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Topic: Parallel Supercomputer
Results
2002 / IEEE / 0-7695-1653-X
By: Glaser, M.A.; Bokhari, S.H.; Van Zeghbroeck, B.; Sauer, J.R.; Lansac, Y.; Jordan, H.F.;
By: Glaser, M.A.; Bokhari, S.H.; Van Zeghbroeck, B.; Sauer, J.R.; Lansac, Y.; Jordan, H.F.;
2003 / IEEE / 0-7695-1926-1
By: Nakano, A.; Kalia, R.K.; Kikuchi, H.; Saini, S.; Shimojo, F.; Vashishta, P.;
By: Nakano, A.; Kalia, R.K.; Kikuchi, H.; Saini, S.; Shimojo, F.; Vashishta, P.;
Experimental analysis of the root causes of performance evaluation results: a backfilling case study
2005 / IEEEBy: Feitelson, D.G.;
2005 / IEEE / 0-7803-9220-5
By: Cases, M.; de Araujo, D.N.; Wenhua Yu; Mittra, R.; Hashemi, M.R.; Matoglu, E.; Pham, N.;
By: Cases, M.; de Araujo, D.N.; Wenhua Yu; Mittra, R.; Hashemi, M.R.; Matoglu, E.; Pham, N.;
2007 / IEEE / 978-1-4244-0916-7
By: Gsell, A.; Adelmann, A.; Stockinger, K.; Siegerist, C.; Shalf, J.M.; Bethel, W.; Schietinger, T.; Oswald, B.;
By: Gsell, A.; Adelmann, A.; Stockinger, K.; Siegerist, C.; Shalf, J.M.; Bethel, W.; Schietinger, T.; Oswald, B.;
2008 / IEEE / 978-1-4244-1814-5
By: Reumann, Matthias; Fitch, Blake G.; Rice, John J.; Pitman, Michael C.; Dossel, Olaf; Seemann, Gunnar; Weiss, Daniel L.; Rayshubskiy, Aleksandr; Keller, David U.;
By: Reumann, Matthias; Fitch, Blake G.; Rice, John J.; Pitman, Michael C.; Dossel, Olaf; Seemann, Gunnar; Weiss, Daniel L.; Rayshubskiy, Aleksandr; Keller, David U.;
1991 / IEEE / 0-89791-459-7
By: Lasinski, T.A.; Frederickson, P.O.; Fatoohi, R.A.; Dagum, L.; Browning, D.S.; Carter, R.L.; Schreiber, R.S.; Barton, J.T.; Barszcz, E.; Bailey, D.H.; Weeratunga, S.K.; Venkatakrishnan, V.; Simon, H.D.;
By: Lasinski, T.A.; Frederickson, P.O.; Fatoohi, R.A.; Dagum, L.; Browning, D.S.; Carter, R.L.; Schreiber, R.S.; Barton, J.T.; Barszcz, E.; Bailey, D.H.; Weeratunga, S.K.; Venkatakrishnan, V.; Simon, H.D.;
2010 / IEEE / 978-1-4244-7837-8
By: Mason, P.; Liu, J.G.; bin Mohd Rahim, M.S.; Kamarudin, S.N.; Ismail, N.A.F.b.;
By: Mason, P.; Liu, J.G.; bin Mohd Rahim, M.S.; Kamarudin, S.N.; Ismail, N.A.F.b.;