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2011 / IEEE
By: Yongqiang Cheng; Zuren Feng; Ping Jiang; Fun Hu; Yuanxiang Ji; Baruch, J.; Feng Tian; Xiaonian Wang; Jin Zhu;
By: Yongqiang Cheng; Zuren Feng; Ping Jiang; Fun Hu; Yuanxiang Ji; Baruch, J.; Feng Tian; Xiaonian Wang; Jin Zhu;
2012 / IEEE
By: Welch, M.; Jalal, R.; Nagpal, S.; Lasso, A.; Jaeger, M.; Borschneck, D.P.; Fichtinger, G.; Mousavi, P.; Ayukawa, I.; Abolmaesumi, P.; Ungi, T.;
By: Welch, M.; Jalal, R.; Nagpal, S.; Lasso, A.; Jaeger, M.; Borschneck, D.P.; Fichtinger, G.; Mousavi, P.; Ayukawa, I.; Abolmaesumi, P.; Ungi, T.;
2012 / IEEE
By: Erdman, Arthur G.; Sotiropoulos, Fotis; Borazjani, Iman; Le, Trung Bao; Malbraaten, Nicholas; Coffey, Dane; Keefe, Daniel F.;
By: Erdman, Arthur G.; Sotiropoulos, Fotis; Borazjani, Iman; Le, Trung Bao; Malbraaten, Nicholas; Coffey, Dane; Keefe, Daniel F.;
2012 / IEEE
By: Tenorth, M.; Mosenlechner, L.; Jain, D.; Beetz, M.; Pangercic, D.; Blodow, N.; Kunze, L.;
By: Tenorth, M.; Mosenlechner, L.; Jain, D.; Beetz, M.; Pangercic, D.; Blodow, N.; Kunze, L.;
2012 / IEEE
By: Oduneye, S.O.; Wright, G.A.; Crystal, E.; Zeidan Shwiri, T.; Kadmon, E.; Laish-FarKash, A.; Barry, J.; Ramanan, V.; Ghate, S.; Biswas, L.;
By: Oduneye, S.O.; Wright, G.A.; Crystal, E.; Zeidan Shwiri, T.; Kadmon, E.; Laish-FarKash, A.; Barry, J.; Ramanan, V.; Ghate, S.; Biswas, L.;
2012 / IEEE
By: Barrett, N.S.; Johnson, C.R.; Kendrick, G.A.; Steinberg, P.D.; Heyward, A.J.; Doherty, P.J.; Mahon, I.; Johnson-Roberson, M.; Steinberg, D.; Friedman, A.; Babcock, R.C.; Jakuba, M.V.; Pizarro, O.R.; Williams, S.B.;
By: Barrett, N.S.; Johnson, C.R.; Kendrick, G.A.; Steinberg, P.D.; Heyward, A.J.; Doherty, P.J.; Mahon, I.; Johnson-Roberson, M.; Steinberg, D.; Friedman, A.; Babcock, R.C.; Jakuba, M.V.; Pizarro, O.R.; Williams, S.B.;
2010 / IEEE / 978-1-4244-9168-1
By: Freyne, J.; Brindal, E.; Baghaei, N.; Kimani, S.; Berkovsky, S.;
By: Freyne, J.; Brindal, E.; Baghaei, N.; Kimani, S.; Berkovsky, S.;
2010 / IEEE / 978-1-60558-719-6
By: Cheung, W.; Karumuri, S.; Zeleznik, R.; Reiss, S.P.; Kaplan, J.; LaViola, J.J.; Bragdon, A.; Adeputra, F.; Coleman, C.;
By: Cheung, W.; Karumuri, S.; Zeleznik, R.; Reiss, S.P.; Kaplan, J.; LaViola, J.J.; Bragdon, A.; Adeputra, F.; Coleman, C.;
2010 / IEEE / 978-1-60558-719-6
By: Coleman, C.; Kaplan, J.; Cheung, W.; Karumuri, S.; Adeputra, F.; Reiss, S.P.; Bragdon, A.; Zeleznik, R.; LaViola, J.J.;
By: Coleman, C.; Kaplan, J.; Cheung, W.; Karumuri, S.; Adeputra, F.; Reiss, S.P.; Bragdon, A.; Zeleznik, R.; LaViola, J.J.;