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Topic: Microelectronics

Results

Purposes of three-dimensional circuits

1987 / IEEE
By: Van de Wiele, F.; Terao, A.;

Guest Editors' Introduction: Asynchronous Design Is Here to Stay (and Is More Mainstream Than You Thought)

2011 / IEEE
By: Lavagno, Luciano; Singh, Montek;

Low on-Resistance SOI Dual-Trench-Gate MOSFET

2012 / IEEE
By: Jie Fan; Wang, Q.; Wang, P.; Zhou, K.; Jiang, Y.H.; Yao, G.L.; Wang, Y.G.; Lei, T.F.; Xiaorong Luo; Zhang, Z.Y.; Udrea, F.; Zhaoji Li; Bo Zhang; Ge, R.;

Numerical Investigation of Magnetic Resonant Coupling Technique in Inter-Chip Communication via Electromagnetics-TCAD Coupled Simulation

2012 / IEEE
By: Ho, S.L.; Quan Chen; Fu, W.N.;

Increasing Electrical Damping in Energy-Harnessing Transducers

2011 / IEEE
By: Rincon-Mora, G.A.; Peterson, K.D.; Lazaro, O.; Dongwon Kwon; Prabha, R.D.;

Sensor Network for Endotracheal Pressure Measurements in Hospital Environments

2011 / IEEE
By: Di Federico, M.; Falcon, A.; Obregon, P.D.P.; Julian, P.M.; Mandolesi, P.S.;

Hasselblad and the Shift to Digital Imaging

2011 / IEEE
By: Sandstrom, C.;

Conversion Experience: The Untold Story of Nuclear Science, Amplitude Measurement, and ADCs

2012 / IEEE
By: Anghinolfi, F.; Heijne, E.H.M.;

Certification of Parts for Space With the Variable Depth Bragg Peak Method

2012 / IEEE
By: Foster, C.C.; Buchner, S.; Warner, J.; Roche, N.J.-M.; Jones, B.H.; Nguyen, K.V.; Reddell, B.D.; O'Neill, P.M.;

A New Dynamic Selector Based on the Bipolar RRAM for the Crossbar Array Application

2012 / IEEE
By: Yue Pan; Ru Huang; Yinglong Huang; Yangyuan Wang; Gengyu Yang; Yimao Cai; Lijie Zhang;

An Electronic Patch for Wearable Health Monitoring by Reflectance Pulse Oximetry

2012 / IEEE
By: Birkelund, K.; Larsen, J.; Belhage, B.; Toft, M.H.; Duun, S.B.; Haahr, R.G.; Thomsen, E.V.;

Monolithic and Two-Dimensional Integration of Silicon Photonic Microdisks With Microelectronics

2012 / IEEE
By: Robertson, G.; Lentine, A.L.; Trotter, D.C.; Zortman, W.A.; Watts, M.R.; Hsia, A.;

Resistive Switching in Organic Memory Device Based on Parylene-C With Highly Compatible Process for High-Density and Low-Cost Memory Applications

2012 / IEEE
By: Yongbian Kuang; Yu Tang; Ru Huang; Yangyuan Wang; Lijie Zhang; Wei Ding;

Special Section on the 2010 International Conference on Microelectronic Test Structures

2012 / IEEE
By: Ohguro, T.;

Editorial Special Section on the 2011 International Conference on Microelectronic Test Structures

2012 / IEEE
By: Selmi, L.;

Special Section on the International Conference on Microelectronic Test Structures

2012 / IEEE
By: Allen, R. A.;

Modeling Operational Modes of a Bipolar Vacuum Microelectronic Device

2012 / IEEE
By: Madison, A.C.; Stoner, B.R.; Glass, J.T.; Parker, C.B.;

Analytical Solution for Steady-State and Transient Temperature Fields in Vertically Stacked 3-D Integrated Circuits

2012 / IEEE
By: Choobineh, L.; Jain, A.;

Hotspot Detection by Improved Adaptive Finite Element Method and its Application in High-Speed PCB and IC Package Design

2012 / IEEE
By: Zhanghong Tang;

A Closed-Form Multiscale Thermal Contact Resistance Model

2012 / IEEE
By: Elkady, Y.A.; Ghaednia, H.; Jackson, R.L.; Knight, R.W.; Bhavnani, S.H.;

The Early History of Microcircuitry: An Overview

2012 / IEEE
By: Laws, D.A.; Brock, D.C.;

Pulsed power technology and its applications at EDI, Nagaoka

2000 / IEEE
By: Kinemuchi, Yoshiaki; Jiang, Weihua; Yatsui, Kiyoshi; Yang, Sung-Chae; Suematsu, Hisayuki; Suzuki, Tsuneo; Imada, Go; Harada, Nobuhiro;

Transistor sizing and folding techniques for radiation hardening

2009 / IEEE / 978-1-4577-0493-2
By: Brusamarello, L.; Wirth, G.; Reis, R.; Ribeiro, I.; Assis, T.; Kastensmidt, F.L.;

Economic and educational perspective on outsourcing/offshoring microelectronics in india

2011 / IEEE / 978-1-61284-952-2
By: Pandit, V.S.;

Research on microelectronics outsourcing

2011 / IEEE / 978-1-61284-952-2
By: Patwardhan, S.; Pandit, V.;

Wearable sensor systems for healthcare and lifestyle

2011 / IEEE / 978-1-4577-0624-0
By: Penders, J.;

Design of spectral analyzer based on FPGA

2011 / IEEE / 978-1-4244-9439-2
By: Youmu Zhang; Jie Yang;

A weighted frequent itemsets Incremental Updating Algorithm base on hash table

2011 / IEEE / 978-1-61284-486-2
By: Zi-guo Huai; Ming-he Huang;

An Internet-based electrical engineering virtual lab: Using Modelica for unified modeling

2011 / IEEE / 978-1-61284-486-2
By: Zhengyin Shi; Shan-an Zhu; Shenglin Zhao;

Integration of micro-PCR with CMOS EC detection: Opportunity and challenges

2011 / IEEE / 978-1-61284-777-1
By: Rong Zhang; Zewen Liu; Taihong Wang; Weihua Si; Hao Tian; Jian Qin; Cangran Guo;

Design and development of insulin delivery system prototype

2011 / IEEE / 978-1-61284-486-2
By: Dikondwar, S.R.;

An improved multiphysics modelling approach for dielectrophoresis-based cell separation

2011 / IEEE / 978-1-4244-9789-8
By: Gagne, A.; Sawan, M.; Miled, M.A.;

Technology and electrical design of IGBT

2011 / IEEE / 978-83-932075-2-7
By: Shelibak, I.; Artamonov, A.; Nelayev, V.;

Study on curriculum design of system on chip

2011 / IEEE / 978-1-4244-9718-8
By: Shengbing Zhang; Xiaoya Fan; Jianfeng An; Wenxing Li;

Third stage of Hybrid Integrated Circuits - The education process in the microelectronics technology and packaging

2011 / IEEE / 978-1-4577-2112-0
By: Szendiuch, I.; Hejatkova, E.; Bursik, M.;

Investigation of nonstationary thermo-photo-elastic effect using the polarization modulation of radiation

2011 / IEEE / 978-1-4577-2112-0
By: Matiash, I.; Serdega, B.; Tsyganok, B.; Oliinyk, O.;

Modeling of microelectronic structures and packages using ANSYS software

2011 / IEEE / 978-1-4577-2112-0
By: Szendiuch, I.; Psota, B.;

Error amplifier for PWM controller

2011 / IEEE / 978-1-4244-8165-1
By: Xiaoyan Wang; Jianping Liu;

The time delay control of CAN messages for real-time communication

2011 / IEEE / 978-1-4577-1732-1
By: Puiu, D.; Moldoveanu, F.;

Inkjet printed electrically conductive structures for microelectronics

2011 / IEEE / 978-1-4577-2112-0
By: Felba, J.;

First-principles study of Si CMOS materials and nanostructures

2011 / IEEE / 978-1-61284-418-3
By: Eun-Ae Choi; Hyeon-Kyun Noh; Kee Joo Chang; Byungki Ryu;

Research of ATS architecture based on Information Path

2011 / IEEE / 978-1-4244-8161-3
By: Cai Xiang; Ying Chaolong; Wang Chengcheng;

A state-based power estimation methodology at system level for integrated RF front-ends

2011 / IEEE / 978-1-4577-0430-7
By: Ussmueller, T.; Weigel, R.; Fischer, G.; Glock, S.; Hasholzner, R.;

Modelling of processes of carry and electronic properties of heterostructures in the Internet

2011 / IEEE / 978-966-335-357-9
By: Muravrev, V.V.; Molodkin, D.F.; Mishenko, V.N.; Tamelo, A.A.;

Total Dose Test Results for CubeSat Electronics

2010 / IEEE / 978-1-4577-1281-4
By: Mee, J.; Finchel, J.; Avery, K.; Alexander, D.; Kemp, W.; Zufelt, B.; Elkins, D.; Netzer, R.;

Rademacher-Krestenson's method of between-bases transformations in designing processors

2011 / IEEE / 978-1-4577-1425-2
By: Nykolaychuk, Y.; Borovyi, A.; Volynskyy, O.;

Materials characterization using a structure based on microstrip line

2011 / IEEE / 978-1-4577-1814-4
By: Zarral, L.; Ndagijimana, F.;

An accurate measurement method for optical radiation loss of silicon-on-insulator curved waveguides

2011 / IEEE / 978-1-4577-0861-9
By: Hall, T.J.; Abdul-Majid, S.; Hasan, I.; DeGui Sun; Qi Zheng;

Advanced thermal ground plane for microelectronics

2011 / IEEE / 978-2-35500-016-4
By: Jiacai Oh; Kokfah Choo; Sooneng Ong; Kingho Li;

Evaluation of TiO2/SiO2 dielectric thin films to overcome the challenges of CMOS scaling

2011 / IEEE / 978-1-61284-846-4
By: Arya, S.K.; Ghlwat, M.; Rathee, D.;

Design and fabrication of microfluidic transistor on silicon substrate

2011 / IEEE / 978-1-61284-846-4
By: Zoolfakar, A.S.; Zolkapli, M.; Poopalan, P.; Taniselass, S.; Manut, A.;

Implementation of a reconfigurable computing system for space applications

2011 / IEEE / 978-1-4577-0246-4
By: Yimao Cai; Lidong Lan; Yuanfu Zhao;

An extensible drive system for AM-OLED panel

2011 / IEEE / 978-1-4577-1997-4
By: Wengao Lu; Lilan Yu; Lijiu Ji; Zhongjian Chen; Ze Huang; Yacong Zhang; Guannan Wang;

The verification of network processor Fast Bus Interface using SystemVerilog

2011 / IEEE / 978-1-4577-1997-4
By: Jiang Yong; Shi Jiang-Yi; Li Kang; Ma Wen-Bo; Ma Pei-Jun;

Warpage measurement of various substrates based on white light shadow moir�echnology

2011 / IEEE / 978-1-4577-1389-7
By: Fulong Zhu; Shao Song; Sheng Liu; Wei Zhang;

ESD-aware circuit design in CMOS integrated circuits to meet system-level ESD specification in microelectronic systems

2011 / IEEE / 978-1-4577-1997-4
By: Ming-Dou Ker;

Design of neural stimulating and neural signal detecting circuit for monolithic integrated MEA

2011 / IEEE / 978-1-4577-0077-4
By: Xiaoying Lu; Tao Fang; Haixian Pan; Zhigong Wang;

Microelectronics neural bridge IC with voltage stimulation

2011 / IEEE / 978-1-4244-9352-4
By: Pei Fei; Li Wenyuan;

Association criteria to optimize energy consumption and latency for IEEE 802.15.4/ZigBee wireless sensor networks

2011 / IEEE / 978-1-4577-1193-0
By: Ayoub, Z.T.; Kamoun, F.; Ouni, S.;

Knowledge driven mobile robots applied in the disassembly domain

2011 / IEEE / 978-1-4577-0330-0
By: Hametner, R.; Koppensteiner, G.; Merdan, M.; Passani, A.M.; Paris, R.;

Graphene: Quantum-mechanical outlook

2011 / IEEE / 978-1-4577-1516-7
By: Lyshevski, S.E.;

Nano and microelectromechanical systems courses

2011 / IEEE / 978-1-4577-1516-7
By: Lyshevski, S.E.; Andersen, J.D.; Puchades, I.; Fuller, L.L.;

Germanium-on-insulator fabricated by ion implantation and dry oxidation technique

2011 / IEEE / 978-1-4577-1516-7
By: Elliman, R.; Taehyun Kim; Luther-Davies, B.; Choi, D.;

High temperature electronics for harsh environments

2011 / IEEE / 978-0-9568086-0-8
By: Tooke, A.; Hunt, B.;

Advanced thermal management materials for heat sinks used in microelectronics

2011 / IEEE / 978-0-9568086-0-8
By: Ekere, N.; Bhatti, R.; Ekpu, M.; Mallik, S.;

Current developments in contactless measurements of high quality materials for microelectronics and nanotechnology employing dielectric resonator techniques

2011 / IEEE / 978-1-4577-0255-6
By: Krupka, J.; Mazierska, J.;

Mobile charger via walk

2011 / IEEE / 978-1-4577-1107-7
By: Tiwari, U.; Jain, M.; Gupta, M.;

Investigation of effects of heat sinks on thermal performance of microelectronic package

2011 / IEEE / 978-1-4673-0759-8
By: Amalu, E.; Mallik, S.; Ekere, N.; Bhatti, R.; Ekpu, M.; Otiaba, K.;

SET and SEU simulation toolkit for LabVIEW

2011 / IEEE / 978-1-4577-0586-1
By: Calienes Bartra, W.; Reis, R.;

Student Working Groups: An effective form of improving microelectronics education quality

2012 / IEEE / 978-1-4673-0840-3
By: Goldman, R.; Babayan, E.; Melikyan, V.; Kranen, K.; Wood, T.; Bartleson, K.;

Take the expressway to go greener

2012 / IEEE / 978-1-4673-0377-4
By: Yano, Y.;

Properties of porous silicon in ultra-violet spectrum

2012 / IEEE / 978-617-607-138-9
By: Kharabet, I.;

A new hardware abstraction-based framework to cope with analog design challenges

2011 / IEEE / 978-1-4577-2209-7
By: Kouki, A.; Lafi, S.; Belzile, J.;

New trends in microelectronics: Towards an ultimate memory concept

2012 / IEEE / 978-1-4577-1117-6
By: Sverdlov, V.; Makarov, A.; Selberherr, S.;

Dielectric resonator antennas based in BiYWO6 and operating at 3.3 GHz: Electrical properties study

2011 / IEEE / 978-1-4577-1664-5
By: Silva, P.V.S.; Fechine, P.B.A.; Melo, L.F.L.; Rocha, G.N.; Sombra, A.S.B.; da Silva, M.A.S.;

Measuring and improving the robustness of automotive smart power microelectronics

2012 / IEEE / 978-1-4577-2145-8
By: Kunze, M.; Meyer zu Bexten, V.; Harrant, M.; Tristl, M.; Rafaila, M.; Nirmaier, T.; Pelz, G.; Lau, J.;

A unified wireless sensor network framework

2012 / IEEE / 978-1-4673-0750-5
By: Kiepert, J.; Sin Ming Loo;

The new age: After microelectronics now nanoelectronics

2012 / IEEE / 978-80-214-4470-6
By: Hartnagel, H.L.;

Gaining 10x in energy efficiency in the next decade in consumer products

2012 / IEEE / 978-1-4577-2081-9
By: Cathelin, A.; Magarshack, P.;

A teamwork-based education strategy for teaching lab of analog integrated circuits design

2012 / IEEE / 978-1-4673-1456-5
By: de la Rosa, J.M.;

PMOS device performance improvement using buried contact implants

2012 / IEEE / 978-1-4577-1738-3
By: Pearlman, M.; Rowe, T.; Parke, S.; Ostyn, M.; Salvador, P.; Barnaby, H.; Velo, Y.G.; Olesky, D.; Butt, D.P.; Mitkova, M.; Chen, P.; Ailavajhala, M.S.; Mitkova, M.; Latif, M.R.; Seibert, M.; Zoller, R.; Miranda, P.; Mitkova, M.; Pun, B.; McTeer, A.; Hu, Y.J.; Burke, R.; Liu, L.J.; McDaniel, T.; Qin, S.; Browning, J.;

Proactive engineering

2012 / IEEE / 978-1-4673-1456-5
By: Campilho, A.C.; Tavares, V.G.; Magalhaes, F.; Oliveira, H.P.; Duarte, C.; de Oliveira, P.G.;

A new current-programmed pixel design for AMOLED displays implemented with organic thin-film transistors

2012 / IEEE / 978-1-4673-0238-8
By: Pappas, I.; Nikolaidis, S.; Rjoub, A.; Tarawneh, B.K.; Voudouris, L.;

Short channel effects in double gate polycrystalline silicon SLS ELA TFTs

2012 / IEEE / 978-1-4673-0238-8
By: Kouvatsos, D.N.; Moschou, D.C.; Voutsas, A.T.; Dimitriadis, C.; Pappas, I.;

Transfer of nanomembranes from solution to a solid frame via reflow of low surface tension liquids

2012 / IEEE / 978-1-4673-0238-8
By: Matovic, J.; Radovanovic, P.; Jaksic, Z.;

Verilog-A modeling of electrical circuit with adding element based on branched hydrogen bonding network

2012 / IEEE / 978-83-932075-8-9
By: Takov, T.B.; Radonov, R.I.; Angelov, G.V.; Rusev, R.P.; Gieva, E.E.; Hristov, M.H.;

Technical Program Committee

2012 / IEEE / 978-1-4577-1619-5

Spatial statistics for micro/nanoelectronics and materials science

2012 / IEEE / 978-1-4673-0238-8
By: Jimenez, D.; Miranda, E.; Hurley, P.K.; Cherkaoui, K.; Monaghan, S.; O'Connor, E.; Sune, J.;

Effects of thermal interface materials (solders) on thermal performance of a microelectronic package

2012 / IEEE / 978-2-35500-021-8
By: Otiaba, K.; Mallik, S.; Ekere, N.; Bhatti, R.; Ekpu, M.;

Recent developments in advanced memory modeling

2012 / IEEE / 978-1-4673-0238-8
By: Sverdlov, V.; Makarov, A.; Selberherr, S.;

Cooling potential of galinstan-based minichannel heat sinks

2012 / IEEE / 978-1-4244-9532-0
By: Hodes, M.; Lower, N.; Wilcoxon, R.; Rui Zhang;

PWB deflection vs. vibration-induced solder joint deformation

2012 / IEEE / 978-1-4244-9532-0
By: Jianmin Qu; Hevel, E.;

Modeling of the conductivity alteration in the gold thin film-based mercury sensor using the fuchs theory

2012 / IEEE / 978-1-4673-0238-8
By: Jovic, V.; Djuric, Z.; Sarajlic, M.;

Low temperature bonding with metallic micro-cones for 3D integration

2012 / IEEE / 978-1-4673-0742-0
By: Ming Li; Anmin Hu; Tao Hang; Qin Lu; Zhuo Chen;

Combiners based on CMOS inverters and application in RF transmitter for wireless sensors

2012 / IEEE / 978-1-4673-1928-7
By: Barthelemy, H.; Seguin, J.-L.; Masmoudi, M.; Meillere, S.; Thabet, H.; Aguir, K.;

Wireless portable sensor for athletic monitoring

2012 / IEEE / 978-1-4577-1772-7
By: Muller, I.; Rossetto, L.T.; Pereira, C.E.; Fabris, E.; Brusamarello, V.;

Mechanical solutions to problems in microsystems

2012 / IEEE / 978-1-4673-1043-7
By: Ananthasuresh, G. K.;

New pedagogical experiment leading to awareness in nanosciences and nanotechnologies for young generations at secondary school

2012 / IEEE / 978-1-4673-2334-5
By: Bonnaud, O.; Bsiesy, A.; Fesquet, L.; Papillon, F.; Excoffon, E.;

Reduction of surface roughness induced spin relaxation in SOI MOSFETs

2012 / IEEE / 978-1-4673-0707-9
By: Sverdlov, V.; Stanojevic, Z.; Baumgartner, O.; Osintsev, D.; Selberherr, S.;

Particle-grid techniques for semiclassical and quantum transport simulations

2012 / IEEE / 978-1-4673-0707-9
By: Selberherr, S.; Nedjalkov, M.; Schwaha, P.; Dimov, I.;

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