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Topic: Particle Measurements
Results
2011 / IEEE
By: Franks, P.J.S.; Horner-Devine, A.R.; Jaffe, J.S.; Steinbuck, J.V.; Roberts, P.L.D.; Simonet, F.;
By: Franks, P.J.S.; Horner-Devine, A.R.; Jaffe, J.S.; Steinbuck, J.V.; Roberts, P.L.D.; Simonet, F.;
2011 / IEEE
By: Clausen, L.B.N.; Ribeiro, A.J.; Ruohoniemi, J.M.; Baker, J.B.H.; Sterne, K.A.; Frissell, N.A.; Greenwald, R.A.;
By: Clausen, L.B.N.; Ribeiro, A.J.; Ruohoniemi, J.M.; Baker, J.B.H.; Sterne, K.A.; Frissell, N.A.; Greenwald, R.A.;
2012 / IEEE
By: Lee, J.H.; Yue, Q.; Choi, J.H.; Kang, W.G.; Kim, B.H.; Kim, H.J.; Kim, K.W.; Kim, S.C.; Kim, S.K.; Kim, Y.D.; Lee, J.I.; Lee, J.K.; Lee, M.J.; Lee, S.J.; Li, J.; Li, J.; Li, X.R.; Li, Y.J.; Myung, S.S.; Olsen, S.L.; Ryu, S.; Seong, I.S.; So, J.H.; Bhang, H.;
By: Lee, J.H.; Yue, Q.; Choi, J.H.; Kang, W.G.; Kim, B.H.; Kim, H.J.; Kim, K.W.; Kim, S.C.; Kim, S.K.; Kim, Y.D.; Lee, J.I.; Lee, J.K.; Lee, M.J.; Lee, S.J.; Li, J.; Li, J.; Li, X.R.; Li, Y.J.; Myung, S.S.; Olsen, S.L.; Ryu, S.; Seong, I.S.; So, J.H.; Bhang, H.;
2012 / IEEE
By: Vilasis-Cardona, X.; Machefert, F.; Lefrancois, J.; Grauges, E.; Gascon, D.; Garrido, L.; Duarte, O.; Abellan, C.; Picatoste, E.;
By: Vilasis-Cardona, X.; Machefert, F.; Lefrancois, J.; Grauges, E.; Gascon, D.; Garrido, L.; Duarte, O.; Abellan, C.; Picatoste, E.;
1992 / IEEE / 000-0-0000-0000-0
By: Krasik, Y.E.; Sarfaty, M.; Fisher, A.; Maron, Y.; Shkolnikova, S.; Weingarten, A.; Arad, R.;
By: Krasik, Y.E.; Sarfaty, M.; Fisher, A.; Maron, Y.; Shkolnikova, S.; Weingarten, A.; Arad, R.;
2002 / IEEE / 978-0-7354-0107-5
By: Fuks, Mikhail I.; Schamiloglu, Edl; Palitsin, Alexey V.; Kovalev, Nikolay F.; Goikhman, Mikhail B.;
By: Fuks, Mikhail I.; Schamiloglu, Edl; Palitsin, Alexey V.; Kovalev, Nikolay F.; Goikhman, Mikhail B.;
2011 / IEEE / 978-1-4577-0574-8
By: Kummamuru, K.; Gangadharan, G.R.; Sharma, A.; Hartman, A.; Somasekhara, J.;
By: Kummamuru, K.; Gangadharan, G.R.; Sharma, A.; Hartman, A.; Somasekhara, J.;