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Topic: Optical Variables Measurement
Results
2011 / IEEE
By: Kan Wu; Lee, K.E.K.; Huy Quoc Lam; Jia Haur Wong; Chunmei Ouyang; Aditya, S.; Shum, P.P.;
By: Kan Wu; Lee, K.E.K.; Huy Quoc Lam; Jia Haur Wong; Chunmei Ouyang; Aditya, S.; Shum, P.P.;
2012 / IEEE
By: Schires, K.; Quirce, A.; Hurtado, A.; Cuesta, J.R.; Valle, A.; Adams, M.J.; Henning, I.D.; Pesquera, L.;
By: Schires, K.; Quirce, A.; Hurtado, A.; Cuesta, J.R.; Valle, A.; Adams, M.J.; Henning, I.D.; Pesquera, L.;
2012 / IEEE
By: Robertson, F.; Derderian, G.; Breen, M.; Nickerson, P.; Bhandari, H.B.; Kudrolli, H.; Prekas, G.; Sabet, H.; Nagarkar, V.V.; Cool, S.;
By: Robertson, F.; Derderian, G.; Breen, M.; Nickerson, P.; Bhandari, H.B.; Kudrolli, H.; Prekas, G.; Sabet, H.; Nagarkar, V.V.; Cool, S.;
2012 / IEEE
By: Yanagida, T.; Fujimoto, Y.; Kamada, K.; Totsuka, D.; Yagi, H.; Nikl, M.; Futami, Y.; Yanagida, S.; Kurosawa, S.; Yokota, Y.; Yoshikawa, A.; Yanagitani, T.;
By: Yanagida, T.; Fujimoto, Y.; Kamada, K.; Totsuka, D.; Yagi, H.; Nikl, M.; Futami, Y.; Yanagida, S.; Kurosawa, S.; Yokota, Y.; Yoshikawa, A.; Yanagitani, T.;
2012 / IEEE
By: Pasqualotto, R.; Serianni, G.; Pomaro, N.; Molon, F.; Brombin, M.; Dalla Palma, M.; Boldrin, M.; Ghiraldelli, R.;
By: Pasqualotto, R.; Serianni, G.; Pomaro, N.; Molon, F.; Brombin, M.; Dalla Palma, M.; Boldrin, M.; Ghiraldelli, R.;
2012 / IEEE
By: Vinuales, A.; Sanchez-Pena, J.M.; Vega, C.; Torres-Zafra, J.C.; Vergaz, R.; Barrios, D.;
By: Vinuales, A.; Sanchez-Pena, J.M.; Vega, C.; Torres-Zafra, J.C.; Vergaz, R.; Barrios, D.;
2012 / IEEE
By: Seoung Hun Lee; Seung Hwan Kim; Dong Wook Kim; El-Hang Lee; Jong-Moo Lee; Kyong Hon Kim;
By: Seoung Hun Lee; Seung Hwan Kim; Dong Wook Kim; El-Hang Lee; Jong-Moo Lee; Kyong Hon Kim;
2012 / IEEE
By: Terry, J.G.; Horsfall, A.B.; Murray, J.; Wilson, C.J.; Schiavone, G.; Stevenson, J.T.M.; Brockie, N.L.; Smith, S.; Walton, A.J.; Mount, A.R.;
By: Terry, J.G.; Horsfall, A.B.; Murray, J.; Wilson, C.J.; Schiavone, G.; Stevenson, J.T.M.; Brockie, N.L.; Smith, S.; Walton, A.J.; Mount, A.R.;
2012 / IEEE
By: Flood, E.; Donegan, J.F.; Barry, L.P.; Bradley, A.L.; Lynch, M.; Smyth, J.F.; Wei-Hua Guo;
By: Flood, E.; Donegan, J.F.; Barry, L.P.; Bradley, A.L.; Lynch, M.; Smyth, J.F.; Wei-Hua Guo;
2012 / IEEE
By: Thiboust, M.; Peiting Zheng; Rougieux, F.E.; Cuevas, A.; Macdonald, D.H.; Grant, N.E.; Tan, J.;
By: Thiboust, M.; Peiting Zheng; Rougieux, F.E.; Cuevas, A.; Macdonald, D.H.; Grant, N.E.; Tan, J.;
2012 / IEEE
By: Chang-yu Shen; Chuan Zhong; Jian-feng Wang; Yong-xing Jin; Ke Li; Xin Zou; Jin-lei Chu;
By: Chang-yu Shen; Chuan Zhong; Jian-feng Wang; Yong-xing Jin; Ke Li; Xin Zou; Jin-lei Chu;
1992 / IEEE / 000-0-0000-0000-0
By: Pechacek, R.E.; Myers, M.C.; Peyser, T.A.; Meger, R.A.; Antoniades, J.A.; Murphy, D.P.;
By: Pechacek, R.E.; Myers, M.C.; Peyser, T.A.; Meger, R.A.; Antoniades, J.A.; Murphy, D.P.;
2002 / IEEE / 978-0-7354-0107-5
By: Dickens, J.; Krompholz, H.; Krile, J.; Haustein, M.; Neuber, A.;
By: Dickens, J.; Krompholz, H.; Krile, J.; Haustein, M.; Neuber, A.;
2002 / IEEE / 978-0-7354-0107-5
By: Scholz, Marek; Bienkowska, Barbara; Vitulli, Silvia; Romanova, Vera; Kravarik, Josef; Kubes, Pavel; Schmidt, Hellmut; Banaszak, Aneta; Ivanova-Stanik, Irena; Karpinski, Leslaw; Miklaszewski, Ryszard; Paduch, Marian; Tomaszewski, Krzysztof; Zielinska, Ewa; Sadowski, Marek J.; Jakubowski, Lech; Szydlowski, Adam;
By: Scholz, Marek; Bienkowska, Barbara; Vitulli, Silvia; Romanova, Vera; Kravarik, Josef; Kubes, Pavel; Schmidt, Hellmut; Banaszak, Aneta; Ivanova-Stanik, Irena; Karpinski, Leslaw; Miklaszewski, Ryszard; Paduch, Marian; Tomaszewski, Krzysztof; Zielinska, Ewa; Sadowski, Marek J.; Jakubowski, Lech; Szydlowski, Adam;
2011 / IEEE / 978-1-4577-1226-5
By: Jaroszewicz, Z.; Ares, J.; Bara, S.; Prado, P.; Arines, J.; Martinez-Cuenca, R.; Lancis, J.; Tajahuerce, E.; Duran, V.; Climent, V.;
By: Jaroszewicz, Z.; Ares, J.; Bara, S.; Prado, P.; Arines, J.; Martinez-Cuenca, R.; Lancis, J.; Tajahuerce, E.; Duran, V.; Climent, V.;
2011 / IEEE / 978-1-4577-1226-5
By: Mendoza-Yero, O.; Perez-Vizcaino, J.; Andres, P.; Lancis, J.; Martinez-Leon, L.; Martinez-Cuenca, R.;
By: Mendoza-Yero, O.; Perez-Vizcaino, J.; Andres, P.; Lancis, J.; Martinez-Leon, L.; Martinez-Cuenca, R.;
2011 / IEEE / 978-1-4244-9439-2
By: Yinbiao Guo; Xiaohui Lin; Ni Tang; Zhenzhong Wang; Yunfeng Peng;
By: Yinbiao Guo; Xiaohui Lin; Ni Tang; Zhenzhong Wang; Yunfeng Peng;
2011 / IEEE / 978-1-4577-1226-5
By: Jaroszewicz, Z.; Bara, S.; Arines, J.; Lancis, J.; Duran, V.; Martinez-Cuenca, R.;
By: Jaroszewicz, Z.; Bara, S.; Arines, J.; Lancis, J.; Duran, V.; Martinez-Cuenca, R.;
2011 / IEEE / 978-1-4577-1226-5
By: Alonso, B.; Minguez-Vega, G.; Climent, V.; Lancis, J.; Sola, I.J.; Mendoza-Yero, O.; Roso, L.; Varela, O.;
By: Alonso, B.; Minguez-Vega, G.; Climent, V.; Lancis, J.; Sola, I.J.; Mendoza-Yero, O.; Roso, L.; Varela, O.;
2011 / IEEE / 978-1-4577-1226-5
By: Minguez-Vega, G.; Mendoza-Yero, O.; Li-Fan Yang; Shang-Da Yang; Tajahuerce, E.;
By: Minguez-Vega, G.; Mendoza-Yero, O.; Li-Fan Yang; Shang-Da Yang; Tajahuerce, E.;
2011 / IEEE / 978-1-4577-1226-5
By: Cormier, E.; Petit, S.; Hazera, C.; Lhermite, J.; Mansuryan, T.; Barthelemy, A.; Louradour, F.; Kalashyan, M.; Martinez-Leon, L.;
By: Cormier, E.; Petit, S.; Hazera, C.; Lhermite, J.; Mansuryan, T.; Barthelemy, A.; Louradour, F.; Kalashyan, M.; Martinez-Leon, L.;
2011 / IEEE / 978-1-4244-5731-1
By: Minaeva, O.V.; Simon, D.S.; Egorov, R.; Fraine, A.M.; Sergienko, A.V.;
By: Minaeva, O.V.; Simon, D.S.; Egorov, R.; Fraine, A.M.; Sergienko, A.V.;