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Topic: Nickel
Results
2011 / IEEE
By: Sasaki, T.; Akutsu, H.; Hokazono, A.; Sonehara, T.; Uchida, H.; Toyoshima, Y.; Inaba, S.; Kawanaka, S.; Tomita, M.;
By: Sasaki, T.; Akutsu, H.; Hokazono, A.; Sonehara, T.; Uchida, H.; Toyoshima, Y.; Inaba, S.; Kawanaka, S.; Tomita, M.;
2011 / IEEE
By: Li-Han Chen; Villwock, D.; Cihan Kuru; Daehoon Hong; Sungho Jin; Young Oh; Kunbae Noh; Chulmin Choi;
By: Li-Han Chen; Villwock, D.; Cihan Kuru; Daehoon Hong; Sungho Jin; Young Oh; Kunbae Noh; Chulmin Choi;
2011 / IEEE
By: Suzuki, T.; Fukami, S.; Tanigawa, H.; Ueda, K.; Chiba, D.; Ohshima, N.; Ono, T.; Koyama, T.; Nakatani, Y.; Ishiwata, N.;
By: Suzuki, T.; Fukami, S.; Tanigawa, H.; Ueda, K.; Chiba, D.; Ohshima, N.; Ono, T.; Koyama, T.; Nakatani, Y.; Ishiwata, N.;
2011 / IEEE
By: Matsumoto, Y.; Kato, T.; Iwata, S.; Tsunashima, S.; Okamoto, S.; Nishizawa, N.; Kitakami, O.; Kikuchi, N.;
By: Matsumoto, Y.; Kato, T.; Iwata, S.; Tsunashima, S.; Okamoto, S.; Nishizawa, N.; Kitakami, O.; Kikuchi, N.;
2012 / IEEE
By: Yoon Hee Jeong; Yong-Woo Lee; Sam Jin Kim; Woo Jun Kwon; Bo Ra Myoung; Chul Sung Kim;
By: Yoon Hee Jeong; Yong-Woo Lee; Sam Jin Kim; Woo Jun Kwon; Bo Ra Myoung; Chul Sung Kim;
2011 / IEEE
By: Coste, P.; Brault, S.; Lefeuvre, E.; Fabbri, F.; Schelcher, G.; Parrain, F.; Dufour-Gergam, E.;
By: Coste, P.; Brault, S.; Lefeuvre, E.; Fabbri, F.; Schelcher, G.; Parrain, F.; Dufour-Gergam, E.;
2012 / IEEE
By: Quetz, A.; Samanta, T.; Dubenko, I.; Ali, N.; Zhukov, A.; Granovsky, A.; Kazakov, A.; Prestigiacomo, J.; Adams, P.W.; Stadler, S.; Prudnikov, V.; Mettus, D.; Rodionov, I.;
By: Quetz, A.; Samanta, T.; Dubenko, I.; Ali, N.; Zhukov, A.; Granovsky, A.; Kazakov, A.; Prestigiacomo, J.; Adams, P.W.; Stadler, S.; Prudnikov, V.; Mettus, D.; Rodionov, I.;
2012 / IEEE
By: Kiermaier, J.; Bartel, A.; Eichwald, I.; Becherer, M.; Schmitt-Landsiedel, D.; Csaba, G.; Breitkreutz, S.;
By: Kiermaier, J.; Bartel, A.; Eichwald, I.; Becherer, M.; Schmitt-Landsiedel, D.; Csaba, G.; Breitkreutz, S.;
2012 / IEEE
By: Tsunashima, S.; Kashima, S.; Matsumoto, Y.; Kato, T.; Okamoto, S.; Kitakami, O.; Iwata, S.; Kikuchi, N.;
By: Tsunashima, S.; Kashima, S.; Matsumoto, Y.; Kato, T.; Okamoto, S.; Kitakami, O.; Iwata, S.; Kikuchi, N.;
2012 / IEEE
By: Chia-Chun Liao; Yi-Hsuan Chen; Rou-Han Kuo; Li-Chen Yen; Po-Yi Kuo; Yi-Hsien Lu; Je-Wei Lin; Yi-Hong Wu; Tien-Sheng Chao;
By: Chia-Chun Liao; Yi-Hsuan Chen; Rou-Han Kuo; Li-Chen Yen; Po-Yi Kuo; Yi-Hsien Lu; Je-Wei Lin; Yi-Hong Wu; Tien-Sheng Chao;
2012 / IEEE
By: Takei, K.; Hazeghi, A.; Yang Chai; Wong, H.-S.P.; Javey, A.; Chan, P.C.H.; Hong-Yu Chen;
By: Takei, K.; Hazeghi, A.; Yang Chai; Wong, H.-S.P.; Javey, A.; Chan, P.C.H.; Hong-Yu Chen;
2012 / IEEE
By: Wiley, J.B.; Jin-Hee Lim; Tripathy, J.; Eskandari, R.; Gaffney, J.; Seonggi Min; Malkinski, L.;
By: Wiley, J.B.; Jin-Hee Lim; Tripathy, J.; Eskandari, R.; Gaffney, J.; Seonggi Min; Malkinski, L.;
Modeling and Estimation of One-Shot Random Access for Finite-User Multichannel Slotted ALOHA Systems
2012 / IEEEBy: Tsao, Shiao-Li; Cheng, Ray-Guang; Wei, Chia-Hung;
2012 / IEEE
By: Tai-Fa Young; Bae-Heng Tseng; Der-Shin Gan; Ya-Hsiang Tai; Shih-Kun Liu; Hui-Chun Huang; Ya-Liang Yang; Min-Chen Chen; Guan-Ru Liu; Geng-Wei Chang; Siang-Lan Chuang; Yong-En Syu; Ting-Chang Chang; Kuan-Chang Chang; Tsung-Ming Tsai; Sze, S.M.; Hao Wang; Cong Ye; Ming-Jinn Tsai; Kai-Huang Chen;
By: Tai-Fa Young; Bae-Heng Tseng; Der-Shin Gan; Ya-Hsiang Tai; Shih-Kun Liu; Hui-Chun Huang; Ya-Liang Yang; Min-Chen Chen; Guan-Ru Liu; Geng-Wei Chang; Siang-Lan Chuang; Yong-En Syu; Ting-Chang Chang; Kuan-Chang Chang; Tsung-Ming Tsai; Sze, S.M.; Hao Wang; Cong Ye; Ming-Jinn Tsai; Kai-Huang Chen;
2012 / IEEE
By: Shih-Ming Wang; Sheng-Joue Young; Bohr-Ran Huang; Shoou-Jinn Chang; Chih-Hung Hsiao; Tse-Pu Chen; Chun-Bo Yang; San-Lein Wu;
By: Shih-Ming Wang; Sheng-Joue Young; Bohr-Ran Huang; Shoou-Jinn Chang; Chih-Hung Hsiao; Tse-Pu Chen; Chun-Bo Yang; San-Lein Wu;
2012 / IEEE
By: Hong-Sik Shin; Min-Ho Kang; Jammy, R.; Hi-Deok Lee; Jung-Ho Yoo; Majhi, P.; Jung-Woo Oh; Ga-Won Lee;
By: Hong-Sik Shin; Min-Ho Kang; Jammy, R.; Hi-Deok Lee; Jung-Ho Yoo; Majhi, P.; Jung-Woo Oh; Ga-Won Lee;
2012 / IEEE
By: Wen-Hwa Chen; Tai-Hong Chen; Yu-Ming Tsai; Hsien-Chie Cheng; Jing-Ye Juang; Su-Tsai Lu;
By: Wen-Hwa Chen; Tai-Hong Chen; Yu-Ming Tsai; Hsien-Chie Cheng; Jing-Ye Juang; Su-Tsai Lu;
Impacts of the Underlying Insulating Layers on the MILC Growth Length and Electrical Characteristics
2012 / IEEEBy: Min-Chen Lin; Chia-Chun Liao; Tien-Sheng Chao; Shao-Xuan Liu;