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Topic: Optical Fibre Testing
Results
2012 / IEEE
By: Marcandella, C.; Girard, S.; Raine, M.; Gaillardin, M.; Paillet, P.; Richard, N.; Ouerdane, Y.; Boukenter, A.; Alessi, A.;
By: Marcandella, C.; Girard, S.; Raine, M.; Gaillardin, M.; Paillet, P.; Richard, N.; Ouerdane, Y.; Boukenter, A.; Alessi, A.;
Evanescent-Wave Fiber-Optic Sensor: On Power Transfer From Core-Cladding Interface to Fiber End-Face
2012 / IEEEBy: Jianjun Ma; Chiniforooshan, Y.; Bock, W.J.;
2012 / IEEE
By: Ugartemendia, J.M.; Illarramendi, M.A.; Ayesta, I.; Sarasua, J.-R.; Arrue, J.; Bikandi, I.; Zubia, J.; Jimenez, F.;
By: Ugartemendia, J.M.; Illarramendi, M.A.; Ayesta, I.; Sarasua, J.-R.; Arrue, J.; Bikandi, I.; Zubia, J.; Jimenez, F.;
2012 / IEEE
By: Xiaodong Zhao; Labao Zhang; Xuping Zhang; Qingyuan Zhao; Junhui Hu; Peiheng Wu; Lin Kang;
By: Xiaodong Zhao; Labao Zhang; Xuping Zhang; Qingyuan Zhao; Junhui Hu; Peiheng Wu; Lin Kang;
2012 / IEEE
By: Qishun Shen; Xuehao Shen; Shouyu Luo; Jinmei Liu; Zhaochang Gu; Li Zhan; Junsong Peng;
By: Qishun Shen; Xuehao Shen; Shouyu Luo; Jinmei Liu; Zhaochang Gu; Li Zhan; Junsong Peng;
2011 / IEEE / 978-986-02-8974-9
By: Saitoh, K.; Matsuo, S.; Sasaki, Y.; Tanigawa, S.; Takenaga, K.; Arakawa, Y.; Koshiba, M.;
By: Saitoh, K.; Matsuo, S.; Sasaki, Y.; Tanigawa, S.; Takenaga, K.; Arakawa, Y.; Koshiba, M.;
2011 / IEEE / 978-1-61284-264-6
By: Yen, A.L.L.; Tey Kok Leng; Yeo Kwok Shien; Teyo Tuan Chin; Teh Peh Chiong; Shee Yu Gang; Tai Yu Ren;
By: Yen, A.L.L.; Tey Kok Leng; Yeo Kwok Shien; Teyo Tuan Chin; Teh Peh Chiong; Shee Yu Gang; Tai Yu Ren;
2011 / IEEE / 978-1-61284-264-6
By: Tamchek, N.; Safar, M.H.; Zulkifli, M.I.; Khairul Anuar, M.S.; Muhd-Yassin, S.Z.; Abdul-Rashid, H.A.;
By: Tamchek, N.; Safar, M.H.; Zulkifli, M.I.; Khairul Anuar, M.S.; Muhd-Yassin, S.Z.; Abdul-Rashid, H.A.;
2011 / IEEE / 978-1-4577-0167-2
By: Bianco, S.; Benussi, L.; Vendittozzi, C.; Felli, F.; Piccolo, D.; Saviano, G.; Lupi, C.; Caponero, M.A.;
By: Bianco, S.; Benussi, L.; Vendittozzi, C.; Felli, F.; Piccolo, D.; Saviano, G.; Lupi, C.; Caponero, M.A.;
2012 / IEEE / 978-1-55752-935-1
By: Hayes, J.R.; Numkam, E.; Slavik, R.; Baddela, N.; Gray, D.R.; Petrovich, M.N.; Wheeler, N.V.; Richardson, D.J.; Poletti, F.;
By: Hayes, J.R.; Numkam, E.; Slavik, R.; Baddela, N.; Gray, D.R.; Petrovich, M.N.; Wheeler, N.V.; Richardson, D.J.; Poletti, F.;
2011 / IEEE / 978-1-4577-0927-2
By: Shubin, A.V.; Fotiadi, A.A.; Pekukhova, I.; Megret, P.; Thienpont, H.; Tomashuk, A.L.; Panajotov, K.; Antipov, O.L.; Zolotovskiy, I.O.; Novikov, S.G.;
By: Shubin, A.V.; Fotiadi, A.A.; Pekukhova, I.; Megret, P.; Thienpont, H.; Tomashuk, A.L.; Panajotov, K.; Antipov, O.L.; Zolotovskiy, I.O.; Novikov, S.G.;
2012 / IEEE / 978-1-4577-0557-1
By: Nejad, R.J.; Stapor, W.J.; Rickey, P.A.; Konadu, K.; Wie, B.; McDonald, P.T.; Turflinger, T.; Critchfield, K.L.;
By: Nejad, R.J.; Stapor, W.J.; Rickey, P.A.; Konadu, K.; Wie, B.; McDonald, P.T.; Turflinger, T.; Critchfield, K.L.;
2011 / IEEE / 978-0-9775657-8-8
By: Schnatz, H.; Raupach, S.M.F.; Predehl, K.; Grosche, G.; Holzwarth, R.; Droste, S.; Terra, O.;
By: Schnatz, H.; Raupach, S.M.F.; Predehl, K.; Grosche, G.; Holzwarth, R.; Droste, S.; Terra, O.;
2012 / IEEE / 978-1-55752-935-1
By: Gruner-Nielsen, L.; Li, Z.; Jespersen, K.; Nicholson, J.W.; Poletti, F.; Palsdottir, B.;
By: Gruner-Nielsen, L.; Li, Z.; Jespersen, K.; Nicholson, J.W.; Poletti, F.; Palsdottir, B.;
2011 / IEEE / 978-0-9775657-8-8
By: Stace, T.M.; Benabid, F.; Light, P.S.; Perrella, C.; Luiten, A.N.;
By: Stace, T.M.; Benabid, F.; Light, P.S.; Perrella, C.; Luiten, A.N.;
1991 / IEEE / 0-7803-0208-7
By: Friebele, E.J.; Kalomiris, V.E.; Harrington, C.C.; Hickey, S.J.; Gingerich, M.E.;
By: Friebele, E.J.; Kalomiris, V.E.; Harrington, C.C.; Hickey, S.J.; Gingerich, M.E.;
1993 / IEEE
By: Zimmer, C.; Salathe, R.P.; Limberger, H.G.; Fonjallaz, P.Y.; Lambelet, P.; Gilgen, H.H.;
By: Zimmer, C.; Salathe, R.P.; Limberger, H.G.; Fonjallaz, P.Y.; Lambelet, P.; Gilgen, H.H.;
1993 / IEEE
By: McKenzie, D.R.; Zhen Hua Wang; Atkins, G.R.; Simmons, H.W.; Poole, S.B.; Sceats, M.G.;
By: McKenzie, D.R.; Zhen Hua Wang; Atkins, G.R.; Simmons, H.W.; Poole, S.B.; Sceats, M.G.;
1993 / IEEE
By: Becker, P.C.; Nykolak, G.; Bruce, A.J.; DiGiovanni, D.J.; Wong, Y.H.; Shmulovich, J.;
By: Becker, P.C.; Nykolak, G.; Bruce, A.J.; DiGiovanni, D.J.; Wong, Y.H.; Shmulovich, J.;
1993 / IEEE
By: Marshall, P.; LaBel, K.A.; Gates, M.M.; Miller, J.T.; Stassinopoulos, E.G.; Crabtree, C.M.; Dale, C.;
By: Marshall, P.; LaBel, K.A.; Gates, M.M.; Miller, J.T.; Stassinopoulos, E.G.; Crabtree, C.M.; Dale, C.;