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Topic: Noise Measurement
Results
2011 / IEEE
By: Marcu, C.; Jiashu Chen; Tabesh, M.; Alon, E.; Niknejad, A.M.; Shinwon Kang; Lingkai Kong;
By: Marcu, C.; Jiashu Chen; Tabesh, M.; Alon, E.; Niknejad, A.M.; Shinwon Kang; Lingkai Kong;
2011 / IEEE
By: Young-Su Kim; Seung-Dong Yang; Ho-Jin Yun; Yu-Mi Kim; Min-Ho Kang; Ga-Won Lee; Kwang-Seok Jeong; Hi-Deok Lee;
By: Young-Su Kim; Seung-Dong Yang; Ho-Jin Yun; Yu-Mi Kim; Min-Ho Kang; Ga-Won Lee; Kwang-Seok Jeong; Hi-Deok Lee;
2011 / IEEE
By: Fan Zhang; Xing Li; Mo Wu; Kayis, C.; Avrutin, V.; Congyong Zhu; Morkoc, H.; Ozgur, U.;
By: Fan Zhang; Xing Li; Mo Wu; Kayis, C.; Avrutin, V.; Congyong Zhu; Morkoc, H.; Ozgur, U.;
2011 / IEEE
By: Kan Wu; Lee, K.E.K.; Huy Quoc Lam; Jia Haur Wong; Chunmei Ouyang; Aditya, S.; Shum, P.P.;
By: Kan Wu; Lee, K.E.K.; Huy Quoc Lam; Jia Haur Wong; Chunmei Ouyang; Aditya, S.; Shum, P.P.;
2012 / IEEE
By: Zimmer, T.; Happy, H.; Meng, N.; Maneux, C.; Grandchamp, B.; Majek, C.; Fregonese, S.; Hainaut, C.;
By: Zimmer, T.; Happy, H.; Meng, N.; Maneux, C.; Grandchamp, B.; Majek, C.; Fregonese, S.; Hainaut, C.;
2012 / IEEE
By: Green, J.E.; David, J.P.R.; Sandvik, P.M.; Soloviev, S.I.; Wei Sun Loh; Tozer, R.C.; Ng, B.K.; Marshall, A.R.J.;
By: Green, J.E.; David, J.P.R.; Sandvik, P.M.; Soloviev, S.I.; Wei Sun Loh; Tozer, R.C.; Ng, B.K.; Marshall, A.R.J.;