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Topic: Optical Packet Switching
Results
2012 / IEEE
By: Xu, Q.; Rastegarfar, H.; Rusch, L.A.; Leon-Garcia, A.; LaRochelle, S.; Ben M'Sallem, Y.;
By: Xu, Q.; Rastegarfar, H.; Rusch, L.A.; Leon-Garcia, A.; LaRochelle, S.; Ben M'Sallem, Y.;
2012 / IEEE
By: Zhang, F.; Wilkinson, T.D.; Elmirghani, J.M.H.; Crossland, W.A.; Pranggono, B.; Chou, H.-H.;
By: Zhang, F.; Wilkinson, T.D.; Elmirghani, J.M.H.; Crossland, W.A.; Pranggono, B.; Chou, H.-H.;
Definition and performance evaluation of a low-cost/high-capacity scalable integrated OTN/WDM switch
2012 / IEEEBy: Eramo, V.; Testa, F.; Sabella, R.; Listanti, M.;
2012 / IEEE
By: Lazarou, I.; Stamatiadis, C.; Vyrsokinos, K.; Stampoulidis, L.; Gomez-Agis, F.; Dorren, H.J.S.; Avramopoulos, H.; De Heyn, P.; Van Thourhout, D.; Voigt, K.; Zimmermann, L.;
By: Lazarou, I.; Stamatiadis, C.; Vyrsokinos, K.; Stampoulidis, L.; Gomez-Agis, F.; Dorren, H.J.S.; Avramopoulos, H.; De Heyn, P.; Van Thourhout, D.; Voigt, K.; Zimmermann, L.;
2012 / IEEE
By: Brahmi, H.; Erasme, D.; Avramopoulos, H.; Kouloumentas, C.; Stamatiadis, C.; Kalavrouziotis, D.; Katopodis, V.; Menif, M.; Giannoulis, G.;
By: Brahmi, H.; Erasme, D.; Avramopoulos, H.; Kouloumentas, C.; Stamatiadis, C.; Kalavrouziotis, D.; Katopodis, V.; Menif, M.; Giannoulis, G.;
2012 / IEEE
By: Akella, V.; Nitta, C.; Xiaohui Ye; Runxiang Yu; Yawei Yin; Proietti, R.; Yoo, S.J.B.;
By: Akella, V.; Nitta, C.; Xiaohui Ye; Runxiang Yu; Yawei Yin; Proietti, R.; Yoo, S.J.B.;
2012 / IEEE
By: Jun Luo; Lucente, S.D.; Rohit, A.; Shihuan Zou; Williams, K.A.; Dorren, H.J.S.; Calabretta, N.;
By: Jun Luo; Lucente, S.D.; Rohit, A.; Shihuan Zou; Williams, K.A.; Dorren, H.J.S.; Calabretta, N.;
2011 / IEEE / 978-1-4244-5731-1
By: Segawa, T.; Urata, R.; Nakahara, T.; Takahashi, R.; Suzaki, Y.; Takenouchi, H.;
By: Segawa, T.; Urata, R.; Nakahara, T.; Takahashi, R.; Suzaki, Y.; Takenouchi, H.;
2011 / IEEE / 978-1-4244-8456-0
By: Qing Xu; Rusch, L.A.; Leon-Garcia, A.; LaRochelle, S.; Ben M'Sallem, Y.; Rastegarfar, H.;
By: Qing Xu; Rusch, L.A.; Leon-Garcia, A.; LaRochelle, S.; Ben M'Sallem, Y.; Rastegarfar, H.;
2011 / IEEE / 978-1-61284-486-2
By: Yi Zhou; Ting Lai; Wen Cheng; Zhen Cao; Zhiyong Tao; Zhujuan Wang; Dexiu Huang; Nan Chi; Wei Li; Bo Huang; Fei Ye; Fanjian Hu; Zhou He; Jin Zeng;
By: Yi Zhou; Ting Lai; Wen Cheng; Zhen Cao; Zhiyong Tao; Zhujuan Wang; Dexiu Huang; Nan Chi; Wei Li; Bo Huang; Fei Ye; Fanjian Hu; Zhou He; Jin Zeng;
2011 / IEEE / 978-1-55752-932-9
By: Stabile, R.; Calabretta, N.; Dorren, H.J.S.; Williams, K.A.; Albores-Mejia, A.;
By: Stabile, R.; Calabretta, N.; Dorren, H.J.S.; Williams, K.A.; Albores-Mejia, A.;
2011 / IEEE / 978-1-55752-932-9
By: van Thourhout, D.; Roelkens, G.; Tassaert, M.; Raz, O.; Dorren, H.J.S.;
By: van Thourhout, D.; Roelkens, G.; Tassaert, M.; Raz, O.; Dorren, H.J.S.;
2011 / IEEE / 978-1-55752-932-9
By: Calabretta, N.; Nazarathy, Y.; Di Lucente, S.; Dorren, H.J.S.; Raz, O.;
By: Calabretta, N.; Nazarathy, Y.; Di Lucente, S.; Dorren, H.J.S.; Raz, O.;
2011 / IEEE / 978-1-55752-932-9
By: Iovanna, P.; Casanova, M.R.; Germoni, A.; Testa, P.; Testa, F.; Sabella, R.;
By: Iovanna, P.; Casanova, M.R.; Germoni, A.; Testa, P.; Testa, F.; Sabella, R.;
2011 / IEEE / 978-1-55752-932-9
By: Yoo, S.J.B.; Akella, V.; Xiaohui Ye; Yawei Yin; Shuang Yin; Runxiang Yu; Proietti, R.;
By: Yoo, S.J.B.; Akella, V.; Xiaohui Ye; Yawei Yin; Shuang Yin; Runxiang Yu; Proietti, R.;
2011 / IEEE / 978-1-55752-932-9
By: Jeppesen, P.; Dorren, H.J.S.; Oxenlowe, L.K.; Calabretta, N.; Hu, H.; Galili, M.; Mulvad, H.C.H.; Luo, J.; Gomez-Agis, F.;
By: Jeppesen, P.; Dorren, H.J.S.; Oxenlowe, L.K.; Calabretta, N.; Hu, H.; Galili, M.; Mulvad, H.C.H.; Luo, J.; Gomez-Agis, F.;
2011 / IEEE / 978-1-55752-932-9
By: Cervello-Pastor, C.; Qin, Y.; Amaya, N.; Triay, J.; Zervas, G.S.; Simeonidou, D.;
By: Cervello-Pastor, C.; Qin, Y.; Amaya, N.; Triay, J.; Zervas, G.S.; Simeonidou, D.;
2011 / IEEE / 978-1-55752-932-9
By: Antona, J.-C.; Lorcy, L.; Simonneau, C.; Pointurier, Y.; Rival, O.; Vacondio, F.; Bigo, S.;
By: Antona, J.-C.; Lorcy, L.; Simonneau, C.; Pointurier, Y.; Rival, O.; Vacondio, F.; Bigo, S.;
2011 / IEEE / 978-1-55752-932-9
By: Dalgaard, K.; Galili, M.; Hu, H.; Mulvad, H.C.H.; Areal, J.L.; Palushani, E.; Oxenlowe, L.K.; Jeppesen, P.; Berger, M.S.; Clausen, A.T.;
By: Dalgaard, K.; Galili, M.; Hu, H.; Mulvad, H.C.H.; Areal, J.L.; Palushani, E.; Oxenlowe, L.K.; Jeppesen, P.; Berger, M.S.; Clausen, A.T.;
2011 / IEEE / 978-1-55752-932-9
By: Urata, R.; Suzaki, Y.; Nakahara, T.; Takahashi, R.; Ishikawa, H.; Segawa, T.;
By: Urata, R.; Suzaki, Y.; Nakahara, T.; Takahashi, R.; Ishikawa, H.; Segawa, T.;
2011 / IEEE / 978-1-55752-932-9
By: Miyazawa, T.; Harai, H.; Furukawa, H.; Wada, N.; Kawasaki, W.; Shinada, S.;
By: Miyazawa, T.; Harai, H.; Furukawa, H.; Wada, N.; Kawasaki, W.; Shinada, S.;
2011 / IEEE / 978-1-4577-1670-6
By: He-Jyun Lin; Yu-Huang Chu; Wen-Shiang Tang; Sheng-Chang Chen; Chung-Ju Chang;
By: He-Jyun Lin; Yu-Huang Chu; Wen-Shiang Tang; Sheng-Chang Chen; Chung-Ju Chang;
2011 / IEEE / 978-1-4577-2019-2
By: Castoldi, P.; Morvan, M.; Gravey, P.; Cerutti, I.; Gravey, A.; Uscumlic, B.;
By: Castoldi, P.; Morvan, M.; Gravey, P.; Cerutti, I.; Gravey, A.; Uscumlic, B.;
2011 / IEEE / 978-1-4244-8939-8
By: Ciaramella, E.; Contestabile, G.; Corsini, R.; Porzi, C.; Calabretta, N.; Presi, M.;
By: Ciaramella, E.; Contestabile, G.; Corsini, R.; Porzi, C.; Calabretta, N.; Presi, M.;
2011 / IEEE / 978-1-4244-8939-8
By: Contestabile, G.; Serafino, G.; Berrettini, G.; Scotti, F.; Bogoni, A.;
By: Contestabile, G.; Serafino, G.; Berrettini, G.; Scotti, F.; Bogoni, A.;
2011 / IEEE / 978-1-4244-9268-8
By: Lopez-Bravo, C.; Fernandez-Hermida, D.; Gonzalez-Castano, F.J.; Rodelgo-Lacruz, M.;
By: Lopez-Bravo, C.; Fernandez-Hermida, D.; Gonzalez-Castano, F.J.; Rodelgo-Lacruz, M.;