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Topic: Millimeter Wave Technology
Results
2011 / IEEE
By: Callahan, P.T.; Nanzer, J.A.; Waterhouse, R.B.; Novak, D.; Clark, T.R.; Dennis, M.L.;
By: Callahan, P.T.; Nanzer, J.A.; Waterhouse, R.B.; Novak, D.; Clark, T.R.; Dennis, M.L.;
2012 / IEEE
By: Sasaki, H.; Yamashiro, Y.; Watanabe, S.; Kojima, M.; Sasaki, K.; Sakai, T.; Wakatsuchi, H.; Hashimoto, O.;
By: Sasaki, H.; Yamashiro, Y.; Watanabe, S.; Kojima, M.; Sasaki, K.; Sakai, T.; Wakatsuchi, H.; Hashimoto, O.;
2012 / IEEE
By: Wenlei Shan; Ji Yang; Jie Liu; Zhenqiang Li; Sheng Li; Aiqing Cao; Wenying Duan; Jiaqiang Zhong; Xuguo Zhang; Shanhuai Chen; Zhenhui Lin; Yingxi Zuo; Qijun Yao; Shengcai Shi;
By: Wenlei Shan; Ji Yang; Jie Liu; Zhenqiang Li; Sheng Li; Aiqing Cao; Wenying Duan; Jiaqiang Zhong; Xuguo Zhang; Shanhuai Chen; Zhenhui Lin; Yingxi Zuo; Qijun Yao; Shengcai Shi;
2011 / IEEE / 978-1-4244-9600-6
By: Yang Li; Fan Chunli; Kou Wei; Hu Shuangxi; Wang Yanwu; Sun Fengrui;
By: Yang Li; Fan Chunli; Kou Wei; Hu Shuangxi; Wang Yanwu; Sun Fengrui;
2011 / IEEE / 978-1-4577-1005-6
By: Leuther, A.; Tessmann, A.; Hulsmann, A.; Kallfass, I.; Weissbrodt, E.; Ambacher, O.; Massler, H.;
By: Leuther, A.; Tessmann, A.; Hulsmann, A.; Kallfass, I.; Weissbrodt, E.; Ambacher, O.; Massler, H.;
2011 / IEEE / 978-1-4577-0321-8
By: Tiefeng Xu; Yifeng Sun; Qiuhua Nie; Yan Ye; Xiangyue Ying; Taijun Liu;
By: Tiefeng Xu; Yifeng Sun; Qiuhua Nie; Yan Ye; Xiangyue Ying; Taijun Liu;
2011 / IEEE / 978-1-4577-1005-6
By: Won-Gyum Kim; Yong-Hoon Kim; Jin-Mi Jung; Jun-Ho Choi; Sang-Won Jung; Mun-Kyo Lee; Yu-Shin Chang; Nam-Won Moon;
By: Won-Gyum Kim; Yong-Hoon Kim; Jin-Mi Jung; Jun-Ho Choi; Sang-Won Jung; Mun-Kyo Lee; Yu-Shin Chang; Nam-Won Moon;
2011 / IEEE / 978-1-4577-0509-0
By: Monaco, F.; Leuterer, F.; Kasparek, W.; Wagner, D.; Munich, M.; Stober, J.; Thumm, M.; Stange, T.; Schutz, H.;
By: Monaco, F.; Leuterer, F.; Kasparek, W.; Wagner, D.; Munich, M.; Stober, J.; Thumm, M.; Stange, T.; Schutz, H.;
2011 / IEEE / 978-1-4577-0509-0
By: Caumes, J.; Abraham, E.; Dautant, A.; Ziegle, A.; Younus, A.; Recur, B.; Chassagne, B.; Salort, S.;
By: Caumes, J.; Abraham, E.; Dautant, A.; Ziegle, A.; Younus, A.; Recur, B.; Chassagne, B.; Salort, S.;
2011 / IEEE / 978-1-4577-0509-0
By: Minzhi Huang; Hairong Yin; Yubin Gong; Yanyu Wei; Xiong Xu; Wenxiang Wang;
By: Minzhi Huang; Hairong Yin; Yubin Gong; Yanyu Wei; Xiong Xu; Wenxiang Wang;
2011 / IEEE / 978-1-4577-0509-0
By: Shimozuma, T.; Takahashi, H.; Imai, T.; Kariya, T.; Minami, R.; Mutoh, T.; Ito, Y.; Takita, Y.; Okada, K.; Mizuno, Y.; Makino, R.; Ogasawara, S.; Nishiura, M.; Igami, H.; Yoshimura, Y.; Kubo, S.; Kobayashi, S.; Ito, S.;
By: Shimozuma, T.; Takahashi, H.; Imai, T.; Kariya, T.; Minami, R.; Mutoh, T.; Ito, Y.; Takita, Y.; Okada, K.; Mizuno, Y.; Makino, R.; Ogasawara, S.; Nishiura, M.; Igami, H.; Yoshimura, Y.; Kubo, S.; Kobayashi, S.; Ito, S.;
2011 / IEEE / 978-1-61284-166-3
By: Heinemann, B.; Fox, A.; Yamamoto, Y.; Wipf, C.; Marschmeyer, S.; Barth, R.;
By: Heinemann, B.; Fox, A.; Yamamoto, Y.; Wipf, C.; Marschmeyer, S.; Barth, R.;
2011 / IEEE / 978-2-87487-022-4
By: Lo, P.G.Q.; Jing Hua Teng; Tiam Lin Sze; Swee Ping Yeo; Xudong Chen; Yuanjin Zheng; Teck Guan Lim; Kiat Seng Yeo; Kaixue Ma; Yilong Lu; Ong, M.L.C.; Xianming Qing; Yandong Gong; Chia, M.Y.W.; Zhi Ning Chen;
By: Lo, P.G.Q.; Jing Hua Teng; Tiam Lin Sze; Swee Ping Yeo; Xudong Chen; Yuanjin Zheng; Teck Guan Lim; Kiat Seng Yeo; Kaixue Ma; Yilong Lu; Ong, M.L.C.; Xianming Qing; Yandong Gong; Chia, M.Y.W.; Zhi Ning Chen;
2011 / IEEE / 978-1-4577-1303-3
By: Gopalsami, N.; Katsaggelos, A.K.; Spinoulas, L.; Luessi, M.; Elmer, T.; Raptis, A.; Babacan, S.D.; Liao, S.; Ahern, R.;
By: Gopalsami, N.; Katsaggelos, A.K.; Spinoulas, L.; Luessi, M.; Elmer, T.; Raptis, A.; Babacan, S.D.; Liao, S.; Ahern, R.;
2011 / IEEE / 978-1-4577-1694-2
By: Ben-dor, E.; Yahalom, A.; Goldshleger, N.; Eliran, A.; Agassi, M.;
By: Ben-dor, E.; Yahalom, A.; Goldshleger, N.; Eliran, A.; Agassi, M.;
2011 / IEEE / 978-2-87487-022-4
By: Kanaya, H.; Dayang, A.B.A.; Dong, R.; Xin Liu; Pokharel, R.K.; Yoshida, K.;
By: Kanaya, H.; Dayang, A.B.A.; Dong, R.; Xin Liu; Pokharel, R.K.; Yoshida, K.;
2011 / IEEE / 978-2-87487-023-1
By: Dong, R.; Xin Liu; Pokharel, R.K.; Yoshida, K.; Kanaya, H.; Dayang, A.B.A.;
By: Dong, R.; Xin Liu; Pokharel, R.K.; Yoshida, K.; Kanaya, H.; Dayang, A.B.A.;
2012 / IEEE / 978-1-4673-0437-5
By: Yijun Qiao; Ben-Dor, E.; Murdock, J.N.; Rappaport, T.S.; Tamir, J.I.;
By: Yijun Qiao; Ben-Dor, E.; Murdock, J.N.; Rappaport, T.S.; Tamir, J.I.;
2012 / IEEE / 978-1-4673-0677-5
By: Yongmao Huang; Kuandong Gao; Zhibing Liang; Zhen Hai Shao; Lianfu Liu;
By: Yongmao Huang; Kuandong Gao; Zhibing Liang; Zhen Hai Shao; Lianfu Liu;
2012 / IEEE / 978-1-4673-0130-5
By: Zhang, T.; Darvil, L.R.; Le Bayon, A.; Letestu, Y.; Ouslimani, H.H.;
By: Zhang, T.; Darvil, L.R.; Le Bayon, A.; Letestu, Y.; Ouslimani, H.H.;
2012 / IEEE / 978-1-4577-1438-2
By: Zhangcheng Hao; Yan Zhang; Cheng Yu; Lei Zhang; Jianfeng Zhai; Zhengbo Jiang; Zhenqi Kuai; Guang Hua; Ling Tian; Hui Zhang; Pinpin Yan; Hongjun Tang; Guangqi Yang; Nianzu Zhang; Haiming Wang; Peng Chen; Jixin Chen; Xiaowei Zhu; Jianyi Zhou; Wei Hong; Zhe Chen;
By: Zhangcheng Hao; Yan Zhang; Cheng Yu; Lei Zhang; Jianfeng Zhai; Zhengbo Jiang; Zhenqi Kuai; Guang Hua; Ling Tian; Hui Zhang; Pinpin Yan; Hongjun Tang; Guangqi Yang; Nianzu Zhang; Haiming Wang; Peng Chen; Jixin Chen; Xiaowei Zhu; Jianyi Zhou; Wei Hong; Zhe Chen;
2012 / IEEE / 978-1-4673-2185-3
By: Xi-cheng Lu; Chang-jiang Tong; Shuang Li; Xue-feng Wang; Guang-qiang Wang;
By: Xi-cheng Lu; Chang-jiang Tong; Shuang Li; Xue-feng Wang; Guang-qiang Wang;
2012 / IEEE / 978-1-4673-1088-8
By: Kunkel, Gerhard; Rusch, Christian; Pauli, Mario; Gulan, Heiko; Beer, Stefan; Zwick, Thomas;
By: Kunkel, Gerhard; Rusch, Christian; Pauli, Mario; Gulan, Heiko; Beer, Stefan; Zwick, Thomas;
2012 / IEEE / 978-1-4673-0189-3
By: Diao, Peng; Gong, Yubin; Wei, Yanyu; Guo, Xin; Lai, Jianqiang; Liu, Yang; Xu, Xiong; Duan, Zhaoyun;
By: Diao, Peng; Gong, Yubin; Wei, Yanyu; Guo, Xin; Lai, Jianqiang; Liu, Yang; Xu, Xiong; Duan, Zhaoyun;
2012 / IEEE / 978-1-4673-0189-3
By: Wei, Yanyu; Shen, Fei; Gong, Yubin; Zhao, Guoqing; Huang, Minzhi; Lai, Jianqiang; Xu, Xiong;
By: Wei, Yanyu; Shen, Fei; Gong, Yubin; Zhao, Guoqing; Huang, Minzhi; Lai, Jianqiang; Xu, Xiong;
2012 / IEEE / 978-1-4673-0189-3
By: Feng, Jinjun; Zeng, Xu; Wang, Efeng; Li, Zhiliang; Liu, Bentian; Yan, Tiechang;
By: Feng, Jinjun; Zeng, Xu; Wang, Efeng; Li, Zhiliang; Liu, Bentian; Yan, Tiechang;
2012 / IEEE / 978-1-4577-1527-3
By: Yasumura, Yoshihiro; Yoshida, Yuki; Kawanishi, Tetsuya; Hosako, Iwao; Kuri, Toshiaki; Pham Tien Dat; Kanno, Atsushi; Kitayama, Ken-ichi;
By: Yasumura, Yoshihiro; Yoshida, Yuki; Kawanishi, Tetsuya; Hosako, Iwao; Kuri, Toshiaki; Pham Tien Dat; Kanno, Atsushi; Kitayama, Ken-ichi;