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Topic: Optical Switches
Results
2011 / IEEE
By: Lemieux, Y.; Mcneill, J.; St. Arnaud, B.; Cherkaoui, O.; Leon-Garcia, A.; Gagnon, F.; Lemay, M.; Thibeault, C.; Cheriet, M.; Labelle, R.; Tho Le Ngoc; Labeau, F.; Despins, C.;
By: Lemieux, Y.; Mcneill, J.; St. Arnaud, B.; Cherkaoui, O.; Leon-Garcia, A.; Gagnon, F.; Lemay, M.; Thibeault, C.; Cheriet, M.; Labelle, R.; Tho Le Ngoc; Labeau, F.; Despins, C.;
2011 / IEEE
By: Hattori, S.; Yukawa, K.; Yanai, A.; Katayama, T.; Kawaguchi, H.; Koh, S.; Ikeda, K.;
By: Hattori, S.; Yukawa, K.; Yanai, A.; Katayama, T.; Kawaguchi, H.; Koh, S.; Ikeda, K.;
2011 / IEEE
By: Kintaka, K.; Nagase, M.; Suda, S.; Shoji, Y.; Kawashima, H.; Ishikawa, H.; Hasama, T.; Kuwatsuka, H.; Akimoto, R.;
By: Kintaka, K.; Nagase, M.; Suda, S.; Shoji, Y.; Kawashima, H.; Ishikawa, H.; Hasama, T.; Kuwatsuka, H.; Akimoto, R.;
2011 / IEEE
By: Yawei Yin; Geisler, D.J.; Yoo, S.J.B.; Shuo Chang; Scott, R.P.; Fontaine, N.K.; Ke Wen;
By: Yawei Yin; Geisler, D.J.; Yoo, S.J.B.; Shuo Chang; Scott, R.P.; Fontaine, N.K.; Ke Wen;
2011 / IEEE
By: Kai Shi; Barry, L.P.; Smyth, F.; Anandarajah, P.M.; Browning, C.; Huynh, T.N.; Reid, D.; Watts, R.;
By: Kai Shi; Barry, L.P.; Smyth, F.; Anandarajah, P.M.; Browning, C.; Huynh, T.N.; Reid, D.; Watts, R.;
2012 / IEEE
By: Schires, K.; Quirce, A.; Hurtado, A.; Cuesta, J.R.; Valle, A.; Adams, M.J.; Henning, I.D.; Pesquera, L.;
By: Schires, K.; Quirce, A.; Hurtado, A.; Cuesta, J.R.; Valle, A.; Adams, M.J.; Henning, I.D.; Pesquera, L.;
2012 / IEEE
By: Balic, V.; Hofferberth, S.; Bajcsy, M.; Peyronel, T.; Hafezi, M.; Vuletic, V.; Lukin, M.D.; Zibrov, A.; Qiyu Liang;
By: Balic, V.; Hofferberth, S.; Bajcsy, M.; Peyronel, T.; Hafezi, M.; Vuletic, V.; Lukin, M.D.; Zibrov, A.; Qiyu Liang;
2012 / IEEE
By: Jackel, H.; Holzman, J.F.; Beck, M.; Kappeler, R.; Fedoryshyn, Y.; Faist, J.; Ping Ma; Kaspar, P.;
By: Jackel, H.; Holzman, J.F.; Beck, M.; Kappeler, R.; Fedoryshyn, Y.; Faist, J.; Ping Ma; Kaspar, P.;
2012 / IEEE
By: Hvam, J.M.; Hua Ji; Oxenlowe, L.K.; Jeppesen, P.; Clausen, A.T.; Galili, M.; Yvind, K.; Mulvad, H.C.H.; Hao Hu; Minhao Pu;
By: Hvam, J.M.; Hua Ji; Oxenlowe, L.K.; Jeppesen, P.; Clausen, A.T.; Galili, M.; Yvind, K.; Mulvad, H.C.H.; Hao Hu; Minhao Pu;
2012 / IEEE
By: Wei Guo; Yaohui Jin; Zijie Xing; Kai Kang; Weisheng Hu; Weiqiang Sun; Papneja, R.; Guoying Zhang;
By: Wei Guo; Yaohui Jin; Zijie Xing; Kai Kang; Weisheng Hu; Weiqiang Sun; Papneja, R.; Guoying Zhang;
2012 / IEEE
By: Magill, P.; Simmons, J.M.; Kwon, T.; Klincewicz, J.; Kim, G.; Li, G.; Jackel, J.; Gannett, J.W.; Feuer, M.; Doverspike, R.; Clapp, G.; Choudhury, G.; Chiu, A.L.; Dahai Xu; Woodward, S.; Wilson, B.J.; Lehmen, A.; Strand, J.; Skoog, R.A.;
By: Magill, P.; Simmons, J.M.; Kwon, T.; Klincewicz, J.; Kim, G.; Li, G.; Jackel, J.; Gannett, J.W.; Feuer, M.; Doverspike, R.; Clapp, G.; Choudhury, G.; Chiu, A.L.; Dahai Xu; Woodward, S.; Wilson, B.J.; Lehmen, A.; Strand, J.; Skoog, R.A.;
2012 / IEEE
By: Ahn, J.H.; Schreiber, R.; Muralimanohar, N.; McLaren, M.; Jouppi, N.; Davis, A.; Binkert, N.;
By: Ahn, J.H.; Schreiber, R.; Muralimanohar, N.; McLaren, M.; Jouppi, N.; Davis, A.; Binkert, N.;
2012 / IEEE
By: Guoqing Hu; Zhangyuan Chen; Anshi Xu; Linzhen Xie; Anpeng Huang; Hequan Wu; Xiang Cheng; Chang, T.;
By: Guoqing Hu; Zhangyuan Chen; Anshi Xu; Linzhen Xie; Anpeng Huang; Hequan Wu; Xiang Cheng; Chang, T.;
2012 / IEEE
By: Yang, M.; Doany, F.E.; Jahnes, C.V.; Kash, J.A.; Vlasov, Y.A.; Van Campenhout, J.; Assefa, S.; Green, W.M.J.; Lee, B.G.; Schow, C.L.; Rylyakov, A.V.;
By: Yang, M.; Doany, F.E.; Jahnes, C.V.; Kash, J.A.; Vlasov, Y.A.; Van Campenhout, J.; Assefa, S.; Green, W.M.J.; Lee, B.G.; Schow, C.L.; Rylyakov, A.V.;
2012 / IEEE
By: Xu, Q.; Rastegarfar, H.; Rusch, L.A.; Leon-Garcia, A.; LaRochelle, S.; Ben M'Sallem, Y.;
By: Xu, Q.; Rastegarfar, H.; Rusch, L.A.; Leon-Garcia, A.; LaRochelle, S.; Ben M'Sallem, Y.;
2012 / IEEE
By: Zhang, F.; Wilkinson, T.D.; Elmirghani, J.M.H.; Crossland, W.A.; Pranggono, B.; Chou, H.-H.;
By: Zhang, F.; Wilkinson, T.D.; Elmirghani, J.M.H.; Crossland, W.A.; Pranggono, B.; Chou, H.-H.;
2012 / IEEE
By: Ming Gao; Lisherness, P.; Yan Zheng; Shiyuan Yang; Hong Wang; Kwang-Ting Cheng; Bovington, J.;
By: Ming Gao; Lisherness, P.; Yan Zheng; Shiyuan Yang; Hong Wang; Kwang-Ting Cheng; Bovington, J.;
2012 / IEEE
By: Wei-Ting Chang; Min-Chi Cheng; Yu-Chuan Su; Chih-Chien Chu; Hsiao, V.K.S.; Prasad, P.N.; Wing-Cheung Law; Ken-Tye Yong;
By: Wei-Ting Chang; Min-Chi Cheng; Yu-Chuan Su; Chih-Chien Chu; Hsiao, V.K.S.; Prasad, P.N.; Wing-Cheung Law; Ken-Tye Yong;
Definition and performance evaluation of a low-cost/high-capacity scalable integrated OTN/WDM switch
2012 / IEEEBy: Eramo, V.; Testa, F.; Sabella, R.; Listanti, M.;
2012 / IEEE
By: Castoldi, P.; Sambo, N.; Andriolli, N.; Ruepp, S.; Giorgetti, A.; Martinez, R.; Mu� R.; Cerutti, I.; Manolova, A.; Casellas, R.;
By: Castoldi, P.; Sambo, N.; Andriolli, N.; Ruepp, S.; Giorgetti, A.; Martinez, R.; Mu� R.; Cerutti, I.; Manolova, A.; Casellas, R.;