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Topic: Measurement Uncertainty
Results
A reflectometer and power-ratio technique for the measurement of low values of waveguide attenuation
1976 / IEEEBy: Skilton, Peter J.;
Techniques for measuring the effective source reflection coefficient of two-resistor power splitters
1987 / IEEEBy: Moyer, R.D.;
1987 / IEEE
By: Field, Bruce F.; Dziuba, Ronald F.; Cage, Marvin E.; Van Degrift, Craig T.; Kiess, Thomas E.;
By: Field, Bruce F.; Dziuba, Ronald F.; Cage, Marvin E.; Van Degrift, Craig T.; Kiess, Thomas E.;
2011 / IEEE
By: Adachi, Y.; Oyama, D.; Uehara, G.; Hashimoto, I.; Yumoto, M.; Kasahara, T.; Hatsusaka, N.;
By: Adachi, Y.; Oyama, D.; Uehara, G.; Hashimoto, I.; Yumoto, M.; Kasahara, T.; Hatsusaka, N.;
2012 / IEEE
By: Bing Han; Shisong Li; Yaqiong Fu; Qing He; Jianting Zhao; Zhonghua Zhang; Jiang Lan; Zhengkun Li; Yunfeng Lu;
By: Bing Han; Shisong Li; Yaqiong Fu; Qing He; Jianting Zhao; Zhonghua Zhang; Jiang Lan; Zhengkun Li; Yunfeng Lu;
2012 / IEEE
By: Lihan Chen; Barker, N.S.; Weikle, R.M.; Lichtenberger, A.W.; Groppi, C.; Bauwens, M.; Arsenovic, A.; Reck, T.J.; Chunhu Zhang;
By: Lihan Chen; Barker, N.S.; Weikle, R.M.; Lichtenberger, A.W.; Groppi, C.; Bauwens, M.; Arsenovic, A.; Reck, T.J.; Chunhu Zhang;
2012 / IEEE
By: Roche, A.; Amharrak, H.; Lyoussi, A.; Di Salvo, J.; Masson-Fauchier, M.; Carette, M.; Bosq, J. C.; Pepino, A.;
By: Roche, A.; Amharrak, H.; Lyoussi, A.; Di Salvo, J.; Masson-Fauchier, M.; Carette, M.; Bosq, J. C.; Pepino, A.;
The Effect of Diode Response of Electromagnetic Field Probes for the Measurements of Complex Signals
2012 / IEEEBy: Douglas, M.; Fehr, M.; Kuhn, S.; Nadakuduti, J.; Kuster, N.; Pokovic, K.;