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Topic: Microwave Electronics
Results
1995 / IEEE / 0-7803-2934-1
By: Dolbilov, G.V.; Fateev, A.A.; Yurkov, M.V.; Shvetsov, V.S.; Ivanov, I.N.; Golubev, I.I.; Petrov, V.A.; Lebedev, N.I.; Kosukhin, V.V.; Razuvakin, V.N.;
By: Dolbilov, G.V.; Fateev, A.A.; Yurkov, M.V.; Shvetsov, V.S.; Ivanov, I.N.; Golubev, I.I.; Petrov, V.A.; Lebedev, N.I.; Kosukhin, V.V.; Razuvakin, V.N.;
1999 / IEEE / 0-7803-5170-3
By: Mutamba, K.; Hartnagel, H.L.; Peerlings, J.; Riementschneider, R.; Pfeiffer, J.;
By: Mutamba, K.; Hartnagel, H.L.; Peerlings, J.; Riementschneider, R.; Pfeiffer, J.;
2000 / IEEE / 0-7803-5987-9
By: Zakurdayev, A.; Zhary, E.; Golenitskij, I.; Zaitsev, S.; Korolyov, A.; Lopin, M.; Homich, V.; Poognin, V.; Pobedonostsev, A.; Negirev, A.; Meleshkevich, P.;
By: Zakurdayev, A.; Zhary, E.; Golenitskij, I.; Zaitsev, S.; Korolyov, A.; Lopin, M.; Homich, V.; Poognin, V.; Pobedonostsev, A.; Negirev, A.; Meleshkevich, P.;
2003 / IEEE / 966-7968-26-X
By: Parshin, V.V.; Konov, V.I.; Ralchenko, V.G.; Heidinger, R.; Garin, B.M.;
By: Parshin, V.V.; Konov, V.I.; Ralchenko, V.G.; Heidinger, R.; Garin, B.M.;
2003 / IEEE / 966-7968-26-X
By: Galdetskiy, A.V.; Zaytsev, S.A.; Korolev, A.N.; Temnov, A.M.; Gelvich, E.A.; Pobedonostsev, A.S.;
By: Galdetskiy, A.V.; Zaytsev, S.A.; Korolev, A.N.; Temnov, A.M.; Gelvich, E.A.; Pobedonostsev, A.S.;
2004 / IEEE / 0-7803-8411-3
By: Konov, V.I.; Heidinger, R.; Derkach, V.N.; Garin, B.M.; Lyapin, L.V.; Parshin, V.V.; Ralchenko, V.G.; Molla, J.;
By: Konov, V.I.; Heidinger, R.; Derkach, V.N.; Garin, B.M.; Lyapin, L.V.; Parshin, V.V.; Ralchenko, V.G.; Molla, J.;
Control of oscillation modes in distributed beam-plasma system by means of continuous delay feedback
2004 / IEEE / 966-7968-69-3By: Hramov, A.E.; Rempen, I.S.;
2006 / IEEE / 978-4-902339-08-6
By: Drevon, C.; Schaffauser, C.; Vendier, O.; Villemazet, J.-F.; Forestier, S.; Cazaux, J.-L.; Muraro, J.-L.;
By: Drevon, C.; Schaffauser, C.; Vendier, O.; Villemazet, J.-F.; Forestier, S.; Cazaux, J.-L.; Muraro, J.-L.;
2007 / IEEE / 978-1-4244-1438-3
By: Hesler, J.L.; Crowe, T.W.; Hui, K.; Kurtz, D.S.; Porterfield, D.W.;
By: Hesler, J.L.; Crowe, T.W.; Hui, K.; Kurtz, D.S.; Porterfield, D.W.;
2009 / IEEE
By: Kuanr, B.K.; Celinski, Z.; Camley, R.E.; Kuanr, A.V.; Mishra, S.R.; Marson, R.; Veerakumar, V.;
By: Kuanr, B.K.; Celinski, Z.; Camley, R.E.; Kuanr, A.V.; Mishra, S.R.; Marson, R.; Veerakumar, V.;
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