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Topic: Permittivity Measurements
Results
2012 / IEEE / 978-1-4577-1772-7
By: Liberti, M.; Apollonio, F.; Zambotti, A.; Merla, C.; D'Atanasio, P.; De Benedetto, E.; Cataldo, A.; Cannazza, G.; Piuzzi, E.;
By: Liberti, M.; Apollonio, F.; Zambotti, A.; Merla, C.; D'Atanasio, P.; De Benedetto, E.; Cataldo, A.; Cannazza, G.; Piuzzi, E.;
2012 / IEEE / 978-1-4673-1088-8
By: Ward-Callan, M.; McKinney, J.K.; Boglione, L.; Robertson, I.; Ridler, N.; Barr, J.; Hunter, I.; Komrij, H.;
By: Ward-Callan, M.; McKinney, J.K.; Boglione, L.; Robertson, I.; Ridler, N.; Barr, J.; Hunter, I.; Komrij, H.;
2012 / IEEE / 978-1-4673-1088-8
By: Battu, Serge; Ling Yan Zhang; Blondy, Pierre; Jauberteau, Marie-Odile; Lalloue, Fabrice; du Puch, Christophe Bounaix Morand; Lautrette, Christophe; Pothier, Arnaud; Dalmay, Claire; Lacroix, Aurelie;
By: Battu, Serge; Ling Yan Zhang; Blondy, Pierre; Jauberteau, Marie-Odile; Lalloue, Fabrice; du Puch, Christophe Bounaix Morand; Lautrette, Christophe; Pothier, Arnaud; Dalmay, Claire; Lacroix, Aurelie;
2013 / IEEE
By: Szafran, Mikolaj; Bobryk, Ewa; Pawlikowska, Emilia; Yashchyshyn, Yevhen; Godziszewski, Konrad;
By: Szafran, Mikolaj; Bobryk, Ewa; Pawlikowska, Emilia; Yashchyshyn, Yevhen; Godziszewski, Konrad;
New developments on automated-active circuits for permittivity measurements at microwave frequencies
1989 / IEEEBy: Bosisio, R.G.; Akyel, C.;
1994 / IEEE / 0-7803-1778-5
By: Preece, A.W.; Gregory, A.P.; Clarke, R.N.; Green, J.L.; Craig, A.A.; Johnson, R.H.;
By: Preece, A.W.; Gregory, A.P.; Clarke, R.N.; Green, J.L.; Craig, A.A.; Johnson, R.H.;
2006 / IEEE
By: Changyul Cheon; Jeiwon Cho; Jeonghoon Yoon; Sungjoon Cho; Sungkyu Lim; Kihyun Kwon; Youngwoo Kwon;
By: Changyul Cheon; Jeiwon Cho; Jeonghoon Yoon; Sungjoon Cho; Sungkyu Lim; Kihyun Kwon; Youngwoo Kwon;
2006 / IEEE / 2-9600551-6-0
By: Guilloux-Viry, M.; Deputier, S.; Tanne, G.; Laurent, P.; Perrin, A.; Rousseau, A.; Laur, V.; Huret, F.;
By: Guilloux-Viry, M.; Deputier, S.; Tanne, G.; Laurent, P.; Perrin, A.; Rousseau, A.; Laur, V.; Huret, F.;
2008 / IEEE / 978-1-4244-2317-0
By: Bermond, C.; Blampey, B.; Farcy, A.; Gallitre, M.; Lacrevaz, T.; de Rivaz, S.; Flechet, B.;
By: Bermond, C.; Blampey, B.; Farcy, A.; Gallitre, M.; Lacrevaz, T.; de Rivaz, S.; Flechet, B.;
2008 / IEEE / 978-1-4244-1780-3
By: Schubler, Martin; Maune, Holger; Rijiranuwa, Arampan; Penirschke, Andreas; Jakoby, Rolf;
By: Schubler, Martin; Maune, Holger; Rijiranuwa, Arampan; Penirschke, Andreas; Jakoby, Rolf;
2009 / IEEE / 978-1-4244-2803-8
By: Canos-Marin, A.J.; Catala-Civera, J.M.; Penaranda-Foix, F.L.; Garcia-Banos, B.;
By: Canos-Marin, A.J.; Catala-Civera, J.M.; Penaranda-Foix, F.L.; Garcia-Banos, B.;
2010 / IEEE / 978-1-4244-6058-8
By: Guerrero-Ojeda, L.G.; Martinez-Brito, J.; Murthy, D.V.B.; Corona-Chavez, A.; Lobato-Morales, H.;
By: Guerrero-Ojeda, L.G.; Martinez-Brito, J.; Murthy, D.V.B.; Corona-Chavez, A.; Lobato-Morales, H.;
2011 / IEEE
By: Murthy, D.V.B.; Lobato-Morales, H.; Guerrero-Ojeda, L.G.; Martinez-Brito, J.; Olvera-Cervantes, J.L.; Corona-Chavez, A.;
By: Murthy, D.V.B.; Lobato-Morales, H.; Guerrero-Ojeda, L.G.; Martinez-Brito, J.; Olvera-Cervantes, J.L.; Corona-Chavez, A.;