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Topic: Micromechanical Resonators
Results
2011 / IEEE
By: Salvia, J.C.; Hopcroft, M.A.; Bongsang Kim; Melamud, R.; Hyung Kyu Lee; Kenny, T.W.;
By: Salvia, J.C.; Hopcroft, M.A.; Bongsang Kim; Melamud, R.; Hyung Kyu Lee; Kenny, T.W.;
2011 / IEEE
By: Moore, E.A.; Collins, P.J.; Coutu, R.A.; Starman, L.A.; Jussaume, M.E.; Langley, D.;
By: Moore, E.A.; Collins, P.J.; Coutu, R.A.; Starman, L.A.; Jussaume, M.E.; Langley, D.;
2012 / IEEE
By: Mehdi, J.M.; Thai, T.T.; Plana, R.; Tentzeris, M.M.; DeJean, G.R.; Pons, P.; Aubert, H.; Chebila, F.;
By: Mehdi, J.M.; Thai, T.T.; Plana, R.; Tentzeris, M.M.; DeJean, G.R.; Pons, P.; Aubert, H.; Chebila, F.;
2012 / IEEE
By: Seong Chan Jun; Insang Song; Duck-Hwan Kim; Sang Uk Son; Jung Han Choi; Seok Lee; Whan Kyun Kim; Jae Hun Kim; Chulki Kim; Yongsoo Choi; Ji Yoong Kang; Joon Hyong Cho; Hyong Seo Yoon;
By: Seong Chan Jun; Insang Song; Duck-Hwan Kim; Sang Uk Son; Jung Han Choi; Seok Lee; Whan Kyun Kim; Jae Hun Kim; Chulki Kim; Yongsoo Choi; Ji Yoong Kang; Joon Hyong Cho; Hyong Seo Yoon;
2012 / IEEE
By: Vandecasteele, M.; Ling Sieben-Xu; Karabacak, D.M.; Brongersma, S.H.; Calama, M.C.; Wouters, D.; van Andel, Y.;
By: Vandecasteele, M.; Ling Sieben-Xu; Karabacak, D.M.; Brongersma, S.H.; Calama, M.C.; Wouters, D.; van Andel, Y.;
2012 / IEEE
By: Pulskamp, J.S.; Bhave, S.A.; Power, B.; Martin, J.; Smith, G.L.; Polcawich, R.G.; Bedair, S.S.;
By: Pulskamp, J.S.; Bhave, S.A.; Power, B.; Martin, J.; Smith, G.L.; Polcawich, R.G.; Bedair, S.S.;
2012 / IEEE
By: Blokhina, E.; Fernandez, D.; Gorreta, S.; Dominguez, M.; Pons-Nin, J.; Madrenas, J.; Feely, O.; O'Connell, D.; Jimenez, V.;
By: Blokhina, E.; Fernandez, D.; Gorreta, S.; Dominguez, M.; Pons-Nin, J.; Madrenas, J.; Feely, O.; O'Connell, D.; Jimenez, V.;
2012 / IEEE
By: Chengkuo Lee; Palaniapan, M.; Dim-Lee Kwong; Bo Woon Soon; Fu-Li Hsiao; Tsai, J.M.-L.; Nan Wang;
By: Chengkuo Lee; Palaniapan, M.; Dim-Lee Kwong; Bo Woon Soon; Fu-Li Hsiao; Tsai, J.M.-L.; Nan Wang;
2012 / IEEE
By: Bin Guo; Bo Wang; Severi, S.; Tanaka, S.; De Wolf, I.; Puers, R.; Osman, H.; Decoutere, S.; Tilmans, H.A.C.; Witvrouw, A.; Haspeslagh, L.; Vereecke, G.; Van Hoof, R.; Verbist, A.; Du Bois, B.; De Coster, J.; Claes, G.; Helin, P.; Lianggong Wen;
By: Bin Guo; Bo Wang; Severi, S.; Tanaka, S.; De Wolf, I.; Puers, R.; Osman, H.; Decoutere, S.; Tilmans, H.A.C.; Witvrouw, A.; Haspeslagh, L.; Vereecke, G.; Van Hoof, R.; Verbist, A.; Du Bois, B.; De Coster, J.; Claes, G.; Helin, P.; Lianggong Wen;
2006 / IEEE / 978-3-9805741-8-1
By: Lengaigne, G.; Gachon, D.; Laude, V.; Ballandras, S.; Majjad, H.; Benchabane, S.;
By: Lengaigne, G.; Gachon, D.; Laude, V.; Ballandras, S.; Majjad, H.; Benchabane, S.;
2011 / IEEE / 978-1-61284-777-1
By: Li Jie; Zhang Yuguang; Yan Yingzhan; Jia Pengfei; Yan Shubin; Zhao Min; Wang Xiaoqian; Liu Jun;
By: Li Jie; Zhang Yuguang; Yan Yingzhan; Jia Pengfei; Yan Shubin; Zhao Min; Wang Xiaoqian; Liu Jun;
2011 / IEEE / 978-986-02-8974-9
By: Tingyun Wang; Zhenyi Chen; Yunqi Liu; Xianglong Zeng; Fufei Pang; Na Chen; Xiaobei Zhang;
By: Tingyun Wang; Zhenyi Chen; Yunqi Liu; Xianglong Zeng; Fufei Pang; Na Chen; Xiaobei Zhang;
2011 / IEEE / 978-1-61284-878-5
By: Gandomkar, M.; Razaghi, M.; Connelly, M.J.; Das, N.; Ahmadi, V.;
By: Gandomkar, M.; Razaghi, M.; Connelly, M.J.; Das, N.; Ahmadi, V.;
2011 / IEEE / 978-1-4244-9277-0
By: Chengkuo Lee; Palaniapan, M.; Fu-Li Hsiao; Soon, B.W.; Nan Wang; Dim-Lee Kwong; Soon, B.W.; Tsai, J.M.;
By: Chengkuo Lee; Palaniapan, M.; Fu-Li Hsiao; Soon, B.W.; Nan Wang; Dim-Lee Kwong; Soon, B.W.; Tsai, J.M.;
2011 / IEEE / 978-1-61284-777-1
By: Senlin Jiang; Guizhen Yan; Zhenchuan Yang; Longtao Lin; Dacheng Zhang;
By: Senlin Jiang; Guizhen Yan; Zhenchuan Yang; Longtao Lin; Dacheng Zhang;
2011 / IEEE / 978-1-4577-0708-7
By: Leverd, F.; Bustos, J.; Carpentier, J.-F.; Mercier, D.; Civet, Y.; Icard, B.; Casset, F.; Basrour, S.;
By: Leverd, F.; Bustos, J.; Carpentier, J.-F.; Mercier, D.; Civet, Y.; Icard, B.; Casset, F.; Basrour, S.;
2011 / IEEE / 978-1-55752-932-9
By: Spuesens, T.; Kumar, R.; Morthier, G.; Van Thourhout, D.; Roelkens, G.; Fedeli, J.; Olivier, N.; Regreny, P.; Mechet, P.;
By: Spuesens, T.; Kumar, R.; Morthier, G.; Van Thourhout, D.; Roelkens, G.; Fedeli, J.; Olivier, N.; Regreny, P.; Mechet, P.;
2011 / IEEE / 978-1-4244-7345-8
By: Khurgin, J.B.; Poitras, C.B.; Cardenas, J.; Morton, P.A.; Lipson, M.;
By: Khurgin, J.B.; Poitras, C.B.; Cardenas, J.; Morton, P.A.; Lipson, M.;
2011 / IEEE / 978-1-61284-264-6
By: Spirkova, J.; Huttel, I.; Strilek, E.; Prajzler, V.; Jerabek, V.;
By: Spirkova, J.; Huttel, I.; Strilek, E.; Prajzler, V.; Jerabek, V.;
2011 / IEEE / 978-4-8634-8182-4
By: Yamada, H.; Ueyama, Y.; Kaneshige, H.; Kokubun, Y.; Arakawa, T.;
By: Yamada, H.; Ueyama, Y.; Kaneshige, H.; Kokubun, Y.; Arakawa, T.;
2011 / IEEE / 978-1-4244-8939-8
By: DiGiovanni, D.J.; Sumetsky, M.; Taunay, T.F.; Monberg, E.M.; Liu, X.; Fini, J.M.; Dulashko, Y.;
By: DiGiovanni, D.J.; Sumetsky, M.; Taunay, T.F.; Monberg, E.M.; Liu, X.; Fini, J.M.; Dulashko, Y.;
2011 / IEEE / 978-2-87487-023-1
By: Chappell, W.J.; Katehi, L.P.B.; Fruehling, A.; Xiaoguang Liu; Peroulis, D.;
By: Chappell, W.J.; Katehi, L.P.B.; Fruehling, A.; Xiaoguang Liu; Peroulis, D.;
2011 / IEEE / 978-0-7695-4551-6
By: Channoufi, M.; Garcia, S.; Delacressonniere, B.; Attia, R.; Lecoy, P.;
By: Channoufi, M.; Garcia, S.; Delacressonniere, B.; Attia, R.; Lecoy, P.;
2011 / IEEE / 978-1-61284-813-6
By: Fraile-Pelaez, F.J.; Chamorro-Posada, P.; Gago-Munoz, E.; Diaz-Otero, F.J.;
By: Fraile-Pelaez, F.J.; Chamorro-Posada, P.; Gago-Munoz, E.; Diaz-Otero, F.J.;
2011 / IEEE / 978-1-61284-813-6
By: Nerukh, A.G.; Sakhnenko, N.K.; Pertsch, T.; Schmidt, C.; Chipouline, A.;
By: Nerukh, A.G.; Sakhnenko, N.K.; Pertsch, T.; Schmidt, C.; Chipouline, A.;