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Topic: Modulation
Results
2011 / IEEE
By: Jaehun Park; Gun-Sik Park; Neil, G.R.; Kory, C.L.; Temkin, R.J.; Dobbs, R.J.; Booske, J.H.; Joye, C.D.;
By: Jaehun Park; Gun-Sik Park; Neil, G.R.; Kory, C.L.; Temkin, R.J.; Dobbs, R.J.; Booske, J.H.; Joye, C.D.;
2011 / IEEE
By: Angquist, L.; Nee, H.-P.; Vasiladiotis, M.; Ilves, K.; Siemaszko, D.; Antonopoulos, A.;
By: Angquist, L.; Nee, H.-P.; Vasiladiotis, M.; Ilves, K.; Siemaszko, D.; Antonopoulos, A.;
2011 / IEEE
By: Callahan, P.T.; Nanzer, J.A.; Waterhouse, R.B.; Novak, D.; Clark, T.R.; Dennis, M.L.;
By: Callahan, P.T.; Nanzer, J.A.; Waterhouse, R.B.; Novak, D.; Clark, T.R.; Dennis, M.L.;
2011 / IEEE
By: Davila-Rodriguez, J.; Hernandez-Romano, I.; Delfyett, P.J.; May-Arrioja, D.A.; Sanchez-Mondragon, J.J.; Mandridis, D.;
By: Davila-Rodriguez, J.; Hernandez-Romano, I.; Delfyett, P.J.; May-Arrioja, D.A.; Sanchez-Mondragon, J.J.; Mandridis, D.;
2011 / IEEE
By: Cassan, E.; Duan, G.; Fedeli, J.; Sanchis, P.; Campo, A.M.G.; Vivien, L.; Marris-Morini, D.; Ziebell, M.; Rasigade, G.; Brimont, A.;
By: Cassan, E.; Duan, G.; Fedeli, J.; Sanchis, P.; Campo, A.M.G.; Vivien, L.; Marris-Morini, D.; Ziebell, M.; Rasigade, G.; Brimont, A.;
2011 / IEEE
By: Hoe, J.C.; Benlachtar, Y.; Milder, P.; Koutsoyannis, R.; Bouziane, R.; Killey, R.I.; Glick, M.;
By: Hoe, J.C.; Benlachtar, Y.; Milder, P.; Koutsoyannis, R.; Bouziane, R.; Killey, R.I.; Glick, M.;
2012 / IEEE
By: Reggiani, S.; Poli, S.; Baccarani, G.; Gnudi, A.; Gnani, E.; Denison, M.; Sharma, R.K.;
By: Reggiani, S.; Poli, S.; Baccarani, G.; Gnudi, A.; Gnani, E.; Denison, M.; Sharma, R.K.;
2012 / IEEE
By: Harris, J.S.; Kamins, T.I.; Wahl, P.; Rong, Y.; Miller, D.A.B.; Fei, E.T.; Roth, J.E.; Edwards, E.H.; Schaevitz, R.K.;
By: Harris, J.S.; Kamins, T.I.; Wahl, P.; Rong, Y.; Miller, D.A.B.; Fei, E.T.; Roth, J.E.; Edwards, E.H.; Schaevitz, R.K.;
2012 / IEEE
By: Shambat, G.; Ellis, B.; Petykiewicz, J.; Mayer, M.A.; Vuckovic, J.; Sarmiento, T.; Harris, J.S.; Haller, E.E.; Majumdar, A.;
By: Shambat, G.; Ellis, B.; Petykiewicz, J.; Mayer, M.A.; Vuckovic, J.; Sarmiento, T.; Harris, J.S.; Haller, E.E.; Majumdar, A.;
2012 / IEEE
By: Su-Ik Park; Jong-In Shim; Han-Youl Ryu; Dong-Soo Shin; Hyun-Sung Kim; Dong-Hyun Jang; Jong-Ik Lee;
By: Su-Ik Park; Jong-In Shim; Han-Youl Ryu; Dong-Soo Shin; Hyun-Sung Kim; Dong-Hyun Jang; Jong-Ik Lee;
2012 / IEEE
By: Tsormpatzoglou, A.; Fasarakis, N.; Dimitriadis, C.A.; Ghibaudo, G.; Bucher, M.; Papathanasiou, K.; Pappas, I.; Tassis, D.H.;
By: Tsormpatzoglou, A.; Fasarakis, N.; Dimitriadis, C.A.; Ghibaudo, G.; Bucher, M.; Papathanasiou, K.; Pappas, I.; Tassis, D.H.;