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Topic: Microwave Theory And Techniques
Results
1987 / IEEE
By: Shibuki, Masaaki; Nakagiri, Koji; Saitoh, Haruo; Ohta, Yasusada; Umezu, Jun; Okazawa, Haruo;
By: Shibuki, Masaaki; Nakagiri, Koji; Saitoh, Haruo; Ohta, Yasusada; Umezu, Jun; Okazawa, Haruo;
2012 / IEEE
By: Chakravarthy, D.P.; Sharma, A.; Parekh, M.; Mangalvedekar, H.A.; Bindu, S.; Mittal, K.C.;
By: Chakravarthy, D.P.; Sharma, A.; Parekh, M.; Mangalvedekar, H.A.; Bindu, S.; Mittal, K.C.;
Clinical Microwave Tomographic Imaging of the Calcaneus: A First-in-Human Case Study of Two Subjects
2012 / IEEEBy: Meaney, P.M.; Paulsen, K.D.; Burke, G.; Geimer, S.D.; Goodwin, D.; Pallone, M.; Tian Zhou; Golnabi, A.H.;
2012 / IEEE
By: Zheng, X.; Moshchalkov, V.V.; Vandenbosch, G.A.E.; Ameloot, M.; Metlushko, V.; Silhanek, A.V.; Jeyaram, Y.; Verellen, N.; Valev, V.K.;
By: Zheng, X.; Moshchalkov, V.V.; Vandenbosch, G.A.E.; Ameloot, M.; Metlushko, V.; Silhanek, A.V.; Jeyaram, Y.; Verellen, N.; Valev, V.K.;
2012 / IEEE
By: Donaldson, C.R.; Wenlong He; Liang Zhang; Cross, A.W.; Ronald, K.; Young, A.R.; Robertson, C.W.; Whyte, C.G.; Phelps, A.D.R.;
By: Donaldson, C.R.; Wenlong He; Liang Zhang; Cross, A.W.; Ronald, K.; Young, A.R.; Robertson, C.W.; Whyte, C.G.; Phelps, A.D.R.;
2012 / IEEE
By: Kaufman, P.A.; Meaney, P.M.; Grzegorczyk, T.M.; Paulsen, K.D.; di Florio-Alexander, R.M.;
By: Kaufman, P.A.; Meaney, P.M.; Grzegorczyk, T.M.; Paulsen, K.D.; di Florio-Alexander, R.M.;
Optically Transparent and Flexible Graphene Reciprocal and Nonreciprocal Microwave Planar Components
2012 / IEEEBy: Szkopek, T.; Sounas, D.; Chamanara, N.; Caloz, C.;
2012 / IEEE
By: Poretti, S.; Pastorino, M.; Monleone, R.; Maffongelli, M.; Salvade, A.; Randazzo, A.;
By: Poretti, S.; Pastorino, M.; Monleone, R.; Maffongelli, M.; Salvade, A.; Randazzo, A.;
2012 / IEEE
By: Bailey, C.; Eicher, F.; Muller, G.; Adamietz, R.; Pavuluri, S.K.; Desmulliez, M.P.Y.; Goussetis, G.; Ferenets, M.; Tilford, T.;
By: Bailey, C.; Eicher, F.; Muller, G.; Adamietz, R.; Pavuluri, S.K.; Desmulliez, M.P.Y.; Goussetis, G.; Ferenets, M.; Tilford, T.;
2012 / IEEE
By: Chung, S.W.J.; Abd-Alhameed, R.A.; Chan Hwang See; Excell, P.S.; Al-Ahmad, H.; Dawei Zhou;
By: Chung, S.W.J.; Abd-Alhameed, R.A.; Chan Hwang See; Excell, P.S.; Al-Ahmad, H.; Dawei Zhou;
1992 / IEEE / 000-0-0000-0000-0
By: Abe, D.K.; Bromborsky, A.; Miller, S.M.; Levush, B.; Carmel, Y.; Antonsen, T.;
By: Abe, D.K.; Bromborsky, A.; Miller, S.M.; Levush, B.; Carmel, Y.; Antonsen, T.;
1992 / IEEE / 000-0-0000-0000-0
By: Khryapov, P.A.; Deichuli, M.P.; Slepkov, A.I.; Chernyavsky, I.A.; Bugaev, S.P.; Bastrikov, A.N.; Koshelev, V.I.; Pikunov, V.M.; Kanavets, V.I.; Zakharov, A.N.; Sukhushin, K.N.; Sochugov, N.S.; Lopatin, V.V.;
By: Khryapov, P.A.; Deichuli, M.P.; Slepkov, A.I.; Chernyavsky, I.A.; Bugaev, S.P.; Bastrikov, A.N.; Koshelev, V.I.; Pikunov, V.M.; Kanavets, V.I.; Zakharov, A.N.; Sukhushin, K.N.; Sochugov, N.S.; Lopatin, V.V.;
2000 / IEEE
By: Tsukuda, H.; Watanabe, T.; Kamada, K.; Ando, R.; Lee, C. Y.; Toyosugi, N.; Matsuoka, M.; Masuzaki, M.;
By: Tsukuda, H.; Watanabe, T.; Kamada, K.; Ando, R.; Lee, C. Y.; Toyosugi, N.; Matsuoka, M.; Masuzaki, M.;
2006 / IEEE / 978-3-9805741-8-1
By: Levi, F.; Jefferts, S.R.; Dai-Hyuk Yu; Heavner, T.P.; Shirley, J.H.;
By: Levi, F.; Jefferts, S.R.; Dai-Hyuk Yu; Heavner, T.P.; Shirley, J.H.;
2011 / IEEE / 978-3-00-035081-8
By: Shuai Tang; Pei Liu; Yu Zhang; Xu, N.S.; Chen, J.; Deng, S.Z.; Du, J.L.;
By: Shuai Tang; Pei Liu; Yu Zhang; Xu, N.S.; Chen, J.; Deng, S.Z.; Du, J.L.;
2011 / IEEE / 978-1-4244-9439-2
By: Qinhong Zheng; Runeng Zhong; Lin Li; Tai Xiang; Wansong Xu; Bin Yao; Jinhui Peng;
By: Qinhong Zheng; Runeng Zhong; Lin Li; Tai Xiang; Wansong Xu; Bin Yao; Jinhui Peng;
2011 / IEEE / 978-1-4244-9439-2
By: Jinhui Peng; Qinhong Zheng; Lin Li; Tai Xiang; Wansong Xu; Runeng Zhong; Bin Yao;
By: Jinhui Peng; Qinhong Zheng; Lin Li; Tai Xiang; Wansong Xu; Runeng Zhong; Bin Yao;
2011 / IEEE / 978-1-4244-9439-2
By: Runeng Zhong; Tai Xiang; Jinhui Peng; Qinhong Zheng; Bin Yao; Wude Cai; Fuyao Xie; Lin Li; Wansong Xu;
By: Runeng Zhong; Tai Xiang; Jinhui Peng; Qinhong Zheng; Bin Yao; Wude Cai; Fuyao Xie; Lin Li; Wansong Xu;
2011 / IEEE / 978-1-4244-9563-4
By: Pistorius, S.; LoVetri, J.; Abubakar, A.; Gilmore, C.; van den Berg, P.M.;
By: Pistorius, S.; LoVetri, J.; Abubakar, A.; Gilmore, C.; van den Berg, P.M.;
2011 / IEEE / 978-1-4244-9563-4
By: Youngwoo Kwon; Jeiwon Cho; Youngseek Chung; Changyul Cheon; Sangbok Park; Tae-Hee Woo; Joosung Hwang;
By: Youngwoo Kwon; Jeiwon Cho; Youngseek Chung; Changyul Cheon; Sangbok Park; Tae-Hee Woo; Joosung Hwang;
2011 / IEEE / 978-1-4244-9439-2
By: Xiuming Li; Tai Xiang; Wansong Xu; Runeng Zhong; Jinhui Peng; Qinhong Zheng; Bin Yao;
By: Xiuming Li; Tai Xiang; Wansong Xu; Runeng Zhong; Jinhui Peng; Qinhong Zheng; Bin Yao;