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Topic: Microwave Amplifiers
Results
2012 / IEEE
By: Bing Han; Shichang Zhang; Pu-Kun Liu; Shou-Xi Xu; Yinong Su; Qianzhong Xue; Wei Gu; Zhi-Hui Geng;
By: Bing Han; Shichang Zhang; Pu-Kun Liu; Shou-Xi Xu; Yinong Su; Qianzhong Xue; Wei Gu; Zhi-Hui Geng;
2012 / IEEE
By: Angelov, I.; Hirano, Y.; Nakayama, M.; Otsuka, H.; Kuwata, E.; Fager, C.; Gustafsson, D.; Andersson, C.M.; Yamanaka, K.; Rorsman, N.;
By: Angelov, I.; Hirano, Y.; Nakayama, M.; Otsuka, H.; Kuwata, E.; Fager, C.; Gustafsson, D.; Andersson, C.M.; Yamanaka, K.; Rorsman, N.;
2012 / IEEE
By: Chang Liu; Yue-Peng Yan; Madihian, M.; Yong-Zhong Xiong; Li-Jun Zhang; Wang-Ling Goh;
By: Chang Liu; Yue-Peng Yan; Madihian, M.; Yong-Zhong Xiong; Li-Jun Zhang; Wang-Ling Goh;
2012 / IEEE
By: Cross, A.W.; Rowlands, D.H.; Robertson, C.W.; He, W.; Young, A.R.; Ronald, K.; Whyte, C.G.;
By: Cross, A.W.; Rowlands, D.H.; Robertson, C.W.; He, W.; Young, A.R.; Ronald, K.; Whyte, C.G.;
2012 / IEEE
By: Donaldson, C.R.; Wenlong He; Liang Zhang; Cross, A.W.; Ronald, K.; Young, A.R.; Robertson, C.W.; Whyte, C.G.; Phelps, A.D.R.;
By: Donaldson, C.R.; Wenlong He; Liang Zhang; Cross, A.W.; Ronald, K.; Young, A.R.; Robertson, C.W.; Whyte, C.G.; Phelps, A.D.R.;
Remote Wideband Microwave Frequency Measurement Based on a Single-Passband Microwave Photonic Filter
2012 / IEEEBy: Kun Zhu; Zuowei Xu; Hongyan Fu;
2012 / IEEE
By: Lourenco, N.E.; Philips, S.D.; Bhattacharya, S.K.; Patterson, C.E.; Poh, C.H.J.; Papapolymerou, J.; Cressler, J.D.;
By: Lourenco, N.E.; Philips, S.D.; Bhattacharya, S.K.; Patterson, C.E.; Poh, C.H.J.; Papapolymerou, J.; Cressler, J.D.;
2012 / IEEE
By: Palazzari, V.; Battistini, A.; Tasselli, G.; Mezzanotte, P.; Alimenti, F.; Roselli, L.;
By: Palazzari, V.; Battistini, A.; Tasselli, G.; Mezzanotte, P.; Alimenti, F.; Roselli, L.;
1992 / IEEE / 000-0-0000-0000-0
By: Fayne, W.R.; Hendricks, K.J.; Lemke, R.W.; Clark, M.C.; Bowers, L.A.; Platt, R.C.; Haworth, M.D.; Davis, C.E.;
By: Fayne, W.R.; Hendricks, K.J.; Lemke, R.W.; Clark, M.C.; Bowers, L.A.; Platt, R.C.; Haworth, M.D.; Davis, C.E.;
1992 / IEEE / 000-0-0000-0000-0
By: Shatkus, A.D.; Polovkov, A.I.; Kolosov, Y.A.; Ostrenskiy, Y.I.; Mitin, L.A.; Karbushev, N.I.; Sotnikov, G.V.; Balakirev, V.A.; Volokitenkova, I.L.;
By: Shatkus, A.D.; Polovkov, A.I.; Kolosov, Y.A.; Ostrenskiy, Y.I.; Mitin, L.A.; Karbushev, N.I.; Sotnikov, G.V.; Balakirev, V.A.; Volokitenkova, I.L.;
1992 / IEEE / 000-0-0000-0000-0
By: Granatstein, V.L.; Striffler, C.D.; Lawson, W.; Hogan, B.; Latham, P.E.; Tantawi, S.; Main, W.;
By: Granatstein, V.L.; Striffler, C.D.; Lawson, W.; Hogan, B.; Latham, P.E.; Tantawi, S.; Main, W.;
1992 / IEEE / 000-0-0000-0000-0
By: Kinross-Wright, J.; Fazio, M.V.; Brown, D.J.; Wheat, R.M.; Carlsten, B.E.; Hoeberling, R.F.; Stringfield, R.M.; Faehl, R.J.; Rodenz, G.;
By: Kinross-Wright, J.; Fazio, M.V.; Brown, D.J.; Wheat, R.M.; Carlsten, B.E.; Hoeberling, R.F.; Stringfield, R.M.; Faehl, R.J.; Rodenz, G.;
2004 / IEEE / 978-5-87911-088-3
By: Shlapakovski, A.S.; Schamiloglu, E.; Petrov, A.V.; Vintizenko, I.I.;
By: Shlapakovski, A.S.; Schamiloglu, E.; Petrov, A.V.; Vintizenko, I.I.;
2004 / IEEE / 978-5-87911-088-3
By: Ulyanov, D.K.; Tarakanov, V.P.; Shkvarunets, A.; Ponomarev, A.V.; Loza, O.T.; Kuzelev, M.V.; Krasilnikov, M.A.; Kartashov, I.N.; Ivanov, I.E.; Bogdankevich, I.L.; Rukhadze, A.A.; Strelkov, P.S.;
By: Ulyanov, D.K.; Tarakanov, V.P.; Shkvarunets, A.; Ponomarev, A.V.; Loza, O.T.; Kuzelev, M.V.; Krasilnikov, M.A.; Kartashov, I.N.; Ivanov, I.E.; Bogdankevich, I.L.; Rukhadze, A.A.; Strelkov, P.S.;
2011 / IEEE / 978-1-61284-795-5
By: Kroshin, F.S.; Shauerman, A.K.; Zharikov, M.S.; Borisov, A.V.; Shauerman, A.A.;
By: Kroshin, F.S.; Shauerman, A.K.; Zharikov, M.S.; Borisov, A.V.; Shauerman, A.A.;
2011 / IEEE / 978-1-4244-6051-9
By: Fujiwara, T.; Fujiwara, E.; Ozawa, Y.; Sasaki, T.; Honma, Y.; Fuse, Y.; Namura, K.; Ijichi, K.; Mihara, S.; Saito, T.;
By: Fujiwara, T.; Fujiwara, E.; Ozawa, Y.; Sasaki, T.; Honma, Y.; Fuse, Y.; Namura, K.; Ijichi, K.; Mihara, S.; Saito, T.;
2011 / IEEE / 978-1-4244-6051-9
By: Collin, A.; Lamproglou, I.; Amourette, C.; Cretallaz, C.; Leveque, P.; Perrin, A.; Diserbo, M.; Fauquette, W.;
By: Collin, A.; Lamproglou, I.; Amourette, C.; Cretallaz, C.; Leveque, P.; Perrin, A.; Diserbo, M.; Fauquette, W.;
2011 / IEEE / 978-966-335-357-9
By: Vaganov, A.A.; Shevchenko, K.L.; Skripnik, Yu.A.; Aleksashin, A.B.;
By: Vaganov, A.A.; Shevchenko, K.L.; Skripnik, Yu.A.; Aleksashin, A.B.;
2011 / IEEE / 978-1-4244-9644-0
By: Zamudio-Lara, A.; Koshevaya, S.V.; Grimalsky, V.V.; Rapoport, Yu.G.;
By: Zamudio-Lara, A.; Koshevaya, S.V.; Grimalsky, V.V.; Rapoport, Yu.G.;
2011 / IEEE / 978-1-61284-712-2
By: DeLisio, M.P.; Deckman, B.C.; Chung, Y.; Moya, M.E.; Than, H.T.; Zeng, J.; Cuellar, G.S.; Sun, G.W.; Schultz, N.T.;
By: DeLisio, M.P.; Deckman, B.C.; Chung, Y.; Moya, M.E.; Than, H.T.; Zeng, J.; Cuellar, G.S.; Sun, G.W.; Schultz, N.T.;
2011 / IEEE / 978-966-335-357-9
By: Manchenko, L.V.; Galdetskiy, A.V.; Malyshchik, V.M.; Korchagin, I.P.; Pchelin, V.A.; Kapralova, A.A.;
By: Manchenko, L.V.; Galdetskiy, A.V.; Malyshchik, V.M.; Korchagin, I.P.; Pchelin, V.A.; Kapralova, A.A.;
2011 / IEEE / 978-1-4577-0509-0
By: Jhou, J.N.; Wu, Z.Q.; Lo, Y.C.; Yang, S.J.; Lai, C.H.; Yeh, Y.S.; Hong, J.W.;
By: Jhou, J.N.; Wu, Z.Q.; Lo, Y.C.; Yang, S.J.; Lai, C.H.; Yeh, Y.S.; Hong, J.W.;
2011 / IEEE / 978-2-87487-023-1
By: Rolland, P.; Rolland, N.; Danneville, F.; Waldhoff, N.; Aufinger, K.;
By: Rolland, P.; Rolland, N.; Danneville, F.; Waldhoff, N.; Aufinger, K.;
2011 / IEEE / 978-2-87487-022-4
By: Gonzalez-Posadas, V.; Garcia-Perez, O.; Segovia-Vargas, D.; Garcia-Munoz, L.E.;
By: Gonzalez-Posadas, V.; Garcia-Perez, O.; Segovia-Vargas, D.; Garcia-Munoz, L.E.;
2011 / IEEE / 978-1-4577-0603-5
By: Peng Wang; Xu-Bo Wei; Li-Zheng Zhu; Bang-Chao Yang; Zhi-Yi Zeng; Song Ma;
By: Peng Wang; Xu-Bo Wei; Li-Zheng Zhu; Bang-Chao Yang; Zhi-Yi Zeng; Song Ma;
2011 / IEEE / 978-1-4577-2019-2
By: Vadala, V.; Avolio, G.; Schreurs, D.M.M.; Raffo, A.; Di Falco, S.; Vannini, G.; Crupi, G.; Caddemi, A.;
By: Vadala, V.; Avolio, G.; Schreurs, D.M.M.; Raffo, A.; Di Falco, S.; Vannini, G.; Crupi, G.; Caddemi, A.;
2011 / IEEE / 978-2-87487-022-4
By: Schiellein, M.; Scavennec, A.; Godin, J.; Riet, M.; Merlet, T.; Algani, C.; Polleux, J.-L.; Rosales, M.;
By: Schiellein, M.; Scavennec, A.; Godin, J.; Riet, M.; Merlet, T.; Algani, C.; Polleux, J.-L.; Rosales, M.;