Your Search Results
Use materials about this topic in your textbook!
AcademicPub holds over eight million pieces of educational content - such as case studies and journal articles - for you to mix-and-match your way.
Experience the freedom of customizing your course pack with AcademicPub!

Topic: Millimetre Wave Measurement
Results
2012 / IEEE
By: Ghasr, M.T.; Kothari, A.; Baumgartner, M.A.; Fallahpour, M.; Zoughi, R.; Pommerenke, D.;
By: Ghasr, M.T.; Kothari, A.; Baumgartner, M.A.; Fallahpour, M.; Zoughi, R.; Pommerenke, D.;
2012 / IEEE
By: Sasaki, H.; Yamashiro, Y.; Watanabe, S.; Kojima, M.; Sasaki, K.; Sakai, T.; Wakatsuchi, H.; Hashimoto, O.;
By: Sasaki, H.; Yamashiro, Y.; Watanabe, S.; Kojima, M.; Sasaki, K.; Sakai, T.; Wakatsuchi, H.; Hashimoto, O.;
2012 / IEEE
By: Fernandes, T.R.; Sanchez, M.G.; Cuinas, I.; Al-Nuaimi, M.O.; Caldeirinha, R.F.S.; Morgadinho, S.; Richter, J.;
By: Fernandes, T.R.; Sanchez, M.G.; Cuinas, I.; Al-Nuaimi, M.O.; Caldeirinha, R.F.S.; Morgadinho, S.; Richter, J.;
2011 / IEEE / 978-1-4244-6051-9
By: Cetinkaya, H.; Vertiy, A.; Ozdemir, C.; Yigit, E.; Demirci, S.; Tekbas, M.; Kizilhan, A.;
By: Cetinkaya, H.; Vertiy, A.; Ozdemir, C.; Yigit, E.; Demirci, S.; Tekbas, M.; Kizilhan, A.;
2011 / IEEE / 978-1-61284-965-2
By: Aguasca, A.; Broquetas, A.; Nova, E.; Abril, J.; Jofre, L.; Romeu, J.;
By: Aguasca, A.; Broquetas, A.; Nova, E.; Abril, J.; Jofre, L.; Romeu, J.;
2011 / IEEE / 978-1-4577-0509-0
By: Seracini, M.; More, A.C.; Spassovsky, I.; Messina, G.; Giovenale, E.; Doria, A.; Gallerano, G.P.;
By: Seracini, M.; More, A.C.; Spassovsky, I.; Messina, G.; Giovenale, E.; Doria, A.; Gallerano, G.P.;
2011 / IEEE / 978-1-4577-1016-2
By: Leonor, N.; Ferreira, D.; Fernandes, T.; Caldeirinha, R.; Feitor, B.;
By: Leonor, N.; Ferreira, D.; Fernandes, T.; Caldeirinha, R.; Feitor, B.;
2012 / IEEE / 978-1-4673-0442-9
By: Neo, H.; Yu Song Meng; Oberto, L.; Yueyan Shan; Sellone, M.; Brunetti, L.;
By: Neo, H.; Yu Song Meng; Oberto, L.; Yueyan Shan; Sellone, M.; Brunetti, L.;
2012 / IEEE / 978-1-4673-0416-0
By: Hashimoto, T.; Kuramoto, T.; Namba, H.; Sakamoto, T.; Uchida, S.; Nakashiba, Y.; Ohkubo, H.; Furumiya, M.; Hayashi, K.;
By: Hashimoto, T.; Kuramoto, T.; Namba, H.; Sakamoto, T.; Uchida, S.; Nakashiba, Y.; Ohkubo, H.; Furumiya, M.; Hayashi, K.;
2012 / IEEE / 978-1-4673-0442-9
By: Schrader, T.; Kurner, T.; Jacob, M.; Priebe, S.; Jastrow, C.; Kleine-Ostmann, T.;
By: Schrader, T.; Kurner, T.; Jacob, M.; Priebe, S.; Jastrow, C.; Kleine-Ostmann, T.;
2006 / American Institute of Physics
By: T. L. Rhodes; W. A. Peebles; X. Nguyen; M. A. VanZeeland; J. S. deGrassie; L. Zeng; E. J. Doyle; G. Wang;
By: T. L. Rhodes; W. A. Peebles; X. Nguyen; M. A. VanZeeland; J. S. deGrassie; L. Zeng; E. J. Doyle; G. Wang;
1994 / IEEE / 0-7803-2425-0
By: Shoucri, M.; Yujiri, L.; Young, S.; Mussetto, M.; Lee, P.; Hauss, B.; Davidheiser, R.;
By: Shoucri, M.; Yujiri, L.; Young, S.; Mussetto, M.; Lee, P.; Hauss, B.; Davidheiser, R.;
1993 / IEEE / 0-7803-1246-5
By: Nashashibi, A.; Ciccarelli, S.; Ulaby, F.T.; Siqueira, P.; Sarabandi, K.;
By: Nashashibi, A.; Ciccarelli, S.; Ulaby, F.T.; Siqueira, P.; Sarabandi, K.;
Simulation of microwave brightness temperatures using a coupled land-surface-canopy-atmosphere model
1994 / IEEE / 0-7803-1497-2By: Lakshmi, V.; Choudhury, B.J.; Wood, E.F.;
1994 / IEEE / 0-7803-1497-2
By: Gasiewski, A.J.; Zacharias, D.S.; Racette, P.E.; Wang, J.R.; Jackson, D.M.;
By: Gasiewski, A.J.; Zacharias, D.S.; Racette, P.E.; Wang, J.R.; Jackson, D.M.;
1994 / IEEE / 0-7803-1497-2
By: Jenq-Neng Hwang; Leung Tsang; Davis, D.T.; Zhengxiao Chen; Njoku, E.;
By: Jenq-Neng Hwang; Leung Tsang; Davis, D.T.; Zhengxiao Chen; Njoku, E.;
1994 / IEEE / 0-7803-1497-2
By: Westwater, E.R.; Snider, J.B.; Yong Han; Ferrare, R.A.; Harvey Melfi, S.;
By: Westwater, E.R.; Snider, J.B.; Yong Han; Ferrare, R.A.; Harvey Melfi, S.;