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Topic: Packaging
Results
2012 / IEEE
By: Sedaka, J.; Scholz, C.; Cooper, M.; Miyasaka, H.; Meras, P.; Mao, P.; Liebe, C.C.; Madsen, K.K.; Kecman, B.; Cook, R.; Clark, G.R.; Bauman, B.W.;
By: Sedaka, J.; Scholz, C.; Cooper, M.; Miyasaka, H.; Meras, P.; Mao, P.; Liebe, C.C.; Madsen, K.K.; Kecman, B.; Cook, R.; Clark, G.R.; Bauman, B.W.;
2012 / IEEE
By: Jiang Wei Man; Liang Xie; Wei Wang; Ning Hua Zhu; Yu Liu; Bao Jun Wang; Ling Juan Zhao; Hai Qing Yuan; Xin Wang; Hong Liang Zhu;
By: Jiang Wei Man; Liang Xie; Wei Wang; Ning Hua Zhu; Yu Liu; Bao Jun Wang; Ling Juan Zhao; Hai Qing Yuan; Xin Wang; Hong Liang Zhu;
2012 / IEEE
By: Lourenco, N.E.; Philips, S.D.; Bhattacharya, S.K.; Patterson, C.E.; Poh, C.H.J.; Papapolymerou, J.; Cressler, J.D.;
By: Lourenco, N.E.; Philips, S.D.; Bhattacharya, S.K.; Patterson, C.E.; Poh, C.H.J.; Papapolymerou, J.; Cressler, J.D.;
2012 / IEEE
By: Matsunaga, K.; Okamoto, Y.; Nakayama, T.; Ando, Y.; Miyamoto, H.; Tanomura, M.; Wakejima, A.; Kuroda, N.; Ota, K.;
By: Matsunaga, K.; Okamoto, Y.; Nakayama, T.; Ando, Y.; Miyamoto, H.; Tanomura, M.; Wakejima, A.; Kuroda, N.; Ota, K.;
2012 / IEEE
By: Bailey, C.; Eicher, F.; Muller, G.; Adamietz, R.; Pavuluri, S.K.; Desmulliez, M.P.Y.; Goussetis, G.; Ferenets, M.; Tilford, T.;
By: Bailey, C.; Eicher, F.; Muller, G.; Adamietz, R.; Pavuluri, S.K.; Desmulliez, M.P.Y.; Goussetis, G.; Ferenets, M.; Tilford, T.;
2012 / IEEE
By: Yung-Jr Hung; Hsinyi Lo; San-Liang Lee; Szu-Chieh Chen; Kuei-Yi Lee; Ram, R.J.; Yen-Ting Pan; Charng-Gan Tu;
By: Yung-Jr Hung; Hsinyi Lo; San-Liang Lee; Szu-Chieh Chen; Kuei-Yi Lee; Ram, R.J.; Yen-Ting Pan; Charng-Gan Tu;
2012 / IEEE
By: Kripesh, V.; Premchandran, C.S.; Tai Chong Chai; Xiaowu Zhang; Seung Wook Yoon; Kumar, A.; Lu Shen; Sekhar, V.N.; Lau, J.H.;
By: Kripesh, V.; Premchandran, C.S.; Tai Chong Chai; Xiaowu Zhang; Seung Wook Yoon; Kumar, A.; Lu Shen; Sekhar, V.N.; Lau, J.H.;
2012 / IEEE
By: Soueidan, M.; Mouawad, B.; Martin, C.; Morel, H.; Bley, V.; Allard, B.; Buttay, C.; Fabregue, D.;
By: Soueidan, M.; Mouawad, B.; Martin, C.; Morel, H.; Bley, V.; Allard, B.; Buttay, C.; Fabregue, D.;
2012 / IEEE
By: Zirath, H.; Chee-Way Oh; Chang, E.Y.; Wei-Cheng Wu; Chin-Te Wang; Li-Han Hsu; Yueh-Chin Lin; Wee-Chin Lim; Szu-Ping Tsai;
By: Zirath, H.; Chee-Way Oh; Chang, E.Y.; Wei-Cheng Wu; Chin-Te Wang; Li-Han Hsu; Yueh-Chin Lin; Wee-Chin Lim; Szu-Ping Tsai;
2012 / IEEE
By: Lau, J.H.; Kripesh, V.; Khan, N.; Kumar, A.; Rao, V.S.; Dim-Lee Kwong; Selvanayagam, C.S.; Rajoo, R.; Xiaowu Zhang; Tummala, R.R.; Sundaram, V.;
By: Lau, J.H.; Kripesh, V.; Khan, N.; Kumar, A.; Rao, V.S.; Dim-Lee Kwong; Selvanayagam, C.S.; Rajoo, R.; Xiaowu Zhang; Tummala, R.R.; Sundaram, V.;
2012 / IEEE
By: Pu Zhang; Yanxin Zhang; Lingling Xiong; Jingwei Wang; Zhiqiang Nie; Xiaoning Li; Xingsheng Liu; Hui Liu; Zhenfu Wang;
By: Pu Zhang; Yanxin Zhang; Lingling Xiong; Jingwei Wang; Zhiqiang Nie; Xiaoning Li; Xingsheng Liu; Hui Liu; Zhenfu Wang;
Review of test methods used for the measurement of hermeticity in packages containing small cavities
2012 / IEEEBy: McCracken, S.; Desmulliez, M.P.Y.; Costello, S.;
2012 / IEEE
By: Gulliksson, M.; Hummelgard, M.; Manuilskiy, A.; Andersson, H.; Siden, J.; Unander, T.; Nilsson, H.;
By: Gulliksson, M.; Hummelgard, M.; Manuilskiy, A.; Andersson, H.; Siden, J.; Unander, T.; Nilsson, H.;
2012 / IEEE
By: Bin Guo; Bo Wang; Severi, S.; Tanaka, S.; De Wolf, I.; Puers, R.; Osman, H.; Decoutere, S.; Tilmans, H.A.C.; Witvrouw, A.; Haspeslagh, L.; Vereecke, G.; Van Hoof, R.; Verbist, A.; Du Bois, B.; De Coster, J.; Claes, G.; Helin, P.; Lianggong Wen;
By: Bin Guo; Bo Wang; Severi, S.; Tanaka, S.; De Wolf, I.; Puers, R.; Osman, H.; Decoutere, S.; Tilmans, H.A.C.; Witvrouw, A.; Haspeslagh, L.; Vereecke, G.; Van Hoof, R.; Verbist, A.; Du Bois, B.; De Coster, J.; Claes, G.; Helin, P.; Lianggong Wen;
2011 / IEEE / 978-1-4577-0158-0
By: Hua, Y.N.; Yeo, A.; Tan, J.B.; Yuan, S.; Lim, Y.K.; Siah, S.Y.; Rao, N.R.;
By: Hua, Y.N.; Yeo, A.; Tan, J.B.; Yuan, S.; Lim, Y.K.; Siah, S.Y.; Rao, N.R.;
2011 / IEEE / 978-1-4244-5731-1
By: Stevens, M.; Baek, B.; Calkins, B.; Lita, A.; Sae Woo Nam; Mirin, R.;
By: Stevens, M.; Baek, B.; Calkins, B.; Lita, A.; Sae Woo Nam; Mirin, R.;