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Topic: Microphones
Results
2012 / IEEE
By: Habets, E.A.P.; Thomas, M.R.P.; Filos, J.; Antonacci, F.; Tubaro, S.; Naylor, P.A.; Sarti, A.;
By: Habets, E.A.P.; Thomas, M.R.P.; Filos, J.; Antonacci, F.; Tubaro, S.; Naylor, P.A.; Sarti, A.;
Generalization of Multi-Channel Linear Prediction Methods for Blind MIMO Impulse Response Shortening
2012 / IEEEBy: Nakatani, T.; Yoshioka, T.;
2012 / IEEE
By: Huijbregts, M.; Hannani, A.E.; Grezl, F.; Garner, P.N.; Dines, J.; Karafiat, M.; Hain, T.; Wan, V.; Burget, L.; Lincoln, M.;
By: Huijbregts, M.; Hannani, A.E.; Grezl, F.; Garner, P.N.; Dines, J.; Karafiat, M.; Hain, T.; Wan, V.; Burget, L.; Lincoln, M.;
2012 / IEEE
By: Ribeiro, J.C.; Marques, P.; Duarte, P.; Esteves, H.; Dionisio, R.; Rodriguez, J.; Ribeiro, J.;
By: Ribeiro, J.C.; Marques, P.; Duarte, P.; Esteves, H.; Dionisio, R.; Rodriguez, J.; Ribeiro, J.;
2012 / IEEE
By: Murata, M.; Miyashita, T.; Oonuma, M.; Sano, Y.; Yamamoto, T.; Kandori, A.; Sakoda, S.;
By: Murata, M.; Miyashita, T.; Oonuma, M.; Sano, Y.; Yamamoto, T.; Kandori, A.; Sakoda, S.;
2012 / IEEE
By: Cecan, Nicolae; Liu, Hongbo; Chandrasekaran, Gayathri; Vu, Tam; Chen, Yingying; Sidhom, Simon; Yang, Jie; Martin, Richard P.; Gruteser, Marco;
By: Cecan, Nicolae; Liu, Hongbo; Chandrasekaran, Gayathri; Vu, Tam; Chen, Yingying; Sidhom, Simon; Yang, Jie; Martin, Richard P.; Gruteser, Marco;
2012 / IEEE
By: Nakatani, T.; Maas, R.; Kinoshita, K.; Delcroix, M.; Sehr, A.; Yoshioka, T.; Kellermann, W.;
By: Nakatani, T.; Maas, R.; Kinoshita, K.; Delcroix, M.; Sehr, A.; Yoshioka, T.; Kellermann, W.;
2012 / IEEE
By: Chang-Ho Liou; Kuan-Wei Chen; Wen-Ching Ko; Chih-Kung Lee; Wen-Jong Wu; Yu-Chi Chen;
By: Chang-Ho Liou; Kuan-Wei Chen; Wen-Ching Ko; Chih-Kung Lee; Wen-Jong Wu; Yu-Chi Chen;
2010 / IEEE / 978-0-9552047-4-6
By: Principi, E.; Cifani, S.; Squartini, S.; Piazza, F.; Rotili, R.;
By: Principi, E.; Cifani, S.; Squartini, S.; Piazza, F.; Rotili, R.;
2011 / IEEE / 978-1-4577-1255-5
By: Tanu, S.; Abhijit, B.; Kadambari, J.; Verma, N.K.; Subramaniam, T.S.S.;
By: Tanu, S.; Abhijit, B.; Kadambari, J.; Verma, N.K.; Subramaniam, T.S.S.;
2011 / IEEE / 978-1-4577-0638-7
By: Noguchi, H.; Izumi, S.; Kawaguchi, H.; Yoshimoto, M.; Soda, S.; Kugata, K.; Takagi, T.;
By: Noguchi, H.; Izumi, S.; Kawaguchi, H.; Yoshimoto, M.; Soda, S.; Kugata, K.; Takagi, T.;
2011 / IEEE / 978-1-4577-1118-3
By: Roning, J.; Pitkanen, A.; Alasalmi, T.; Siirtola, P.; Sokan, A.; Suutala, J.; Fujinami, K.; Nakajo, H.; Trang Thuy Vu;
By: Roning, J.; Pitkanen, A.; Alasalmi, T.; Siirtola, P.; Sokan, A.; Suutala, J.; Fujinami, K.; Nakajo, H.; Trang Thuy Vu;
2011 / IEEE / 978-1-61284-456-5
By: Liang, Dong; Ishi, Carlos T.; Hagita, Norihiro; Ishiguro, Hiroshi;
By: Liang, Dong; Ishi, Carlos T.; Hagita, Norihiro; Ishiguro, Hiroshi;
2011 / IEEE / 978-1-61284-456-5
By: Nakadai, Kazuhiro; Gong, Zheng; Hagiwara, Ichiro; Nakajima, Hirofumi;
By: Nakadai, Kazuhiro; Gong, Zheng; Hagiwara, Ichiro; Nakajima, Hirofumi;
2011 / IEEE / 978-1-61284-456-5
By: Kuhn, Benjamin; Schauerte, Boris; Stiefelhagen, Rainer; Kroschel, Kristian;
By: Kuhn, Benjamin; Schauerte, Boris; Stiefelhagen, Rainer; Kroschel, Kristian;
2011 / IEEE / 978-1-61284-456-5
By: Grunberg, David K.; Kim, Youngmoo E.; Oh, Paul Y.; Lofaro, Daniel M.;
By: Grunberg, David K.; Kim, Youngmoo E.; Oh, Paul Y.; Lofaro, Daniel M.;