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Topic: Modulator
Results
2012 / IEEE
By: Yong-Zhong Xiong; Sanming Hu; Madihian, M.; Minkyu Je; Teck-Guan Lim; Lei Wang; Bo Zhang;
By: Yong-Zhong Xiong; Sanming Hu; Madihian, M.; Minkyu Je; Teck-Guan Lim; Lei Wang; Bo Zhang;
2012 / IEEE
By: Li Xian Wang; Xiao Qiong Qi; Yu Liu; Liang Xie; Jian Guo Liu; Xu Ming Wu; Jiang Wei Man; Ning Hua Zhu;
By: Li Xian Wang; Xiao Qiong Qi; Yu Liu; Liang Xie; Jian Guo Liu; Xu Ming Wu; Jiang Wei Man; Ning Hua Zhu;
2011 / IEEE / 978-1-61284-175-5
By: Silva, J.; Ashburn, M.; Gealow, J.; Qicheng Yu; Chih-Hong Lou; Shabra, A.; Riehl, P.; Ho, S.;
By: Silva, J.; Ashburn, M.; Gealow, J.; Qicheng Yu; Chih-Hong Lou; Shabra, A.; Riehl, P.; Ho, S.;
2011 / IEEE / 978-1-4244-8340-2
By: Edwards, E.H.; Miller, D.A.B.; Harris, J.S.; Vuckovic, J.; Kamins, T.I.; Fei, E.; Claussen, S.A.; Yiwen Rong; Schaevitz, R.K.; Shambat, G.; Audet, R.M.;
By: Edwards, E.H.; Miller, D.A.B.; Harris, J.S.; Vuckovic, J.; Kamins, T.I.; Fei, E.; Claussen, S.A.; Yiwen Rong; Schaevitz, R.K.; Shambat, G.; Audet, R.M.;
2011 / IEEE / 978-1-4577-0321-8
By: Xiaoxing Feng; Jinpeng Shen; Jinfeng Huang; Zejun Wu; Xin'an Wang;
By: Xiaoxing Feng; Jinpeng Shen; Jinfeng Huang; Zejun Wu; Xin'an Wang;
2011 / IEEE / 978-1-4244-8340-2
By: Schaevitz, R.K.; Miller, D.A.B.; Harris, J.S.; Roth, J.E.; Tasyurek, E.; Ren, S.; Claussen, S.A.; Yiwen Rong; Audet, R.M.; Ly-Gagnon, D.S.; Edwards, E.H.;
By: Schaevitz, R.K.; Miller, D.A.B.; Harris, J.S.; Roth, J.E.; Tasyurek, E.; Ren, S.; Claussen, S.A.; Yiwen Rong; Audet, R.M.; Ly-Gagnon, D.S.; Edwards, E.H.;
2011 / IEEE / 978-1-55752-932-9
By: Peucheret, C.; Mulvad, H.C.H.; Hu, H.; Oxenlowe, L.K.; Jeppesen, P.; Clausen, A.T.; Galili, M.;
By: Peucheret, C.; Mulvad, H.C.H.; Hu, H.; Oxenlowe, L.K.; Jeppesen, P.; Clausen, A.T.; Galili, M.;
2011 / IEEE / 978-1-4673-0490-0
By: Heng-Yi Wu; Lang Li; Nephew, K.P.; Huang, T.H.M.; Yu Wang; Yunlong Liu; Jiang, G.; Zheng, P.;
By: Heng-Yi Wu; Lang Li; Nephew, K.P.; Huang, T.H.M.; Yu Wang; Yunlong Liu; Jiang, G.; Zheng, P.;
2011 / IEEE / 978-1-4577-0390-4
By: Bujang, S.; Amiruddin, M.F.; Jaafar, S.; Sulaiman, A.; Ariffin, A.;
By: Bujang, S.; Amiruddin, M.F.; Jaafar, S.; Sulaiman, A.; Ariffin, A.;
2012 / IEEE / 978-1-4673-2185-3
By: Yun-Chuan Zhou; Ji-Fei Zhan; Zhu Jia-Xu; Cheng Yan-ping; Yao Wu-Sheng; Zhu Hua-Shun; Fen-Yan Mo-Li;
By: Yun-Chuan Zhou; Ji-Fei Zhan; Zhu Jia-Xu; Cheng Yan-ping; Yao Wu-Sheng; Zhu Hua-Shun; Fen-Yan Mo-Li;
2012 / IEEE / 978-1-4673-1088-8
By: Bhadkamkar, Atul; Sangchul Bae; Yue Weng Mak; Huan-Yang Chen; van der Weide, Daniel W.;
By: Bhadkamkar, Atul; Sangchul Bae; Yue Weng Mak; Huan-Yang Chen; van der Weide, Daniel W.;
2012 / IEEE / 978-1-4673-2229-4
By: Van Campenhout, J.; Pantouvaki, M.; Hui Yu; Bogaerts, W.; Baets, R.; Leuthold, J.; Komorowska, K.; Hillerkuss, D.; Korn, D.; Absil, P.; Lepage, G.; Verheyen, P.; Dumon, P.;
By: Van Campenhout, J.; Pantouvaki, M.; Hui Yu; Bogaerts, W.; Baets, R.; Leuthold, J.; Komorowska, K.; Hillerkuss, D.; Korn, D.; Absil, P.; Lepage, G.; Verheyen, P.; Dumon, P.;
2012 / IEEE / 978-1-4673-2229-4
By: Calzadilla, V.; Justo, Y.; Muehlbrandt, S.; Mishra, A.; Kohl, M.; Muslija, A.; Sommer, M.; Melikyan, A.; Leuthold, J.; Koos, C.; Freude, W.; Smit, M.; Hens, Z.; Van Thourhout, D.; Scandurra, A.; Tomkos, I.; Martinez-Pastor, J.P.;
By: Calzadilla, V.; Justo, Y.; Muehlbrandt, S.; Mishra, A.; Kohl, M.; Muslija, A.; Sommer, M.; Melikyan, A.; Leuthold, J.; Koos, C.; Freude, W.; Smit, M.; Hens, Z.; Van Thourhout, D.; Scandurra, A.; Tomkos, I.; Martinez-Pastor, J.P.;
2013 / IEEE
By: Yoo, S. J. B.; Liu, Hai-Feng; Basak, Juthika; Liao, Ling; Djordjevic, Stevan S.; Cheung, Stanley T. S.; Guan, Binbin; Shang, Kuanping; Qin, Chuan;
By: Yoo, S. J. B.; Liu, Hai-Feng; Basak, Juthika; Liao, Ling; Djordjevic, Stevan S.; Cheung, Stanley T. S.; Guan, Binbin; Shang, Kuanping; Qin, Chuan;
2013 / IEEE
By: Junfu Chen; Ait-Ouali, Abderrahmane; Prosyk, Kelvin; Woods, Ian; Velthaus, Karl-Otto; Hamacher, Michael; Pirastu, Alessio; Millett, Ron; Kaiser, Ronald; Hoffmann, Detlef; Totolo, Marco;
By: Junfu Chen; Ait-Ouali, Abderrahmane; Prosyk, Kelvin; Woods, Ian; Velthaus, Karl-Otto; Hamacher, Michael; Pirastu, Alessio; Millett, Ron; Kaiser, Ronald; Hoffmann, Detlef; Totolo, Marco;
2014 / IEEE
By: Kim, Seong-Jin; Chiang, Sie Boo; Ma, Fan-Yung; Leow, Yoon Hwee; Wee, David; Ng, Simon Sheung Yan;
By: Kim, Seong-Jin; Chiang, Sie Boo; Ma, Fan-Yung; Leow, Yoon Hwee; Wee, David; Ng, Simon Sheung Yan;
2014 / IEEE
By: Shur, Michael S.; Popov, Vyacheslav V.; Ryzhii, Victor; Tombet, Stephane Boubanga; Satou, Akira; Otsuji, Taiichi;
By: Shur, Michael S.; Popov, Vyacheslav V.; Ryzhii, Victor; Tombet, Stephane Boubanga; Satou, Akira; Otsuji, Taiichi;
2014 / IEEE
By: Ribeiro, Ricardo M.; Fracasso, Bruno; Lucarz, Frederic; Barbero, Andres P. L.; Silva, Vinicius N. H.;
By: Ribeiro, Ricardo M.; Fracasso, Bruno; Lucarz, Frederic; Barbero, Andres P. L.; Silva, Vinicius N. H.;
2014 / IEEE
By: Chia-Hao Tu; Lai, Chang-Ming; Chun-Hsiang Chi; Li, Jian-Yu; Feng-Hsu Chung; Yu-Ju Chuang; Wu, Ping-Hsun;
By: Chia-Hao Tu; Lai, Chang-Ming; Chun-Hsiang Chi; Li, Jian-Yu; Feng-Hsu Chung; Yu-Ju Chuang; Wu, Ping-Hsun;
2014 / IEEE
By: Korn, D.; Jazbinsek, M.; Leuthold, J.; Freude, W.; Koos, C.; Guenter, P.; Absil, P.; Verheyen, P.; Lepage, G.; Bogaerts, W.; Yu, H.; Alloatti, L.; Baier, M.; Palmer, R.;
By: Korn, D.; Jazbinsek, M.; Leuthold, J.; Freude, W.; Koos, C.; Guenter, P.; Absil, P.; Verheyen, P.; Lepage, G.; Bogaerts, W.; Yu, H.; Alloatti, L.; Baier, M.; Palmer, R.;
2010 / RSC Publishing
By: David M. Marsden; Rebecca L. Nicholson; David R. Spring; Martin Welch; Mark Ladlow; George P. C. Salmond; Michael Givskov; Hannah F. Sore; Warren R. J. D. Galloway; Mette E. Skindersoe;
By: David M. Marsden; Rebecca L. Nicholson; David R. Spring; Martin Welch; Mark Ladlow; George P. C. Salmond; Michael Givskov; Hannah F. Sore; Warren R. J. D. Galloway; Mette E. Skindersoe;
1988 / IEEE
By: Calame, J.; Lawson, W.; Granatstein, V.L.; Reiser, M.; Striffler, C.D.; Skopec, M.; Read, M.E.; Renbaum, J.; Naimann, M.; Hogan, B.; Welsh, D.;
By: Calame, J.; Lawson, W.; Granatstein, V.L.; Reiser, M.; Striffler, C.D.; Skopec, M.; Read, M.E.; Renbaum, J.; Naimann, M.; Hogan, B.; Welsh, D.;
1991 / IEEE / 0-87942-582-2
By: Coppero, L.; Baggini, B.; Palmisano, G.; Maloberti, F.; Sforzini, L.; Gazzoli, G.;
By: Coppero, L.; Baggini, B.; Palmisano, G.; Maloberti, F.; Sforzini, L.; Gazzoli, G.;
1993 / IEEE / 0-7803-1203-1
By: Woodle, N.; Qiu, X.Z.; Lynch, D.; Sheehan, J.; Li, D.; Krinsky, S.; Ben-Zvi, I.; Solomon, L.; Ingold, G.; Weissenburger, D.; Sheehan, J.; Heuer, R.; Lehrman, I.; Robins, K.; Gardner, M.; Sampson, W.; Zhang, X.; Yu, L.H.;
By: Woodle, N.; Qiu, X.Z.; Lynch, D.; Sheehan, J.; Li, D.; Krinsky, S.; Ben-Zvi, I.; Solomon, L.; Ingold, G.; Weissenburger, D.; Sheehan, J.; Heuer, R.; Lehrman, I.; Robins, K.; Gardner, M.; Sampson, W.; Zhang, X.; Yu, L.H.;
1993 / IEEE / 0-7803-1203-1
By: Hawkins, S.A.; Cravey, W.R.; Newton, M.A.; Ollis, C.W.; Kirbie, H.C.;
By: Hawkins, S.A.; Cravey, W.R.; Newton, M.A.; Ollis, C.W.; Kirbie, H.C.;
1993 / IEEE / 0-7803-1203-1
By: Loew, G.A.; Lavine, T.L.; Hoag, H.A.; Galloway, C.; Fowkes, W.R.; Koontz, R.; Farkas, Z.D.; Fant, K.S.; Early, R.; Deruyter, H.; Callin, R.; Vlieks, A.E.; Nantista, C.; Kroll, N.; Yoneda, C.; Wang, J.W.; Wilson, P.B.; Tantawi, S.G.; Ruth, R.D.; Pearson, C.C.; Palmer, D.; Miller, R.H.; Menegat, A.;
By: Loew, G.A.; Lavine, T.L.; Hoag, H.A.; Galloway, C.; Fowkes, W.R.; Koontz, R.; Farkas, Z.D.; Fant, K.S.; Early, R.; Deruyter, H.; Callin, R.; Vlieks, A.E.; Nantista, C.; Kroll, N.; Yoneda, C.; Wang, J.W.; Wilson, P.B.; Tantawi, S.G.; Ruth, R.D.; Pearson, C.C.; Palmer, D.; Miller, R.H.; Menegat, A.;