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Topic: Optical Fiber Networks
Results
Anycast Routing for Survivable Optical Grids: Scalable Solution Methods and the Impact of Relocation
2011 / IEEEBy: Buysse, J.; Shaikh, A.; Develder, C.; Jaumard, B.;
2011 / IEEE
By: Sasaki, M.; Kitayama, K.-I.; Takada, A.; Nagasako, Y.; Harasawa, K.; Inoue, K.; Tomita, A.; Tsubokawa, M.; Araki, S.;
By: Sasaki, M.; Kitayama, K.-I.; Takada, A.; Nagasako, Y.; Harasawa, K.; Inoue, K.; Tomita, A.; Tsubokawa, M.; Araki, S.;
2011 / IEEE
By: Yawei Yin; Geisler, D.J.; Yoo, S.J.B.; Shuo Chang; Scott, R.P.; Fontaine, N.K.; Ke Wen;
By: Yawei Yin; Geisler, D.J.; Yoo, S.J.B.; Shuo Chang; Scott, R.P.; Fontaine, N.K.; Ke Wen;
2012 / IEEE
By: Manousakis, K.; Kokkinos, P.; Spadaro, S.; Careglio, D.; Perello, J.; Tomkos, I.; Azodolmolky, S.; Angelou, M.; Yabin Ye; Gagnaire, M.; Saradhi, C.V.; Colle, D.; Staessens, D.; Varvarigos, E.;
By: Manousakis, K.; Kokkinos, P.; Spadaro, S.; Careglio, D.; Perello, J.; Tomkos, I.; Azodolmolky, S.; Angelou, M.; Yabin Ye; Gagnaire, M.; Saradhi, C.V.; Colle, D.; Staessens, D.; Varvarigos, E.;
2012 / IEEE
By: Tovar, A.; Contreras, L.M.; De Dios, O.G.; Lopez, V.; Munoz, F.; Folgueira, J.; Fernandez-Palacios, J.P.; Azanon, A.;
By: Tovar, A.; Contreras, L.M.; De Dios, O.G.; Lopez, V.; Munoz, F.; Folgueira, J.; Fernandez-Palacios, J.P.; Azanon, A.;
Spectrum-efficient and agile CO-OFDM optical transport networks: architecture, design, and operation
2012 / IEEEBy: Zukerman, M.; Gangxiang Shen;
2012 / IEEE
By: Chaves, D.A.R.; Pereira, H.A.; de Santana, J.L.; Martins-Filho, J.F.; Bastos-Filho, C.J.A.;
By: Chaves, D.A.R.; Pereira, H.A.; de Santana, J.L.; Martins-Filho, J.F.; Bastos-Filho, C.J.A.;
2012 / IEEE
By: Le Rouzic, E.; Mannersalo, P.; Correia, L.M.; Cardoso, F.D.; Frantti, T.; Genay, N.; Nunzi, G.; Serrador, A.;
By: Le Rouzic, E.; Mannersalo, P.; Correia, L.M.; Cardoso, F.D.; Frantti, T.; Genay, N.; Nunzi, G.; Serrador, A.;
2012 / IEEE
By: Angelou, M.; Agraz, F.; Spadaro, S.; Perello, J.; Tomkos, I.; Azodolmolky, S.; Varvarigos, E.; Kokkinos, P.; Simeonidou, D.; Nejabati, R.; Qin, Y.;
By: Angelou, M.; Agraz, F.; Spadaro, S.; Perello, J.; Tomkos, I.; Azodolmolky, S.; Varvarigos, E.; Kokkinos, P.; Simeonidou, D.; Nejabati, R.; Qin, Y.;
2012 / IEEE
By: Careglio, D.; Fernandez-Palacios, J. P.; Ruiz, M.; Velasco, L.; Castro, A.; Pedrola, O.;
By: Careglio, D.; Fernandez-Palacios, J. P.; Ruiz, M.; Velasco, L.; Castro, A.; Pedrola, O.;
2012 / IEEE
By: Tsuritani, T.; Lei Liu; Hayashi, R.; Kubo, K.; Yoshida, S.; Shaowei Huang; Nishioka, I.;
By: Tsuritani, T.; Lei Liu; Hayashi, R.; Kubo, K.; Yoshida, S.; Shaowei Huang; Nishioka, I.;
2012 / IEEE
By: Gerardi, L.; Secondini, M.; Sambo, N.; Paolucci, F.; Poti, L.; Cugini, F.; Meloni, G.; Castoldi, P.;
By: Gerardi, L.; Secondini, M.; Sambo, N.; Paolucci, F.; Poti, L.; Cugini, F.; Meloni, G.; Castoldi, P.;
2012 / IEEE
By: Develder, C.; De Leenheer, M.; Dhoedt, B.; Pickavet, M.; Colle, D.; De Turck, F.; Demeester, P.;
By: Develder, C.; De Leenheer, M.; Dhoedt, B.; Pickavet, M.; Colle, D.; De Turck, F.; Demeester, P.;
2012 / IEEE
By: Watanabe, M.; Kobayashi, T.; Taru, T.; Hayashi, T.; Sakaguchi, J.; Kanno, A.; Wada, N.; Awaji, Y.; Kawanishi, T.;
By: Watanabe, M.; Kobayashi, T.; Taru, T.; Hayashi, T.; Sakaguchi, J.; Kanno, A.; Wada, N.; Awaji, Y.; Kawanishi, T.;
2012 / IEEE
By: Xiaobin Hong; Jian Wu; Tsuritani, T.; Yawei Yin; Jintong Lin; Hongxiang Guo; Lei Liu; Suzuki, M.;
By: Xiaobin Hong; Jian Wu; Tsuritani, T.; Yawei Yin; Jintong Lin; Hongxiang Guo; Lei Liu; Suzuki, M.;
2012 / IEEE
By: Pi Ling Huang; Taga, H.; Yu-Kuan Lu; Jui-Pin Wu; Wei-Lun Wang; De-Ming Kong; Kuang-Yao Huang; Jau-Sheng Wang; Pochi Yeh; Wood-Hi Cheng; Yi-Chung Huang; Yi-Jen Chiu; Sheng-Lung Huang; Szu-Ming Yeh;
By: Pi Ling Huang; Taga, H.; Yu-Kuan Lu; Jui-Pin Wu; Wei-Lun Wang; De-Ming Kong; Kuang-Yao Huang; Jau-Sheng Wang; Pochi Yeh; Wood-Hi Cheng; Yi-Chung Huang; Yi-Jen Chiu; Sheng-Lung Huang; Szu-Ming Yeh;
2012 / IEEE
By: Perez-Herrera, R.A.; Lopez-Amo, M.; Lopez-Higuera, J.M.; Loayssa, A.; Quintela, M.A.; Fernandez-Vallejo, M.; Leandro, D.; Ullan, A.;
By: Perez-Herrera, R.A.; Lopez-Amo, M.; Lopez-Higuera, J.M.; Loayssa, A.; Quintela, M.A.; Fernandez-Vallejo, M.; Leandro, D.; Ullan, A.;
2012 / IEEE
By: Yu-Ting Hsueh; Stark, A.J.; Ralph, S.E.; Gee-Kung Chang; Tibuleac, S.; Filer, M.M.; Cheng Liu; Detwiler, T.F.; Searcy, S.;
By: Yu-Ting Hsueh; Stark, A.J.; Ralph, S.E.; Gee-Kung Chang; Tibuleac, S.; Filer, M.M.; Cheng Liu; Detwiler, T.F.; Searcy, S.;
2012 / IEEE
By: Xu, Feng; Diaz, Oscar; Ghani, Nasir; Khan, Samee; Peng, Min; Khodeir, Mahmoud; Min-Allah, Nasro;
By: Xu, Feng; Diaz, Oscar; Ghani, Nasir; Khan, Samee; Peng, Min; Khodeir, Mahmoud; Min-Allah, Nasro;
2012 / IEEE
By: Gomes, N.; Zegaoui, M.; Loyez, C.; Vilcot, J.-P.; Rolland, N.; Wake, D.; Lethien, C.; Verbeke, B.; Rolland, P.-A.;
By: Gomes, N.; Zegaoui, M.; Loyez, C.; Vilcot, J.-P.; Rolland, N.; Wake, D.; Lethien, C.; Verbeke, B.; Rolland, P.-A.;