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Topic: Microwave Measurement
Results
2011 / IEEE
By: Daly, W.G.; Durgin, G.D.; Koo, G.A.; Trotter, M.S.; Graf, P.A.; Valenta, C.R.; Schafer, B.J.;
By: Daly, W.G.; Durgin, G.D.; Koo, G.A.; Trotter, M.S.; Graf, P.A.; Valenta, C.R.; Schafer, B.J.;
2012 / IEEE
By: Devgan, P.S.; Bucholtz, F.; McDermitt, C.S.; Urick, V.J.; Diehl, J.F.; Williams, K.J.;
By: Devgan, P.S.; Bucholtz, F.; McDermitt, C.S.; Urick, V.J.; Diehl, J.F.; Williams, K.J.;
Remote Wideband Microwave Frequency Measurement Based on a Single-Passband Microwave Photonic Filter
2012 / IEEEBy: Kun Zhu; Zuowei Xu; Hongyan Fu;
2012 / IEEE
By: Gasparri, N.I.; Karszenbaum, H.; Barraza, V.; Salvia, M.; Ferrazzoli, P.; Douna, V.; Grings, F.; Rahmoune, R.;
By: Gasparri, N.I.; Karszenbaum, H.; Barraza, V.; Salvia, M.; Ferrazzoli, P.; Douna, V.; Grings, F.; Rahmoune, R.;
2011 / IEEE / 978-1-4244-9563-4
By: Joseph, W.; Bamba, A.; Nielsen, J.O.; Andersen, J.B.; Martens, L.; Vermeeren, G.; Tanghe, E.; Plets, D.;
By: Joseph, W.; Bamba, A.; Nielsen, J.O.; Andersen, J.B.; Martens, L.; Vermeeren, G.; Tanghe, E.; Plets, D.;
Vector Green'S function for S-parameter measurements of the electromagnetic volume integral equation
2011 / IEEE / 978-1-4244-9563-4By: Haynes, M.; Moghaddam, M.;
2011 / IEEE / 978-1-61284-961-4
By: Tasker, P.J.; Canning, T.A.J.; Bell, J.W.; Saini, R.S.; Woodington, S.P.; Benedikt, J.; Lees, J.; FitzPatrick, D.;
By: Tasker, P.J.; Canning, T.A.J.; Bell, J.W.; Saini, R.S.; Woodington, S.P.; Benedikt, J.; Lees, J.; FitzPatrick, D.;
2011 / IEEE / 978-1-4244-6051-9
By: Brogioni, E.S.M.; Pettinato, S.; Pampaloni, P.; Paloscia, S.; Macelloni, G.; Fontanelli, G.;
By: Brogioni, E.S.M.; Pettinato, S.; Pampaloni, P.; Paloscia, S.; Macelloni, G.; Fontanelli, G.;
2011 / IEEE / 978-1-4577-1005-6
By: Medeiros, S.; Weishampel, J.; Hagen, S.C.; Chaouch, N.; Feyen, J.; Temimi, M.; Khanbilvardi, R.; Funakoshi, Y.;
By: Medeiros, S.; Weishampel, J.; Hagen, S.C.; Chaouch, N.; Feyen, J.; Temimi, M.; Khanbilvardi, R.; Funakoshi, Y.;
2011 / IEEE / 978-1-4577-1005-6
By: Sahoo, S.; Park, H.; Reising, S.C.; Camps, A.; Padmanabhan, S.; Bosch-Lluis, X.; Valencia, E.; Ramos-Perez, I.; Rodriguez-Alvarez, N.;
By: Sahoo, S.; Park, H.; Reising, S.C.; Camps, A.; Padmanabhan, S.; Bosch-Lluis, X.; Valencia, E.; Ramos-Perez, I.; Rodriguez-Alvarez, N.;
2011 / IEEE / 978-1-4577-1005-6
By: Ishikawa, T.; Kasahara, M.; Ito, N.; Noguchi, T.; Ito, T.; Yokobori, S.;
By: Ishikawa, T.; Kasahara, M.; Ito, N.; Noguchi, T.; Ito, T.; Yokobori, S.;
Combining space-based active and passive microwave observations to improve global snowfall estimates
2011 / IEEE / 978-1-4577-1005-6By: Wood, N.; L'Ecuyer, T.;
2011 / IEEE / 978-1-4577-1005-6
By: Chan, S.; Cosh, M.; Tianjie Zhao; Jackson, T.J.; Bindlish, R.; O'Neill, P.; Kerr, Y.; Shi, J.C.; Colliander, A.; Njoku, E.;
By: Chan, S.; Cosh, M.; Tianjie Zhao; Jackson, T.J.; Bindlish, R.; O'Neill, P.; Kerr, Y.; Shi, J.C.; Colliander, A.; Njoku, E.;
2011 / IEEE / 978-1-4577-1005-6
By: Lingmei Jiang; Lixin Zhang; Jiancheng Shi; Bindlish, R.; Yunqing Li; Tianjie Zhao; Xinxin Li; Tao Zhang; Shaojie Zhao;
By: Lingmei Jiang; Lixin Zhang; Jiancheng Shi; Bindlish, R.; Yunqing Li; Tianjie Zhao; Xinxin Li; Tao Zhang; Shaojie Zhao;
2011 / IEEE / 978-1-4577-1005-6
By: Grigoryan, M.; Arakelyan, A.; Karyan, V.; Hovhannisyan, G.; Simonyan, M.; Hambaryan, A.; Arakelyan, A.; Krdyan, M.;
By: Grigoryan, M.; Arakelyan, A.; Karyan, V.; Hovhannisyan, G.; Simonyan, M.; Hambaryan, A.; Arakelyan, A.; Krdyan, M.;
2011 / IEEE / 978-1-4577-1005-6
By: Grigoryan, M.; Manukyan, M.; Hambaryan, A.; Karyan, V.; Hambaryan, V.; Hovhannisyan, G.G.; Arakelyan, A.; Krdyan, M.; Simonyan, M.; Arakelyan, A.A.;
By: Grigoryan, M.; Manukyan, M.; Hambaryan, A.; Karyan, V.; Hambaryan, V.; Hovhannisyan, G.G.; Arakelyan, A.; Krdyan, M.; Simonyan, M.; Arakelyan, A.A.;
2011 / IEEE / 978-1-4577-1005-6
By: Davidson, M.; Rott, H.; Nagler, T.; Wiesmann, A.; Vehvilainen, J.; Schuettemeyer, D.; Arslan, A.; Pulliainen, J.; Lemmetyinen, J.; Rautiainen, K.; Kern, M.;
By: Davidson, M.; Rott, H.; Nagler, T.; Wiesmann, A.; Vehvilainen, J.; Schuettemeyer, D.; Arslan, A.; Pulliainen, J.; Lemmetyinen, J.; Rautiainen, K.; Kern, M.;
2011 / IEEE / 978-1-4577-1005-6
By: O'Neill, P.E.; van der Velde, R.; Joseph, A.T.; Gish, T.; Lang, R.H.; Kim, E.; Choudhury, B.J.;
By: O'Neill, P.E.; van der Velde, R.; Joseph, A.T.; Gish, T.; Lang, R.H.; Kim, E.; Choudhury, B.J.;