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Topic: Permittivity Measurement
Results
Rigorous Characterization of Carbon Nanotube Complex Permittivity Over a Broadband of RF Frequencies
2012 / IEEEBy: Decrossas, E.; El-Ghazaly, S.M.; Hanna, V.F.; El Sabbagh, M.A.;
2012 / IEEE
By: Sasaki, H.; Yamashiro, Y.; Watanabe, S.; Kojima, M.; Sasaki, K.; Sakai, T.; Wakatsuchi, H.; Hashimoto, O.;
By: Sasaki, H.; Yamashiro, Y.; Watanabe, S.; Kojima, M.; Sasaki, K.; Sakai, T.; Wakatsuchi, H.; Hashimoto, O.;
2012 / IEEE
By: Leow Pei Ling; Rahim, R.A.; Mohamad, E.J.; Ayob, N.M.N.; Faizan Bin Marwah, O.M.; Rahiman, M.H.F.;
By: Leow Pei Ling; Rahim, R.A.; Mohamad, E.J.; Ayob, N.M.N.; Faizan Bin Marwah, O.M.; Rahiman, M.H.F.;
2011 / IEEE / 978-1-61284-463-3
By: Kuan-Yu Chen; Kuen-Fwu Fuh; Lin, T.; Cheng, A.; Tzuang-Han Lin; En-Ting Chen;
By: Kuan-Yu Chen; Kuen-Fwu Fuh; Lin, T.; Cheng, A.; Tzuang-Han Lin; En-Ting Chen;
2011 / IEEE / 978-1-61284-978-2
By: Miyamoto, K.; Hidaka, N.; Sugama, H.; Tsuchiya, A.; Hashimoto, O.; Tsujino, S.;
By: Miyamoto, K.; Hidaka, N.; Sugama, H.; Tsuchiya, A.; Hashimoto, O.; Tsujino, S.;
2011 / IEEE / 978-4-907764-39-5
By: Higuchi, K.; Chamnongthai, K.; Jirasereeamornkul, K.; Watcharakitchakorn, O.; Kittiamornkul, N.;
By: Higuchi, K.; Chamnongthai, K.; Jirasereeamornkul, K.; Watcharakitchakorn, O.; Kittiamornkul, N.;
2011 / IEEE / 978-1-4577-1589-1
By: Teng, E.; Moon, K.; Giraud-Carrier, M.; Mazzeo, B.A.; Warnick, K.F.; Hawkins, A.R.;
By: Teng, E.; Moon, K.; Giraud-Carrier, M.; Mazzeo, B.A.; Warnick, K.F.; Hawkins, A.R.;
2011 / IEEE / 978-966-335-357-9
By: Makarov, O.L.; Ovsyanikov, V.V.; Petrenko, G.V.; Romanenko, Y.D.; Popel, V.M.; Olrshevsrkii, O.L.;
By: Makarov, O.L.; Ovsyanikov, V.V.; Petrenko, G.V.; Romanenko, Y.D.; Popel, V.M.; Olrshevsrkii, O.L.;
2011 / IEEE / 978-89-93246-17-9
By: Watanabe, T.; Arii, M.; Yamaguchi, Y.; Kobayashi, H.; Yamada, H.;
By: Watanabe, T.; Arii, M.; Yamaguchi, Y.; Kobayashi, H.; Yamada, H.;
2011 / IEEE / 978-1-4577-1631-7
By: Zolkapli, M.; Abu Bakar, R.; Zoolfakar, A.S.; Baba, N.H.; Awang, Z.; Zaki, F.A.M.; Fadzlina, N.;
By: Zolkapli, M.; Abu Bakar, R.; Zoolfakar, A.S.; Baba, N.H.; Awang, Z.; Zaki, F.A.M.; Fadzlina, N.;
2011 / IEEE / 978-1-4673-0020-9
By: Burhanudin, Z.A.; bin Ibrahim, T.; Rawther, M.B.K.; Saeed Rabih, A.A.;
By: Burhanudin, Z.A.; bin Ibrahim, T.; Rawther, M.B.K.; Saeed Rabih, A.A.;
2012 / IEEE / 978-1-4673-0325-5
By: Takahashi, H.; Takei, Y.; Kan, T.; Ishizu, K.; Shimoyama, I.; Matsumoto, K.;
By: Takahashi, H.; Takei, Y.; Kan, T.; Ishizu, K.; Shimoyama, I.; Matsumoto, K.;