Your Search Results
Use materials about this topic in your textbook!
AcademicPub holds over eight million pieces of educational content - such as case studies and journal articles - for you to mix-and-match your way.
Experience the freedom of customizing your course pack with AcademicPub!

Topic: Optical Fibres
Results
2011 / IEEE
By: Modotto, D.; Couderc, V.; Tonello, A.; Town, G.; De Angelis, C.; Wabnitz, S.; Minoni, U.; Manili, G.;
By: Modotto, D.; Couderc, V.; Tonello, A.; Town, G.; De Angelis, C.; Wabnitz, S.; Minoni, U.; Manili, G.;
2011 / IEEE
By: Geernaert, T.; Baghdasaryan, T.; Thienpont, H.; Berghmans, F.; Mergo, P.; Makara, M.; Bartelt, H.; Schuster, K.; Becker, M.;
By: Geernaert, T.; Baghdasaryan, T.; Thienpont, H.; Berghmans, F.; Mergo, P.; Makara, M.; Bartelt, H.; Schuster, K.; Becker, M.;
2012 / IEEE
By: Ju Han Lee; Eun Joo Jung; Chang-Seok Kim; Myung Yung Jeong; Jae-Jin Song; Woo-Jin Lee; Sung Hwan Hwang; Myoung Jin Kim; Byung Sup Rho;
By: Ju Han Lee; Eun Joo Jung; Chang-Seok Kim; Myung Yung Jeong; Jae-Jin Song; Woo-Jin Lee; Sung Hwan Hwang; Myoung Jin Kim; Byung Sup Rho;
2011 / IEEE
By: de la Rosa, J.M.; Fabila, D.A.; Soto, J.L.; Mercado, R.; Arellano, A.; Moreno, E.; Alvarez, M.; Lopez, T.; Mercado, S.M.; Dominguez, J.; Stolik, S.;
By: de la Rosa, J.M.; Fabila, D.A.; Soto, J.L.; Mercado, R.; Arellano, A.; Moreno, E.; Alvarez, M.; Lopez, T.; Mercado, S.M.; Dominguez, J.; Stolik, S.;
2012 / IEEE
By: Di Matteo, F.M.; Caponero, M.A.; Schena, E.; Saccomandi, P.; Silvestri, S.; Pandolfi, M.; Martino, M.;
By: Di Matteo, F.M.; Caponero, M.A.; Schena, E.; Saccomandi, P.; Silvestri, S.; Pandolfi, M.; Martino, M.;
2012 / IEEE
By: Fok, M.P.; Yue Tian; Kravtsov, K.S.; Rafidi, N.S.; Prucnal, P.R.; Tait, A.N.; Nahmias, M.A.;
By: Fok, M.P.; Yue Tian; Kravtsov, K.S.; Rafidi, N.S.; Prucnal, P.R.; Tait, A.N.; Nahmias, M.A.;
2012 / IEEE
By: Hansch, T.W.; Ekstrom, C.; Prokofiev, A.; Habs, D.; Assmann, W.; Thirolf, P.; Holzwarth, R.; Greiter, M.; Turler, A.; Stower, W.; Predehl, K.; Lezius, M.; Hoeschen, C.;
By: Hansch, T.W.; Ekstrom, C.; Prokofiev, A.; Habs, D.; Assmann, W.; Thirolf, P.; Holzwarth, R.; Greiter, M.; Turler, A.; Stower, W.; Predehl, K.; Lezius, M.; Hoeschen, C.;
2012 / IEEE
By: Jin-Ming Cui; Xiang-Dong Chen; Liu Lv; Xi-Feng Ren; Yun-Feng Xiao; Zheng-Fu Han; Fang-Wen Sun; Chang-Ling Zou; Chun-Hua Dong; Guang-Can Guo;
By: Jin-Ming Cui; Xiang-Dong Chen; Liu Lv; Xi-Feng Ren; Yun-Feng Xiao; Zheng-Fu Han; Fang-Wen Sun; Chang-Ling Zou; Chun-Hua Dong; Guang-Can Guo;
2012 / IEEE
By: Li Xian Wang; Xiao Qiong Qi; Yu Liu; Liang Xie; Jian Guo Liu; Xu Ming Wu; Jiang Wei Man; Ning Hua Zhu;
By: Li Xian Wang; Xiao Qiong Qi; Yu Liu; Liang Xie; Jian Guo Liu; Xu Ming Wu; Jiang Wei Man; Ning Hua Zhu;
2012 / IEEE
By: Ming Ding; Pengfei Wang; Lee, T.; Murugan, G.S.; Brambilla, G.; Farrell, G.; Koizumi, F.; Qiang Wu; Semenova, Y.;
By: Ming Ding; Pengfei Wang; Lee, T.; Murugan, G.S.; Brambilla, G.; Farrell, G.; Koizumi, F.; Qiang Wu; Semenova, Y.;
2012 / IEEE
By: Tur, M.; Dolinar, S.; Erkmen, B.I.; Birnbaum, K.M.; Hao Huang; Yongxiong Ren; Willner, A.E.; Lin Zhang; Jeng-Yuan Yang; Ahmed, N.; Yan Yan; Yang Yue;
By: Tur, M.; Dolinar, S.; Erkmen, B.I.; Birnbaum, K.M.; Hao Huang; Yongxiong Ren; Willner, A.E.; Lin Zhang; Jeng-Yuan Yang; Ahmed, N.; Yan Yan; Yang Yue;
2012 / IEEE
By: Kasahara, M.; Matsuo, S.; Ning Guan; Sasaki, Y.; Takenaga, K.; Koshiba, M.; Saitoh, K.;
By: Kasahara, M.; Matsuo, S.; Ning Guan; Sasaki, Y.; Takenaga, K.; Koshiba, M.; Saitoh, K.;
2012 / IEEE
By: Amezcua-Correa, R.; Cen Xia; Guifang Li; Xiang Zhou; Mateo, E.; Antonio-Lopez, E.; Neng Bai; Li�s, J.; Richardson, M.; Schulzgen, A.; Arrioja, D.M.; Montero, C.;
By: Amezcua-Correa, R.; Cen Xia; Guifang Li; Xiang Zhou; Mateo, E.; Antonio-Lopez, E.; Neng Bai; Li�s, J.; Richardson, M.; Schulzgen, A.; Arrioja, D.M.; Montero, C.;
2012 / IEEE
By: Shu Fan Zhou; Kwai Man Luk; Po Sheun Chung; Yuk Tak Chow; Reekie, L.; Hau Ping Chan;
By: Shu Fan Zhou; Kwai Man Luk; Po Sheun Chung; Yuk Tak Chow; Reekie, L.; Hau Ping Chan;
2011 / IEEE / 978-1-4577-1226-5
By: Soker, S.; Ge Wang; Furth, M.; Rylander, C.; Rylander, M.N.; Yong Xu; Goldstein, A.S.; Whited, B.M.; Hofmann, M.C.; Freeman, J.W.;
By: Soker, S.; Ge Wang; Furth, M.; Rylander, C.; Rylander, M.N.; Yong Xu; Goldstein, A.S.; Whited, B.M.; Hofmann, M.C.; Freeman, J.W.;
2011 / IEEE / 978-3-8007-3356-9
By: Seeger, A.; Kunkel, R.; Bach, H.-G.; Janiak, K.; Schubert, S.; Umbach, A.; Zhang, R.-Y.; Matiss, A.; Schell, M.;
By: Seeger, A.; Kunkel, R.; Bach, H.-G.; Janiak, K.; Schubert, S.; Umbach, A.; Zhang, R.-Y.; Matiss, A.; Schell, M.;
2011 / IEEE / 978-1-61284-329-2
By: Delchie, J.-M.; Lample, R.; Ritter, S.; d'Almeida, T.; Lassalle, F.; Zucchini, F.;
By: Delchie, J.-M.; Lample, R.; Ritter, S.; d'Almeida, T.; Lassalle, F.; Zucchini, F.;
2011 / IEEE / 978-986-02-8974-9
By: Andre, P.S.; Facao, M.; Pinto, A.N.; Domingues, F.; Fernandes, G.; Rocha, A.M.;
By: Andre, P.S.; Facao, M.; Pinto, A.N.; Domingues, F.; Fernandes, G.; Rocha, A.M.;
2011 / IEEE / 978-986-02-8974-9
By: Katsuyama, Y.; Yamada, M.; Kasahara, S.; Tokunaga, Y.; Koyama, O.;
By: Katsuyama, Y.; Yamada, M.; Kasahara, S.; Tokunaga, Y.; Koyama, O.;
In-line tunable Mach-Zehnder interferometer based on cascaded micro-ridge long period fiber gratings
2011 / IEEE / 978-986-02-8974-9By: Young-Geun Han; Sangoh Park; Oh-Jang Kwon;
2011 / IEEE / 978-986-02-8974-9
By: Bhujwalla, Z.; Kakkad, S.; Yongping Chen; Jiefeng Xi; Glunde, K.; Murari, K.; Xingde Li; Yuying Zhang; Ming-Jun Li;
By: Bhujwalla, Z.; Kakkad, S.; Yongping Chen; Jiefeng Xi; Glunde, K.; Murari, K.; Xingde Li; Yuying Zhang; Ming-Jun Li;