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Topic: Network-on-chip
Results
2011 / IEEE
By: Chi-Sang Poon; Yakovlev, A.; Yicong Meng; Kai-Pui Lam; Kuan Zhou; Al-Dujaily, R.; Mak, T.;
By: Chi-Sang Poon; Yakovlev, A.; Yicong Meng; Kai-Pui Lam; Kuan Zhou; Al-Dujaily, R.; Mak, T.;
2012 / IEEE
By: Kim, Joo-Young; Lee, Seungjin; Park, Junyoung; Hong, Injoon; Woo, Jeong-Ho; Oh, Jinwook; Kim, Gyeonghoon; Yoo, Hoi-Jun;
By: Kim, Joo-Young; Lee, Seungjin; Park, Junyoung; Hong, Injoon; Woo, Jeong-Ho; Oh, Jinwook; Kim, Gyeonghoon; Yoo, Hoi-Jun;
2012 / IEEE
By: Carloni, L.P.; Mantovani, P.; Warren, S.; Petracca, M.; Sturcken, N.; Shepard, K.L.; Peterchev, A.V.;
By: Carloni, L.P.; Mantovani, P.; Warren, S.; Petracca, M.; Sturcken, N.; Shepard, K.L.; Peterchev, A.V.;
2012 / IEEE
By: Keun Sup Shim; Myong Hyon Cho; Lis, M.; Pengju Ren; Fletcher, C.W.; Devadas, S.; Nanning Zheng; Khan, O.;
By: Keun Sup Shim; Myong Hyon Cho; Lis, M.; Pengju Ren; Fletcher, C.W.; Devadas, S.; Nanning Zheng; Khan, O.;
2012 / IEEE
By: Ming Gao; Lisherness, P.; Yan Zheng; Shiyuan Yang; Hong Wang; Kwang-Ting Cheng; Bovington, J.;
By: Ming Gao; Lisherness, P.; Yan Zheng; Shiyuan Yang; Hong Wang; Kwang-Ting Cheng; Bovington, J.;
2012 / IEEE
By: Sylvester, D.; Wenisch, T.F.; Das, R.; Cieslak, M.; Blake, G.; Pinckney, N.; Blaauw, D.; Manville, T.; Dreslinski, R.G.; Sewell, K.; Satpathy, S.; Mudge, T.;
By: Sylvester, D.; Wenisch, T.F.; Das, R.; Cieslak, M.; Blake, G.; Pinckney, N.; Blaauw, D.; Manville, T.; Dreslinski, R.G.; Sewell, K.; Satpathy, S.; Mudge, T.;
2012 / IEEE
By: Giovannini, P.; Beanato, G.; Leblebici, Y.; Temiz, Y.; Zervas, M.; Athanasopoulos, P.; Cevrero, A.;
By: Giovannini, P.; Beanato, G.; Leblebici, Y.; Temiz, Y.; Zervas, M.; Athanasopoulos, P.; Cevrero, A.;
2009 / IEEE / 978-1-4577-0236-5
By: Carro, L.; Concatto, C.; Matos, D.; Susin, A.; Kreutz, M.; Kastensmidt, F.;
By: Carro, L.; Concatto, C.; Matos, D.; Susin, A.; Kreutz, M.; Kastensmidt, F.;
2011 / IEEE / 978-1-4577-0642-4
By: Daneshtalab, M.; Tenhunen, H.; Plosila, J.; Liljeberg, P.; Ebrahimi, M.;
By: Daneshtalab, M.; Tenhunen, H.; Plosila, J.; Liljeberg, P.; Ebrahimi, M.;
2011 / IEEE / 978-1-61284-383-4
By: Alfaro, F.J.; Andujar, F.J.; Trivino, F.; Ros, A.; Sanchez, J.L.;
By: Alfaro, F.J.; Andujar, F.J.; Trivino, F.; Ros, A.; Sanchez, J.L.;
2011 / IEEE / 978-1-4577-0642-4
By: Farisi, B.A.; Vancayseele, R.; Stroobandt, D.; Bruneel, K.; Heirman, W.;
By: Farisi, B.A.; Vancayseele, R.; Stroobandt, D.; Bruneel, K.; Heirman, W.;
2011 / IEEE / 978-1-4577-0642-4
By: Ying, H.; Jaiswal, A.; Samman, F.A.; Hollstein, T.; Hofmann, K.; Glesner, M.;
By: Ying, H.; Jaiswal, A.; Samman, F.A.; Hollstein, T.; Hofmann, K.; Glesner, M.;
2011 / IEEE / 978-1-4577-0642-4
By: Ost, L.; Moraes, F.; Robert, M.; Indrusiak, L.S.; Mandelli, M.; Sassatelli, G.; Varyani, S.; Wachter, E.; Almeida, G.M.;
By: Ost, L.; Moraes, F.; Robert, M.; Indrusiak, L.S.; Mandelli, M.; Sassatelli, G.; Varyani, S.; Wachter, E.; Almeida, G.M.;
2011 / IEEE / 978-1-4577-0642-4
By: Plosila, J.; Liljeberg, P.; Daneshtalab, M.; Ebrahimi, M.; Tenhunen, H.;
By: Plosila, J.; Liljeberg, P.; Daneshtalab, M.; Ebrahimi, M.; Tenhunen, H.;
2011 / IEEE / 978-1-4577-0803-9
By: Weichen Liu; Zhehui Wang; Nikdast, M.; Wei Zhang; Jiang Xu; Xuan Wang; Yaoyao Ye; Xiaowen Wu;
By: Weichen Liu; Zhehui Wang; Nikdast, M.; Wei Zhang; Jiang Xu; Xuan Wang; Yaoyao Ye; Xiaowen Wu;
2011 / IEEE / 978-1-4577-0803-9
By: Jinwen Li; Minxuan Zhang; Chaochao Feng; Jantsch, A.; Zhonghai Lu; Jiang Jiang;
By: Jinwen Li; Minxuan Zhang; Chaochao Feng; Jantsch, A.; Zhonghai Lu; Jiang Jiang;
2011 / IEEE / 978-1-4577-0803-9
By: Benini, L.; Kamakoti, V.; Murali, S.; Kumar, M.P.; Kumar, A.S.; De Micheli, G.;
By: Benini, L.; Kamakoti, V.; Murali, S.; Kumar, M.P.; Kumar, A.S.; De Micheli, G.;
2011 / IEEE / 978-1-4577-0803-9
By: Murali, S.; Kumar, A.S.; Kumar, M.P.; Veezhinathan, K.; Benini, L.;
By: Murali, S.; Kumar, A.S.; Kumar, M.P.; Veezhinathan, K.; Benini, L.;
2011 / IEEE / 978-1-61284-486-2
By: Hengzhu Liu; Jantsch, A.; Zhonghai Lu; Wenmin Hu; Dongpei Liu; Shixian Wang;
By: Hengzhu Liu; Jantsch, A.; Zhonghai Lu; Wenmin Hu; Dongpei Liu; Shixian Wang;
2011 / IEEE / 978-1-4577-0803-9
By: Xiaowen Wu; Jiang Xu; Yaoyao Ye; Weichen Liu; Wei Zhang; Zhehui Wang; Nikdast, M.; Xuan Wang;
By: Xiaowen Wu; Jiang Xu; Yaoyao Ye; Weichen Liu; Wei Zhang; Zhehui Wang; Nikdast, M.; Xuan Wang;