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Topic: Needles
Results
2011 / IEEE
By: Kallem, V.; Majewicz, A.; Reed, K.B.; Okamura, A.M.; Cowan, N.J.; Goldberg, K.; Alterovitz, R.;
By: Kallem, V.; Majewicz, A.; Reed, K.B.; Okamura, A.M.; Cowan, N.J.; Goldberg, K.; Alterovitz, R.;
2012 / IEEE
By: Welch, M.; Jalal, R.; Nagpal, S.; Lasso, A.; Jaeger, M.; Borschneck, D.P.; Fichtinger, G.; Mousavi, P.; Ayukawa, I.; Abolmaesumi, P.; Ungi, T.;
By: Welch, M.; Jalal, R.; Nagpal, S.; Lasso, A.; Jaeger, M.; Borschneck, D.P.; Fichtinger, G.; Mousavi, P.; Ayukawa, I.; Abolmaesumi, P.; Ungi, T.;
2012 / IEEE
By: Camphausen, K.; Cho, N.B.; Sang-Eun Song; Whitcomb, L.L.; Iordachita, I.I.; Kaushal, A.; Fichtinger, G.; Guion, P.;
By: Camphausen, K.; Cho, N.B.; Sang-Eun Song; Whitcomb, L.L.; Iordachita, I.I.; Kaushal, A.; Fichtinger, G.; Guion, P.;
2012 / IEEE
By: Ying Jui Chao; Yi Yuan Chang; Sheng Chieh Huang; Gwo Bin Lee; Xi Zhang Lin; Yan Shen Shan;
By: Ying Jui Chao; Yi Yuan Chang; Sheng Chieh Huang; Gwo Bin Lee; Xi Zhang Lin; Yan Shen Shan;
2012 / IEEE
By: Saunders, C.M.; Wood, B.A.; Robbins, P.D.; Scolaro, L.; Lorenser, D.; Sampson, D.D.; Kirk, R.W.; Curatolo, A.; Quirk, B.C.; McLaughlin, R.A.;
By: Saunders, C.M.; Wood, B.A.; Robbins, P.D.; Scolaro, L.; Lorenser, D.; Sampson, D.D.; Kirk, R.W.; Curatolo, A.; Quirk, B.C.; McLaughlin, R.A.;
2012 / IEEE
By: Abdel Ghafar, H.H.; Elsawah, M.; Garamoon, A.A.; Elakshar, F.F.; Samir, A.; Hassaballa, S.; Morgan, N.N.;
By: Abdel Ghafar, H.H.; Elsawah, M.; Garamoon, A.A.; Elakshar, F.F.; Samir, A.; Hassaballa, S.; Morgan, N.N.;
2012 / IEEE
By: Song, D.Y.; Choti, M.A.; MingDe Lin; van Vledder, M.G.; Marra, S.P.; Majewicz, A.; Okamura, A.M.;
By: Song, D.Y.; Choti, M.A.; MingDe Lin; van Vledder, M.G.; Marra, S.P.; Majewicz, A.; Okamura, A.M.;
2012 / IEEE
By: Dehghan, E.; Salcudean, S. E.; Mahdavi, S. S.; Moradi, M.; Lobo, J. R.; Fichtinger, G.; Morris, W. J.; Deshmukh, S.;
By: Dehghan, E.; Salcudean, S. E.; Mahdavi, S. S.; Moradi, M.; Lobo, J. R.; Fichtinger, G.; Morris, W. J.; Deshmukh, S.;
2012 / IEEE
By: Dankelman, J.; Jansen, F.W.; Rodrigues, S.P.; Horeman, T.; van den Dobbelsteen, J.J.;
By: Dankelman, J.; Jansen, F.W.; Rodrigues, S.P.; Horeman, T.; van den Dobbelsteen, J.J.;
2012 / IEEE
By: Salcudean, S.E.; Fichtinger, G.; Morris, W.J.; Dehghan, E.; Chng, N.; Moradi, M.; Lobo, J.R.;
By: Salcudean, S.E.; Fichtinger, G.; Morris, W.J.; Dehghan, E.; Chng, N.; Moradi, M.; Lobo, J.R.;
2012 / IEEE
By: McGraw, R.C.; Pinter, C.; Lasso, A.; Moult, E.; Sargent, D.; Ungi, T.; Fichtinger, G.;
By: McGraw, R.C.; Pinter, C.; Lasso, A.; Moult, E.; Sargent, D.; Ungi, T.; Fichtinger, G.;
2012 / IEEE
By: Weiwei Li; Ohki, Y.; Benhong Ouyang; Jiankang Zhao; Shengtao Li; Guilai Yin; Jianying Li;
By: Weiwei Li; Ohki, Y.; Benhong Ouyang; Jiankang Zhao; Shengtao Li; Guilai Yin; Jianying Li;
2012 / IEEE
By: Konishi, K.; Hatano, M.; Kato, A.; Suzuki, M.; Kobayashi, Y.; Fujie, M.G.; Hashizume, M.;
By: Konishi, K.; Hatano, M.; Kato, A.; Suzuki, M.; Kobayashi, Y.; Fujie, M.G.; Hashizume, M.;
2010 / IEEE / 978-1-4244-5261-3
By: Corrie, S.; Flaim, C.; Jenkins, D.W.K.; Aljada, M.; Kendall, M.A.F.;
By: Corrie, S.; Flaim, C.; Jenkins, D.W.K.; Aljada, M.; Kendall, M.A.F.;
2011 / IEEE / 978-1-61284-385-8
By: Shiraishi, Y.; Suzuki, M.; Hamano, R.; Kobayashi, Y.; Yambe, T.; Fujie, M.G.; Hatano, M.; Hashizume, M.; Konishi, K.;
By: Shiraishi, Y.; Suzuki, M.; Hamano, R.; Kobayashi, Y.; Yambe, T.; Fujie, M.G.; Hatano, M.; Hashizume, M.; Konishi, K.;
2011 / IEEE / 978-1-61284-385-8
By: Cho, N.B.; Sang-Eun Song; Whitcomb, L.L.; Fichtinger, G.; Guion, P.; Iordachita, I.I.;
By: Cho, N.B.; Sang-Eun Song; Whitcomb, L.L.; Fichtinger, G.; Guion, P.; Iordachita, I.I.;
2011 / IEEE / 978-1-4244-8115-6
By: Thiruvalluvan, K.; Zhou, Y.; Zhengrong Liang; Zhigang Xu; Moore, W.H.; Krzeminski, L.;
By: Thiruvalluvan, K.; Zhou, Y.; Zhengrong Liang; Zhigang Xu; Moore, W.H.; Krzeminski, L.;
2011 / IEEE / 978-1-61284-456-5
By: Koseki, Yoshihiko; Okamura, Allison M.; Chinzei, Kiyoyuki; De Lorenzo, Danilo;
By: Koseki, Yoshihiko; Okamura, Allison M.; Chinzei, Kiyoyuki; De Lorenzo, Danilo;
2011 / IEEE / 978-1-4244-9277-0
By: Senevirathne, R.; Molligoda, S.; Fernando, H.H.L.K.; Weerasooriya, T.R.;
By: Senevirathne, R.; Molligoda, S.; Fernando, H.H.L.K.; Weerasooriya, T.R.;
2011 / IEEE / 978-1-61284-777-1
By: Ruo-Chi Hsu; Gwo-Bin Lee; Huan-Yao Lei; Chen-Sheng Yeh; Chih-Chia Huang; Fong-Yu Cheng; Lein-Yu Hung; Kang-Yi Lien; Ming-Yang Lin;
By: Ruo-Chi Hsu; Gwo-Bin Lee; Huan-Yao Lei; Chen-Sheng Yeh; Chih-Chia Huang; Fong-Yu Cheng; Lein-Yu Hung; Kang-Yi Lien; Ming-Yang Lin;
2011 / IEEE / 978-1-61284-456-5
By: Ryu, Seok Chang; Cutkosky, Mark R.; Daniel, Bruce L.; Black, Richard J.; Renaud, Pierre;
By: Ryu, Seok Chang; Cutkosky, Mark R.; Daniel, Bruce L.; Black, Richard J.; Renaud, Pierre;
2011 / IEEE / 978-1-61284-456-5
By: Poignet, P.; Adorno, B.V.; Bernardes, M.C.; Borges, G.A.; Zemiti, N.;
By: Poignet, P.; Adorno, B.V.; Bernardes, M.C.; Borges, G.A.; Zemiti, N.;
2011 / IEEE / 978-1-61284-456-5
By: Berkley, Jeff; Hager, Gregory; Choti, Michael; Peng, Peter; Jog, Amod; Sedef, Mert; Gao, Yixin; Kumar, Rajesh;
By: Berkley, Jeff; Hager, Gregory; Choti, Michael; Peng, Peter; Jog, Amod; Sedef, Mert; Gao, Yixin; Kumar, Rajesh;
2011 / IEEE / 978-1-61284-456-5
By: van Veen, Youri R.J.; Roesthuis, Roy J.; Misra, Sarthak; Jahya, Alex;
By: van Veen, Youri R.J.; Roesthuis, Roy J.; Misra, Sarthak; Jahya, Alex;
2011 / IEEE / 978-1-4577-1589-1
By: Sutherland, C.; Mousavi, P.; Abolmaesumi, P.; Hashtrudi-Zaad, K.;
By: Sutherland, C.; Mousavi, P.; Abolmaesumi, P.; Hashtrudi-Zaad, K.;
2011 / IEEE / 978-1-4577-1589-1
By: Reynaerts, D.; Penders, J.; de Beeck, M.O.; De Volder, M.; Vanlerberghe, F.; Puers, R.; Van Hoof, C.;
By: Reynaerts, D.; Penders, J.; de Beeck, M.O.; De Volder, M.; Vanlerberghe, F.; Puers, R.; Van Hoof, C.;
2011 / IEEE / 978-1-4577-1589-1
By: Jie Tian; Youbo You; Zhenyu Liu; Hu Wang; Chongguang Zhong; Ting Xue; Ruwei Dai; Lijun Bai; Yuanyuan Feng;
By: Jie Tian; Youbo You; Zhenyu Liu; Hu Wang; Chongguang Zhong; Ting Xue; Ruwei Dai; Lijun Bai; Yuanyuan Feng;
2011 / IEEE / 978-1-4577-1589-1
By: Hao Su; Fischer, G.S.; Cole, G.A.; Xiaoan Yan; Iordachita, I.I.;
By: Hao Su; Fischer, G.S.; Cole, G.A.; Xiaoan Yan; Iordachita, I.I.;
2011 / IEEE / 978-1-4577-1589-1
By: Ceyssens, F.; Chaudhri, B.P.; Puers, R.; Van Hoof, C.; La Manna, A.; Neves, H.P.;
By: Ceyssens, F.; Chaudhri, B.P.; Puers, R.; Van Hoof, C.; La Manna, A.; Neves, H.P.;