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Topic: Microwave Photonics
Results
2011 / IEEE
By: Sai Hua Xu; Huy Quoc Lam; Jia Haur Wong; Chunmei Ouyang; Kan Wu; Ruo Ming Li; Shum, P.P.; Aditya, S.; Peng Huei Lim; Wong, V.; Lee, K.E.K.;
By: Sai Hua Xu; Huy Quoc Lam; Jia Haur Wong; Chunmei Ouyang; Kan Wu; Ruo Ming Li; Shum, P.P.; Aditya, S.; Peng Huei Lim; Wong, V.; Lee, K.E.K.;
2011 / IEEE
By: Bogoni, A.; Cruz, J.L.; Palaci, J.; Villanueva, G.E.; Perez-Millan, P.; Ghelfi, P.; Serafino, G.;
By: Bogoni, A.; Cruz, J.L.; Palaci, J.; Villanueva, G.E.; Perez-Millan, P.; Ghelfi, P.; Serafino, G.;
2011 / IEEE
By: Kan Wu; Lee, K.E.K.; Huy Quoc Lam; Jia Haur Wong; Chunmei Ouyang; Aditya, S.; Shum, P.P.;
By: Kan Wu; Lee, K.E.K.; Huy Quoc Lam; Jia Haur Wong; Chunmei Ouyang; Aditya, S.; Shum, P.P.;
2012 / IEEE
By: Parker, J.S.; Guzzon, R.S.; Norberg, E.J.; Mingzhi Lu; Binetti, P.R.A.; Sivananthan, A.; Coldren, L.A.; Rodwell, M.J.; Johansson, L.A.; Bhardwaj, A.;
By: Parker, J.S.; Guzzon, R.S.; Norberg, E.J.; Mingzhi Lu; Binetti, P.R.A.; Sivananthan, A.; Coldren, L.A.; Rodwell, M.J.; Johansson, L.A.; Bhardwaj, A.;
2012 / IEEE
By: van den Boom, H.; Okonkwo, C.M.; Hejie Yang; Visani, D.; Tartarini, G.; Yan Shi; Koonen, T.; Tangdiongga, E.;
By: van den Boom, H.; Okonkwo, C.M.; Hejie Yang; Visani, D.; Tartarini, G.; Yan Shi; Koonen, T.; Tangdiongga, E.;
2012 / IEEE
By: Devgan, P.S.; Bucholtz, F.; McDermitt, C.S.; Urick, V.J.; Diehl, J.F.; Williams, K.J.;
By: Devgan, P.S.; Bucholtz, F.; McDermitt, C.S.; Urick, V.J.; Diehl, J.F.; Williams, K.J.;
Remote Wideband Microwave Frequency Measurement Based on a Single-Passband Microwave Photonic Filter
2012 / IEEEBy: Kun Zhu; Zuowei Xu; Hongyan Fu;
2012 / IEEE
By: Bing-Hsiao Wang; Jen-Inn Chyi; Pei-Chin Chiu; Hung-Pin Chen; Yu-Ru Huang; Chi-Kuang Sun; Shih-Yuan Chen;
By: Bing-Hsiao Wang; Jen-Inn Chyi; Pei-Chin Chiu; Hung-Pin Chen; Yu-Ru Huang; Chi-Kuang Sun; Shih-Yuan Chen;
2012 / IEEE
By: Cheng-Ling Ying; Chia-Yi Chen; Po-Yi Wu; Hai-Han Lu; Ching-Hung Chang; Heng-Sheng Su; Chung-Yi Li;
By: Cheng-Ling Ying; Chia-Yi Chen; Po-Yi Wu; Hai-Han Lu; Ching-Hung Chang; Heng-Sheng Su; Chung-Yi Li;
2012 / IEEE
By: Ouyang, C.; Wu, K.; Lim, P.H.; Wong, V.; Shum, P.P.; Aditya, S.; Lam, H.Q.; Wong, J.H.; Lee, K.E.K.;
By: Ouyang, C.; Wu, K.; Lim, P.H.; Wong, V.; Shum, P.P.; Aditya, S.; Lam, H.Q.; Wong, J.H.; Lee, K.E.K.;
2012 / IEEE
By: Porcon, P.; Bouchet, O.; Turnbull, R.; Faulkner, G.; Hoa Le Minh; El Tabach, M.; O'Brien, D.; Jianhui Li; Grobe, L.; Wolf, M.; Gueutier, E.;
By: Porcon, P.; Bouchet, O.; Turnbull, R.; Faulkner, G.; Hoa Le Minh; El Tabach, M.; O'Brien, D.; Jianhui Li; Grobe, L.; Wolf, M.; Gueutier, E.;
2012 / IEEE
By: Gaomeng Wang; Li Zhan; Qishun Shen; Pingping Xiao; Zhijing Wu; Jinmei Liu; Liang Zhang; Xuesong Liu;
By: Gaomeng Wang; Li Zhan; Qishun Shen; Pingping Xiao; Zhijing Wu; Jinmei Liu; Liang Zhang; Xuesong Liu;
2012 / IEEE
By: Gomes, N.; Zegaoui, M.; Loyez, C.; Vilcot, J.-P.; Rolland, N.; Wake, D.; Lethien, C.; Verbeke, B.; Rolland, P.-A.;
By: Gomes, N.; Zegaoui, M.; Loyez, C.; Vilcot, J.-P.; Rolland, N.; Wake, D.; Lethien, C.; Verbeke, B.; Rolland, P.-A.;
2012 / IEEE
By: Guogang Qin; Lingjuan Zhao; Wei Wang; Guangzhao Ran; Chong Wang; Jifang Qiu; Jiaoqing Pan; Song Liang; Weixi Chen; Tao Hong; Yanping Li; Bin Niu;
By: Guogang Qin; Lingjuan Zhao; Wei Wang; Guangzhao Ran; Chong Wang; Jifang Qiu; Jiaoqing Pan; Song Liang; Weixi Chen; Tao Hong; Yanping Li; Bin Niu;
2012 / IEEE
By: de Ridder, R.M.; Bernhardi, E.H.; Burla, M.; Marpaung, D.A.I.; Worhoff, K.; Khan, M.R.H.; Roeloffzen, C.G.H.; Pollnau, M.;
By: de Ridder, R.M.; Bernhardi, E.H.; Burla, M.; Marpaung, D.A.I.; Worhoff, K.; Khan, M.R.H.; Roeloffzen, C.G.H.; Pollnau, M.;
2012 / IEEE
By: Shihuan Zou; Shilie Zheng; Xianmin Zhang; Hao Chi; Haoshuo Chen; Bo Yang; Koonen, T.; Xiaofeng Jin; Tangdiongga, E.;
By: Shihuan Zou; Shilie Zheng; Xianmin Zhang; Hao Chi; Haoshuo Chen; Bo Yang; Koonen, T.; Xiaofeng Jin; Tangdiongga, E.;
2012 / IEEE
By: Peng Huei Lim; Jin Xue; Aditya, S.; Nanxi Li; Junqiang Zhou; Lee, K.E.K.; Huy Quoc Lam; Jia Haur Wong; Shum, P.P.; Kan Wu;
By: Peng Huei Lim; Jin Xue; Aditya, S.; Nanxi Li; Junqiang Zhou; Lee, K.E.K.; Huy Quoc Lam; Jia Haur Wong; Shum, P.P.; Kan Wu;
2012 / IEEE
By: Chang-Hasnain, C.J.; Wu, M.C.; Sedgwick, F.; Chase, C.; Parekh, D.; Tur, M.; Zhang, L.; Yue, Y.; Huang, H.; Willner, A.E.;
By: Chang-Hasnain, C.J.; Wu, M.C.; Sedgwick, F.; Chase, C.; Parekh, D.; Tur, M.; Zhang, L.; Yue, Y.; Huang, H.; Willner, A.E.;
2012 / IEEE
By: Faci, S.; Tripon-Canseliet, C.; Chazelas, J.; Decoster, D.; Formont, S.; Magnin, V.; Pagies, A.;
By: Faci, S.; Tripon-Canseliet, C.; Chazelas, J.; Decoster, D.; Formont, S.; Magnin, V.; Pagies, A.;
2012 / IEEE
By: Bowers, J.E.; Ci-Ling Pan; Nan-Wei Chen; Kuo, F.; Huang, C.; Lin, J.W.; Jin-Wei Shi;
By: Bowers, J.E.; Ci-Ling Pan; Nan-Wei Chen; Kuo, F.; Huang, C.; Lin, J.W.; Jin-Wei Shi;