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Topic: Noise Level
Results
2012 / IEEE
By: Zimmer, T.; Happy, H.; Meng, N.; Maneux, C.; Grandchamp, B.; Majek, C.; Fregonese, S.; Hainaut, C.;
By: Zimmer, T.; Happy, H.; Meng, N.; Maneux, C.; Grandchamp, B.; Majek, C.; Fregonese, S.; Hainaut, C.;
2012 / IEEE
By: Ferreira, R.; Cardoso, S.; Lopes, A.; Gameiro, L.; Janeiro, R.J.; Freitas, P.P.; Paz, E.;
By: Ferreira, R.; Cardoso, S.; Lopes, A.; Gameiro, L.; Janeiro, R.J.; Freitas, P.P.; Paz, E.;
A Diversity Compression and Combining Technique Based on Channel Shortening for Cooperative Networks
2012 / IEEEBy: Hussain, S.I.; Hasna, M.O.; Alouini, M.;
2012 / IEEE
By: Lopez-Quiroz, P.; Doin, M.P.; Yajing Yan; Trouve, E.; Pinel, V.; Fruneau, B.; Tupin, F.;
By: Lopez-Quiroz, P.; Doin, M.P.; Yajing Yan; Trouve, E.; Pinel, V.; Fruneau, B.; Tupin, F.;
2011 / IEEE / 978-1-4577-0088-0
By: Carreras, N.; Shariat-Panahi, S.; Molino, E.; Owen, T.; Lazaro, A.M.; Artero, C.;
By: Carreras, N.; Shariat-Panahi, S.; Molino, E.; Owen, T.; Lazaro, A.M.; Artero, C.;
2011 / IEEE / 978-1-4577-0192-4
By: Martin, S.; Sanchez-Garcia, M.A.; Grandal, J.; Vilalta-Clemente, A.; Mechin, L.; Calle, F.; Mutta, G.R.; Routoure, J.-M.; Guillet, B.; Ruterana, P.;
By: Martin, S.; Sanchez-Garcia, M.A.; Grandal, J.; Vilalta-Clemente, A.; Mechin, L.; Calle, F.; Mutta, G.R.; Routoure, J.-M.; Guillet, B.; Ruterana, P.;
Development of GIS based noise simulation model: A case study of Mumbai India Development of GIS-NSM
2011 / IEEE / 978-1-61284-774-0By: Vijay, R.; Sharma, A.; Sohony, R.;
2011 / IEEE / 978-1-4577-0845-9
By: Solignac, T.; Mirbach, B.; Aouada, D.; Garcia, F.; Ottersten, B.;
By: Solignac, T.; Mirbach, B.; Aouada, D.; Garcia, F.; Ottersten, B.;
2011 / IEEE / 978-1-4577-1589-1
By: Deblaere, K.; Pizurica, A.; Vansteenkiste, E.; Platisa, L.; Segers, I.; Despotovic, I.; Philips, W.;
By: Deblaere, K.; Pizurica, A.; Vansteenkiste, E.; Platisa, L.; Segers, I.; Despotovic, I.; Philips, W.;
2011 / IEEE / 978-966-335-357-9
By: Zharkov, J.D.; Dmitriev, B.S.; Stepanov, A.O.; Skorokhodov, V.N.; Sadovnikov, S.A.;
By: Zharkov, J.D.; Dmitriev, B.S.; Stepanov, A.O.; Skorokhodov, V.N.; Sadovnikov, S.A.;
2011 / IEEE / 978-1-4244-9306-7
By: Song Hongchao; Hou Xuefeng; Zhao Xiaoxu; Yuanyuan Shang; Baoyuan Han;
By: Song Hongchao; Hou Xuefeng; Zhao Xiaoxu; Yuanyuan Shang; Baoyuan Han;
2011 / IEEE / 978-1-4673-0120-6
By: Martin, R.; Loach, J.; Amman, M.; Detwiler, J.; Yuen-Dat Chan; Poon, A.; Luke, P.; Barton, P.; Vetter, K.; Tindall, C.;
By: Martin, R.; Loach, J.; Amman, M.; Detwiler, J.; Yuen-Dat Chan; Poon, A.; Luke, P.; Barton, P.; Vetter, K.; Tindall, C.;
2011 / IEEE / 978-1-4577-1676-8
By: Gadeo-Martos, M.A.; Fernandez-Prieto, J.A.; Mariscal-Ramirez, J.A.; Canada-Bago, J.;
By: Gadeo-Martos, M.A.; Fernandez-Prieto, J.A.; Mariscal-Ramirez, J.A.; Canada-Bago, J.;
2012 / IEEE / 978-1-4577-1216-6
By: Grinberg, R.; Hensgens, N.; De La Parra, H.Z.; Canales, F.; Dujic, D.;
By: Grinberg, R.; Hensgens, N.; De La Parra, H.Z.; Canales, F.; Dujic, D.;
2011 / IEEE / 978-1-4577-0611-0
By: Abacherli, R.; Christov, I.; Dotsinsky, I.; Krasteva, V.; Jekova, I.;
By: Abacherli, R.; Christov, I.; Dotsinsky, I.; Krasteva, V.; Jekova, I.;
2012 / IEEE / 978-1-4673-0747-5
By: Xin Zhang; Bingjun Han; Dacheng Yang; Yitong Liu; Yuehong Gao; Yifei Qi;
By: Xin Zhang; Bingjun Han; Dacheng Yang; Yitong Liu; Yuehong Gao; Yifei Qi;
2012 / IEEE / 978-1-4673-0658-4
By: Hongwei Liu; Lan Du; Zheng Bao; Mian Pan; Bo Feng; Penghui Wang;
By: Hongwei Liu; Lan Du; Zheng Bao; Mian Pan; Bo Feng; Penghui Wang;