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Topic: Millimeter-wave Applications
Results
2011 / IEEE / 978-1-4244-9563-4
By: Mohmmad-pour Aghdam, K.; Enayati, A.; Vandenbosch, G.A.E.; De Raedt, W.;
By: Mohmmad-pour Aghdam, K.; Enayati, A.; Vandenbosch, G.A.E.; De Raedt, W.;
2011 / IEEE / 978-1-61284-965-2
By: Pradell, L.; Lancaster, M.J.; Yi Wang; Maolong Ke; Llamas-Garro, I.; Jaimes-Vera, A.;
By: Pradell, L.; Lancaster, M.J.; Yi Wang; Maolong Ke; Llamas-Garro, I.; Jaimes-Vera, A.;
2012 / IEEE
By: Hsin-Chia Lu; Che-Chung Kuo; Po-An Lin; Chen-Fang Tai; Huei Wang; Yu-Sian Jiang; Jeng-Han Tsai; Yue-Ming Hsin; Yi-Long Chang;
By: Hsin-Chia Lu; Che-Chung Kuo; Po-An Lin; Chen-Fang Tai; Huei Wang; Yu-Sian Jiang; Jeng-Han Tsai; Yue-Ming Hsin; Yi-Long Chang;
1989 / IEEE
By: Kao, M.Y.; Smith, P.M.; Ballingall, J.M.; Smith, R.P.; Ho, P.; Jabra, A.A.; Duh, K.H.G.; Chao, P.C.;
By: Kao, M.Y.; Smith, P.M.; Ballingall, J.M.; Smith, R.P.; Ho, P.; Jabra, A.A.; Duh, K.H.G.; Chao, P.C.;
1989 / IEEE
By: Tayrani, R.; Bandla, S.; McDermott, G.; Payne, D.; Bartle, D.C.; Bellantoni, J.V.; Raffaelli, L.;
By: Tayrani, R.; Bandla, S.; McDermott, G.; Payne, D.; Bartle, D.C.; Bellantoni, J.V.; Raffaelli, L.;
A wide-band monolithic quasi-optical power meter for millimeter- and submillimeter-wave applications
1991 / IEEEBy: Ling, C.C.; Rebeiz, G.M.;
1992 / IEEE
By: Nguyen, L.D.; Matloubian, M.; Larson, L.E.; Jelloian, L.M.; Thompson, M.A.; Brown, A.S.;
By: Nguyen, L.D.; Matloubian, M.; Larson, L.E.; Jelloian, L.M.; Thompson, M.A.; Brown, A.S.;
1991 / IEEE / 0-7803-0135-8
By: Demroff, H.P.; McIntyre, P.M.; Yue, W.K.; Yu, W.; Wiechold, M.H.; Lee, B.; Elliott, S.M.; Popovic, M.; Parker, D.L.; Pang, Y.; Legg, J.D.; Stewart, M.D.;
By: Demroff, H.P.; McIntyre, P.M.; Yue, W.K.; Yu, W.; Wiechold, M.H.; Lee, B.; Elliott, S.M.; Popovic, M.; Parker, D.L.; Pang, Y.; Legg, J.D.; Stewart, M.D.;
1993 / IEEE / 0-7803-1209-0
By: Velebir, J.; Lai, R.; Chow, P.D.; Chen, T.H.; Tan, K.L.; Wang, H.; Ponchak, G.; Liu, P.H.; Streit, D.C.;
By: Velebir, J.; Lai, R.; Chow, P.D.; Chen, T.H.; Tan, K.L.; Wang, H.; Ponchak, G.; Liu, P.H.; Streit, D.C.;
1996 / IEEE / 0-7803-3393-4
By: Streit, D.; Block, T.; Lin, E.; Wang, H.; Tran, L.; Cowles, J.; Oki, A.;
By: Streit, D.; Block, T.; Lin, E.; Wang, H.; Tran, L.; Cowles, J.; Oki, A.;
1997 / IEEE / 0-7803-3898-7
By: Miyamoto, H.; Wakejima, A.; Nakayama, T.; Mizuki, E.; Ando, Y.; Fujihara, A.; Onda, K.; Kanamori, M.;
By: Miyamoto, H.; Wakejima, A.; Nakayama, T.; Mizuki, E.; Ando, Y.; Fujihara, A.; Onda, K.; Kanamori, M.;
1998 / IEEE
By: Kraus, S.A.; Heiss, H.G.; Dong Xu; Abstreiter, G.; Sexl, M.; Weimann, G.; Trankle, G.; Bohm, G.;
By: Kraus, S.A.; Heiss, H.G.; Dong Xu; Abstreiter, G.; Sexl, M.; Weimann, G.; Trankle, G.; Bohm, G.;
2001 / IEEE / 0-7803-7138-0
By: Oki, A.; Gutierrez-Aitken, A.; Lai, R.; Tsai, R.; Grunbacher, R.; Sawdai, D.; Streit, D.C.;
By: Oki, A.; Gutierrez-Aitken, A.; Lai, R.; Tsai, R.; Grunbacher, R.; Sawdai, D.; Streit, D.C.;
2002 / IEEE / 0-7803-7486-X
By: Ban-Leong Ooi; So-Chi Hui; Fu-Jiang Lin; Pang-Shyan Kooi; Tianshu Zhou;
By: Ban-Leong Ooi; So-Chi Hui; Fu-Jiang Lin; Pang-Shyan Kooi; Tianshu Zhou;
2003 / IEEE / 0-7803-7704-4
By: Eye, R.A.; Yun, T.; Beam, E.A., III; Kao, M.; Campbell, C.F.; Delaney, J.B.; Saunier, P.; Heins, M.S.;
By: Eye, R.A.; Yun, T.; Beam, E.A., III; Kao, M.; Campbell, C.F.; Delaney, J.B.; Saunier, P.; Heins, M.S.;