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Topic: Optical Fabrication
Results
2011 / IEEE
By: Gates, J.C.; Sparrow, I.J.G.; Daly, K.R.; Holmes, C.; Smith, P.G.R.; D'Alessandro, G.;
By: Gates, J.C.; Sparrow, I.J.G.; Daly, K.R.; Holmes, C.; Smith, P.G.R.; D'Alessandro, G.;
2011 / IEEE
By: Vyrsokinos, K.; Stamatiadis, C.; Avramopoulos, H.; Van Thourhout, D.; Zhen Sheng; De Heyn, P.; Wahlbrink, T.; Karl, M.; Bolten, J.; Maziotis, A.; Lazarou, I.; Stampoulidis, L.;
By: Vyrsokinos, K.; Stamatiadis, C.; Avramopoulos, H.; Van Thourhout, D.; Zhen Sheng; De Heyn, P.; Wahlbrink, T.; Karl, M.; Bolten, J.; Maziotis, A.; Lazarou, I.; Stampoulidis, L.;
2011 / IEEE
By: Geernaert, T.; Baghdasaryan, T.; Thienpont, H.; Berghmans, F.; Mergo, P.; Makara, M.; Bartelt, H.; Schuster, K.; Becker, M.;
By: Geernaert, T.; Baghdasaryan, T.; Thienpont, H.; Berghmans, F.; Mergo, P.; Makara, M.; Bartelt, H.; Schuster, K.; Becker, M.;
2011 / IEEE
By: Xinliang Zhang; Yvind, K.; Jing Xu; Haiyan Ou; Dexiu Huang; Peucheret, C.; Liu Liu; Yunhong Ding;
By: Xinliang Zhang; Yvind, K.; Jing Xu; Haiyan Ou; Dexiu Huang; Peucheret, C.; Liu Liu; Yunhong Ding;
2011 / IEEE
By: Kai Wang; Kandulski, W.; Calver, J.; Rygate, J.; Zakariyah, S.S.; Selviah, D.R.; Hutt, D.A.; Conway, P.P.;
By: Kai Wang; Kandulski, W.; Calver, J.; Rygate, J.; Zakariyah, S.S.; Selviah, D.R.; Hutt, D.A.; Conway, P.P.;
2011 / IEEE
By: Jenkins, M.; Keeley, J.; Shuo Liu; Holmes, M.R.; Hawkins, A.R.; Schmidt, H.; Leake, K.;
By: Jenkins, M.; Keeley, J.; Shuo Liu; Holmes, M.R.; Hawkins, A.R.; Schmidt, H.; Leake, K.;
2012 / IEEE
By: Xuejun Xu; Narusawa, S.; Chiba, T.; Shiraki, Y.; Jinsong Xia; Usami, N.; Maruizumi, T.; Tsuboi, T.;
By: Xuejun Xu; Narusawa, S.; Chiba, T.; Shiraki, Y.; Jinsong Xia; Usami, N.; Maruizumi, T.; Tsuboi, T.;
2012 / IEEE
By: Jackel, H.; Holzman, J.F.; Beck, M.; Kappeler, R.; Fedoryshyn, Y.; Faist, J.; Ping Ma; Kaspar, P.;
By: Jackel, H.; Holzman, J.F.; Beck, M.; Kappeler, R.; Fedoryshyn, Y.; Faist, J.; Ping Ma; Kaspar, P.;
2012 / IEEE
By: Gunapala, S.D.; Ting, D.Z.; Hoglund, L.; Keo, S.A.; Mumolo, J.M.; Rafol, S.B.; Liu, J.K.; Nguyen, J.; Khoshakhlagh, A.; Soibel, A.;
By: Gunapala, S.D.; Ting, D.Z.; Hoglund, L.; Keo, S.A.; Mumolo, J.M.; Rafol, S.B.; Liu, J.K.; Nguyen, J.; Khoshakhlagh, A.; Soibel, A.;
2012 / IEEE
By: Jr-Hau He; Miin-Jang Chen; Der-Hsien Lien; Chia-Yang Hsu; Ming-Wei Chen; Cheng-Ying Chen;
By: Jr-Hau He; Miin-Jang Chen; Der-Hsien Lien; Chia-Yang Hsu; Ming-Wei Chen; Cheng-Ying Chen;
2012 / IEEE
By: Harduin, J.; Ben Bakir, B.; Letartre, X.; Seassal, C.; Olivier, N.; Sciancalepore, C.; Viktorovitch, P.; Fedeli, J.;
By: Harduin, J.; Ben Bakir, B.; Letartre, X.; Seassal, C.; Olivier, N.; Sciancalepore, C.; Viktorovitch, P.; Fedeli, J.;
2012 / IEEE
By: Orofino, C.; Kanibolotsky, A.L.; Chen, Y.; Herrnsdorf, J.; Skabara, P.J.; Guilhabert, B.; Laurand, N.; Dawson, M.D.;
By: Orofino, C.; Kanibolotsky, A.L.; Chen, Y.; Herrnsdorf, J.; Skabara, P.J.; Guilhabert, B.; Laurand, N.; Dawson, M.D.;
2012 / IEEE
By: Xiuyou Han; Ren, J.; Linghua Wang; Morthier, G.; Claes, T.; Mingshan Zhao; Baets, R.; Bienstman, P.; Xigao Jian;
By: Xiuyou Han; Ren, J.; Linghua Wang; Morthier, G.; Claes, T.; Mingshan Zhao; Baets, R.; Bienstman, P.; Xigao Jian;
2012 / IEEE
By: Pang, A.; Le Li; Chao Qiu; Zhiqi Wang; Aimin Wu; Fuwan Gan; Zhen Sheng; Shichang Zou; Xi Wang;
By: Pang, A.; Le Li; Chao Qiu; Zhiqi Wang; Aimin Wu; Fuwan Gan; Zhen Sheng; Shichang Zou; Xi Wang;
2012 / IEEE
By: Bing-Hsiao Wang; Jen-Inn Chyi; Pei-Chin Chiu; Hung-Pin Chen; Yu-Ru Huang; Chi-Kuang Sun; Shih-Yuan Chen;
By: Bing-Hsiao Wang; Jen-Inn Chyi; Pei-Chin Chiu; Hung-Pin Chen; Yu-Ru Huang; Chi-Kuang Sun; Shih-Yuan Chen;
2012 / IEEE
By: Lazarou, I.; Stamatiadis, C.; Vyrsokinos, K.; Stampoulidis, L.; Gomez-Agis, F.; Dorren, H.J.S.; Avramopoulos, H.; De Heyn, P.; Van Thourhout, D.; Voigt, K.; Zimmermann, L.;
By: Lazarou, I.; Stamatiadis, C.; Vyrsokinos, K.; Stampoulidis, L.; Gomez-Agis, F.; Dorren, H.J.S.; Avramopoulos, H.; De Heyn, P.; Van Thourhout, D.; Voigt, K.; Zimmermann, L.;
2012 / IEEE
By: Rojo-Romeo, P.; Mandorlo, F.; Spuesens, T.; Van Thourhout, D.; Fedeli, J.-M.; Olivier, N.; Regreny, P.;
By: Rojo-Romeo, P.; Mandorlo, F.; Spuesens, T.; Van Thourhout, D.; Fedeli, J.-M.; Olivier, N.; Regreny, P.;
2012 / IEEE
By: Junfeng Song; Shiyi Chen; Jing Zhang; Huijuan Zhang; Guo-Qiang Lo; Mingbin Yu; Kee, J.S.;
By: Junfeng Song; Shiyi Chen; Jing Zhang; Huijuan Zhang; Guo-Qiang Lo; Mingbin Yu; Kee, J.S.;
2012 / IEEE
By: Myung Yung Jeong; Gye Won Kim; Eun Joo Jung; Jong Bea An; Byung Sup Rho; Myoung Jin Kim; Sung Hwan Hwang; Woo-Jin Lee;
By: Myung Yung Jeong; Gye Won Kim; Eun Joo Jung; Jong Bea An; Byung Sup Rho; Myoung Jin Kim; Sung Hwan Hwang; Woo-Jin Lee;
2012 / IEEE
By: Stark, A.J.; Dabkowski, M.; Kirk, J.B.; Kim, J.; Kim, T.W.; Sultana, N.; Evans, G.A.; LaFave, T.P.; Liu, K.; Christensen, M.P.; MacFarlane, D.L.; Huntoon, N.; Ramakrishna, V.; Hunt, L.R.;
By: Stark, A.J.; Dabkowski, M.; Kirk, J.B.; Kim, J.; Kim, T.W.; Sultana, N.; Evans, G.A.; LaFave, T.P.; Liu, K.; Christensen, M.P.; MacFarlane, D.L.; Huntoon, N.; Ramakrishna, V.; Hunt, L.R.;
2012 / IEEE
By: Guogang Qin; Lingjuan Zhao; Wei Wang; Guangzhao Ran; Chong Wang; Jifang Qiu; Jiaoqing Pan; Song Liang; Weixi Chen; Tao Hong; Yanping Li; Bin Niu;
By: Guogang Qin; Lingjuan Zhao; Wei Wang; Guangzhao Ran; Chong Wang; Jifang Qiu; Jiaoqing Pan; Song Liang; Weixi Chen; Tao Hong; Yanping Li; Bin Niu;
2012 / IEEE
By: Yang Wang; Song Liang; Hong-Liang Zhu; Guang-Zhao Ran; Guo-Gang Qin; Jiao-Qing Pan; Wei-Xi Chen; Yan-Ping Li; Tao Hong; Wei Wang;
By: Yang Wang; Song Liang; Hong-Liang Zhu; Guang-Zhao Ran; Guo-Gang Qin; Jiao-Qing Pan; Wei-Xi Chen; Yan-Ping Li; Tao Hong; Wei Wang;
2012 / IEEE
By: Yue-De Yang; Yong-Zhen Huang; Jian-Dong Lin; Ling-Xiu Zou; Qi-Feng Yao; Xiao-Meng Lv; Yun Du; Jin-Long Xiao;
By: Yue-De Yang; Yong-Zhen Huang; Jian-Dong Lin; Ling-Xiu Zou; Qi-Feng Yao; Xiao-Meng Lv; Yun Du; Jin-Long Xiao;
2012 / IEEE
By: Heck, M.J.R.; John, D.D.; Blumenthal, D.J.; Bowers, J.E.; Barton, J.S.; Moreira, R.; Bauters, J.F.;
By: Heck, M.J.R.; John, D.D.; Blumenthal, D.J.; Bowers, J.E.; Barton, J.S.; Moreira, R.; Bauters, J.F.;
2012 / IEEE
By: Selvaraja, S.; Vermeulen, D.; Roelkens, G.; Van Thourhout, D.; Bogaerts, W.; Absil, P.; Verheyen, P.;
By: Selvaraja, S.; Vermeulen, D.; Roelkens, G.; Van Thourhout, D.; Bogaerts, W.; Absil, P.; Verheyen, P.;
2012 / IEEE
By: Wei-Hua Guo; Donegan, J.F.; Weldon, V.; Lynch, M.; Qiaoyin Lu; O'Callaghan, J.; Abdullaev, A.; Nawrocka, M.;
By: Wei-Hua Guo; Donegan, J.F.; Weldon, V.; Lynch, M.; Qiaoyin Lu; O'Callaghan, J.; Abdullaev, A.; Nawrocka, M.;
2012 / IEEE
By: Ming Ding; Pengfei Wang; Lee, T.; Murugan, G.S.; Brambilla, G.; Farrell, G.; Koizumi, F.; Qiang Wu; Semenova, Y.;
By: Ming Ding; Pengfei Wang; Lee, T.; Murugan, G.S.; Brambilla, G.; Farrell, G.; Koizumi, F.; Qiang Wu; Semenova, Y.;
2012 / IEEE
By: Beaudin, G.; Veerasubramanian, V.; Kirk, A.G.; Aimez, V.; Le Drogoff, B.; Giguere, A.;
By: Beaudin, G.; Veerasubramanian, V.; Kirk, A.G.; Aimez, V.; Le Drogoff, B.; Giguere, A.;
2012 / IEEE
By: Bellanca, G.; Malaguti, S.; de Rossi, A.; Combrie, S.; Lehoucq, G.; Trillo, S.; Simon, J.C.; Bramerie, L.; Gay, M.; Lengle, K.;
By: Bellanca, G.; Malaguti, S.; de Rossi, A.; Combrie, S.; Lehoucq, G.; Trillo, S.; Simon, J.C.; Bramerie, L.; Gay, M.; Lengle, K.;
2012 / IEEE
By: Bosman, E.; Van Hoe, B.; Van Steenberge, G.; Van Daele, P.; Godier, G.; De Geyter, T.; Melpignano, G.; Kalathimekkad, S.; Missinne, J.;
By: Bosman, E.; Van Hoe, B.; Van Steenberge, G.; Van Daele, P.; Godier, G.; De Geyter, T.; Melpignano, G.; Kalathimekkad, S.; Missinne, J.;
2012 / IEEE
By: Hongwei Qu; Bin Jiang; Yufei Wang; Jianxin Zhang; Lei Liu; Wanhua Zheng; Yejin Zhang;
By: Hongwei Qu; Bin Jiang; Yufei Wang; Jianxin Zhang; Lei Liu; Wanhua Zheng; Yejin Zhang;
2012 / IEEE
By: Myoung Jin Kim; Sung Hwan Hwang; Woo-Jin Lee; Byung Sup Rho; Eun Joo Jung; Myung Yung Jeong; Gye Won Kim; Jong Bea An;
By: Myoung Jin Kim; Sung Hwan Hwang; Woo-Jin Lee; Byung Sup Rho; Eun Joo Jung; Myung Yung Jeong; Gye Won Kim; Jong Bea An;
2012 / IEEE
By: Selvaraja, S.; Subramanian, A.Z.; Baets, R.; Komorowska, K.; Dhakal, A.; Verheyen, P.;
By: Selvaraja, S.; Subramanian, A.Z.; Baets, R.; Komorowska, K.; Dhakal, A.; Verheyen, P.;
2012 / IEEE
By: Martinez, A.; Laude, V.; Beugnot, J.; Djafari-Rouhani, B.; Puerto, D.; Escalante, J.M.; Griol, A.; Pennec, Y.;
By: Martinez, A.; Laude, V.; Beugnot, J.; Djafari-Rouhani, B.; Puerto, D.; Escalante, J.M.; Griol, A.; Pennec, Y.;
2012 / IEEE
By: Kai-Feng Huang; Cheng-Chang Yu; Yu-Ting Hsu; Wen-Jen Lin; Jia-Ching Lin; Jing-En Huang; Wen-How Lan;
By: Kai-Feng Huang; Cheng-Chang Yu; Yu-Ting Hsu; Wen-Jen Lin; Jia-Ching Lin; Jing-En Huang; Wen-How Lan;
2012 / IEEE
By: Karvonen, L.; Honkanen, S.; Guo-Qiang Lo; Hiltunen, M.; Ya Chen; Hiltunen, J.; Tsung-Yang Liow; Xiaoguang Tu; Saynatjoki, A.;
By: Karvonen, L.; Honkanen, S.; Guo-Qiang Lo; Hiltunen, M.; Ya Chen; Hiltunen, J.; Tsung-Yang Liow; Xiaoguang Tu; Saynatjoki, A.;
2012 / IEEE
By: Volk, T.R.; Shcherbina, V.V.; Shandarov, S.M.; Burimov, N.I.; Borodin, M.V.; Kokhanchik, L.S.;
By: Volk, T.R.; Shcherbina, V.V.; Shandarov, S.M.; Burimov, N.I.; Borodin, M.V.; Kokhanchik, L.S.;
2012 / IEEE
By: Albero, J.; Davis, J.A.; Moreno, I.; Cerrolaza, B.; Oton, E.; Bennis, N.; Garcia-Martinez, P.;
By: Albero, J.; Davis, J.A.; Moreno, I.; Cerrolaza, B.; Oton, E.; Bennis, N.; Garcia-Martinez, P.;