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Topic: Optical Fiber Devices
Results
2011 / IEEE
By: Hongwei Zhu; Wei Zhang; Xiaosheng Xiao; Xiao Li; Kunlin Wang; Lili Gui; Changxi Yang; Dehai Wu;
By: Hongwei Zhu; Wei Zhang; Xiaosheng Xiao; Xiao Li; Kunlin Wang; Lili Gui; Changxi Yang; Dehai Wu;
2012 / IEEE
By: Hirth, R.; Elbakoury, H.; Mukai, H.; Hajduczenia, M.; Nishihara, S.; Kato, M.; Kimura, M.;
By: Hirth, R.; Elbakoury, H.; Mukai, H.; Hajduczenia, M.; Nishihara, S.; Kato, M.; Kimura, M.;
2012 / IEEE
By: Fok, M.P.; Yue Tian; Kravtsov, K.S.; Rafidi, N.S.; Prucnal, P.R.; Tait, A.N.; Nahmias, M.A.;
By: Fok, M.P.; Yue Tian; Kravtsov, K.S.; Rafidi, N.S.; Prucnal, P.R.; Tait, A.N.; Nahmias, M.A.;
2012 / IEEE
By: Yuan-Fu Tsai; Jen-Tang Lu; Chih-Hsien Lai; Tzu-Fang Tseng; Chi-Kuang Sun; Yuh-Jing Hwang;
By: Yuan-Fu Tsai; Jen-Tang Lu; Chih-Hsien Lai; Tzu-Fang Tseng; Chi-Kuang Sun; Yuh-Jing Hwang;
2012 / IEEE
By: Schuster, K.; Kobelke, J.; Schwuchow, A.; Rothhardt, M.; Bartelt, H.; Spittel, R.; Balakrishnan, M.; Becker, M.;
By: Schuster, K.; Kobelke, J.; Schwuchow, A.; Rothhardt, M.; Bartelt, H.; Spittel, R.; Balakrishnan, M.; Becker, M.;
2012 / IEEE
By: Chychlowski, M.S.; Tefelska, M.M.; Rodriaguez, A.H.; Ertman, S.; Pysz, D.; Dabrowski, R.; Wolinski, T.R.; Nowinowski-Kruszelnicki, E.; Buczynaski, R.;
By: Chychlowski, M.S.; Tefelska, M.M.; Rodriaguez, A.H.; Ertman, S.; Pysz, D.; Dabrowski, R.; Wolinski, T.R.; Nowinowski-Kruszelnicki, E.; Buczynaski, R.;
2012 / IEEE
By: Dong-Yo Jheng; Kuang-Yu Hsu; Sheng-Lung Huang; Chien-Chih Lai; Tuan-Shu Ho; Yi-Han Liao;
By: Dong-Yo Jheng; Kuang-Yu Hsu; Sheng-Lung Huang; Chien-Chih Lai; Tuan-Shu Ho; Yi-Han Liao;
2012 / IEEE
By: Gomes, N.; Zegaoui, M.; Loyez, C.; Vilcot, J.-P.; Rolland, N.; Wake, D.; Lethien, C.; Verbeke, B.; Rolland, P.-A.;
By: Gomes, N.; Zegaoui, M.; Loyez, C.; Vilcot, J.-P.; Rolland, N.; Wake, D.; Lethien, C.; Verbeke, B.; Rolland, P.-A.;
2012 / IEEE
By: Mergo, P.; Nasilowski, T.; Beres-Pawlik, E.; Napierala, M.; Thienpont, H.; Berghmans, F.;
By: Mergo, P.; Nasilowski, T.; Beres-Pawlik, E.; Napierala, M.; Thienpont, H.; Berghmans, F.;
2012 / IEEE
By: Nasirabad, R.R.; Babazadeh, A.; Roohforouz, A.; Golshan, A.H.; Norouzy, A.; Jafari, N.T.; Amidian, A.; Alavian, A.; Poozesh, R.; Hejaz, K.; Heidariazar, A.;
By: Nasirabad, R.R.; Babazadeh, A.; Roohforouz, A.; Golshan, A.H.; Norouzy, A.; Jafari, N.T.; Amidian, A.; Alavian, A.; Poozesh, R.; Hejaz, K.; Heidariazar, A.;
2012 / IEEE
By: Zacharopoulos, I.; Varoutas, D.; Tselekounis, M.; Neokosmidis, I.; Rokkas, T.; Katsianis, D.; Bartzoudi, A.;
By: Zacharopoulos, I.; Varoutas, D.; Tselekounis, M.; Neokosmidis, I.; Rokkas, T.; Katsianis, D.; Bartzoudi, A.;
2012 / IEEE
By: Flood, E.; Donegan, J.F.; Barry, L.P.; Bradley, A.L.; Lynch, M.; Smyth, J.F.; Wei-Hua Guo;
By: Flood, E.; Donegan, J.F.; Barry, L.P.; Bradley, A.L.; Lynch, M.; Smyth, J.F.; Wei-Hua Guo;
2012 / IEEE
By: Jau-Sheng Wang; Wei-Lun Wang; Wood-Hi Cheng; Sheng-Lung Huang; Li-Wei Liu; Yi-Chung Huang;
By: Jau-Sheng Wang; Wei-Lun Wang; Wood-Hi Cheng; Sheng-Lung Huang; Li-Wei Liu; Yi-Chung Huang;
2012 / IEEE
By: Klaus, W.; Watanabe, M.; Kobayashi, T.; Wada, N.; Awaji, Y.; Puttnam, B.J.; Sakaguchi, J.;
By: Klaus, W.; Watanabe, M.; Kobayashi, T.; Wada, N.; Awaji, Y.; Puttnam, B.J.; Sakaguchi, J.;
2012 / IEEE
By: Shu Fan Zhou; Kwai Man Luk; Po Sheun Chung; Yuk Tak Chow; Reekie, L.; Hau Ping Chan;
By: Shu Fan Zhou; Kwai Man Luk; Po Sheun Chung; Yuk Tak Chow; Reekie, L.; Hau Ping Chan;
2012 / IEEE
By: Adikan, F.R.M.; Carpenter, L.G.; Webb, A.S.; Gates, J.C.; Smith, P.G.R.; Ambran, S.; Holmes, C.; Sahu, J.K.;
By: Adikan, F.R.M.; Carpenter, L.G.; Webb, A.S.; Gates, J.C.; Smith, P.G.R.; Ambran, S.; Holmes, C.; Sahu, J.K.;
2012 / IEEE
By: Landles, K.; Duffy, S.; Moerl, L.; Preve, G.B.; Voigt, K.; Kreissl, J.; Stampoulidis, L.; Riccardi, E.; Morro, R.; Pagano, A.; Kalavrouziotis, D.; Stamatiadis, C.; Petermann, K.; Zimmermann, L.; Avramopoulos, H.;
By: Landles, K.; Duffy, S.; Moerl, L.; Preve, G.B.; Voigt, K.; Kreissl, J.; Stampoulidis, L.; Riccardi, E.; Morro, R.; Pagano, A.; Kalavrouziotis, D.; Stamatiadis, C.; Petermann, K.; Zimmermann, L.; Avramopoulos, H.;
2011 / IEEE / 978-986-02-8974-9
By: Takahashi, H.; Sato, K.; Hasegawa, H.; Ishii, K.; Hirako, R.; Okuno, M.;
By: Takahashi, H.; Sato, K.; Hasegawa, H.; Ishii, K.; Hirako, R.; Okuno, M.;
2011 / IEEE / 978-986-02-8974-9
By: Chieh Hu; Yao-Wun Jhang; Chien-Ming Huang; Hsin-Chia Su; Shih-Ting Lin; Chih-Lin Wang; Tzong-Yow Tsai; Hong-Xi Tsao;
By: Chieh Hu; Yao-Wun Jhang; Chien-Ming Huang; Hsin-Chia Su; Shih-Ting Lin; Chih-Lin Wang; Tzong-Yow Tsai; Hong-Xi Tsao;
2011 / IEEE / 978-986-02-8974-9
By: Chien-Ming Huang; Chieh Hu; Shih-Ting Lin; Hsin-Chia Su; Yao-Wun Jhang;
By: Chien-Ming Huang; Chieh Hu; Shih-Ting Lin; Hsin-Chia Su; Yao-Wun Jhang;
2011 / IEEE / 978-986-02-8974-9
By: Chou, G.; Pan, C.L.; Yeh, C.H.; Chow, C.W.; Yang, L.G.; Chiang, R.;
By: Chou, G.; Pan, C.L.; Yeh, C.H.; Chow, C.W.; Yang, L.G.; Chiang, R.;
2011 / IEEE / 978-0-9555293-7-5
By: Yongping Dan; Hongtao Peng; Dongyun Wang; Liusong Wang; Fanghua Liu;
By: Yongping Dan; Hongtao Peng; Dongyun Wang; Liusong Wang; Fanghua Liu;
2011 / IEEE / 978-1-61284-777-1
By: Jijun Xiong; Chenyang Xue; Juin Liu; Li Wang; Yuguang Zhang; Shubin Yan; Yingzhan Yan;
By: Jijun Xiong; Chenyang Xue; Juin Liu; Li Wang; Yuguang Zhang; Shubin Yan; Yingzhan Yan;
2011 / IEEE / 978-1-55752-932-9
By: Paquet, C.; Maheux-Lacroix, B.; Morin, M.; Trepanier, F.; Patel, A.; Brochu, G.; Tibuleac, S.; Meyer, C.; Filer, M.;
By: Paquet, C.; Maheux-Lacroix, B.; Morin, M.; Trepanier, F.; Patel, A.; Brochu, G.; Tibuleac, S.; Meyer, C.; Filer, M.;
2011 / IEEE / 978-1-55752-932-9
By: Fiol, G.; Wolf, P.; Hofmann, W.; Moser, P.; Bimberg, D.; Ledentsov, N.N.; Lott, J.A.;
By: Fiol, G.; Wolf, P.; Hofmann, W.; Moser, P.; Bimberg, D.; Ledentsov, N.N.; Lott, J.A.;
2011 / IEEE / 978-1-4577-1562-4
By: Lin Heng; Yi Hongling; Wang Weishan; Zheng Baicun; Wei Ting; Gong Weiguang;
By: Lin Heng; Yi Hongling; Wang Weishan; Zheng Baicun; Wei Ting; Gong Weiguang;
2011 / IEEE / 978-1-55752-932-9
By: Bhardwaj, A.; Benabid, F.; Blondy, J.; Auguste, J.; Humbert, G.; Gerome, F.; Beaudou, B.;
By: Bhardwaj, A.; Benabid, F.; Blondy, J.; Auguste, J.; Humbert, G.; Gerome, F.; Beaudou, B.;
2011 / IEEE / 978-1-55752-932-9
By: Khopin, V.F.; Melkumov, M.A.; Firstov, S.V.; Medvedkov, O.I.; Guryanov, A.N.; Shubin, A.V.; Bufetov, I.A.; Dianov, E.M.;
By: Khopin, V.F.; Melkumov, M.A.; Firstov, S.V.; Medvedkov, O.I.; Guryanov, A.N.; Shubin, A.V.; Bufetov, I.A.; Dianov, E.M.;
2011 / IEEE / 978-1-55752-932-9
By: Marques, C.A.F.; Cook, K.; Canning, J.; Nogueira, R.N.; Pohl, A.A.P.; Oliveira, R.A.;
By: Marques, C.A.F.; Cook, K.; Canning, J.; Nogueira, R.N.; Pohl, A.A.P.; Oliveira, R.A.;
2011 / IEEE / 978-1-4244-8340-2
By: Tekin, T.; Galan, J.V.; Sanchis, P.; Llopis, M.; Brimont, A.; Preve, G.B.;
By: Tekin, T.; Galan, J.V.; Sanchis, P.; Llopis, M.; Brimont, A.; Preve, G.B.;