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Topic: Optical Scattering
Results
2011 / IEEE
By: Callahan, P.T.; Nanzer, J.A.; Waterhouse, R.B.; Novak, D.; Clark, T.R.; Dennis, M.L.;
By: Callahan, P.T.; Nanzer, J.A.; Waterhouse, R.B.; Novak, D.; Clark, T.R.; Dennis, M.L.;
2012 / IEEE
By: Shuhui Bu; Asao, Y.; Someda, Y.; Fukutani, K.; Yamakawa, M.; Kondo, K.; Shiina, T.; Zhenbao Liu;
By: Shuhui Bu; Asao, Y.; Someda, Y.; Fukutani, K.; Yamakawa, M.; Kondo, K.; Shiina, T.; Zhenbao Liu;
2012 / IEEE
By: Kothapalli, S.; Gambhir, S.S.; Khuri-Yakub, B.T.; Oralkan, O.; Vaithilingam, S.; Te-Jen Ma;
By: Kothapalli, S.; Gambhir, S.S.; Khuri-Yakub, B.T.; Oralkan, O.; Vaithilingam, S.; Te-Jen Ma;
2012 / IEEE
By: Mutyal, N. N.; Turzhitsky, V.; Rogers, J. D.; Radosevich, A. J.; Backman, V.; Roy, H. K.; Yi, J.;
By: Mutyal, N. N.; Turzhitsky, V.; Rogers, J. D.; Radosevich, A. J.; Backman, V.; Roy, H. K.; Yi, J.;
2012 / IEEE
By: Jordan, M.H.; Moffatt, L.T.; Shupp, J.W.; Nguyen, T.T.A.; Ramella-Roman, J.C.; Leto, E.J.;
By: Jordan, M.H.; Moffatt, L.T.; Shupp, J.W.; Nguyen, T.T.A.; Ramella-Roman, J.C.; Leto, E.J.;
2012 / IEEE
By: Schneeweiss, P.; Reitz, D.; Mitsch, R.; Dawkins, S.T.; Vetsch, E.; Rauschenbeutel, A.;
By: Schneeweiss, P.; Reitz, D.; Mitsch, R.; Dawkins, S.T.; Vetsch, E.; Rauschenbeutel, A.;
2012 / IEEE
By: Trunina, N.A.; Genina, E.A.; Bashkatov, A.N.; Ghosn, M.G.; Larin, K.V.; Tuchin, V.V.;
By: Trunina, N.A.; Genina, E.A.; Bashkatov, A.N.; Ghosn, M.G.; Larin, K.V.; Tuchin, V.V.;
2012 / IEEE
By: Wei-Ting Chang; Min-Chi Cheng; Yu-Chuan Su; Chih-Chien Chu; Hsiao, V.K.S.; Prasad, P.N.; Wing-Cheung Law; Ken-Tye Yong;
By: Wei-Ting Chang; Min-Chi Cheng; Yu-Chuan Su; Chih-Chien Chu; Hsiao, V.K.S.; Prasad, P.N.; Wing-Cheung Law; Ken-Tye Yong;
2012 / IEEE
By: Maillotte, H.; Hauden, J.; Stiller, B.; Min Won Lee; Sylvestre, T.; Thevenaz, L.; Roch, C.;
By: Maillotte, H.; Hauden, J.; Stiller, B.; Min Won Lee; Sylvestre, T.; Thevenaz, L.; Roch, C.;
2012 / IEEE
By: Bouwmans, G.; Min Won Lee; Kudlinski, A.; Stiller, B.; Delque, M.; Sylvestre, T.; Maillotte, H.; Beugnot, J.-C.;
By: Bouwmans, G.; Min Won Lee; Kudlinski, A.; Stiller, B.; Delque, M.; Sylvestre, T.; Maillotte, H.; Beugnot, J.-C.;
2012 / IEEE
By: Hawkins, A.R.; Schmidt, H.; Keeley, J.; Jenkins, M.H.; Measor, P.; Leake, K.D.; Yue Zhao;
By: Hawkins, A.R.; Schmidt, H.; Keeley, J.; Jenkins, M.H.; Measor, P.; Leake, K.D.; Yue Zhao;
2010 / IEEE / 978-1-4244-5261-3
By: Wieczorek, L.; Nan Zeng; Glenn, A.M.; Baxter, G.R.; Myers, J.; Raguse, B.; Murphy, A.B.;
By: Wieczorek, L.; Nan Zeng; Glenn, A.M.; Baxter, G.R.; Myers, J.; Raguse, B.; Murphy, A.B.;
2011 / IEEE / 978-1-4577-0088-0
By: Katz, J.; Sullivan, J.; Donaghay, P.; Hong, J.; Twardowski, M.; Talapatra, S.;
By: Katz, J.; Sullivan, J.; Donaghay, P.; Hong, J.; Twardowski, M.; Talapatra, S.;
2011 / IEEE / 978-1-61284-774-0
By: Kun Zhang; Xuejun Jiang; Wu Deng; Xin Zhang; Wei Zhou; Xiaomin Zhang; Wanjun Dai; Dongxia Hu; Junpu Zhao; Kun Cheng; Feng Jing;
By: Kun Zhang; Xuejun Jiang; Wu Deng; Xin Zhang; Wei Zhou; Xiaomin Zhang; Wanjun Dai; Dongxia Hu; Junpu Zhao; Kun Cheng; Feng Jing;
2011 / IEEE / 978-1-61284-774-0
By: Yu Qiu; Wang, L.; Heqiu Zhang; Lizhong Hu; Ye Lang; Jin xue Ma; Jiuyu Ji; Guangwei Qu; Guoqiang Liu;
By: Yu Qiu; Wang, L.; Heqiu Zhang; Lizhong Hu; Ye Lang; Jin xue Ma; Jiuyu Ji; Guangwei Qu; Guoqiang Liu;
2011 / IEEE / 978-1-4244-9563-4
By: Ramaccia, D.; Cingolani, R.; Massaro, A.; Toscano, A.; Bilotti, F.;
By: Ramaccia, D.; Cingolani, R.; Massaro, A.; Toscano, A.; Bilotti, F.;
2011 / IEEE / 978-1-4577-0088-0
By: Ebert, K.; Chami, M.; Galland, F.; Boffety, M.; Allais, A.; Maciol, N.; Edmond, T.; Bouhier, M.; Nicolas, S.;
By: Ebert, K.; Chami, M.; Galland, F.; Boffety, M.; Allais, A.; Maciol, N.; Edmond, T.; Bouhier, M.; Nicolas, S.;
2011 / IEEE / 978-1-61284-329-2
By: Graham, W.; Nedanovska, E.; Huwel, L.; Morgan, T.; Riley, D.; Nersisyan, G.;
By: Graham, W.; Nedanovska, E.; Huwel, L.; Morgan, T.; Riley, D.; Nersisyan, G.;
2011 / IEEE / 978-986-02-8974-9
By: Hung Ji Huang; Handel, B.; Yu-Hsuan Lin; Din Ping Tsai; Heh-Nan Lin; Yung-Fu Chen; Hsiang-An Chen;
By: Hung Ji Huang; Handel, B.; Yu-Hsuan Lin; Din Ping Tsai; Heh-Nan Lin; Yung-Fu Chen; Hsiang-An Chen;
2011 / IEEE / 978-4-907764-39-5
By: Hara, H.; Tezuka, S.; Ishizawa, H.; Horiguchi, T.; Miyauchi, Y.;
By: Hara, H.; Tezuka, S.; Ishizawa, H.; Horiguchi, T.; Miyauchi, Y.;
2011 / IEEE / 978-1-4244-6051-9
By: Simon, C.; Lamy, H.; Brandstrom, U.; Sandahl, I.; Sergienko, T.; Gustavsson, B.;
By: Simon, C.; Lamy, H.; Brandstrom, U.; Sandahl, I.; Sergienko, T.; Gustavsson, B.;
2011 / IEEE / 978-1-4577-1005-6
By: Eguchi, N.; Yokota, T.; Watanabe, H.; Maksyutov, S.; Uchino, O.; Inoue, M.; Saeki, T.; Kikuchi, N.; Morino, I.; Yoshida, Y.;
By: Eguchi, N.; Yokota, T.; Watanabe, H.; Maksyutov, S.; Uchino, O.; Inoue, M.; Saeki, T.; Kikuchi, N.; Morino, I.; Yoshida, Y.;
2011 / IEEE / 978-1-4244-6051-9
By: Murib, M.S.; Yilmaz, H.; Nakata, J.; Taira, K.; Serpenguzel, A.;
By: Murib, M.S.; Yilmaz, H.; Nakata, J.; Taira, K.; Serpenguzel, A.;
2011 / IEEE / 978-1-4244-8165-1
By: Bonan Kang; Fumin Li; Lihua Chen; Kuixue Liu; Shengping Ruan; Yu Wang;
By: Bonan Kang; Fumin Li; Lihua Chen; Kuixue Liu; Shengping Ruan; Yu Wang;
2011 / IEEE / 978-1-4244-6051-9
By: Chan, S.; Tombet, S.A.B.; Otsuji, T.; Ryzhii, V.; Ryzhii, M.; Satou, A.; Watanabe, T.;
By: Chan, S.; Tombet, S.A.B.; Otsuji, T.; Ryzhii, V.; Ryzhii, M.; Satou, A.; Watanabe, T.;
2011 / IEEE / 978-1-55752-932-9
By: Ming-Chun Tien; Heideman, R.G.; John, D.D.; Heck, M.J.R.; Bauters, J.F.; Wenzao Li; Leinse, A.; Bowers, J.E.; Blumenthal, D.J.; Barton, J.S.;
By: Ming-Chun Tien; Heideman, R.G.; John, D.D.; Heck, M.J.R.; Bauters, J.F.; Wenzao Li; Leinse, A.; Bowers, J.E.; Blumenthal, D.J.; Barton, J.S.;
2011 / IEEE / 978-1-4577-1425-2
By: Budnyk, M.; Osadtsiv, I.; Merzhvynskyi, P.; Merzhvynskyi, A.; Voitovych, I.;
By: Budnyk, M.; Osadtsiv, I.; Merzhvynskyi, P.; Merzhvynskyi, A.; Voitovych, I.;
2011 / IEEE / 978-1-55752-932-9
By: Yvind, K.; Reithmaier, J.P.; Saal, A.; Capua, A.; Eisenstein, G.;
By: Yvind, K.; Reithmaier, J.P.; Saal, A.; Capua, A.; Eisenstein, G.;
2011 / IEEE / 978-1-4577-1769-7
By: Sheng Liu; Yao-Hao Wang; Bin-Hai Yu; Cheng Li; Zong-Yuan Liu; Han-Ben Niu;
By: Sheng Liu; Yao-Hao Wang; Bin-Hai Yu; Cheng Li; Zong-Yuan Liu; Han-Ben Niu;