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Topic: Mode Matching
Results
Rigorous Characterization of Carbon Nanotube Complex Permittivity Over a Broadband of RF Frequencies
2012 / IEEEBy: Decrossas, E.; El-Ghazaly, S.M.; Hanna, V.F.; El Sabbagh, M.A.;
2011 / IEEE / 978-1-61284-878-5
By: Rochard, P.; Combrie, S.; Nguyen, T.N.; Lengle, K.; Akrout, A.; De Rossi, A.; Bramerie, L.; Trillo, S.; Bellanca, G.; Armaroli, A.; Malaguti, S.; Thual, M.; Gay, M.;
By: Rochard, P.; Combrie, S.; Nguyen, T.N.; Lengle, K.; Akrout, A.; De Rossi, A.; Bramerie, L.; Trillo, S.; Bellanca, G.; Armaroli, A.; Malaguti, S.; Thual, M.; Gay, M.;
2011 / IEEE / 978-2-87487-022-4
By: Ruiz-Cruz, J.A.; Rebollar, J.M.; Montejo-Garai, J.R.; Leal-Sevillano, C.A.;
By: Ruiz-Cruz, J.A.; Rebollar, J.M.; Montejo-Garai, J.R.; Leal-Sevillano, C.A.;
2011 / IEEE / 978-1-4244-9289-3
By: Hu, Z.X.; Townsend, K.; Fell, C.P.; Burdess, J.S.; Gallacher, B.J.;
By: Hu, Z.X.; Townsend, K.; Fell, C.P.; Burdess, J.S.; Gallacher, B.J.;
Characterizing waveguide open and slit coupled T-junctions using single port mode matching technique
1993 / IEEE / 0-7803-1246-5By: Abdelmonem, A.; Zaki, K.A.; Yao, H.-W.;