Your Search Results
Use materials about this topic in your textbook!
AcademicPub holds over eight million pieces of educational content - such as case studies and journal articles - for you to mix-and-match your way.
Experience the freedom of customizing your course pack with AcademicPub!

Topic: Optical Diffraction
Results
1987 / IEEE
By: Greene, Geoffrey L.; Tanaka, Mitsuru; Deslattes, Richard D.; Kessler, Ernest G.; Henins, Albert;
By: Greene, Geoffrey L.; Tanaka, Mitsuru; Deslattes, Richard D.; Kessler, Ernest G.; Henins, Albert;
2011 / IEEE
By: Yun-Wei Cheng; Szu-Chieh Wang; Jian Jang Huang; Yen-Jen Hung; Liang-Yu Su; Liang-Yi Chen; Yu-Feng Yin;
By: Yun-Wei Cheng; Szu-Chieh Wang; Jian Jang Huang; Yen-Jen Hung; Liang-Yu Su; Liang-Yi Chen; Yu-Feng Yin;
2012 / IEEE
By: Albero, J.; Davis, J.A.; Moreno, I.; Cerrolaza, B.; Oton, E.; Bennis, N.; Garcia-Martinez, P.;
By: Albero, J.; Davis, J.A.; Moreno, I.; Cerrolaza, B.; Oton, E.; Bennis, N.; Garcia-Martinez, P.;
2011 / IEEE / 978-1-4577-1226-5
By: Bergmann, R.B.; Falldorf, C.; Dankwart, C.; Glabe, R.; Meier, A.;
By: Bergmann, R.B.; Falldorf, C.; Dankwart, C.; Glabe, R.; Meier, A.;
2011 / IEEE / 978-1-4577-1226-5
By: de Aldana, J.R.V.; Romero, C.; Climent, V.; Lancis, J.; Mendoza-Yero, O.; Camino, A.; Roso, L.; Andres, P.; Minguez-Vega, G.; Borrego-Varillas, R.; Hernandez-Toro, J.;
By: de Aldana, J.R.V.; Romero, C.; Climent, V.; Lancis, J.; Mendoza-Yero, O.; Camino, A.; Roso, L.; Andres, P.; Minguez-Vega, G.; Borrego-Varillas, R.; Hernandez-Toro, J.;
2011 / IEEE / 978-1-61284-774-0
By: Kun Zhang; Xuejun Jiang; Wu Deng; Xin Zhang; Wei Zhou; Xiaomin Zhang; Wanjun Dai; Dongxia Hu; Junpu Zhao; Kun Cheng; Feng Jing;
By: Kun Zhang; Xuejun Jiang; Wu Deng; Xin Zhang; Wei Zhou; Xiaomin Zhang; Wanjun Dai; Dongxia Hu; Junpu Zhao; Kun Cheng; Feng Jing;
2011 / IEEE / 978-1-4577-1226-5
By: Alonso, B.; Minguez-Vega, G.; Climent, V.; Lancis, J.; Sola, I.J.; Mendoza-Yero, O.; Roso, L.; Varela, O.;
By: Alonso, B.; Minguez-Vega, G.; Climent, V.; Lancis, J.; Sola, I.J.; Mendoza-Yero, O.; Roso, L.; Varela, O.;
2011 / IEEE / 978-1-4577-1226-5
By: Loriot, V.; Banares, L.; Minguez-Vega, G.; Mendoza-Yero, O.; de Nalda, R.;
By: Loriot, V.; Banares, L.; Minguez-Vega, G.; Mendoza-Yero, O.; de Nalda, R.;
2011 / IEEE / 978-1-4577-0378-2
By: Sangiorgi, E.; Vyurkov, V.; Zanuccoli, M.; Semenikhin, I.; Fiegna, C.;
By: Sangiorgi, E.; Vyurkov, V.; Zanuccoli, M.; Semenikhin, I.; Fiegna, C.;
2011 / IEEE / 978-1-4577-0860-2
By: Yu Li-Yuan; Niu Pin-Juan; Xing Hai-Ying; Yao Guang-Rui; Sun Shao-Jiao; Zhang Jian-Xin;
By: Yu Li-Yuan; Niu Pin-Juan; Xing Hai-Ying; Yao Guang-Rui; Sun Shao-Jiao; Zhang Jian-Xin;
2011 / IEEE / 978-1-4244-9793-5
By: Li, L.W.; Wang, Y.; Gui, T.L.; Tian, X.H.; Hao, L.; Wu, Q.; Yang, G.H.; Wu, Y.M.;
By: Li, L.W.; Wang, Y.; Gui, T.L.; Tian, X.H.; Hao, L.; Wu, Q.; Yang, G.H.; Wu, Y.M.;
2011 / IEEE / 978-1-4577-1411-5
By: Vasinek, V.; Siska, P.; Hanacek, F.; Koudelka, P.; Skapa, J.; Latal, J.; Vitasek, J.;
By: Vasinek, V.; Siska, P.; Hanacek, F.; Koudelka, P.; Skapa, J.; Latal, J.; Vitasek, J.;
2011 / IEEE / 978-1-4577-1005-6
By: Ting-Ming Huang; Yu-Cheng Cheng; Shenq-Tsong Chang; Long-Jeng Lee; Yu-Chuan Lin;
By: Ting-Ming Huang; Yu-Cheng Cheng; Shenq-Tsong Chang; Long-Jeng Lee; Yu-Chuan Lin;
2011 / IEEE / 978-1-4577-0509-0
By: Schnell, M.; Huth, F.; Hillenbrand, R.; Ocelic, N.; Wittborn, J.;
By: Schnell, M.; Huth, F.; Hillenbrand, R.; Ocelic, N.; Wittborn, J.;
2011 / IEEE / 978-1-4577-0509-0
By: Chi-Fan Chen; Zettl, A.; Horng, J.; Long Ju; Feng Wang; Baisong Geng; Martin, M.; Bechtel, H.A.; Zhao Hao; Yuanbo Zhang; Girit, C.;
By: Chi-Fan Chen; Zettl, A.; Horng, J.; Long Ju; Feng Wang; Baisong Geng; Martin, M.; Bechtel, H.A.; Zhao Hao; Yuanbo Zhang; Girit, C.;
2011 / IEEE / 978-1-4244-8939-8
By: Artar, A.; Altug, H.; Cetin, A.E.; Yanik, A.; Min Huang; Aksu, S.;
By: Artar, A.; Altug, H.; Cetin, A.E.; Yanik, A.; Min Huang; Aksu, S.;
2011 / IEEE / 978-1-61284-264-6
By: Suhaimi, N.F.M.; Abd-Rahmana, M.K.; Ferrari, M.; Chiasera, A.; Bhaktha, S.N.B.; Jais, U.S.; Razaki, N.I.;
By: Suhaimi, N.F.M.; Abd-Rahmana, M.K.; Ferrari, M.; Chiasera, A.; Bhaktha, S.N.B.; Jais, U.S.; Razaki, N.I.;
2011 / IEEE / 978-1-4577-1997-4
By: Yi Wang; Lei Sun; Dedong Han; Shaojuan Li; Shengdong Zhang; Quqi Han;
By: Yi Wang; Lei Sun; Dedong Han; Shaojuan Li; Shengdong Zhang; Quqi Han;
2011 / IEEE / 978-4-8634-8182-4
By: Inoue, T.; Yoshimoto, S.; Chichibu, T.; Okazaki, M.; Suhara, T.;
By: Inoue, T.; Yoshimoto, S.; Chichibu, T.; Okazaki, M.; Suhara, T.;
2011 / IEEE / 978-1-4577-1516-7
By: Lawrence, A.J.; Doughty, J.; Nowak, D.; Sanchez, E.; DeArmond, M.;
By: Lawrence, A.J.; Doughty, J.; Nowak, D.; Sanchez, E.; DeArmond, M.;
2011 / IEEE / 978-1-4673-0120-6
By: Sugiyama, M.; Yanagida, T.; Totsuka, D.; Yoshikawa, A.; Yokota, Y.; Fujimoto, Y.;
By: Sugiyama, M.; Yanagida, T.; Totsuka, D.; Yoshikawa, A.; Yokota, Y.; Fujimoto, Y.;
2011 / IEEE / 978-1-4673-0451-1
By: Tong Ye; Baiheng Ma; Fei Peng; Ming Lei; Shaohui Yan; Baoli Yao;
By: Tong Ye; Baiheng Ma; Fei Peng; Ming Lei; Shaohui Yan; Baoli Yao;
2012 / IEEE / 978-1-55752-935-1
By: Han Zhao; ZhiYong Feng; Lun Wei; Shaofeng Qiu; Shiyi Cao; QianJin Xiong; Chiwu Ding; Saulsberry, W.; Jordan, K.; HuiYu Zhou; Min Ye; QiWen Zhong; Junling Xiang;
By: Han Zhao; ZhiYong Feng; Lun Wei; Shaofeng Qiu; Shiyi Cao; QianJin Xiong; Chiwu Ding; Saulsberry, W.; Jordan, K.; HuiYu Zhou; Min Ye; QiWen Zhong; Junling Xiang;
Simple analytic modeling of photoresist development profiles in evanescent-field optical lithography
2011 / IEEE / 978-0-9775657-8-8By: Eun Seong Lee; Jae Yong Lee;
2011 / IEEE / 978-0-9775657-8-8
By: Heejong Kang; Ju Won Choi; Nan Ei Yu; Jung Hoon Ro; Do-Kyeong Ko;
By: Heejong Kang; Ju Won Choi; Nan Ei Yu; Jung Hoon Ro; Do-Kyeong Ko;
2012 / IEEE / 978-1-4577-0557-1
By: Bingenheimer, M.; Oglevie, B.; Lachenmeier, T.; Fox, J.; Young, E.F.; Jaehnig, K.P.; Percival, J.W.; Mellon, R.;
By: Bingenheimer, M.; Oglevie, B.; Lachenmeier, T.; Fox, J.; Young, E.F.; Jaehnig, K.P.; Percival, J.W.; Mellon, R.;