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Topic: Network Analysers
Results
2012 / IEEE
By: Ghasr, M.T.; Kothari, A.; Baumgartner, M.A.; Fallahpour, M.; Zoughi, R.; Pommerenke, D.;
By: Ghasr, M.T.; Kothari, A.; Baumgartner, M.A.; Fallahpour, M.; Zoughi, R.; Pommerenke, D.;
2012 / IEEE
By: Donaldson, C.R.; Wenlong He; Liang Zhang; Cross, A.W.; Ronald, K.; Young, A.R.; Robertson, C.W.; Whyte, C.G.; Phelps, A.D.R.;
By: Donaldson, C.R.; Wenlong He; Liang Zhang; Cross, A.W.; Ronald, K.; Young, A.R.; Robertson, C.W.; Whyte, C.G.; Phelps, A.D.R.;
2011 / IEEE / 978-1-4244-9563-4
By: Oodachi, N.; Morooka, T.; Obayashi, S.; Shoki, H.; Kudo, H.; Ogawa, K.;
By: Oodachi, N.; Morooka, T.; Obayashi, S.; Shoki, H.; Kudo, H.; Ogawa, K.;
2011 / IEEE / 978-1-4577-1207-4
By: Anh Hoang; Nhan Ai Tran; Nguyen Dat Son; Mau Chien Dang; Fribourg-Blanc, E.; Hong Phuong Phan; Ho Cong Tam Vuong; Thuat Nguyen-Tran;
By: Anh Hoang; Nhan Ai Tran; Nguyen Dat Son; Mau Chien Dang; Fribourg-Blanc, E.; Hong Phuong Phan; Ho Cong Tam Vuong; Thuat Nguyen-Tran;
2011 / IEEE / 978-1-4577-0253-2
By: Farah, T.; Lally, S.; Trajkovic, L.; Al-Rousan, N.; Paul, R.; Gill, R.;
By: Farah, T.; Lally, S.; Trajkovic, L.; Al-Rousan, N.; Paul, R.; Gill, R.;
2011 / IEEE / 978-1-61284-697-2
By: Chee Wee Kim; Jeng Wai Kwan; Tat Meng Chiam; Yu Ge; See, T.S.P.;
By: Chee Wee Kim; Jeng Wai Kwan; Tat Meng Chiam; Yu Ge; See, T.S.P.;
2011 / IEEE / 978-1-4577-0811-4
By: Kuo-Hsien Liao; Chuen-De Wang; Chun-Hsiang Huang; Chih-Ying Hsiao; Tzong-Lin Wu; Chen-Chao Wang; Chia-Hsien Shen;
By: Kuo-Hsien Liao; Chuen-De Wang; Chun-Hsiang Huang; Chih-Ying Hsiao; Tzong-Lin Wu; Chen-Chao Wang; Chia-Hsien Shen;
2011 / IEEE / 978-1-61284-961-4
By: Gaquiere, C.; Tanbakuchi, H.; Theron, D.; Ducatteau, D.; Gloria, D.; Debroucke, R.;
By: Gaquiere, C.; Tanbakuchi, H.; Theron, D.; Ducatteau, D.; Gloria, D.; Debroucke, R.;
2011 / IEEE / 978-1-61284-961-4
By: Zuniga-Juarez, J.E.; Loo-Yau, J.R.; Maya-Sanchez, M.C.; Reynoso-Hernandez, J.A.;
By: Zuniga-Juarez, J.E.; Loo-Yau, J.R.; Maya-Sanchez, M.C.; Reynoso-Hernandez, J.A.;
2011 / IEEE / 978-966-335-357-9
By: Andronov, E.V.; Schurov, V.V.; Fateyev, A.V.; Semibratov, V.P.; Goshin, G.G.;
By: Andronov, E.V.; Schurov, V.V.; Fateyev, A.V.; Semibratov, V.P.; Goshin, G.G.;
2011 / IEEE / 978-1-4577-1769-7
By: Wu YouHong; Men Chuan; Zhang Nian Yong; Yamashita, T.; Kawai, T.; Goto, N.; Futamura, H.; Wu Xiao Qing; Ren Wei;
By: Wu YouHong; Men Chuan; Zhang Nian Yong; Yamashita, T.; Kawai, T.; Goto, N.; Futamura, H.; Wu Xiao Qing; Ren Wei;
2011 / IEEE / 978-1-61284-712-2
By: Weigel, R.; Kissinger, D.; Scheytt, C.; Schmalz, K.; Laemmle, B.;
By: Weigel, R.; Kissinger, D.; Scheytt, C.; Schmalz, K.; Laemmle, B.;
2011 / IEEE / 978-1-61284-965-2
By: Gonzalo, R.; Ederra, I.; Teniente, J.; Maestrojuan, I.; Palacios, I.; Iriarte, J.C.; Etayo, D.;
By: Gonzalo, R.; Ederra, I.; Teniente, J.; Maestrojuan, I.; Palacios, I.; Iriarte, J.C.; Etayo, D.;
2011 / IEEE / 978-1-4577-0027-9
By: Mau Chien Dang; Thuat Nguyen-Tran; Tien Thong Pham; Van Hieu Nguyen; Anh Hoang; Nhan Ai Tran; Hong Phuong Phan; Fribourg-Blanc, E.; Dat Son Nguyen; Ho Cong Tam Vuong;
By: Mau Chien Dang; Thuat Nguyen-Tran; Tien Thong Pham; Van Hieu Nguyen; Anh Hoang; Nhan Ai Tran; Hong Phuong Phan; Fribourg-Blanc, E.; Dat Son Nguyen; Ho Cong Tam Vuong;
2011 / IEEE / 978-1-4577-0509-0
By: Duan, Y.; Kai Hui; Durant, S.; Foley, B.; Crowe, T.W.; Hesler, J.L.;
By: Duan, Y.; Kai Hui; Durant, S.; Foley, B.; Crowe, T.W.; Hesler, J.L.;
2011 / IEEE / 978-2-87487-022-4
By: Doerner, R.; Schmiickle, F.J.; Arz, U.; Williams, D.; Heinrich, W.; Phung, G.N.;
By: Doerner, R.; Schmiickle, F.J.; Arz, U.; Williams, D.; Heinrich, W.; Phung, G.N.;
2011 / IEEE / 978-2-87487-023-1
By: Ouhachi, R.; Gloria, D.; Chevalier, P.; Lacave, T.; Gaquiere, D.D.C.;
By: Ouhachi, R.; Gloria, D.; Chevalier, P.; Lacave, T.; Gaquiere, D.D.C.;
2011 / IEEE / 978-0-85825-974-4
By: Sung-Mao Wu; Reng-Fang Hsu; Cheng-Han Huang; Cheng-Chang Chen; Yung-Chi Tang;
By: Sung-Mao Wu; Reng-Fang Hsu; Cheng-Han Huang; Cheng-Chang Chen; Yung-Chi Tang;
2012 / IEEE / 978-1-4673-0886-1
By: Zarim, Z.A.A.; Ghani, A.B.; Hock, G.C.; Chakrabarty, C.K.; Raymond, W.J.K.;
By: Zarim, Z.A.A.; Ghani, A.B.; Hock, G.C.; Chakrabarty, C.K.; Raymond, W.J.K.;
2012 / IEEE / 978-3-9812668-4-9
By: Sterns, M.; Hrobak, M.; Schmidt, L.-P.; Schramm, M.; Schrauder, T.; Seler, E.;
By: Sterns, M.; Hrobak, M.; Schmidt, L.-P.; Schramm, M.; Schrauder, T.; Seler, E.;
2012 / IEEE / 978-1-4673-1236-3
By: Takizawa, K.; Kobayashi, T.; Takada, J.; Aoyagi, T.; Kohno, R.; Yazdandoost, K.Y.; Miura, R.; Hamaguchi, K.; Hernandez, M.; Huan-Bang Li;
By: Takizawa, K.; Kobayashi, T.; Takada, J.; Aoyagi, T.; Kohno, R.; Yazdandoost, K.Y.; Miura, R.; Hamaguchi, K.; Hernandez, M.; Huan-Bang Li;
2012 / IEEE / 978-1-4673-0658-4
By: Colburn, J.S.; Geary, K.; Litkouhi, B.; Shuqing Zeng; Bekaryan, A.;
By: Colburn, J.S.; Geary, K.; Litkouhi, B.; Shuqing Zeng; Bekaryan, A.;