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Topic: Optical Films
Results
2011 / IEEE
By: Davila-Rodriguez, J.; Hernandez-Romano, I.; Delfyett, P.J.; May-Arrioja, D.A.; Sanchez-Mondragon, J.J.; Mandridis, D.;
By: Davila-Rodriguez, J.; Hernandez-Romano, I.; Delfyett, P.J.; May-Arrioja, D.A.; Sanchez-Mondragon, J.J.; Mandridis, D.;
2011 / IEEE
By: Eun Jong Cha; Taeyong Kim; Sungil Kim; Muhan Choi; Min Hwan Kwak; Seung Beom Kang; Kwang Yong Kang;
By: Eun Jong Cha; Taeyong Kim; Sungil Kim; Muhan Choi; Min Hwan Kwak; Seung Beom Kang; Kwang Yong Kang;
2011 / IEEE
By: Nguyen Duc Tho; Schwob, C.; Avoine, A.; Hoang Nam Nhat; Pham Thu Nga; Phan Tien Dung;
By: Nguyen Duc Tho; Schwob, C.; Avoine, A.; Hoang Nam Nhat; Pham Thu Nga; Phan Tien Dung;
2011 / IEEE
By: Jenkins, M.; Keeley, J.; Shuo Liu; Holmes, M.R.; Hawkins, A.R.; Schmidt, H.; Leake, K.;
By: Jenkins, M.; Keeley, J.; Shuo Liu; Holmes, M.R.; Hawkins, A.R.; Schmidt, H.; Leake, K.;
2011 / IEEE
By: Carta, P.; Angeloni, G.; Girardin, E.; Calbucci, V.; Giuliani, A.; Di Gregorio, G.M.; Manescu, A.; Albertini, G.;
By: Carta, P.; Angeloni, G.; Girardin, E.; Calbucci, V.; Giuliani, A.; Di Gregorio, G.M.; Manescu, A.; Albertini, G.;
2012 / IEEE
By: Jaehyun Moon; Jin Woo Huh; Hye Yong Chu; Jeong-Ik Lee; Doo-Hee Cho; Joo Won Lee; Joohyun Hwang; Jun-Han Han; Jin-Wook Shin; Chul Woong Joo;
By: Jaehyun Moon; Jin Woo Huh; Hye Yong Chu; Jeong-Ik Lee; Doo-Hee Cho; Joo Won Lee; Joohyun Hwang; Jun-Han Han; Jin-Wook Shin; Chul Woong Joo;
2012 / IEEE
By: Myung Yung Jeong; Gye Won Kim; Eun Joo Jung; Jong Bea An; Byung Sup Rho; Myoung Jin Kim; Sung Hwan Hwang; Woo-Jin Lee;
By: Myung Yung Jeong; Gye Won Kim; Eun Joo Jung; Jong Bea An; Byung Sup Rho; Myoung Jin Kim; Sung Hwan Hwang; Woo-Jin Lee;
2012 / IEEE
By: Jin-Ming Cui; Xiang-Dong Chen; Liu Lv; Xi-Feng Ren; Yun-Feng Xiao; Zheng-Fu Han; Fang-Wen Sun; Chang-Ling Zou; Chun-Hua Dong; Guang-Can Guo;
By: Jin-Ming Cui; Xiang-Dong Chen; Liu Lv; Xi-Feng Ren; Yun-Feng Xiao; Zheng-Fu Han; Fang-Wen Sun; Chang-Ling Zou; Chun-Hua Dong; Guang-Can Guo;
2012 / IEEE
By: Korakakis, D.; Timperman, A.; Lim, M.S.; Dawson, J.M.; Hornak, L.A.; Duperre, J.A.; Nightingale, J.R.; Goswami, R.;
By: Korakakis, D.; Timperman, A.; Lim, M.S.; Dawson, J.M.; Hornak, L.A.; Duperre, J.A.; Nightingale, J.R.; Goswami, R.;
Optimization of the Optical Whiteness Ratio for Flexible Display by Using Taguchi's Dynamic Approach
2012 / IEEEBy: Chao-Ton Su; Chia-Ming Lin; Chun-Chin Hsu;
2012 / IEEE
By: Po-Ta Shih; Shuo-Fu Hong; Shr-Hau Huang; Bi-Zen Hsieh; Rui-Xuan Dong; Chao-Yung Yeh; Pi Ling Huang; Wood-Hi Cheng; Hsin-Hui Kuo; Jiang-Jen Lin; Gong-Ru Lin;
By: Po-Ta Shih; Shuo-Fu Hong; Shr-Hau Huang; Bi-Zen Hsieh; Rui-Xuan Dong; Chao-Yung Yeh; Pi Ling Huang; Wood-Hi Cheng; Hsin-Hui Kuo; Jiang-Jen Lin; Gong-Ru Lin;
2012 / IEEE
By: Myoung Jin Kim; Sung Hwan Hwang; Woo-Jin Lee; Byung Sup Rho; Eun Joo Jung; Myung Yung Jeong; Gye Won Kim; Jong Bea An;
By: Myoung Jin Kim; Sung Hwan Hwang; Woo-Jin Lee; Byung Sup Rho; Eun Joo Jung; Myung Yung Jeong; Gye Won Kim; Jong Bea An;
2012 / IEEE
By: Mangeney, J.; Monteagudo-Lerma, L.; Valdueza-Felip, S.; Naranjo, F.B.; Julien, F.H.; Gonzalez-Herraez, M.;
By: Mangeney, J.; Monteagudo-Lerma, L.; Valdueza-Felip, S.; Naranjo, F.B.; Julien, F.H.; Gonzalez-Herraez, M.;
2012 / IEEE
By: Karvonen, L.; Honkanen, S.; Guo-Qiang Lo; Hiltunen, M.; Ya Chen; Hiltunen, J.; Tsung-Yang Liow; Xiaoguang Tu; Saynatjoki, A.;
By: Karvonen, L.; Honkanen, S.; Guo-Qiang Lo; Hiltunen, M.; Ya Chen; Hiltunen, J.; Tsung-Yang Liow; Xiaoguang Tu; Saynatjoki, A.;
2012 / IEEE
By: Shu Fan Zhou; Kwai Man Luk; Po Sheun Chung; Yuk Tak Chow; Reekie, L.; Hau Ping Chan;
By: Shu Fan Zhou; Kwai Man Luk; Po Sheun Chung; Yuk Tak Chow; Reekie, L.; Hau Ping Chan;
2012 / IEEE
By: Hui-Chuan Cheng; Ching-Huan Lin; Shin-Tson Wu; Kang-Hung Liu; Ishinabe, T.; Jin Yan;
By: Hui-Chuan Cheng; Ching-Huan Lin; Shin-Tson Wu; Kang-Hung Liu; Ishinabe, T.; Jin Yan;
1974 / IEEE
By: Yamauchi, Y.; Mito, S.; Inoguchi, T.; Nakata, Y.; Kishishita, H.; Kawaguchi, J.; Yoshida, M.; Kakihara, Y.; Takeda, M.;
By: Yamauchi, Y.; Mito, S.; Inoguchi, T.; Nakata, Y.; Kishishita, H.; Kawaguchi, J.; Yoshida, M.; Kakihara, Y.; Takeda, M.;
2000 / IEEE
By: Gorokhov, V.V.; Yermolovich, V.F.; Volkov, A.A.; Selyavsky, V.T.; Selemir, V.D.; Savchenko, R.V.; Repin, P.B.; Orlov, A.P.; Karelin, V.I.; Ivanovsky, A.V.; Ivanov, M.M.; Grebenev, E.V.;
By: Gorokhov, V.V.; Yermolovich, V.F.; Volkov, A.A.; Selyavsky, V.T.; Selemir, V.D.; Savchenko, R.V.; Repin, P.B.; Orlov, A.P.; Karelin, V.I.; Ivanovsky, A.V.; Ivanov, M.M.; Grebenev, E.V.;
2002 / IEEE / 978-0-7354-0107-5
By: Palmer, James B.A.; Ampleford, David J.; Chittenden, Jeremy P.; Bland, Simon N.; Lebedev, Sergey V.;
By: Palmer, James B.A.; Ampleford, David J.; Chittenden, Jeremy P.; Bland, Simon N.; Lebedev, Sergey V.;
2010 / IEEE / 978-1-4244-8701-1
By: Valk, B.; Todt, R.; Muller, J.; Krejci, M.; Lichtenstein, N.; Gilbert, Y.; Brunner, R.; Baettig, R.;
By: Valk, B.; Todt, R.; Muller, J.; Krejci, M.; Lichtenstein, N.; Gilbert, Y.; Brunner, R.; Baettig, R.;
2010 / IEEE / 978-1-4244-5261-3
By: Wieczorek, L.; Nan Zeng; Glenn, A.M.; Baxter, G.R.; Myers, J.; Raguse, B.; Murphy, A.B.;
By: Wieczorek, L.; Nan Zeng; Glenn, A.M.; Baxter, G.R.; Myers, J.; Raguse, B.; Murphy, A.B.;
2011 / IEEE / 978-1-4244-8115-6
By: Bin Wang; Mao Ye; Sato, S.; Takahashi, S.; Yanase, S.; Uchida, M.;
By: Bin Wang; Mao Ye; Sato, S.; Takahashi, S.; Yanase, S.; Uchida, M.;
2011 / IEEE / 978-1-4577-1301-9
By: Azadian, H.; Rahimi, A.; Taghizadeh, M.; Zamani, M.; Mahmoodi, D.;
By: Azadian, H.; Rahimi, A.; Taghizadeh, M.; Zamani, M.; Mahmoodi, D.;
2011 / IEEE / 978-1-4244-9563-4
By: Qingzhen Hao; Werner, D.H.; Xiande Wang; Yong Zeng; Huang, T.J.;
By: Qingzhen Hao; Werner, D.H.; Xiande Wang; Yong Zeng; Huang, T.J.;
2011 / IEEE / 978-1-4577-0378-2
By: Ho Chang; Chin-Guo Kuo; Cheng-Fu Yang; Ya-Chieh Tung; Wen-Ray Chen;
By: Ho Chang; Chin-Guo Kuo; Cheng-Fu Yang; Ya-Chieh Tung; Wen-Ray Chen;
2011 / IEEE / 978-1-61284-795-5
By: Khasanov, T.; Atuchin, V.V.; Senchenko, E.S.; Pokrovsky, L.D.; Kochubey, V.A.;
By: Khasanov, T.; Atuchin, V.V.; Senchenko, E.S.; Pokrovsky, L.D.; Kochubey, V.A.;
2011 / IEEE / 978-1-4577-0378-2
By: Young, S.L.; Shih, Y.T.; Horng, L.; Kung, C.Y.; Chen, H.Z.; Ou, C.R.; Lin, C.C.; Lin, C.H.; Kao, M.C.;
By: Young, S.L.; Shih, Y.T.; Horng, L.; Kung, C.Y.; Chen, H.Z.; Ou, C.R.; Lin, C.C.; Lin, C.H.; Kao, M.C.;
2011 / IEEE / 978-1-4577-0378-2
By: Sangiorgi, E.; Vyurkov, V.; Zanuccoli, M.; Semenikhin, I.; Fiegna, C.;
By: Sangiorgi, E.; Vyurkov, V.; Zanuccoli, M.; Semenikhin, I.; Fiegna, C.;
2011 / IEEE / 978-1-4577-0378-2
By: Wei-Chun Chen; Fang-I Lai; Shou-Yi Kuo; Kang-Yuan Lee; Hung-Wen Huang; Woei-Tyng Lin;
By: Wei-Chun Chen; Fang-I Lai; Shou-Yi Kuo; Kang-Yuan Lee; Hung-Wen Huang; Woei-Tyng Lin;
2011 / IEEE / 978-1-61284-795-5
By: Gavrilova, T.A.; Atuchin, V.V.; Troitskaia, I.B.; Sheglov, D.V.;
By: Gavrilova, T.A.; Atuchin, V.V.; Troitskaia, I.B.; Sheglov, D.V.;
2011 / IEEE / 978-1-4577-0860-2
By: Yu Li-Yuan; Niu Pin-Juan; Xing Hai-Ying; Yao Guang-Rui; Sun Shao-Jiao; Zhang Jian-Xin;
By: Yu Li-Yuan; Niu Pin-Juan; Xing Hai-Ying; Yao Guang-Rui; Sun Shao-Jiao; Zhang Jian-Xin;
2011 / IEEE / 978-1-61284-088-8
By: Yangan Yan; Jing Wang; Huawa Yu; Yali Du; Hanchen Liu; Bin Gao; Xin Wang;
By: Yangan Yan; Jing Wang; Huawa Yu; Yali Du; Hanchen Liu; Bin Gao; Xin Wang;
2011 / IEEE / 978-986-02-8974-9
By: Hung Ji Huang; Handel, B.; Yu-Hsuan Lin; Din Ping Tsai; Heh-Nan Lin; Yung-Fu Chen; Hsiang-An Chen;
By: Hung Ji Huang; Handel, B.; Yu-Hsuan Lin; Din Ping Tsai; Heh-Nan Lin; Yung-Fu Chen; Hsiang-An Chen;
2011 / IEEE / 978-1-4244-9793-5
By: Li, L.W.; Wang, Y.; Gui, T.L.; Tian, X.H.; Hao, L.; Wu, Q.; Yang, G.H.; Wu, Y.M.;
By: Li, L.W.; Wang, Y.; Gui, T.L.; Tian, X.H.; Hao, L.; Wu, Q.; Yang, G.H.; Wu, Y.M.;
2011 / IEEE / 978-1-61284-878-5
By: Geum-Yoon Oh; Tae-Kyeong Lee; Hong-Seung Kim; Young-Wan Choi; Doo-Gun Kim;
By: Geum-Yoon Oh; Tae-Kyeong Lee; Hong-Seung Kim; Young-Wan Choi; Doo-Gun Kim;
Impact of the silicon layer thickness to the optical property of sandwich photonic crystal structure
2011 / IEEE / 978-1-61284-777-1By: Xuyuan Chen; Haisheng San; Changzheng Li; Fangqiang Li;
2011 / IEEE / 978-0-9555293-7-5
By: Cui Lujun; Zhao Zexiang; Chen Youping; Zhang Gang; Shang Huichao;
By: Cui Lujun; Zhao Zexiang; Chen Youping; Zhang Gang; Shang Huichao;
2011 / IEEE / 978-1-61284-777-1
By: Hong-Wei Chen; Wen-Hui Li; Fei-Bin Hsiao; Yung-Chun Lee; Ya-Wen Hu;
By: Hong-Wei Chen; Wen-Hui Li; Fei-Bin Hsiao; Yung-Chun Lee; Ya-Wen Hu;
2011 / IEEE / 978-1-61284-878-5
By: Benzi, M.; Zanuccoli, M.; Semenikhin, I.; Fiegna, C.; Sangiorgi, E.; Vyurkov, V.;
By: Benzi, M.; Zanuccoli, M.; Semenikhin, I.; Fiegna, C.; Sangiorgi, E.; Vyurkov, V.;
2011 / IEEE / 978-1-61284-777-1
By: Hsin-Chun Huang; Tsung-Hsun Yang; Ting-Jou Ding; Jiann-Hwa Lue; Che-Lung Hsu; Jenq-Yang Chang; Wen-Yih Chen; Jen-Tsai Liu;
By: Hsin-Chun Huang; Tsung-Hsun Yang; Ting-Jou Ding; Jiann-Hwa Lue; Che-Lung Hsu; Jenq-Yang Chang; Wen-Yih Chen; Jen-Tsai Liu;
2011 / IEEE / 978-1-4577-0336-2
By: Witvrouw, A.; Van Thourhout, D.; Rudra, S.; Van Hoof, R.; De Coster, J.;
By: Witvrouw, A.; Van Thourhout, D.; Rudra, S.; Van Hoof, R.; De Coster, J.;