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Topic: Optical Communication Equipment
Results
2011 / IEEE
By: Freude, W.; Koos, C.; Bimberg, D.; Schmeckebier, H.; Leuthold, J.; Guetlein, J.; Vallaitis, T.; Bonk, R.; Meuer, C.;
By: Freude, W.; Koos, C.; Bimberg, D.; Schmeckebier, H.; Leuthold, J.; Guetlein, J.; Vallaitis, T.; Bonk, R.; Meuer, C.;
2011 / IEEE
By: Papadopoulos, S.; Moreira, P.; Menouni, M.; Ping Gui; Detraz, S.; Sigaud, C.; Vasey, F.; Troska, J.; El Nasr-Storey, S.S.; Stejskal, P.; Soos, C.;
By: Papadopoulos, S.; Moreira, P.; Menouni, M.; Ping Gui; Detraz, S.; Sigaud, C.; Vasey, F.; Troska, J.; El Nasr-Storey, S.S.; Stejskal, P.; Soos, C.;
2011 / IEEE
By: Linghao Cheng; Jing Yang; Yanfu Yang; Changyuan Yu; Zhaohui Li; Wai, P.K.A.; Hwa-yaw Tam; Lau, A.P.T.; Chao Lu;
By: Linghao Cheng; Jing Yang; Yanfu Yang; Changyuan Yu; Zhaohui Li; Wai, P.K.A.; Hwa-yaw Tam; Lau, A.P.T.; Chao Lu;
2011 / IEEE
By: Cassan, E.; Duan, G.; Fedeli, J.; Sanchis, P.; Campo, A.M.G.; Vivien, L.; Marris-Morini, D.; Ziebell, M.; Rasigade, G.; Brimont, A.;
By: Cassan, E.; Duan, G.; Fedeli, J.; Sanchis, P.; Campo, A.M.G.; Vivien, L.; Marris-Morini, D.; Ziebell, M.; Rasigade, G.; Brimont, A.;
2011 / IEEE
By: Xinliang Zhang; Yvind, K.; Jing Xu; Haiyan Ou; Dexiu Huang; Peucheret, C.; Liu Liu; Yunhong Ding;
By: Xinliang Zhang; Yvind, K.; Jing Xu; Haiyan Ou; Dexiu Huang; Peucheret, C.; Liu Liu; Yunhong Ding;
2011 / IEEE
By: Poette, J.; Brendel, F.; Accard, A.; Lelarge, F.; van Dijk, F.; Zwick, T.; Cabon, B.;
By: Poette, J.; Brendel, F.; Accard, A.; Lelarge, F.; van Dijk, F.; Zwick, T.; Cabon, B.;
2012 / IEEE
By: Coldren, L.A.; Binetti, P.R.A.; Bhardwaj, A.; Norberg, E.J.; Guzzon, R.S.; Parker, J.S.;
By: Coldren, L.A.; Binetti, P.R.A.; Bhardwaj, A.; Norberg, E.J.; Guzzon, R.S.; Parker, J.S.;
2012 / IEEE
By: Andrekson, P.A.; Karlsson, M.; Gustavsson, J.S.; Haglund, A.; Agrell, E.; Karout, J.; Westbergh, P.; Szczerba, K.; Larsson, A.;
By: Andrekson, P.A.; Karlsson, M.; Gustavsson, J.S.; Haglund, A.; Agrell, E.; Karout, J.; Westbergh, P.; Szczerba, K.; Larsson, A.;
2012 / IEEE
By: Aamer, M.; Gutierrez, A.M.; Brimont, A.; Sanchis, P.; Thomson, D.J.; Marti, J.; Reed, G.T.; Fedeli, J.; Gardes, F.Y.;
By: Aamer, M.; Gutierrez, A.M.; Brimont, A.; Sanchis, P.; Thomson, D.J.; Marti, J.; Reed, G.T.; Fedeli, J.; Gardes, F.Y.;
2012 / IEEE
By: Xiang Liu; Benyuan Zhu; Yan, M.F.; Fini, J.M.; Chandrasekhar, S.; Dimarcello, F.V.; Monberg, E.M.; Fishteyn, M.; Taunay, T.F.;
By: Xiang Liu; Benyuan Zhu; Yan, M.F.; Fini, J.M.; Chandrasekhar, S.; Dimarcello, F.V.; Monberg, E.M.; Fishteyn, M.; Taunay, T.F.;
2012 / IEEE
By: Tsuritani, T.; Lei Liu; Hayashi, R.; Kubo, K.; Yoshida, S.; Shaowei Huang; Nishioka, I.;
By: Tsuritani, T.; Lei Liu; Hayashi, R.; Kubo, K.; Yoshida, S.; Shaowei Huang; Nishioka, I.;
2012 / IEEE
By: Voigt, K.; Rahim, A.; Bruns, J.; Schwarz, S.; Kroushkov, D.I.; Petermann, K.; Schaffer, C.G.; Arnous, M.T.;
By: Voigt, K.; Rahim, A.; Bruns, J.; Schwarz, S.; Kroushkov, D.I.; Petermann, K.; Schaffer, C.G.; Arnous, M.T.;
2012 / IEEE
By: Goetz, P.G.; Reese, S.; Mahon, R.; Murphy, J.L.; Ferraro, M.S.; Suite, M.R.; Smith, W.R.; Burris, H.R.; Moore, C.I.; Schultz, W.W.; Freeman, W.T.; Frawley, S.J.; Mathieu, B.M.; Hacker, K.; Rabinovich, W.S.;
By: Goetz, P.G.; Reese, S.; Mahon, R.; Murphy, J.L.; Ferraro, M.S.; Suite, M.R.; Smith, W.R.; Burris, H.R.; Moore, C.I.; Schultz, W.W.; Freeman, W.T.; Frawley, S.J.; Mathieu, B.M.; Hacker, K.; Rabinovich, W.S.;
2012 / IEEE
By: Hayden, O.; Tedde, S.F.; Rajbhandari, S.; Arca, F.; Papakonstantinou, I.; Hoa Le Minh; Ghassemlooy, Z.; Haigh, P.A.;
By: Hayden, O.; Tedde, S.F.; Rajbhandari, S.; Arca, F.; Papakonstantinou, I.; Hoa Le Minh; Ghassemlooy, Z.; Haigh, P.A.;
2012 / IEEE
By: Salsi, M.; Bigo, S.; Charlet, G.; Tran, P.; Mardoyan, H.; Bertran-Pardo, O.; Renaudier, J.;
By: Salsi, M.; Bigo, S.; Charlet, G.; Tran, P.; Mardoyan, H.; Bertran-Pardo, O.; Renaudier, J.;
2012 / IEEE
By: Kai Shi; Browning, C.; Barry, L.P.; Cardiff, B.; Smyth, F.; Anandarajah, P.M.; Latkowski, S.;
By: Kai Shi; Browning, C.; Barry, L.P.; Cardiff, B.; Smyth, F.; Anandarajah, P.M.; Latkowski, S.;
2012 / IEEE
By: Bunge, C.-A.; Strauss, U.; Muller, J.; Loquai, S.; Ziemann, O.; Vinogradov, J.; Kruglov, R.;
By: Bunge, C.-A.; Strauss, U.; Muller, J.; Loquai, S.; Ziemann, O.; Vinogradov, J.; Kruglov, R.;
2012 / IEEE
By: Akella, V.; Nitta, C.; Xiaohui Ye; Runxiang Yu; Yawei Yin; Proietti, R.; Yoo, S.J.B.;
By: Akella, V.; Nitta, C.; Xiaohui Ye; Runxiang Yu; Yawei Yin; Proietti, R.; Yoo, S.J.B.;
2012 / IEEE
By: Hongyun Meng; Wei Wang; Xuguang Huang; Chunhua Tan; Hongchao Xue; Wei Wang; Xiaowei Wu;
By: Hongyun Meng; Wei Wang; Xuguang Huang; Chunhua Tan; Hongchao Xue; Wei Wang; Xiaowei Wu;
2012 / IEEE
By: Ping Yu; Ting Hu; Chen Qiu; Wanjun Wang; Huiye Qiu; Jianyi Yang; Xiaoqing Jiang; Yong Zhao;
By: Ping Yu; Ting Hu; Chen Qiu; Wanjun Wang; Huiye Qiu; Jianyi Yang; Xiaoqing Jiang; Yong Zhao;
2012 / IEEE
By: Tur, M.; Dolinar, S.; Erkmen, B.I.; Birnbaum, K.M.; Hao Huang; Yongxiong Ren; Willner, A.E.; Lin Zhang; Jeng-Yuan Yang; Ahmed, N.; Yan Yan; Yang Yue;
By: Tur, M.; Dolinar, S.; Erkmen, B.I.; Birnbaum, K.M.; Hao Huang; Yongxiong Ren; Willner, A.E.; Lin Zhang; Jeng-Yuan Yang; Ahmed, N.; Yan Yan; Yang Yue;
2012 / IEEE
By: Bellanca, G.; Malaguti, S.; de Rossi, A.; Combrie, S.; Lehoucq, G.; Trillo, S.; Simon, J.C.; Bramerie, L.; Gay, M.; Lengle, K.;
By: Bellanca, G.; Malaguti, S.; de Rossi, A.; Combrie, S.; Lehoucq, G.; Trillo, S.; Simon, J.C.; Bramerie, L.; Gay, M.; Lengle, K.;
2012 / IEEE
By: Avramopoulos, H.; Apostolopoulos, D.; Giannoulis, G.; Dereux, A.; Pleros, N.; Vyrsokinos, K.; Papaioannou, S.; Kalavrouziotis, D.; Markey, L.;
By: Avramopoulos, H.; Apostolopoulos, D.; Giannoulis, G.; Dereux, A.; Pleros, N.; Vyrsokinos, K.; Papaioannou, S.; Kalavrouziotis, D.; Markey, L.;
2012 / IEEE
By: Hashizume, Y.; Suzuki, K.; Mizuno, T.; Ono, H.; Abe, Y.; Takara, H.; Matsuo, S.; Takenaga, K.; Takahashi, T.;
By: Hashizume, Y.; Suzuki, K.; Mizuno, T.; Ono, H.; Abe, Y.; Takara, H.; Matsuo, S.; Takenaga, K.; Takahashi, T.;
2012 / IEEE
By: Fang-Ming Wu; Chun-Hung Ho; Hou-Tzu Huang; Cheng-Wei Chen; Chia-Chien Wei; Chun-Ting Lin;
By: Fang-Ming Wu; Chun-Hung Ho; Hou-Tzu Huang; Cheng-Wei Chen; Chia-Chien Wei; Chun-Ting Lin;
2012 / IEEE
By: Liu, A.Q.; Bo Chen; Lei Gao; Man Ying Lam; Yuen Hong Tsang; Ming Feng; Ning Wang; Zhiqing Feng; Xuming Zhang;
By: Liu, A.Q.; Bo Chen; Lei Gao; Man Ying Lam; Yuen Hong Tsang; Ming Feng; Ning Wang; Zhiqing Feng; Xuming Zhang;
2012 / IEEE
By: Chen, E.Y.; Gomez, L.T.; Pardo, F.; Cappuzzo, M.A.; Earnshaw, M.P.; Kun-Yii Tu; Chen, Y.; Rasras, M.S.; DeSalvo, R.; Middleton, C.; Meredith, S.; Peach, R.; Wu, M.C.; Wyrwas, J.M.; Buhl, L.; Bolle, C.; Keller, B.; Klemens, F.;
By: Chen, E.Y.; Gomez, L.T.; Pardo, F.; Cappuzzo, M.A.; Earnshaw, M.P.; Kun-Yii Tu; Chen, Y.; Rasras, M.S.; DeSalvo, R.; Middleton, C.; Meredith, S.; Peach, R.; Wu, M.C.; Wyrwas, J.M.; Buhl, L.; Bolle, C.; Keller, B.; Klemens, F.;
2012 / IEEE
By: Klaus, W.; Watanabe, M.; Kobayashi, T.; Wada, N.; Awaji, Y.; Puttnam, B.J.; Sakaguchi, J.;
By: Klaus, W.; Watanabe, M.; Kobayashi, T.; Wada, N.; Awaji, Y.; Puttnam, B.J.; Sakaguchi, J.;
2012 / IEEE
By: Wei Pan; Nianqiang Li; Shuiying Xiang; Ning Jiang; Xihua Zou; Lianshan Yan; Bin Luo;
By: Wei Pan; Nianqiang Li; Shuiying Xiang; Ning Jiang; Xihua Zou; Lianshan Yan; Bin Luo;
2011 / IEEE / 978-1-86135-373-3
By: Troska, J.; Vasey, F.; Papakonstantinou, I.; Papadopoulos, S.; Darwazeh, I.;
By: Troska, J.; Vasey, F.; Papakonstantinou, I.; Papadopoulos, S.; Darwazeh, I.;
2011 / IEEE / 978-3-8007-3356-9
By: Adachi, K.; Tsuji, S.; Sugawara, T.; Matsuoka, Y.; Kitatani, T.; Shinoda, K.;
By: Adachi, K.; Tsuji, S.; Sugawara, T.; Matsuoka, Y.; Kitatani, T.; Shinoda, K.;
2011 / IEEE / 978-1-4244-5731-1
By: Segawa, T.; Urata, R.; Nakahara, T.; Takahashi, R.; Suzaki, Y.; Takenouchi, H.;
By: Segawa, T.; Urata, R.; Nakahara, T.; Takahashi, R.; Suzaki, Y.; Takenouchi, H.;