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Topic: Microwave Imaging
Results
2011 / IEEE
By: Ostadrahimi, M.; LoVetri, J.; Pistorius, S.; Noghanian, S.; Zakaria, A.; Gilmore, C.; Mojabi, P.;
By: Ostadrahimi, M.; LoVetri, J.; Pistorius, S.; Noghanian, S.; Zakaria, A.; Gilmore, C.; Mojabi, P.;
Clinical Microwave Tomographic Imaging of the Calcaneus: A First-in-Human Case Study of Two Subjects
2012 / IEEEBy: Meaney, P.M.; Paulsen, K.D.; Burke, G.; Geimer, S.D.; Goodwin, D.; Pallone, M.; Tian Zhou; Golnabi, A.H.;
2012 / IEEE
By: Kaufman, P.A.; Meaney, P.M.; Grzegorczyk, T.M.; Paulsen, K.D.; di Florio-Alexander, R.M.;
By: Kaufman, P.A.; Meaney, P.M.; Grzegorczyk, T.M.; Paulsen, K.D.; di Florio-Alexander, R.M.;
2012 / IEEE
By: Poretti, S.; Pastorino, M.; Monleone, R.; Maffongelli, M.; Salvade, A.; Randazzo, A.;
By: Poretti, S.; Pastorino, M.; Monleone, R.; Maffongelli, M.; Salvade, A.; Randazzo, A.;
2011 / IEEE / 978-1-4244-9563-4
By: Pistorius, S.; LoVetri, J.; Abubakar, A.; Gilmore, C.; van den Berg, P.M.;
By: Pistorius, S.; LoVetri, J.; Abubakar, A.; Gilmore, C.; van den Berg, P.M.;
2011 / IEEE / 978-1-4577-1005-6
By: Bourqui, P.; Doucet, M.; Suess, M.; Harnisch, B.; Marchese, L.; Bergeron, A.; Legros, M.; Martel, A.; Savard, M.; Chateauneuf, F.; Mercier, L.; Guillot, L.; Desnoyers, N.;
By: Bourqui, P.; Doucet, M.; Suess, M.; Harnisch, B.; Marchese, L.; Bergeron, A.; Legros, M.; Martel, A.; Savard, M.; Chateauneuf, F.; Mercier, L.; Guillot, L.; Desnoyers, N.;
2011 / IEEE / 978-1-4244-6051-9
By: Stang, J.; Clarkson, S.; van Nieuwstadt, L.; Haynes, M.; Moghaddam, M.; Ward, C.;
By: Stang, J.; Clarkson, S.; van Nieuwstadt, L.; Haynes, M.; Moghaddam, M.; Ward, C.;
2011 / IEEE / 978-1-4244-6051-9
By: Hallikainen, M.; Rautiainen, K.; Hakkarainen, A.; Seppanen, J.; Kainulainen, J.;
By: Hallikainen, M.; Rautiainen, K.; Hakkarainen, A.; Seppanen, J.; Kainulainen, J.;
2011 / IEEE / 978-1-4244-6051-9
By: Hedstrom, A.; Thordstein, M.; Edelevik, F.; Mahmood, Q.; Chodorowski, A.; Elam, M.; Fhager, A.; Mckelvey, T.; Persson, M.; Shirvany, Y.;
By: Hedstrom, A.; Thordstein, M.; Edelevik, F.; Mahmood, Q.; Chodorowski, A.; Elam, M.; Fhager, A.; Mckelvey, T.; Persson, M.; Shirvany, Y.;
2011 / IEEE / 978-1-4577-1005-6
By: Pablos, M.; Corbella, I.; Duffo, N.; Torres, F.; Davila, R.; Martin-Neira, M.;
By: Pablos, M.; Corbella, I.; Duffo, N.; Torres, F.; Davila, R.; Martin-Neira, M.;
2011 / IEEE / 978-1-4577-1005-6
By: Pulliainen, J.; Luojus, K.; Lemmetyinen, J.; Karna, J.-P.; Koskinen, J.; Bojkov, B.; Derksen, C.; Takala, M.;
By: Pulliainen, J.; Luojus, K.; Lemmetyinen, J.; Karna, J.-P.; Koskinen, J.; Bojkov, B.; Derksen, C.; Takala, M.;