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Topic: Mesfet Technology
Results
1988 / IEEE
By: Furutsuka, T.; Ohno, N.; Ohno, Y.; Nakaizumi, K.; Maeda, T.; Ishikawa, M.; Asai, S.; Tomonoh, Y.; Miyatake, Y.;
By: Furutsuka, T.; Ohno, N.; Ohno, Y.; Nakaizumi, K.; Maeda, T.; Ishikawa, M.; Asai, S.; Tomonoh, Y.; Miyatake, Y.;
1989 / IEEE
By: Delaney, M.J.; Rosenbaum, S.E.; McCray, L.G.; Thompson, M.A.; Hooper, W.W.; Brown, A.S.; Deakin, D.S.; Jensen, J.F.; Larson, L.E.; Chou, C.S.;
By: Delaney, M.J.; Rosenbaum, S.E.; McCray, L.G.; Thompson, M.A.; Hooper, W.W.; Brown, A.S.; Deakin, D.S.; Jensen, J.F.; Larson, L.E.; Chou, C.S.;
1989 / IEEE
By: Tanaka, Y.; Kanamori, M.; Setoyama, Y.; Tsuchiya, T.; Hosono, Y.; Uetake, K.; Saito, H.; Hirayama, H.; Kishi, K.; Furutsuka, T.;
By: Tanaka, Y.; Kanamori, M.; Setoyama, Y.; Tsuchiya, T.; Hosono, Y.; Uetake, K.; Saito, H.; Hirayama, H.; Kishi, K.; Furutsuka, T.;
1992 / IEEE
By: Pande, K.; Hegazi, G.; Pages, P.; Ghahremani, M.; Phelleps, F.; Rice, P.; Cornfeld, A.; Chang, E.;
By: Pande, K.; Hegazi, G.; Pages, P.; Ghahremani, M.; Phelleps, F.; Rice, P.; Cornfeld, A.; Chang, E.;
1992 / IEEE
By: Contolatis, A.; Mondal, J.P.; Becker, R.C.; Geddes, J.J.; Vickerberg, M.; Sokolov, V.; Anderson, C.; Bounnak, S.S.; Carlson, D.;
By: Contolatis, A.; Mondal, J.P.; Becker, R.C.; Geddes, J.J.; Vickerberg, M.; Sokolov, V.; Anderson, C.; Bounnak, S.S.; Carlson, D.;
1994 / IEEE / 0-7803-1778-5
By: Chang Hua; Wei, J.; Yun Chung; Basset, R.; Meng, C.; Shu, J.; Ding Day; Hall, J.; Chye, P.;
By: Chang Hua; Wei, J.; Yun Chung; Basset, R.; Meng, C.; Shu, J.; Ding Day; Hall, J.; Chye, P.;
1995 / IEEE / 0-7803-2581-8
By: Costa Freire, J.; Dieudonne, J.M.; Rosario, M.J.; Fortes, F.; Torres, J.P.;
By: Costa Freire, J.; Dieudonne, J.M.; Rosario, M.J.; Fortes, F.; Torres, J.P.;
1999 / IEEE / 0-7803-5668-3
By: Jupp, P.M.; Edwards, F.M.; Brown, D.A.; Green, C.R.; Pennington, D.C.; Birkbeck, J.D.;
By: Jupp, P.M.; Edwards, F.M.; Brown, D.A.; Green, C.R.; Pennington, D.C.; Birkbeck, J.D.;
1999 / IEEE / 0-7803-5585-7
By: Cheskis, D.; Bustos, M.; Jayakumar, A.; Al-Kuran, S.; Bonelli, M.; Pietrucha, S.;
By: Cheskis, D.; Bustos, M.; Jayakumar, A.; Al-Kuran, S.; Bonelli, M.; Pietrucha, S.;
2001 / IEEE / 0-7803-7189-5
By: Novak, J.; Nguyen, T.; Van Der Star, J.; Consolazio, S.; Becker, R.; Peterson, K.; Gawron, J.; Bogus, E.; Haubenstricker, R.; Bourgeois, B.; Ferek, A.; Sahm, P.; Dietz, G.;
By: Novak, J.; Nguyen, T.; Van Der Star, J.; Consolazio, S.; Becker, R.; Peterson, K.; Gawron, J.; Bogus, E.; Haubenstricker, R.; Bourgeois, B.; Ferek, A.; Sahm, P.; Dietz, G.;
2001 / IEEE
By: Songcheol Hong; Laskar, J.; Euisik Yoon; Sang-Goog Lee; Sang-Woong Yoon; Sanghoon Sim; Chang-Ho Lee; Eun-Chul Park;
By: Songcheol Hong; Laskar, J.; Euisik Yoon; Sang-Goog Lee; Sang-Woong Yoon; Sanghoon Sim; Chang-Ho Lee; Eun-Chul Park;
2009 / IEEE / 978-1-4244-4749-7
By: Sinisi, F.; Corsaro, A.; Calvani, P.; Limiti, E.; Rossi, M.C.; Ciccognani, W.; Giovine, E.; Conte, G.;
By: Sinisi, F.; Corsaro, A.; Calvani, P.; Limiti, E.; Rossi, M.C.; Ciccognani, W.; Giovine, E.; Conte, G.;