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Topic: Measurement Uncertainties

Results

Identification of Soft Magnetic B-H Characteristics Using Discrete Dynamic Preisach Model and Single Measured Hysteresis Loop
2012 / IEEE
By: Ruderman, M.; Bertram, T.;
Traceable Technique to Calibrate Clamp Meters in AC Current From 100 to 1500 A
2012 / IEEE
By: Capra, P.P.; Galliana, F.;
Nondestructive testing ultrasonic immersion probe assessment and uncertainty evaluation according to EN 12668-2:2010
2012 / IEEE
By: Costa-Felix, R.P.B.; Alvarenga, A.V.; Silva, C.E.R.;
3D target tracking by UAVs subject to measurement uncertainties
2011 / IEEE / 978-1-4577-1063-6
By: Subbarao, K.; Ahmed, M.;
An automatic measurement setup for outer diameter of inner conductor in coaxial air lines
2011 / IEEE / 978-1-61284-961-4
By: Huang Hui; Lv Xin; Liu Xinmeng;
Small signal and pulse characteristics of AlN/GaN MOS-HEMTs
2011 / IEEE / 978-2-87487-023-1
By: Wasige, E.; Murad, S.K.; Taking, S.; MacFarlane, D.;
Monte-Carlo analysis of measurement uncertainties for on-wafer Short-Open-Load-Reciprocal calibrations
2011 / IEEE / 978-0-85825-974-4
By: Huang Hui; Lv Xin; Liu Xinmeng;
Experimental investigation of the role of measurement uncertainties in the violation of Leggett-Garg inequalities
2011 / IEEE / 978-0-9775657-8-8
By: Suzuki, Y.; Hofmann, H.F.; Kadoya, Y.; Taguchi, G.; Okazaki, T.; Iinuma, M.;
Effects of parameter and measurement uncertainties on the power system WLS state estimation
2012 / IEEE / 978-1-4577-1772-7
By: Davoudi, M.; D'Antona, G.;
Evaluation of low-ohmic resistance measurement capabilities between VSL and NIST
2012 / IEEE / 978-1-4673-0442-9
By: Kraft, M.; van der Beek, J.; Rietveld, G.;
Implementation of Monte Carlo Method (MCM) for evaluation of measurement uncertainties at SCL
2012 / IEEE / 978-1-4673-0442-9
By: Chau, Y.C.; Lee, D.W.K.;
Traceability to national standards for S-parameter measurements in waveguide at 1.1 THz
2012 / IEEE / 978-1-4673-0442-9
By: Horibe, M.; Kishikawa, R.;
Characterisation of measurement uncertainties due to preamplifier gain variation
2015 / IEEE
By: Song, J.; Guo, Y.X.;
Complex Permittivity Determination From Far-Field Scattering Patterns
2015 / IEEE
By: Litman, A.; Geffrin, J.-M.; Eyraud, C.; Tortel, H.;
Investigation of Measurement Uncertainties and Errors in a Radiated Emission Test System
2015 / IEEE
By: Sim, Z.W.; Hui, H.T.; Song, J.;
The Effect of Variable Weights in a WLS State Estimator Considering Instrument Transformer Uncertainties
2014 / IEEE
By: Asprou, M.; Albu, M.; Kyriakides, E.;
Evaluation of uncertainties in testing of losses in power transformers using GUM-S1
2014 / IEEE
By: Lourenco, Marcelo Luiz; da Silva, Wander Goncalves; Batista, Adalberto Jose;
Capacitance measurements with a four terminal-pair coaxial bridge
2014 / IEEE
By: de Barros e Vasconcellos, Renata T.; Silveira, Flavio A.;
Self-calibration of the binary inductive voltage divider at frequencies up to 1MHz
2014 / IEEE
By: Zhang, Jiangtao; Cao, Shuguang; Li, Hao; Tu, Zhiguo; Pan, Xianlin; Zhang, Deshi;
NBS calibration procedures for horizontal dipole antennas (25 to 1000 MHz)
1988 / IEEE
By: Larsen, E.B.; Camell, D.G.; Anson, W.J.;
Calculated frequency characteristic of GR1482 inductance standards between 100 Hz and 100 kHz
1991 / IEEE
By: Hanke, R.; Droge, K.;
Noise power measurements and measurement uncertainties
1992 / IEEE
By: Buchholz, F.-I.; Melchert, F.; Kessel, W.;
Analysis of the least median of squares estimator for computer vision applications
1992 / IEEE / 0-8186-2855-3
By: Rosenfeld, A.; Meer, P.; Mintz, D.;
An accurate and repeatable technique for noise parameter measurements
1993 / IEEE
By: Boudiaf, A.; Laporte, M.;
Individual characterization of broadband sampling oscilloscopes with a nose-to-nose calibration procedure
1994 / IEEE
By: Rush, K.; Verspecht, J.;
Towards direct reconstruction from a gamma camera based on Compton scattering
1994 / IEEE
By: Bones, P.J.; Cree, M.J.;
A hybrid expert system and neural network approach for environmental applications
1994 / IEEE / 0-8186-5780-4
By: Lam, D.; Swayne, D.;
A new wattmeter for traceable power measurements at audio frequencies
1994 / IEEE / 0-7803-1984-2
By: Wright, P.S.; Pickering, J.R.;
Multi-variance analysis: last improvements and practical utilization
1994 / IEEE / 0-7803-1984-2
By: Vernotte, F.; Lantz, E.; Zalamansky, G.;
Microcalorimetric measurement of the effective efficiency of microwave power sensors comprising thermocouples
1994 / IEEE / 0-7803-1984-2
By: Butz, W.; Peinelt, W.; Janik, D.; Ruhaak, J.; Vollmer, E.; Stumper, U.;
Direct reconstruction methods for the Compton scattering camera for use in SPECT
1993 / IEEE / 0-7803-1487-5
By: Bones, P.J.; Cree, M.;
A new wattmeter for traceable power measurements at audio frequencies
1995 / IEEE
By: Pickering, J.R.; Wright, P.S.;
Experiments with monocular visual tracking and environment modeling
1993 / IEEE / 0-8186-3870-2
By: Silven, O.; Repo, T.;
Individual characterization of broadband sampling oscilloscopes with a 'nose-to-nose' calibration procedure
1993 / IEEE / 0-7803-1229-5
By: Verspecht, J.; Rush, K.;
Capacitive sensor arrays in dimensional analysis of surfaces
1995 / IEEE
By: Nerino, R.;
A general planar waveguide autoregressive optical filter
1996 / IEEE
By: Zhao, J.H.; Madsen, C.K.;
Neural networks and pseudo-measurements for real-time monitoring of distribution systems
1996 / IEEE
By: Losi, A.; Liguori, C.; Betta, G.; Bernieri, A.;
Nonlinear robust adaptive observers
1996 / IEEE / 0-8186-7352-4
By: Azemi, A.; Yaz, E.E.;
Millimeter radio astronomical research: acousto-optic spectrometer device and measurement uncertainties
1995 / IEEE / 0-7803-2674-1
By: Scalise, E., Jr.; Pacheco, G.M.;
Novel algorithms for FMCW range finding with microwaves
1995 / IEEE / 0-7803-2591-1
By: Stolle, R.; Schiek, B.; Heuermann, H.;
Small-signal modeling for microwave FET linear circuits based on a genetic algorithm
1996 / IEEE
By: Contini, F.; Piazzi, A.; Menozzi, R.;
A noise-adaptive digital null detector
1996 / IEEE / 0-7803-3376-4
By: Tarach, D.; Trenkler, G.;
Robust tracking control for a wheeled mobile robot
1996 / IEEE / 0-7803-3109-5
By: Tayebi, A.; Rachid, A.;
A noise-adaptive digital null detector
1997 / IEEE
By: Tarach, D.; Trenkler, G.;
Dielectric characterization of low-loss materials a comparison of techniques
1998 / IEEE
By: Jones, C.A.; Janezic, M.D.; Grosvenor, J.H., Jr.; Geyer, R.G.; Riddle, B.; Krupka, J.; Baker-Jarvis, J.; Weil, C.M.;
Complex permittivity measurements using a quasi-optical multistate reflectometer
1998 / IEEE / 0-7803-4903-2
By: Miles, R.E.; Thompson, D.; Pollard, R.D.;
Robust/adaptive observers for systems having uncertain functions with unknown bounds
1994 / IEEE / 0-7803-1783-1
By: Azemi, A.; Yaz, E.;
Calibration of dissipation factor standards
1999 / IEEE
By: FitzPatrick, G.J.; Simmon, E.D.; Petersons, O.;
Bodyloss for handheld phones
1999 / IEEE / 0-7803-5565-2
By: Olesen, K.; Pedersen, G.F.; Larsen, S.L.;
Generating dextrous manipulation for multifingered robot hands by combining motion planning and teaching
1999 / IEEE / 0-7803-5579-2
By: Leung, M.Y.Y.; Dazhai Li; Yun-Hui Liu; Pak Chiao Lam;
Analysis of log periodic dipole array antennas for site validation and radiated emissions testing
1999 / IEEE / 0-7803-5057-X
By: Harrington, T.; Foegelle, M.; Zhong Chen;
Measurement of conducted emissions. Possible sources for measurement uncertainties
1999 / IEEE / 0-7803-5057-X
By: Krattenmacher, H.; Schwab, A.;
A novel method of determining the permittivity of liquids
2000 / IEEE
By: Knochel, R.; Weiss, M.;
Measurement assurance in traceable time dissemination
2000 / IEEE / 0-7803-5744-2
By: Chua, H.A.; Shan, Y.;
Absolute quantum efficiency measurements using correlated photons: A study of systematics
2000 / IEEE / 0-7803-5744-2
By: Migdall, A.L.;
Development and uncertainty estimation of bridges for the link between capacitance and the QHR at 1 kHz
2000 / IEEE / 0-7803-5744-2
By: Sakamoto, Y.; Nakanishi, M.; Nakamura, Y.; Endo, T.;
Voltage divider characterisation at frequencies up to 200 kHz
2000 / IEEE / 0-7803-5744-2
By: Gibbes, A.M.; Budovsky, I.; Hammond, G.M.;
A new method for measuring ratios of dc voltages from 10 V to 1100 V
2000 / IEEE / 0-7803-5744-2
By: Christian, L.A.;
Initial rotor position estimation method for PM motors
2000 / IEEE / 0-7803-6401-5
By: Petrella, R.; Tursini, M.; Parasiliti, F.;
Interlaboratory comparison of Josephson voltage standards
2001 / IEEE
By: Plowman, D.; Jaeger, K.; Pardo, L.; Miller, W.B.; Deaver, D.; Hamilton, C.A.;
Measurement uncertainties arising from unpowered shipment of dc voltage references
2001 / IEEE
By: Tian Yeong Sim; Sze Wey Chua; Christian, L.A.; Ling Xiang Liu;
Fast method applied to the measurement of microwave power standards
2001 / IEEE
By: Velasco, L.; Mellouet, B.; Achkar, J.;
Absolute quantum efficiency measurements using: toward a measurement protocol
2001 / IEEE
By: Migdall, A.L.;
Accuracy evaluation of a cesium fountain primary frequency standard at NIST
2001 / IEEE
By: Jefferts, S.R.; Meekhof, D.M.; Parker, T.E.; Stepanovic, M.;
High frequency MOS transistor matching measurements for the determination of mixer port crosstalk
2001 / IEEE / 0-7803-6511-9
By: Laursen, S.;
AC-DC current transfer step-up calibration and uncertainty calculation
2001 / IEEE / 0-7803-6646-8
By: Bittel, P.; Spiegel, T.; Laiz, H.; Klonz, M.;
An interpolation scheme for precision reflection coefficient measurements at intermediate frequencies. I. Theoretical development
2001 / IEEE / 0-7803-6646-8
By: Dainton, M.P.; Cox, M.G.; Ridler, N.M.;
EUT directivity and other uncertainty considerations for GHz-range use of TEM waveguides
2001 / IEEE / 0-7803-6569-0
By: Bronaugh, E.L.; Harrington, T.E.;
Rebinning errors in coincidence imaging due to depth of interaction
2001 / IEEE
By: Ordonez, C.E.; Wei Chang; Matthews, K.L., II.;
Equivalent lumped elements G, L, C, and unloaded Q's of closed- and open-loop ring resonators
2002 / IEEE
By: Kai Chang; Lung-Hwa Hsieh;
GADT: a probability space ADT for representing and querying the physical world
2002 / IEEE / 0-7695-1531-2
By: Gehrke, J.; Faradjian, A.; Bonnett, P.;
Generalised calibration schemes for precision RF vector network analyser measurements
2002 / IEEE / 0-7803-7218-2
By: Ridler, N.M.; Morgan, A.G.; Salter, M.J.;
Evaluation of the synchronous generation and synchronous sampling technique for the determination of low frequency AC quantities
2002 / IEEE / 0-7803-7242-5
By: Ramm, G.; Ihlenfeld, K.; Guilherme, W.; Moser, H.; Bachmair, H.;
Integrated waveguide allpass filter tunable dispersion compensators
2002 / IEEE / 1-55752-701-6
By: Madsen, C.K.;
AC-DC current transfer step-up and step-down calibration and uncertainty calculation
2002 / IEEE
By: Klonz, M.; Bittel, P.; Spiegel, T.; Laiz, H.;
Measurement and monitoring of microwave reflection and transmission properties of cement-based specimens
2002 / IEEE
By: Hasar, U.C.; Akay, M.F.; Kharkovsky, S.N.; Atis, C.D.;
Approaches to evaluate the virtual instrumentation measurement uncertainties
2002 / IEEE
By: Nuccio, S.; Spataro, C.;
Random and systematic uncertainties of reflection-type Q-factor measurement with network analyzer
2003 / IEEE
By: Kajfez, D.;
A wide-band on-wafer noise parameter measurement system at 50-75 GHz
2003 / IEEE
By: Vaha-Heikkila, T.; Lahdes, M.; Kantanen, M.; Tuovinen, J.;
Evaluation of the synchronous generation and sampling technique
2003 / IEEE
By: Mohns, E.; Ihlenfeld, W.G.K.; Moser, H.; Ramm, G.; Bachmair, H.;
Calibration of electronic capacitance and dissipation factor bridges
2003 / IEEE
By: Moser, H.; Ramm, G.;
Small antenna measurements using a GTEM cell
2003 / IEEE / 0-7803-7846-6
By: Ping Hui;
Specification of acoustic output level and measurement uncertainty in ultrasonic exposimetry
2003 / IEEE
By: Ziskin, M.C.;
NIST-NPL interlaboratory pulse measurement comparison
2003 / IEEE
By: Smith, A.J.A.; Paulter, N.G.; Roddie, A.G.; Souders, T.M.; Larson, D.R.;
Stabilization of a class of time varying systems with control saturations and measurement noise with application to nonholonomic systems
2003 / IEEE / 0-7803-7924-1
By: Battilotti, S.;
Radial profiles of arcjet flow properties measured with laser-induced fluorescence of atomic nitrogen
2003 / IEEE / 0-7803-8149-1
By: Driver, D.M.; Grinstead, J.H.; Raiche, G.A.;
SNS linac commissioning - transverse matching
2003 / IEEE / 0-7803-7738-9
By: Stovall, J.; Jeon, D.;
Evaluation of the measurement uncertainties in the conducted emissions from adjustable speed electrical power drive systems
2004 / IEEE
By: Capriglione, D.; Betta, G.; Tomasso, G.;
Operational calibration of the Meteosat radiometer VIS band
2004 / IEEE
By: Govaerts, Y.M.; Clerbaux, N.; Clerici, M.;
Evaluation of the uncertainties in the measurement of distorted power by means of the IEN sampling system
2004 / IEEE / 0-7803-8248-X
By: Pogliano, U.;
Characterization and calibration of a CCD detector for light engineering
2005 / IEEE
By: Rossi, G.; Iacomussi, P.; Fiorentin, P.;
Quartz planar multijunction thermal converter as a new AC-DC current transfer standard up to 1 MHz
2005 / IEEE
By: Klonz, M.; Scarioni, L.; Funck, T.;
Determination of the AC-DC voltage transfer difference of high-voltage transfer standards at low frequencies
2005 / IEEE
By: Lapuh, R.; Laiz, H.; Klonz, M.; Kessler, E.; Kampik, M.; Funck, T.;
Localization of autonomous underwater vehicles by floating acoustic buoys: a set-membership approach
2005 / IEEE
By: Prattichizzo, D.; Livide, F.; Garulli, A.; Caiti, A.;
Extraction of critical dimension reference feature CDs from new test structure using HRTEM imaging
2005 / IEEE / 0-7803-8855-0
By: Hunt, A.; Allen, R.A.; Cresswell, M.W.; Guthrie, W.F.; Park, B.; Murabito, C.E.;
The influence of measurement uncertainties on the evaluation of the distribution volume ratio in rat studies on a microPET/spl reg/ R4: a phantom study
2004 / IEEE / 0-7803-8700-7
By: Tropini, G.; Rahmim, A.; Newport, D.; Camborde, M.-L.; Sossi, V.; Ruth, T.J.; Doudet, D.J.;
Robust model predictive control with imperfect information
2005 / IEEE / 0-7803-9098-9
By: Richards, A.; How, J.;
Measurement uncertainties of the calibration of multi-junction solar cells
2005 / IEEE / 0-7803-8707-4
By: Baur, C.; Bett, A.W.;
Effective Sounding Depths for HVDC Grounding Electrode Design: Wenner versus Schlumberger Methods
2005 / IEEE / 0-7803-9114-4
By: Southey, R.D.; Ruan, W.; Dawalibi, F.P.; Fortin, S.;
Errors and uncertainties in the measurement of ultrasonic wave attenuation and phase velocity
2005 / IEEE
By: Challis, R.E.; Kalashnikov, A.N.;

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