Your Search Results
Use materials about this topic in your textbook!
AcademicPub holds over eight million pieces of educational content - such as case studies and journal articles - for you to mix-and-match your way.
Experience the freedom of customizing your course pack with AcademicPub!

Topic: Microwave Resonators
Results
2011 / IEEE
By: Bourgeois, P.; Schafer, W.S.; Grop, S.G.; Giordano, V.; Rubiola, E.; Oxborrow, M.; Kersale, Y.K.;
By: Bourgeois, P.; Schafer, W.S.; Grop, S.G.; Giordano, V.; Rubiola, E.; Oxborrow, M.; Kersale, Y.K.;
2012 / IEEE
By: Dow, A.B.A.; Lin, H.; Schneider, M.; Petkov, C.; Kherani, N.P.; Ahmed, A.; Popov, C.; Schmid, U.; Bittner, A.;
By: Dow, A.B.A.; Lin, H.; Schneider, M.; Petkov, C.; Kherani, N.P.; Ahmed, A.; Popov, C.; Schmid, U.; Bittner, A.;
1992 / IEEE / 000-0-0000-0000-0
By: Kinross-Wright, J.; Fazio, M.V.; Brown, D.J.; Wheat, R.M.; Carlsten, B.E.; Hoeberling, R.F.; Stringfield, R.M.; Faehl, R.J.; Rodenz, G.;
By: Kinross-Wright, J.; Fazio, M.V.; Brown, D.J.; Wheat, R.M.; Carlsten, B.E.; Hoeberling, R.F.; Stringfield, R.M.; Faehl, R.J.; Rodenz, G.;
2004 / IEEE / 978-5-87911-088-3
By: Raymond, P.; Larour, J.; Cousin, R.; Gouard, P.; Durand, A.J.; Wey, J.;
By: Raymond, P.; Larour, J.; Cousin, R.; Gouard, P.; Durand, A.J.; Wey, J.;
Mechanism of self-excitation of an FEM oscillator based on coupling of propagating and trapped waves
2004 / IEEE / 978-5-87911-088-3By: Malkin, A.M.; Ginzburg, N.S.; Sergeev, A.S.; Peskov, N.Yu.;
2011 / IEEE / 978-1-4244-9563-4
By: Rucker, D.G.; Rahmatallah, Y.A.; Al-Rizzo, H.M.; Khaleel, H.R.; Mohan, S.;
By: Rucker, D.G.; Rahmatallah, Y.A.; Al-Rizzo, H.M.; Khaleel, H.R.; Mohan, S.;
2011 / IEEE / 978-4-907764-39-5
By: Higuchi, K.; Chamnongthai, K.; Jirasereeamornkul, K.; Watcharakitchakorn, O.; Kittiamornkul, N.;
By: Higuchi, K.; Chamnongthai, K.; Jirasereeamornkul, K.; Watcharakitchakorn, O.; Kittiamornkul, N.;
2011 / IEEE / 978-1-4244-6051-9
By: Hoang Van Nguyen; Sounas, D.; Kodera, T.; Caloz, C.; Razavipour, H.;
By: Hoang Van Nguyen; Sounas, D.; Kodera, T.; Caloz, C.; Razavipour, H.;
2011 / IEEE / 978-1-61284-965-2
By: Naccarato, F.; Gamez-Machado, A.; Gismero-Menoyo, J.; Asensio-Lopez, A.; Valdes-Martin, D.;
By: Naccarato, F.; Gamez-Machado, A.; Gismero-Menoyo, J.; Asensio-Lopez, A.; Valdes-Martin, D.;
2011 / IEEE / 978-966-335-357-9
By: Kamba, S.; Molchanov, V.; Kempa, M.; Pashkov, V.V.; Bovtun, V.; Yakymenko, Y.; Poplavko, Y.;
By: Kamba, S.; Molchanov, V.; Kempa, M.; Pashkov, V.V.; Bovtun, V.; Yakymenko, Y.; Poplavko, Y.;
2011 / IEEE / 978-1-4577-0509-0
By: Born, N.; Koch, M.; Vieweg, N.; Wichmann, M.; Jansen, C.; Al-Naib, I.A.I.;
By: Born, N.; Koch, M.; Vieweg, N.; Wichmann, M.; Jansen, C.; Al-Naib, I.A.I.;
2011 / IEEE / 978-2-87487-022-4
By: Hong, J.S.; Martel, J.; Fernandez-Prieto, A.; Mesa, F.; Qian, S.; Medina, F.;
By: Hong, J.S.; Martel, J.; Fernandez-Prieto, A.; Mesa, F.; Qian, S.; Medina, F.;
2011 / IEEE / 978-2-87487-022-4
By: Bandler, J.W.; Cheng, Q.S.; Amineh, R.K.; Khalatpour, A.; Nikolova, N.K.;
By: Bandler, J.W.; Cheng, Q.S.; Amineh, R.K.; Khalatpour, A.; Nikolova, N.K.;
2012 / IEEE / 978-3-9812668-4-9
By: Otto, S.; Al-Bassam, A.; Zhichao Chen; Rennings, A.; Solbach, K.; Caloz, C.;
By: Otto, S.; Al-Bassam, A.; Zhichao Chen; Rennings, A.; Solbach, K.; Caloz, C.;
2012 / IEEE / 978-1-4673-0377-4
By: Ueda, D.; Tanaka, T.; Ueda, T.; Sakai, H.; Nagai, S.; Fukuda, T.; Negoro, N.; Otsuka, N.;
By: Ueda, D.; Tanaka, T.; Ueda, T.; Sakai, H.; Nagai, S.; Fukuda, T.; Negoro, N.; Otsuka, N.;
2012 / IEEE / 978-3-9812668-4-9
By: Maune, H.; Yuliang Zheng; Sazegar, M.; Nikfalazar, M.; Jakoby, R.; Mehmood, A.;
By: Maune, H.; Yuliang Zheng; Sazegar, M.; Nikfalazar, M.; Jakoby, R.; Mehmood, A.;
2011 / IEEE / 978-1-4577-1631-7
By: Kamarudin, M.R.; Khalajmehrabadi, A.; Rahim, M.K.A.; Khalily, M.;
By: Kamarudin, M.R.; Khalajmehrabadi, A.; Rahim, M.K.A.; Khalily, M.;
2011 / IEEE / 978-1-4577-1664-5
By: de Farias, J.E.P.; Fontgalland, G.; Serres, G.K.F.; Serres, A.; Baudrand, H.;
By: de Farias, J.E.P.; Fontgalland, G.; Serres, G.K.F.; Serres, A.; Baudrand, H.;
2011 / IEEE / 978-0-85825-974-4
By: Po-Hui Yu; Chun Ting Kuo; Che-Hao Li; Ming-Huei Huang; Sung-Mao Wu;
By: Po-Hui Yu; Chun Ting Kuo; Che-Hao Li; Ming-Huei Huang; Sung-Mao Wu;
2012 / IEEE / 978-1-4577-0920-3
By: Guilloux-Viry, M.; Deputier, S.; Le Febvrier, A.; Mahdjoubi, K.; Benzerga, R.; Sauleau, R.; Zhang, L.; Castel, X.; Simon, Q.; Corredores, Y.; Tanne, G.; Laurent, P.;
By: Guilloux-Viry, M.; Deputier, S.; Le Febvrier, A.; Mahdjoubi, K.; Benzerga, R.; Sauleau, R.; Zhang, L.; Castel, X.; Simon, Q.; Corredores, Y.; Tanne, G.; Laurent, P.;
2012 / IEEE / 978-1-4673-2185-3
By: Zongxi Tang; Ruimin Xu; Yuanfu Chen; Zegao Wang; Yuehang Xu; Yunqiu Wu; Biao Zhang;
By: Zongxi Tang; Ruimin Xu; Yuanfu Chen; Zegao Wang; Yuehang Xu; Yunqiu Wu; Biao Zhang;
2012 / IEEE / 978-1-4673-2229-4
By: Nosich, A.I.; Sewell, P.; Benson, T.M.; Vukovic, A.; Bulygin, V.S.;
By: Nosich, A.I.; Sewell, P.; Benson, T.M.; Vukovic, A.; Bulygin, V.S.;
2012 / IEEE / 978-1-4673-1088-8
By: Yamanaka, Koji; Noto, Hifumi; Uchida, Hiromitsu; Hirano, Yoshihito; Nakayama, Masatoshi;
By: Yamanaka, Koji; Noto, Hifumi; Uchida, Hiromitsu; Hirano, Yoshihito; Nakayama, Masatoshi;
2012 / IEEE / 978-1-4673-1088-8
By: Battu, Serge; Ling Yan Zhang; Blondy, Pierre; Jauberteau, Marie-Odile; Lalloue, Fabrice; du Puch, Christophe Bounaix Morand; Lautrette, Christophe; Pothier, Arnaud; Dalmay, Claire; Lacroix, Aurelie;
By: Battu, Serge; Ling Yan Zhang; Blondy, Pierre; Jauberteau, Marie-Odile; Lalloue, Fabrice; du Puch, Christophe Bounaix Morand; Lautrette, Christophe; Pothier, Arnaud; Dalmay, Claire; Lacroix, Aurelie;
2012 / American Institute of Physics
By: E. Strupiechonski; G. Xu; M. Brekenfeld; Y. Todorov; N. Isac; A. M. Andrews; P. Klang; C. Sirtori; G. Strasser; A. Degiron; R. Colombelli;
By: E. Strupiechonski; G. Xu; M. Brekenfeld; Y. Todorov; N. Isac; A. M. Andrews; P. Klang; C. Sirtori; G. Strasser; A. Degiron; R. Colombelli;
2012 / American Institute of Physics
By: K. Geerlings; S. Shankar; E. Edwards; L. Frunzio; R. J. Schoelkopf; M. H. Devoret;
By: K. Geerlings; S. Shankar; E. Edwards; L. Frunzio; R. J. Schoelkopf; M. H. Devoret;