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Topic: Optical Pumping
Results
2011 / IEEE
By: Lempereur, S.; Galkovsky, L.; Fleureau, A.; Mussot, A.; Melin, G.; Labat, D.; Kudlinski, A.;
By: Lempereur, S.; Galkovsky, L.; Fleureau, A.; Mussot, A.; Melin, G.; Labat, D.; Kudlinski, A.;
2011 / IEEE
By: Modotto, D.; Couderc, V.; Tonello, A.; Town, G.; De Angelis, C.; Wabnitz, S.; Minoni, U.; Manili, G.;
By: Modotto, D.; Couderc, V.; Tonello, A.; Town, G.; De Angelis, C.; Wabnitz, S.; Minoni, U.; Manili, G.;
Tradeoffs in the Realization of Electrically Pumped Vertical External Cavity Surface Emitting Lasers
2011 / IEEEBy: Lin, L.C.; Childs, D.T.; Orchard, J.R.; Hogg, R.A.; Williams, D.M.; Stevens, B.J.;
2012 / IEEE
By: Xuejun Xu; Narusawa, S.; Chiba, T.; Shiraki, Y.; Jinsong Xia; Usami, N.; Maruizumi, T.; Tsuboi, T.;
By: Xuejun Xu; Narusawa, S.; Chiba, T.; Shiraki, Y.; Jinsong Xia; Usami, N.; Maruizumi, T.; Tsuboi, T.;
2012 / IEEE
By: Chunle Xiong; Monat, C.; Collins, M.J.; Tranchant, L.; Petiteau, D.; Clark, A.S.; Eggleton, B.J.; Marshall, G.D.; Steel, M.J.; Juntao Li; O'Faolain, L.; Krauss, T.F.; Grillet, C.;
By: Chunle Xiong; Monat, C.; Collins, M.J.; Tranchant, L.; Petiteau, D.; Clark, A.S.; Eggleton, B.J.; Marshall, G.D.; Steel, M.J.; Juntao Li; O'Faolain, L.; Krauss, T.F.; Grillet, C.;
Investigation on Back-Reflected Pumping Light in High-Power Quasi-End-Pumped Yb:YAG Thin-Disk Lasers
2012 / IEEEBy: Radmard, S.; Kazemi, S.; Shayganmanesh, M.; Arabgari, S.;
2012 / IEEE
By: Galili, M.; Rottwitt, K.; Lund-Hansen, T.; Cristofori, V.; Lali-Dastjerdi, Z.; Peucheret, C.;
By: Galili, M.; Rottwitt, K.; Lund-Hansen, T.; Cristofori, V.; Lali-Dastjerdi, Z.; Peucheret, C.;
2012 / IEEE
By: Viktorovitch, P.; Fedeli, J.M.; Letartre, X.; Orobtchouk, R.; Mandorlo, F.; Ferrier, L.; Olivier, N.; Romeo, P.R.;
By: Viktorovitch, P.; Fedeli, J.M.; Letartre, X.; Orobtchouk, R.; Mandorlo, F.; Ferrier, L.; Olivier, N.; Romeo, P.R.;
Experimental Measurements of Path Length Sensitivity in Coherent Beam Combining by Spatial Filtering
2012 / IEEEBy: Chenhao Wan; Leger, J.R.;
2012 / IEEE
By: Weixia Lan; Xuebin Wan; Zhaojun Liu; Xingyu Zhang; Guofan Jin; Qingpu Wang; Fen Bai; Huaijin Zhang;
By: Weixia Lan; Xuebin Wan; Zhaojun Liu; Xingyu Zhang; Guofan Jin; Qingpu Wang; Fen Bai; Huaijin Zhang;
2012 / IEEE
By: Ty-Wang Liaw; Sun-Chien Ko; Chun-Liang Yang; Cheng-Kuang Liu; San-Liang Lee; Shu-Chuan Lin; Keiser, G.;
By: Ty-Wang Liaw; Sun-Chien Ko; Chun-Liang Yang; Cheng-Kuang Liu; San-Liang Lee; Shu-Chuan Lin; Keiser, G.;
2012 / IEEE
By: De-Yuan Shen; Cheng Li; Zhi Yang; Wei Zhang; Cun-Xiao Gao; Jia Yu; Xiao-Hui Li; Wei Zhao; Xiao-Hong Hu; Yi-Shan Wang; Yong-Gang Wang; Xiang-Lian Liu;
By: De-Yuan Shen; Cheng Li; Zhi Yang; Wei Zhang; Cun-Xiao Gao; Jia Yu; Xiao-Hui Li; Wei Zhao; Xiao-Hong Hu; Yi-Shan Wang; Yong-Gang Wang; Xiang-Lian Liu;
2012 / IEEE
By: Harduin, J.; Ben Bakir, B.; Letartre, X.; Seassal, C.; Olivier, N.; Sciancalepore, C.; Viktorovitch, P.; Fedeli, J.;
By: Harduin, J.; Ben Bakir, B.; Letartre, X.; Seassal, C.; Olivier, N.; Sciancalepore, C.; Viktorovitch, P.; Fedeli, J.;
2012 / IEEE
By: Orofino, C.; Kanibolotsky, A.L.; Chen, Y.; Herrnsdorf, J.; Skabara, P.J.; Guilhabert, B.; Laurand, N.; Dawson, M.D.;
By: Orofino, C.; Kanibolotsky, A.L.; Chen, Y.; Herrnsdorf, J.; Skabara, P.J.; Guilhabert, B.; Laurand, N.; Dawson, M.D.;
2012 / IEEE
By: Yilmaz, O.F.; Khaleghi, S.; Willner, A.E.; Fejer, M.M.; Langrock, C.; Haney, M.W.; Xiaoxia Wu; Fazal, I.M.; Nuccio, S.R.; Ahmed, N.; Tur, M.; Chitgarha, M.R.;
By: Yilmaz, O.F.; Khaleghi, S.; Willner, A.E.; Fejer, M.M.; Langrock, C.; Haney, M.W.; Xiaoxia Wu; Fazal, I.M.; Nuccio, S.R.; Ahmed, N.; Tur, M.; Chitgarha, M.R.;
2012 / IEEE
By: Carlson, K.; Borel, P.I.; Peckham, D.W.; Benyuan Zhu; Xiang Zhou; Isaac, R.; Magill, P.; Nelson, L.E.;
By: Carlson, K.; Borel, P.I.; Peckham, D.W.; Benyuan Zhu; Xiang Zhou; Isaac, R.; Magill, P.; Nelson, L.E.;
2012 / IEEE
By: Pi Ling Huang; Taga, H.; Yu-Kuan Lu; Jui-Pin Wu; Wei-Lun Wang; De-Ming Kong; Kuang-Yao Huang; Jau-Sheng Wang; Pochi Yeh; Wood-Hi Cheng; Yi-Chung Huang; Yi-Jen Chiu; Sheng-Lung Huang; Szu-Ming Yeh;
By: Pi Ling Huang; Taga, H.; Yu-Kuan Lu; Jui-Pin Wu; Wei-Lun Wang; De-Ming Kong; Kuang-Yao Huang; Jau-Sheng Wang; Pochi Yeh; Wood-Hi Cheng; Yi-Chung Huang; Yi-Jen Chiu; Sheng-Lung Huang; Szu-Ming Yeh;
2012 / IEEE
By: Lopez, E.; Le, Q.T.; Saliou, F.; Polo, V.; Bonada, F.; Klonidis, D.; Lazaro, J.A.; Schrenk, B.; Prat, J.; Kazmierski, C.; Brenot, R.; de Valicourt, G.; Spirou, S.; Soila, R.; Leino, D.; Beleffi, G.M.T.; Tomkos, I.; Chatzi, S.; Teixeira, A.; Costa, L.; Chanclou, P.;
By: Lopez, E.; Le, Q.T.; Saliou, F.; Polo, V.; Bonada, F.; Klonidis, D.; Lazaro, J.A.; Schrenk, B.; Prat, J.; Kazmierski, C.; Brenot, R.; de Valicourt, G.; Spirou, S.; Soila, R.; Leino, D.; Beleffi, G.M.T.; Tomkos, I.; Chatzi, S.; Teixeira, A.; Costa, L.; Chanclou, P.;
2012 / IEEE
By: Olivier, N.; Bakir, B.B.; Harduin, J.; Letartre, X.; Seassal, C.; Sciancalepore, C.; Viktorovitch, P.; Fedeli, J.;
By: Olivier, N.; Bakir, B.B.; Harduin, J.; Letartre, X.; Seassal, C.; Sciancalepore, C.; Viktorovitch, P.; Fedeli, J.;
2012 / IEEE
By: Dong-Yo Jheng; Kuang-Yu Hsu; Sheng-Lung Huang; Chien-Chih Lai; Tuan-Shu Ho; Yi-Han Liao;
By: Dong-Yo Jheng; Kuang-Yu Hsu; Sheng-Lung Huang; Chien-Chih Lai; Tuan-Shu Ho; Yi-Han Liao;
2012 / IEEE
By: Quarterman, A.H.; Kbashi, H.J.; Wilcox, K.G.; Tropper, A.C.; Henini, M.; Apostolopoulos, V.; Morris, O.J.;
By: Quarterman, A.H.; Kbashi, H.J.; Wilcox, K.G.; Tropper, A.C.; Henini, M.; Apostolopoulos, V.; Morris, O.J.;
2012 / IEEE
By: Maillotte, H.; Hauden, J.; Stiller, B.; Min Won Lee; Sylvestre, T.; Thevenaz, L.; Roch, C.;
By: Maillotte, H.; Hauden, J.; Stiller, B.; Min Won Lee; Sylvestre, T.; Thevenaz, L.; Roch, C.;
2012 / IEEE
By: Bergman, K.; Kuzucu, O.; Okawachi, Y.; Gaeta, A.L.; Lipson, M.; Foster, M.A.; Ophir, N.; Biberman, A.; Turner-Foster, A.C.; Salem, R.;
By: Bergman, K.; Kuzucu, O.; Okawachi, Y.; Gaeta, A.L.; Lipson, M.; Foster, M.A.; Ophir, N.; Biberman, A.; Turner-Foster, A.C.; Salem, R.;
2012 / IEEE
By: Koch, S.W.; Moloney, J.V.; Yarborough, M.J.; Hader, J.; Kunert, B.; Tsuei-Lian Wang; Laurain, A.; Stolz, W.;
By: Koch, S.W.; Moloney, J.V.; Yarborough, M.J.; Hader, J.; Kunert, B.; Tsuei-Lian Wang; Laurain, A.; Stolz, W.;
2012 / IEEE
By: Shihuan Zou; Shilie Zheng; Xianmin Zhang; Hao Chi; Haoshuo Chen; Bo Yang; Koonen, T.; Xiaofeng Jin; Tangdiongga, E.;
By: Shihuan Zou; Shilie Zheng; Xianmin Zhang; Hao Chi; Haoshuo Chen; Bo Yang; Koonen, T.; Xiaofeng Jin; Tangdiongga, E.;