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Topic: Optical Feedback
Results
2011 / IEEE
By: Nian Qiang Li; Lei Yang; Ning Jiang; Xi Hua Zou; Shui Ying Xiang; Bin Luo; Wei Pan; Lian Shan Yan;
By: Nian Qiang Li; Lei Yang; Ning Jiang; Xi Hua Zou; Shui Ying Xiang; Bin Luo; Wei Pan; Lian Shan Yan;
2011 / IEEE
By: Xinliang Zhang; Yvind, K.; Jing Xu; Haiyan Ou; Dexiu Huang; Peucheret, C.; Liu Liu; Yunhong Ding;
By: Xinliang Zhang; Yvind, K.; Jing Xu; Haiyan Ou; Dexiu Huang; Peucheret, C.; Liu Liu; Yunhong Ding;
2011 / IEEE
By: Herczfeld, P.; Bowers, J.E.; Coldren, L.A.; Sheilei Jin; Renyuan Wang; Bhardwaj, A.; Yifei Li;
By: Herczfeld, P.; Bowers, J.E.; Coldren, L.A.; Sheilei Jin; Renyuan Wang; Bhardwaj, A.; Yifei Li;
Wideband Unpredictability-Enhanced Chaotic Semiconductor Lasers With Dual-Chaotic Optical Injections
2012 / IEEEBy: Nianqiang Li; Xi Hua Zou; Lian Shan Yan; Bin Luo; Wei Pan; Shui Ying Xiang; Hong Na Zhu;
Flat Broadband Chaos in Vertical-Cavity Surface-Emitting Lasers Subject to Chaotic Optical Injection
2012 / IEEEBy: Shore, K.A.; Spencer, P.S.; Yanhua Hong;
2012 / IEEE
By: Momtaz, A.; Jun Cao; Huang, N.; Ali, T.; Wei Zhang; Maarefi, H.; Nazemi, A.; Khanpour, M.; Pi, D.; Zhi Huang; Vasani, A.; Singh, U.; Raghavan, B.; Delong Cui; Bo Zhang;
By: Momtaz, A.; Jun Cao; Huang, N.; Ali, T.; Wei Zhang; Maarefi, H.; Nazemi, A.; Khanpour, M.; Pi, D.; Zhi Huang; Vasani, A.; Singh, U.; Raghavan, B.; Delong Cui; Bo Zhang;
2012 / IEEE
By: Alexoudi, T.; Bakopoulos, P.; Fitsios, D.; Vyrsokinos, K.; Apostolopoulos, D.; Pleros, N.; Miliou, A.; Avramopoulos, H.;
By: Alexoudi, T.; Bakopoulos, P.; Fitsios, D.; Vyrsokinos, K.; Apostolopoulos, D.; Pleros, N.; Miliou, A.; Avramopoulos, H.;
2012 / IEEE
By: de Ridder, R.M.; Bernhardi, E.H.; Burla, M.; Marpaung, D.A.I.; Worhoff, K.; Khan, M.R.H.; Roeloffzen, C.G.H.; Pollnau, M.;
By: de Ridder, R.M.; Bernhardi, E.H.; Burla, M.; Marpaung, D.A.I.; Worhoff, K.; Khan, M.R.H.; Roeloffzen, C.G.H.; Pollnau, M.;
2012 / IEEE
By: Corbett, B.; O'Callaghan, J.; Daunt, C.L.M.; Peters, F.H.; Ko-Hsin Lee; Pelucchi, E.; Thomas, K.; Young, R.J.; Hua Yang;
By: Corbett, B.; O'Callaghan, J.; Daunt, C.L.M.; Peters, F.H.; Ko-Hsin Lee; Pelucchi, E.; Thomas, K.; Young, R.J.; Hua Yang;
2012 / IEEE
By: Xiao-Dong Lin; Yi-Yuan Xie; Guang-Qiong Xia; Zhu-Qiang Zhong; Li Fan; Zheng-Mao Wu; Tao Deng;
By: Xiao-Dong Lin; Yi-Yuan Xie; Guang-Qiong Xia; Zhu-Qiang Zhong; Li Fan; Zheng-Mao Wu; Tao Deng;
2012 / IEEE
By: Bosman, E.; Van Hoe, B.; Van Steenberge, G.; Van Daele, P.; Godier, G.; De Geyter, T.; Melpignano, G.; Kalathimekkad, S.; Missinne, J.;
By: Bosman, E.; Van Hoe, B.; Van Steenberge, G.; Van Daele, P.; Godier, G.; De Geyter, T.; Melpignano, G.; Kalathimekkad, S.; Missinne, J.;
2012 / IEEE
By: Liyue Zhang; Nianqiang Li; Shuiying Xiang; Xihua Zou; Bin Luo; Lianshan Yan; Wei Pan;
By: Liyue Zhang; Nianqiang Li; Shuiying Xiang; Xihua Zou; Bin Luo; Lianshan Yan; Wei Pan;
2012 / IEEE
By: Shui Ying Xiang; Penghua Mu; Liyue Zhang; Xi Hua Zou; Lian Shan Yan; Bin Luo; Nian Qiang Li; Wei Pan;
By: Shui Ying Xiang; Penghua Mu; Liyue Zhang; Xi Hua Zou; Lian Shan Yan; Bin Luo; Nian Qiang Li; Wei Pan;
2012 / IEEE
By: Ye Li; Yang Zhao; Erjun Zang; Tianchu Li; Zhanjun Fang; Fei Meng; Qiang Wang; Shiying Cao; Baike Lin; Shaokai Wang; Yige Lin; Jianping Cao;
By: Ye Li; Yang Zhao; Erjun Zang; Tianchu Li; Zhanjun Fang; Fei Meng; Qiang Wang; Shiying Cao; Baike Lin; Shaokai Wang; Yige Lin; Jianping Cao;
2006 / IEEE / 978-3-9805741-8-1
By: Wicht, A.; Danzmann, K.; Rinkleff, R.-H.; Huke, P.; Schiller, S.; Chepurov, S.; Ernsting, I.; Strauss, N.;
By: Wicht, A.; Danzmann, K.; Rinkleff, R.-H.; Huke, P.; Schiller, S.; Chepurov, S.; Ernsting, I.; Strauss, N.;
2011 / IEEE / 978-1-61284-175-5
By: Kawabe, A.; Tanimoto, K.; Nishino, H.; Dosho, S.; Kobayashi, H.; Sakiyama, S.; Okamoto, K.; Senoue, F.; Morie, T.;
By: Kawabe, A.; Tanimoto, K.; Nishino, H.; Dosho, S.; Kobayashi, H.; Sakiyama, S.; Okamoto, K.; Senoue, F.; Morie, T.;
2011 / IEEE / 978-986-02-8974-9
By: Chuan-Pi Hsu; Tsu-Chiang Yen; Wang-Chuang Kuo; Da-Long Cheng; Yu-Heng Wu;
By: Chuan-Pi Hsu; Tsu-Chiang Yen; Wang-Chuang Kuo; Da-Long Cheng; Yu-Heng Wu;
2011 / IEEE / 978-986-02-8974-9
By: Hung Ji Huang; Handel, B.; Yu-Hsuan Lin; Din Ping Tsai; Heh-Nan Lin; Yung-Fu Chen; Hsiang-An Chen;
By: Hung Ji Huang; Handel, B.; Yu-Hsuan Lin; Din Ping Tsai; Heh-Nan Lin; Yung-Fu Chen; Hsiang-An Chen;
2011 / IEEE / 978-1-4577-0762-9
By: Figueiredo, J.M.L.; Romeira, B.; Javaloyes, J.; Seunarine, K.; Ironside, C.N.;
By: Figueiredo, J.M.L.; Romeira, B.; Javaloyes, J.; Seunarine, K.; Ironside, C.N.;
2011 / IEEE / 978-1-4577-1207-4
By: Dang Van Liet; Le Nguyen Binh; Nguyen Huu Phuong; Nguyen Anh Vinh;
By: Dang Van Liet; Le Nguyen Binh; Nguyen Huu Phuong; Nguyen Anh Vinh;
2011 / IEEE / 978-1-55752-932-9
By: Ji, P.N.; Aoki, Y.; Shaoliang Zhang; Ming-Fang Huang; Dayou Qian; Yin Shao; Ogata, T.; Inada, Y.; Ting Wang; Mateo, E.; Yaman, F.;
By: Ji, P.N.; Aoki, Y.; Shaoliang Zhang; Ming-Fang Huang; Dayou Qian; Yin Shao; Ogata, T.; Inada, Y.; Ting Wang; Mateo, E.; Yaman, F.;
2011 / IEEE / 978-1-55752-932-9
By: Pleros, N.; Miliou, A.; Avramopoulos, H.; Apostolopoulos, D.; Vyrsokinos, K.; Alexoudi, T.; Fitsios, D.; Bakopoulos, P.;
By: Pleros, N.; Miliou, A.; Avramopoulos, H.; Apostolopoulos, D.; Vyrsokinos, K.; Alexoudi, T.; Fitsios, D.; Bakopoulos, P.;
2011 / IEEE / 978-1-4577-0509-0
By: Kuwashima, F.; Iwasawa, H.; Nagashima, T.; Hangyo, M.; Takei, K.; Kurihara, K.; Tani, M.; Fujii, T.;
By: Kuwashima, F.; Iwasawa, H.; Nagashima, T.; Hangyo, M.; Takei, K.; Kurihara, K.; Tani, M.; Fujii, T.;
2011 / IEEE / 978-1-4577-0509-0
By: Donghun Lee; Jeong-Woo Park; Han-Cheol Ryu; Hyunsung Ko; Min Yong Jeon; Sang-Pil Han; Young Ahn Leem; Namje Kim; Kyung Hyun Park;
By: Donghun Lee; Jeong-Woo Park; Han-Cheol Ryu; Hyunsung Ko; Min Yong Jeon; Sang-Pil Han; Young Ahn Leem; Namje Kim; Kyung Hyun Park;
2011 / IEEE / 978-2-87487-022-4
By: Taeyong Kim; Sungil Kim; Kwang-Yong Kang; Seungbeom Kang; Min Hwan Kwak;
By: Taeyong Kim; Sungil Kim; Kwang-Yong Kang; Seungbeom Kang; Min Hwan Kwak;
2011 / IEEE / 978-1-4244-8939-8
By: Pleros, N.; Miliou, A.; Avramopoulos, H.; Apostolopoulos, D.; Fitsios, D.; Bakopoulos, P.; Vyrsokinos, K.; Alexoudi, T.;
By: Pleros, N.; Miliou, A.; Avramopoulos, H.; Apostolopoulos, D.; Fitsios, D.; Bakopoulos, P.; Vyrsokinos, K.; Alexoudi, T.;
2011 / IEEE / 978-1-4244-8939-8
By: Mandridis, D.; Williams, C.; Delfyett, P.J.; Klee, A.; Davila-Rodriguez, J.;
By: Mandridis, D.; Williams, C.; Delfyett, P.J.; Klee, A.; Davila-Rodriguez, J.;
2011 / IEEE / 978-1-4244-8939-8
By: Naderi, N.A.; Grillot, F.; Lester, L.F.; Crowley, M.T.; Raghunathan, R.; Rahimi, N.; Wright, J.B.;
By: Naderi, N.A.; Grillot, F.; Lester, L.F.; Crowley, M.T.; Raghunathan, R.; Rahimi, N.; Wright, J.B.;
2011 / IEEE / 978-1-61284-813-6
By: Fraile-Pelaez, F.J.; Chamorro-Posada, P.; Gago-Munoz, E.; Diaz-Otero, F.J.;
By: Fraile-Pelaez, F.J.; Chamorro-Posada, P.; Gago-Munoz, E.; Diaz-Otero, F.J.;
2011 / IEEE / 978-1-4244-9289-3
By: Wixted, A.; O'Keefe, S.G.; Thiel, D.V.; Hagem, R.M.; Fickenscher, T.;
By: Wixted, A.; O'Keefe, S.G.; Thiel, D.V.; Hagem, R.M.; Fickenscher, T.;
2011 / IEEE / 978-1-4244-9289-3
By: Rakic, A.D.; Wilson, S.J.; Nikolic, M.; Kliese, R.; Yah Leng Lim; Davies, A.G.; Linfield, E.H.; Harrison, P.; Ikonic, Z.; Indjin, D.; Lachab, M.; Khanna, S.P.; Valavanis, A.; Dean, P.;
By: Rakic, A.D.; Wilson, S.J.; Nikolic, M.; Kliese, R.; Yah Leng Lim; Davies, A.G.; Linfield, E.H.; Harrison, P.; Ikonic, Z.; Indjin, D.; Lachab, M.; Khanna, S.P.; Valavanis, A.; Dean, P.;
2011 / IEEE / 978-0-9775657-8-8
By: Inoue, T.; Edamura, T.; Fujita, K.; Akikusa, N.; Kasahara, K.; Kataoka, T.; Tsushima, K.;
By: Inoue, T.; Edamura, T.; Fujita, K.; Akikusa, N.; Kasahara, K.; Kataoka, T.; Tsushima, K.;
2012 / IEEE / 978-1-55752-935-1
By: Masini, G.; Narasimha, A.; Liang, Y.; Xu, W.; Pinguet, T.; Yu, S.; Sahni, S.; Jackson, S.; Hovey, S.; Gloeckner, S.; Abdalla, S.; Leap, S.; LeBlanc, R.; De Dobbelaere, P.; Sharp, M.; Mack, M.; Saberi, M.; Peterson, M.; Harrison, M.; Yokoyama, K.; Redman, J.; Mekis, A.; Welch, B.; Ogden, C.; Bradbury, C.; Sohn, C.; Song, D.; Martinez, D.; Foltz, D.; Guckenberger, D.; Eicher, J.; Dong, J.; Schramm, J.; White, J.;
By: Masini, G.; Narasimha, A.; Liang, Y.; Xu, W.; Pinguet, T.; Yu, S.; Sahni, S.; Jackson, S.; Hovey, S.; Gloeckner, S.; Abdalla, S.; Leap, S.; LeBlanc, R.; De Dobbelaere, P.; Sharp, M.; Mack, M.; Saberi, M.; Peterson, M.; Harrison, M.; Yokoyama, K.; Redman, J.; Mekis, A.; Welch, B.; Ogden, C.; Bradbury, C.; Sohn, C.; Song, D.; Martinez, D.; Foltz, D.; Guckenberger, D.; Eicher, J.; Dong, J.; Schramm, J.; White, J.;
2012 / IEEE / 978-1-55752-935-1
By: Suzuki, N.; Yoshida, T.; Ishii, K.; Akiyama, Y.; Maruta, A.; Koguchi, K.; Yoshida, Y.; Kitayama, K.; Mizuochi, T.; Nakagawa, J.;
By: Suzuki, N.; Yoshida, T.; Ishii, K.; Akiyama, Y.; Maruta, A.; Koguchi, K.; Yoshida, Y.; Kitayama, K.; Mizuochi, T.; Nakagawa, J.;
2011 / IEEE / 978-0-9775657-8-8
By: Szorkovszky, A.; Taylor, M.A.; Bowen, W.P.; Lee, K.H.; Knittel, J.;
By: Szorkovszky, A.; Taylor, M.A.; Bowen, W.P.; Lee, K.H.; Knittel, J.;
2011 / IEEE / 978-0-9775657-8-8
By: Tanaka, Y.; Kashiwagi, K.; Mozawa, K.; Weifan Qiao; Kurokawa, T.;
By: Tanaka, Y.; Kashiwagi, K.; Mozawa, K.; Weifan Qiao; Kurokawa, T.;
2011 / IEEE / 978-0-9775657-8-8
By: Chow, J.H.; Mow-Lowry, C.M.; Mullavey, A.J.; Slamogen, B.J.J.; Miller, J.; Nguyen, T.T.-H.; McClelland, D.E.;
By: Chow, J.H.; Mow-Lowry, C.M.; Mullavey, A.J.; Slamogen, B.J.J.; Miller, J.; Nguyen, T.T.-H.; McClelland, D.E.;
2012 / IEEE / 978-1-4577-1073-5
By: Miyazaki, T.; Ohishi, K.; Ogata, T.; Nakazaki, T.; Tokumaru, H.; Takano, Y.; Koide, D.;
By: Miyazaki, T.; Ohishi, K.; Ogata, T.; Nakazaki, T.; Tokumaru, H.; Takano, Y.; Koide, D.;