; Yaeger, C.; Griggio, F.;
By: Wasa, K.; Kalinin, S.V.; Jesse, S.; Jackson, T.N.; Bharadwaja, S.S.N.; Trolier-McKinstry, S.; Dalong Zhao; Jousse, P.; Yaeger, C.; Griggio, F.;
2011 / IEEE
By: Eun Jong Cha; Taeyong Kim; Sungil Kim; Muhan Choi; Min Hwan Kwak; Seung Beom Kang; Kwang Yong Kang;
By: Eun Jong Cha; Taeyong Kim; Sungil Kim; Muhan Choi; Min Hwan Kwak; Seung Beom Kang; Kwang Yong Kang;
2011 / IEEE
By: Shih, W.Y.; Youngsoo Chung; Wei Wu; Xiang Li; Shung, K.K.; Qifa Zhou; Wei-Heng Shih;
By: Shih, W.Y.; Youngsoo Chung; Wei Wu; Xiang Li; Shung, K.K.; Qifa Zhou; Wei-Heng Shih;
2011 / IEEE
By: Shung, K.K.; Qifa Zhou; Sien-Ting Lau; Xi Yao; Xiaoqing Wu; Hongfen Ji; Peng Shi; Lingyan Wang; Wei Ren; Xiaofeng Chen;
By: Shung, K.K.; Qifa Zhou; Sien-Ting Lau; Xi Yao; Xiaoqing Wu; Hongfen Ji; Peng Shi; Lingyan Wang; Wei Ren; Xiaofeng Chen;
2011 / IEEE
By: Panina, L.V.; Peng, H.X.; Qin, F.X.; Gonzalez, J.; Zhukov, A.; Zhukova, V.; Ipatov, M.;
By: Panina, L.V.; Peng, H.X.; Qin, F.X.; Gonzalez, J.; Zhukov, A.; Zhukova, V.; Ipatov, M.;
2012 / IEEE
By: Liberti, M.; Apollonio, F.; d'Inzeo, G.; Casciola, M.; Paffi, A.; Denzi, A.; Merla, C.;
By: Liberti, M.; Apollonio, F.; d'Inzeo, G.; Casciola, M.; Paffi, A.; Denzi, A.; Merla, C.;
2012 / IEEE
By: Franc, A.-L.; Xiao-Lan Tang; Fournier, J.; Ferrari, P.; Vincent, P.; Siligaris, A.; Pistono, E.;
By: Franc, A.-L.; Xiao-Lan Tang; Fournier, J.; Ferrari, P.; Vincent, P.; Siligaris, A.; Pistono, E.;
Effects of Dielectric Barrier Discharge Treatment Conditions on the Uprightness of Carbon Nanofibers
2012 / IEEEBy: Takikawa, H.; Tanoue, H.; Suda, Y.; Sugioka, Y.; Umeda, Y.; Shimizu, K.; Ue, H.;
2011 / IEEE
By: Frechette, M.; Gubanski, S.; Bulinski, A.; Tanaka, T.; Han, S.J.; Sutton, S.; Reed, C.W.; Ohki, Y.; Vaughan, A.; Castellon, J.; Pelissou, S.; Tanaka, Y.; Morshuis, P.; Nagao, M.; Montanari, G.C.; Kindersberger, J.;
By: Frechette, M.; Gubanski, S.; Bulinski, A.; Tanaka, T.; Han, S.J.; Sutton, S.; Reed, C.W.; Ohki, Y.; Vaughan, A.; Castellon, J.; Pelissou, S.; Tanaka, Y.; Morshuis, P.; Nagao, M.; Montanari, G.C.; Kindersberger, J.;
2012 / IEEE
By: Pasquale, M.; Olariu, M.A.; Olivetti, E.S.; Manu, O.M.; Scarlatache, V.A.; Kabos, P.; Fiorillo, F.; Coisson, M.; Caprile, A.;
By: Pasquale, M.; Olariu, M.A.; Olivetti, E.S.; Manu, O.M.; Scarlatache, V.A.; Kabos, P.; Fiorillo, F.; Coisson, M.; Caprile, A.;